JP2013539074A - ３ｄ局在顕微鏡法並びに４ｄ局在顕微鏡法及び追跡方法並びに追跡システム - Google Patents

３ｄ局在顕微鏡法並びに４ｄ局在顕微鏡法及び追跡方法並びに追跡システム Download PDF

Info

Publication number
JP2013539074A
JP2013539074A JP2013530109A JP2013530109A JP2013539074A JP 2013539074 A JP2013539074 A JP 2013539074A JP 2013530109 A JP2013530109 A JP 2013530109A JP 2013530109 A JP2013530109 A JP 2013530109A JP 2013539074 A JP2013539074 A JP 2013539074A
Authority
JP
Japan
Prior art keywords
image
objective lens
lobes
radiator
phase
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP2013530109A
Other languages
English (en)
Japanese (ja)
Inventor
ゾエラー、クリスティアン
バデリー、ダーヴィト・ミヒャエル
キャネル、マルク・ブライデン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Carl Zeiss Microscopy GmbH
Original Assignee
Carl Zeiss Microscopy GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Carl Zeiss Microscopy GmbH filed Critical Carl Zeiss Microscopy GmbH
Publication of JP2013539074A publication Critical patent/JP2013539074A/ja
Ceased legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0092—Polarisation microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/14—Condensers affording illumination for phase-contrast observation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/58—Optics for apodization or superresolution; Optical synthetic aperture systems
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/24—Classification techniques
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/194—Segmentation; Edge detection involving foreground-background segmentation
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/20—Image signal generators
    • H04N13/204—Image signal generators using stereoscopic image cameras
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N17/00—Diagnosis, testing or measuring for television systems or their details
    • H04N17/002—Diagnosis, testing or measuring for television systems or their details for television cameras
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10056—Microscopic image

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Signal Processing (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Data Mining & Analysis (AREA)
  • Biomedical Technology (AREA)
  • Quality & Reliability (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Artificial Intelligence (AREA)
  • Evolutionary Biology (AREA)
  • Evolutionary Computation (AREA)
  • General Engineering & Computer Science (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
JP2013530109A 2010-09-24 2011-09-26 ３ｄ局在顕微鏡法並びに４ｄ局在顕微鏡法及び追跡方法並びに追跡システム Ceased JP2013539074A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
NZ588199 2010-09-24
NZ58819910 2010-09-24
PCT/NZ2011/000200 WO2012039636A2 (en) 2010-09-24 2011-09-26 "3d localisation microscopy and 4d localisation microscopy and tracking methods and systems"

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2016147913A Division JP6416160B2 (ja) 2010-09-24 2016-07-28 ３ｄ局在顕微鏡法並びに４ｄ局在顕微鏡法及び追跡方法並びに追跡システム

Publications (1)

Publication Number Publication Date
JP2013539074A true JP2013539074A (ja) 2013-10-17

Family

ID=44993857

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2013530109A Ceased JP2013539074A (ja) 2010-09-24 2011-09-26 ３ｄ局在顕微鏡法並びに４ｄ局在顕微鏡法及び追跡方法並びに追跡システム
JP2016147913A Active JP6416160B2 (ja) 2010-09-24 2016-07-28 ３ｄ局在顕微鏡法並びに４ｄ局在顕微鏡法及び追跡方法並びに追跡システム

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2016147913A Active JP6416160B2 (ja) 2010-09-24 2016-07-28 ３ｄ局在顕微鏡法並びに４ｄ局在顕微鏡法及び追跡方法並びに追跡システム

Country Status (4)

Country Link
US (3) US9523846B2 (enExample)
JP (2) JP2013539074A (enExample)
DE (1) DE112011103187B4 (enExample)
WO (1) WO2012039636A2 (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013250430A (ja) * 2012-05-31 2013-12-12 Nikon Corp 顕微鏡装置
JP2015072472A (ja) * 2013-09-30 2015-04-16 カール ツァイス マイクロスコピー ゲーエムベーハーＣａｒｌ Ｚｅｉｓｓ Ｍｉｃｒｏｓｃｏｐｙ Ｇｍｂｈ 微視的標本を検査するための光学顕微鏡および顕微鏡方法
JP2020515907A (ja) * 2017-04-04 2020-05-28 ザ ユニバーシティ オブ ユタ リサーチ ファウンデイション 顕微鏡における高精度波長抽出用の位相板

Families Citing this family (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7838302B2 (en) 2006-08-07 2010-11-23 President And Fellows Of Harvard College Sub-diffraction limit image resolution and other imaging techniques
CN101918816B (zh) 2007-12-21 2015-12-02 哈佛大学 三维中的亚衍射极限图像分辨率
DE102012201003B4 (de) * 2012-01-24 2024-07-25 Carl Zeiss Microscopy Gmbh Mikroskop und Verfahren für die hochauflösende 3-D Fluoreszenzmikroskopie
DE102012201286B4 (de) * 2012-01-30 2025-07-24 Carl Zeiss Microscopy Gmbh Mikroskop und Verfahren für die wellenlängenselektive und örtlich hochauflösende Mikroskopie
DE102012202730B4 (de) 2012-02-22 2025-07-24 Carl Zeiss Microscopy Gmbh Wellenlängenselektive und örtlich hochauflösende Fluoreszenzmikroskopie
EP2966492B1 (en) 2012-05-02 2020-10-21 Centre National De La Recherche Scientifique Method and apparatus for single-particle localization using wavelet analysis
DE102013208415B4 (de) * 2013-05-07 2023-12-28 Carl Zeiss Microscopy Gmbh Mikroskop und Verfahren für die 3D-hochauflösende Lokalisierungsmikroskopie
DE102013208927A1 (de) 2013-05-14 2014-11-20 Carl Zeiss Microscopy Gmbh Verfahren zur 3D-hochauflösenden Lokalisierungsmikroskopie
DE102013208926A1 (de) 2013-05-14 2014-11-20 Carl Zeiss Microscopy Gmbh Verfahren zur 3D-hochauflösenden Lokalisierungsmikroskopie
DE102013015933A1 (de) 2013-09-19 2015-03-19 Carl Zeiss Microscopy Gmbh Hochauflösende Scanning-Mikroskopie
WO2017090210A1 (ja) 2015-11-27 2017-06-01 株式会社ニコン 顕微鏡、観察方法、及び画像処理プログラム
CN105403170B (zh) * 2015-12-11 2018-05-25 华侨大学 一种显微3d形貌测量方法及装置
US10908072B2 (en) 2016-12-15 2021-02-02 The Board Of Regents Of The University Of Texas System Total internal reflection and transmission illumination fluorescence microscopy imaging system with improved background suppression
JPWO2018116851A1 (ja) * 2016-12-21 2019-10-24 株式会社ニコン 情報処理装置、画像処理装置、顕微鏡、情報処理方法、及び情報処理プログラム
DE102017105103A1 (de) 2017-03-10 2018-09-13 Carl Zeiss Microscopy Gmbh 3D-Mikroskopie
CN107133964B (zh) * 2017-06-01 2020-04-24 江苏火米互动科技有限公司 一种基于Kinect的抠像方法
WO2019135069A1 (en) * 2018-01-02 2019-07-11 King's College London Method and system for localisation microscopy
CN109080144A (zh) * 2018-07-10 2018-12-25 泉州装备制造研究所 基于中心点判断的3d打印喷头末端实时跟踪定位方法
CN108982454B (zh) * 2018-07-30 2021-03-02 华中科技大学苏州脑空间信息研究院 一种轴向多层并行扫描显微成像方法及系统
US20200056615A1 (en) 2018-08-16 2020-02-20 Saudi Arabian Oil Company Motorized pump
US20200056462A1 (en) 2018-08-16 2020-02-20 Saudi Arabian Oil Company Motorized pump
DE102018122652B4 (de) * 2018-09-17 2025-11-27 Carl Zeiss Microscopy Gmbh Spektralauflösende, hochauflösende 3D-Lokalisierungmikroskopie
DE102018128590A1 (de) 2018-11-14 2020-05-14 Carl Zeiss Microscopy Gmbh Fluktuationsbasierte Fluoreszenzmikroskopie
US11347040B2 (en) 2019-02-14 2022-05-31 Double Helix Optics Inc. 3D target for optical system characterization
DE102020113998A1 (de) 2020-05-26 2021-12-02 Abberior Instruments Gmbh Verfahren, Computerprogramm und Vorrichtung zum Bestimmen von Positionen von Molekülen in einer Probe
US11371326B2 (en) 2020-06-01 2022-06-28 Saudi Arabian Oil Company Downhole pump with switched reluctance motor
US11499563B2 (en) 2020-08-24 2022-11-15 Saudi Arabian Oil Company Self-balancing thrust disk
US11920469B2 (en) 2020-09-08 2024-03-05 Saudi Arabian Oil Company Determining fluid parameters
US11644351B2 (en) 2021-03-19 2023-05-09 Saudi Arabian Oil Company Multiphase flow and salinity meter with dual opposite handed helical resonators
US11591899B2 (en) 2021-04-05 2023-02-28 Saudi Arabian Oil Company Wellbore density meter using a rotor and diffuser
US11913464B2 (en) 2021-04-15 2024-02-27 Saudi Arabian Oil Company Lubricating an electric submersible pump
US11994016B2 (en) 2021-12-09 2024-05-28 Saudi Arabian Oil Company Downhole phase separation in deviated wells
US12258954B2 (en) 2021-12-15 2025-03-25 Saudi Arabian Oil Company Continuous magnetic positive displacement pump
US12085687B2 (en) 2022-01-10 2024-09-10 Saudi Arabian Oil Company Model-constrained multi-phase virtual flow metering and forecasting with machine learning
DE102022200841B3 (de) 2022-01-26 2023-05-04 Carl Zeiss Microscopy Gmbh Verfahren, Anordnung und Mikroskop zur dreidimensionalen Bildgebung in der Mikroskopie unter Nutzung einer asymmetrischen Punktbildübertragungsfunktion
JP7673010B2 (ja) * 2022-03-22 2025-05-08 株式会社日立ハイテク 光電子顕微鏡

Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006071950A (ja) * 2004-09-01 2006-03-16 Canon Inc 光学機器
JP2006317261A (ja) * 2005-05-12 2006-11-24 Olympus Corp 走査型サイトメータの画像処理方法及び装置
WO2006127692A2 (en) * 2005-05-23 2006-11-30 Hess Harald F Optical microscopy with phototransformable optical labels
JP2008122856A (ja) * 2006-11-15 2008-05-29 Citizen Holdings Co Ltd 液晶光変調素子、液晶光変調装置、および液晶光変調素子の駆動方法
US20080137059A1 (en) * 2006-06-05 2008-06-12 University Of Colorado Method And System For Optical Imaging And Ranging
WO2008132976A1 (ja) * 2007-04-12 2008-11-06 Nikon Corporation 顕微鏡装置
JP4288323B1 (ja) * 2008-09-13 2009-07-01 独立行政法人科学技術振興機構 顕微鏡装置及びそれを用いた蛍光観察方法
WO2009100830A1 (de) * 2008-02-13 2009-08-20 Carl Zeiss Microimaging Gmbh Vorrichtung und verfahren zum räumlichen hochauflösenden abbilden einer struktur einer probe
WO2009115244A1 (en) * 2008-03-19 2009-09-24 Ruprecht-Karls-Universität Heidelberg A method and an apparatus for localization of single dye molecules in the fluorescent microscopy
WO2010060545A1 (de) * 2008-11-27 2010-06-03 Carl Zeiss Microimaging Gmbh Auflösungsgesteigerte mikroskopie
WO2010060515A1 (de) * 2008-11-03 2010-06-03 Carl Zeiss Microlmaging Gmbh Kombinationsmikroskopie

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0695038A (ja) * 1992-03-19 1994-04-08 Matsushita Electric Ind Co Ltd 超解像走査光学装置、光学装置の超解像用光源装置及び光学装置の超解像用フィルター
JP4789177B2 (ja) 2005-07-06 2011-10-12 独立行政法人科学技術振興機構 ３次元位置観測方法及び装置
KR100743591B1 (ko) * 2005-09-23 2007-07-27 한국과학기술원 사이드 로브가 제거된 공초점 자가 간섭 현미경
US7924432B2 (en) * 2006-12-21 2011-04-12 Howard Hughes Medical Institute Three-dimensional interferometric microscopy
JP5536650B2 (ja) 2007-08-31 2014-07-02 ザ ジェネラル ホスピタル コーポレイション 自己干渉蛍光顕微鏡検査のためのシステムと方法、及び、それに関連するコンピュータがアクセス可能な媒体
CN101918816B (zh) * 2007-12-21 2015-12-02 哈佛大学 三维中的亚衍射极限图像分辨率
US7772569B2 (en) * 2008-04-01 2010-08-10 The Jackson Laboratory 3D biplane microscopy
DE102008049886B4 (de) 2008-09-30 2021-11-04 Carl Zeiss Microscopy Gmbh Vorrichtung, insbesondere ein Mikroskop, zur Untersuchung von Proben
WO2010080030A2 (en) 2009-01-09 2010-07-15 Aleksey Nikolaevich Simonov Optical rangefinder an imaging apparatus with chiral optical arrangement
US8620065B2 (en) * 2010-04-09 2013-12-31 The Regents Of The University Of Colorado Methods and systems for three dimensional optical imaging, sensing, particle localization and manipulation
US8711211B2 (en) * 2010-06-14 2014-04-29 Howard Hughes Medical Institute Bessel beam plane illumination microscope
US9500846B2 (en) * 2014-03-17 2016-11-22 Howard Hughes Medical Institute Rapid adaptive optical microscopy over large multicellular volumes
US10341640B2 (en) * 2015-04-10 2019-07-02 The Board Of Trustees Of The Leland Stanford Junior University Multi-wavelength phase mask

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006071950A (ja) * 2004-09-01 2006-03-16 Canon Inc 光学機器
JP2006317261A (ja) * 2005-05-12 2006-11-24 Olympus Corp 走査型サイトメータの画像処理方法及び装置
WO2006127692A2 (en) * 2005-05-23 2006-11-30 Hess Harald F Optical microscopy with phototransformable optical labels
US20080137059A1 (en) * 2006-06-05 2008-06-12 University Of Colorado Method And System For Optical Imaging And Ranging
JP2008122856A (ja) * 2006-11-15 2008-05-29 Citizen Holdings Co Ltd 液晶光変調素子、液晶光変調装置、および液晶光変調素子の駆動方法
WO2008132976A1 (ja) * 2007-04-12 2008-11-06 Nikon Corporation 顕微鏡装置
WO2009100830A1 (de) * 2008-02-13 2009-08-20 Carl Zeiss Microimaging Gmbh Vorrichtung und verfahren zum räumlichen hochauflösenden abbilden einer struktur einer probe
WO2009115244A1 (en) * 2008-03-19 2009-09-24 Ruprecht-Karls-Universität Heidelberg A method and an apparatus for localization of single dye molecules in the fluorescent microscopy
JP4288323B1 (ja) * 2008-09-13 2009-07-01 独立行政法人科学技術振興機構 顕微鏡装置及びそれを用いた蛍光観察方法
WO2010060515A1 (de) * 2008-11-03 2010-06-03 Carl Zeiss Microlmaging Gmbh Kombinationsmikroskopie
WO2010060545A1 (de) * 2008-11-27 2010-06-03 Carl Zeiss Microimaging Gmbh Auflösungsgesteigerte mikroskopie

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013250430A (ja) * 2012-05-31 2013-12-12 Nikon Corp 顕微鏡装置
JP2015072472A (ja) * 2013-09-30 2015-04-16 カール ツァイス マイクロスコピー ゲーエムベーハーＣａｒｌ Ｚｅｉｓｓ Ｍｉｃｒｏｓｃｏｐｙ Ｇｍｂｈ 微視的標本を検査するための光学顕微鏡および顕微鏡方法
JP2020515907A (ja) * 2017-04-04 2020-05-28 ザ ユニバーシティ オブ ユタ リサーチ ファウンデイション 顕微鏡における高精度波長抽出用の位相板
JP7144438B2 (ja) 2017-04-04 2022-09-29 ザ ユニバーシティ オブ ユタ リサーチ ファウンデイション 顕微鏡における高精度波長抽出用の位相板

Also Published As

Publication number Publication date
US9523846B2 (en) 2016-12-20
US20180348499A1 (en) 2018-12-06
DE112011103187B4 (de) 2021-10-14
WO2012039636A2 (en) 2012-03-29
JP6416160B2 (ja) 2018-10-31
US10571674B2 (en) 2020-02-25
DE112011103187T8 (de) 2013-09-26
DE112011103187T5 (de) 2013-07-25
US20170168283A1 (en) 2017-06-15
JP2016197260A (ja) 2016-11-24
US20130300833A1 (en) 2013-11-14
US10007103B2 (en) 2018-06-26
WO2012039636A3 (en) 2012-07-12

Similar Documents

Publication Publication Date Title
JP6416160B2 (ja) ３ｄ局在顕微鏡法並びに４ｄ局在顕微鏡法及び追跡方法並びに追跡システム
Backlund et al. The double-helix point spread function enables precise and accurate measurement of 3D single-molecule localization and orientation
JP6444869B2 (ja) 誘導放出抑制顕微鏡検査
US20210112187A1 (en) High-illumination numerical aperture-based large field-of-view high-resolution microimaging device and a method for iterative reconstruction
US20200249168A1 (en) SCAPE Microscopy with Phase Modulating Element and Image Reconstruction
US20100224796A1 (en) Imaging System Using Dynamic Speckle Illumination
US20080033677A1 (en) Methods And System For Compensating For Spatial Cross-Talk
JP2012504226A (ja) 試料を検査するための装置、特に顕微鏡
JP6255389B2 (ja) 試料中の関心組織を高空間分解能で画像化するための顕微鏡
US10234672B2 (en) Light-microscopic method of localization microscopy for localizing point objects
CN116075763B (zh) 估计样品中发射体位置的方法、器件、显微镜和计算机程序
Murray Methods for imaging thick specimens: confocal microscopy, deconvolution, and structured illumination
US20220057329A1 (en) Method and apparatus for detecting fluorescence signals in a three-dimensional region of a sample
US20230296515A1 (en) Method for single molecule localization microscopy
CN115248498A (zh) 基于led光源的结构光超分辨自适应显微镜装置及成像方法
CN111189807A (zh) 基于波动的荧光显微术
Bourgenot et al. Comparison of closed loop and sensorless adaptive optics in widefield optical microscopy
CN112585521B (zh) 用于捕获具有湍流衰减的显微全光图像的设备和方法
US20100284067A1 (en) Modulation contrast microscope
JP2003255231A (ja) 光イメージングシステム及び光イメージのデータ処理方法
US12320751B2 (en) Methods of correcting aberration-induced imaging errors
EP3583459A1 (en) Structured illumination scanning microscopy
Fuseler et al. Types of confocal instruments: Basic principles and advantages and disadvantages
Lim et al. Multiphoton super-resolution imaging via virtual structured illumination
Liu et al. Total internal reflection fluorescence pattern-illuminated Fourier ptychographic microscopy

Legal Events

Date Code Title Description
RD01 Notification of change of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7426

Effective date: 20130725

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A821

Effective date: 20130725

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20140617

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20150227

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20150303

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20150522

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20150625

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20150728

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20150903

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20160301

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20160530

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20160628

A045 Written measure of dismissal of application [lapsed due to lack of payment]

Free format text: JAPANESE INTERMEDIATE CODE: A045

Effective date: 20161025