JP2013524445A5 - - Google Patents

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Publication number
JP2013524445A5
JP2013524445A5 JP2013502852A JP2013502852A JP2013524445A5 JP 2013524445 A5 JP2013524445 A5 JP 2013524445A5 JP 2013502852 A JP2013502852 A JP 2013502852A JP 2013502852 A JP2013502852 A JP 2013502852A JP 2013524445 A5 JP2013524445 A5 JP 2013524445A5
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JP
Japan
Prior art keywords
sample
fluid
drawer
outlet
sample chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2013502852A
Other languages
English (en)
Japanese (ja)
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JP2013524445A (ja
Filing date
Publication date
Priority claimed from US12/752,788 external-priority patent/US8319176B2/en
Application filed filed Critical
Publication of JP2013524445A publication Critical patent/JP2013524445A/ja
Publication of JP2013524445A5 publication Critical patent/JP2013524445A5/ja
Pending legal-status Critical Current

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JP2013502852A 2010-04-01 2011-03-31 レーザアブレーション誘導結合プラズマ質量分析のための改良された試料チャンバ Pending JP2013524445A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/752,788 2010-04-01
US12/752,788 US8319176B2 (en) 2010-04-01 2010-04-01 Sample chamber for laser ablation inductively coupled plasma mass spectroscopy
PCT/US2011/030757 WO2011123664A2 (en) 2010-04-01 2011-03-31 Improved sample chamber for laser ablation inductively coupled plasma mass spectroscopy

Publications (2)

Publication Number Publication Date
JP2013524445A JP2013524445A (ja) 2013-06-17
JP2013524445A5 true JP2013524445A5 (enExample) 2014-04-24

Family

ID=44708516

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013502852A Pending JP2013524445A (ja) 2010-04-01 2011-03-31 レーザアブレーション誘導結合プラズマ質量分析のための改良された試料チャンバ

Country Status (7)

Country Link
US (2) US8319176B2 (enExample)
EP (1) EP2553709A2 (enExample)
JP (1) JP2013524445A (enExample)
KR (1) KR20130018710A (enExample)
CN (1) CN103098168A (enExample)
TW (1) TW201142270A (enExample)
WO (1) WO2011123664A2 (enExample)

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WO2015103492A1 (en) * 2014-01-06 2015-07-09 Teledyne Instruments, Inc. Laser-ablation-based material analysis system with a power/energy detector
JP2015148572A (ja) * 2014-02-07 2015-08-20 株式会社ルケオ 歪検査器
US11293872B2 (en) * 2014-09-18 2022-04-05 Universiteit Gent Laser ablation probe
KR102766510B1 (ko) 2016-01-11 2025-02-13 엘레멘탈 사이언티픽 레이저스 엘엘씨 샘플 가공 동안 동시 패턴 스캔 배치
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CN110864959A (zh) * 2019-10-28 2020-03-06 散裂中子源科学中心 一种用于低温环境设备的换样方法、系统及应用
CN113063643B (zh) * 2021-03-25 2022-02-25 中国科学院地质与地球物理研究所 用于流体包裹体la-icp-ms分析的双体积冷冻剥蚀池装置及其剥蚀方法
US20230408542A1 (en) * 2022-06-09 2023-12-21 Elemental Scientific, Inc. Automated inline nanoparticle standard material addition

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