KR20130018710A - 레이저 어블레이션 유도 결합 플라스마 질량 분광기용 개선된 샘플 챔버 - Google Patents

레이저 어블레이션 유도 결합 플라스마 질량 분광기용 개선된 샘플 챔버 Download PDF

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Publication number
KR20130018710A
KR20130018710A KR1020127025086A KR20127025086A KR20130018710A KR 20130018710 A KR20130018710 A KR 20130018710A KR 1020127025086 A KR1020127025086 A KR 1020127025086A KR 20127025086 A KR20127025086 A KR 20127025086A KR 20130018710 A KR20130018710 A KR 20130018710A
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KR
South Korea
Prior art keywords
sample
drawer
fluid
sample chamber
outlet
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
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KR1020127025086A
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English (en)
Korean (ko)
Inventor
로버트 후친슨
레이프 썸머필드
셰인 힐리어드
제이 윌킨즈
Original Assignee
일렉트로 싸이언티픽 인더스트리이즈 인코포레이티드
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Publication of KR20130018710A publication Critical patent/KR20130018710A/ko
Withdrawn legal-status Critical Current

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0409—Sample holders or containers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Electron Tubes For Measurement (AREA)
KR1020127025086A 2010-04-01 2011-03-31 레이저 어블레이션 유도 결합 플라스마 질량 분광기용 개선된 샘플 챔버 Withdrawn KR20130018710A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/752,788 2010-04-01
US12/752,788 US8319176B2 (en) 2010-04-01 2010-04-01 Sample chamber for laser ablation inductively coupled plasma mass spectroscopy
PCT/US2011/030757 WO2011123664A2 (en) 2010-04-01 2011-03-31 Improved sample chamber for laser ablation inductively coupled plasma mass spectroscopy

Publications (1)

Publication Number Publication Date
KR20130018710A true KR20130018710A (ko) 2013-02-25

Family

ID=44708516

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020127025086A Withdrawn KR20130018710A (ko) 2010-04-01 2011-03-31 레이저 어블레이션 유도 결합 플라스마 질량 분광기용 개선된 샘플 챔버

Country Status (7)

Country Link
US (2) US8319176B2 (enExample)
EP (1) EP2553709A2 (enExample)
JP (1) JP2013524445A (enExample)
KR (1) KR20130018710A (enExample)
CN (1) CN103098168A (enExample)
TW (1) TW201142270A (enExample)
WO (1) WO2011123664A2 (enExample)

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GB201810219D0 (en) * 2018-06-21 2018-08-08 Micromass Ltd Ion source
CN109297800B (zh) * 2018-11-05 2021-02-02 中国工程物理研究院材料研究所 一种激光剥蚀吹扫池
CN110864959A (zh) * 2019-10-28 2020-03-06 散裂中子源科学中心 一种用于低温环境设备的换样方法、系统及应用
CN113063643B (zh) * 2021-03-25 2022-02-25 中国科学院地质与地球物理研究所 用于流体包裹体la-icp-ms分析的双体积冷冻剥蚀池装置及其剥蚀方法
US20230408542A1 (en) * 2022-06-09 2023-12-21 Elemental Scientific, Inc. Automated inline nanoparticle standard material addition

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Also Published As

Publication number Publication date
US20110240839A1 (en) 2011-10-06
EP2553709A2 (en) 2013-02-06
US8710435B2 (en) 2014-04-29
CN103098168A (zh) 2013-05-08
TW201142270A (en) 2011-12-01
US20130042703A1 (en) 2013-02-21
WO2011123664A3 (en) 2012-02-23
JP2013524445A (ja) 2013-06-17
US8319176B2 (en) 2012-11-27
WO2011123664A2 (en) 2011-10-06

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PA0105 International application

Patent event date: 20120925

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid