TW201142270A - Improved sample chamber for laser ablation inductively coupled plasma mass spectroscopy - Google Patents

Improved sample chamber for laser ablation inductively coupled plasma mass spectroscopy Download PDF

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Publication number
TW201142270A
TW201142270A TW100111225A TW100111225A TW201142270A TW 201142270 A TW201142270 A TW 201142270A TW 100111225 A TW100111225 A TW 100111225A TW 100111225 A TW100111225 A TW 100111225A TW 201142270 A TW201142270 A TW 201142270A
Authority
TW
Taiwan
Prior art keywords
sample
fluid
drawer
outlet
inlet
Prior art date
Application number
TW100111225A
Other languages
English (en)
Chinese (zh)
Inventor
Robert Hutchinson
Leif Summerfield
Shane Hilliard
Jay Wilkins
Original Assignee
Electro Scient Ind Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Electro Scient Ind Inc filed Critical Electro Scient Ind Inc
Publication of TW201142270A publication Critical patent/TW201142270A/zh

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0409Sample holders or containers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/105Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Electron Tubes For Measurement (AREA)
TW100111225A 2010-04-01 2011-03-31 Improved sample chamber for laser ablation inductively coupled plasma mass spectroscopy TW201142270A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US12/752,788 US8319176B2 (en) 2010-04-01 2010-04-01 Sample chamber for laser ablation inductively coupled plasma mass spectroscopy

Publications (1)

Publication Number Publication Date
TW201142270A true TW201142270A (en) 2011-12-01

Family

ID=44708516

Family Applications (1)

Application Number Title Priority Date Filing Date
TW100111225A TW201142270A (en) 2010-04-01 2011-03-31 Improved sample chamber for laser ablation inductively coupled plasma mass spectroscopy

Country Status (7)

Country Link
US (2) US8319176B2 (enExample)
EP (1) EP2553709A2 (enExample)
JP (1) JP2013524445A (enExample)
KR (1) KR20130018710A (enExample)
CN (1) CN103098168A (enExample)
TW (1) TW201142270A (enExample)
WO (1) WO2011123664A2 (enExample)

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JP2015148572A (ja) * 2014-02-07 2015-08-20 株式会社ルケオ 歪検査器
US11293872B2 (en) * 2014-09-18 2022-04-05 Universiteit Gent Laser ablation probe
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US11183378B2 (en) 2018-06-05 2021-11-23 Elemental Scientific Lasers, Llc Apparatus and method to bypass a sample chamber in laser assisted spectroscopy
GB201810219D0 (en) * 2018-06-21 2018-08-08 Micromass Ltd Ion source
CN109297800B (zh) * 2018-11-05 2021-02-02 中国工程物理研究院材料研究所 一种激光剥蚀吹扫池
CN110864959A (zh) * 2019-10-28 2020-03-06 散裂中子源科学中心 一种用于低温环境设备的换样方法、系统及应用
CN113063643B (zh) * 2021-03-25 2022-02-25 中国科学院地质与地球物理研究所 用于流体包裹体la-icp-ms分析的双体积冷冻剥蚀池装置及其剥蚀方法
US20230408542A1 (en) * 2022-06-09 2023-12-21 Elemental Scientific, Inc. Automated inline nanoparticle standard material addition

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Also Published As

Publication number Publication date
US20110240839A1 (en) 2011-10-06
EP2553709A2 (en) 2013-02-06
US8710435B2 (en) 2014-04-29
CN103098168A (zh) 2013-05-08
US20130042703A1 (en) 2013-02-21
WO2011123664A3 (en) 2012-02-23
JP2013524445A (ja) 2013-06-17
US8319176B2 (en) 2012-11-27
WO2011123664A2 (en) 2011-10-06
KR20130018710A (ko) 2013-02-25

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