JP2013524445A - レーザアブレーション誘導結合プラズマ質量分析のための改良された試料チャンバ - Google Patents

レーザアブレーション誘導結合プラズマ質量分析のための改良された試料チャンバ Download PDF

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JP2013524445A
JP2013524445A JP2013502852A JP2013502852A JP2013524445A JP 2013524445 A JP2013524445 A JP 2013524445A JP 2013502852 A JP2013502852 A JP 2013502852A JP 2013502852 A JP2013502852 A JP 2013502852A JP 2013524445 A JP2013524445 A JP 2013524445A
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sample
fluid
drawer
sample chamber
outlet
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JP2013524445A5 (enExample
Inventor
ハッチンソン，ロバート
サマーフィールド，リーフ
ヒリアード，シェーン
ウィルキンス，ジェイ
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エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド
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Publication of JP2013524445A publication Critical patent/JP2013524445A/ja
Publication of JP2013524445A5 publication Critical patent/JP2013524445A5/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0409—Sample holders or containers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Electron Tubes For Measurement (AREA)
JP2013502852A 2010-04-01 2011-03-31 レーザアブレーション誘導結合プラズマ質量分析のための改良された試料チャンバ Pending JP2013524445A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/752,788 2010-04-01
US12/752,788 US8319176B2 (en) 2010-04-01 2010-04-01 Sample chamber for laser ablation inductively coupled plasma mass spectroscopy
PCT/US2011/030757 WO2011123664A2 (en) 2010-04-01 2011-03-31 Improved sample chamber for laser ablation inductively coupled plasma mass spectroscopy

Publications (2)

Publication Number Publication Date
JP2013524445A true JP2013524445A (ja) 2013-06-17
JP2013524445A5 JP2013524445A5 (enExample) 2014-04-24

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JP2013502852A Pending JP2013524445A (ja) 2010-04-01 2011-03-31 レーザアブレーション誘導結合プラズマ質量分析のための改良された試料チャンバ

Country Status (7)

Country Link
US (2) US8319176B2 (enExample)
EP (1) EP2553709A2 (enExample)
JP (1) JP2013524445A (enExample)
KR (1) KR20130018710A (enExample)
CN (1) CN103098168A (enExample)
TW (1) TW201142270A (enExample)
WO (1) WO2011123664A2 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021527200A (ja) * 2018-06-05 2021-10-11 エレメンタル・サイエンティフィック・レーザーズ・リミテッド・ライアビリティ・カンパニーＥｌｅｍｅｎｔａｌ Ｓｃｉｅｎｔｉｆｉｃ Ｌａｓｅｒｓ， Ｌｌｃ レーザアシスト分光法でサンプルチャンバをバイパスする装置及び方法
JP2022151404A (ja) * 2021-03-25 2022-10-07 インスティチュート オブ ジオロジー アンド ジオフィジックス， チャイニーズ アカデミー オブ サイエンシズ 流体包有物のｌａ－ｉｃｐ－ｍｓ分析に用いられるダブルチャンバー冷凍アブレーションセル装置およびそのアブレーション方法

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AU2014214888B2 (en) * 2013-02-09 2018-04-05 Elemental Scientific Lasers, Llc In-chamber fluid handling system and methods handling fluids using the same
ES2669524T3 (es) 2013-04-08 2018-05-28 Allnex Netherlands B.V. Composición reticulable por reacción de adición de Michael Real (RMA)
WO2015103492A1 (en) * 2014-01-06 2015-07-09 Teledyne Instruments, Inc. Laser-ablation-based material analysis system with a power/energy detector
JP2015148572A (ja) * 2014-02-07 2015-08-20 株式会社ルケオ 歪検査器
US11293872B2 (en) * 2014-09-18 2022-04-05 Universiteit Gent Laser ablation probe
KR102766510B1 (ko) 2016-01-11 2025-02-13 엘레멘탈 사이언티픽 레이저스 엘엘씨 샘플 가공 동안 동시 패턴 스캔 배치
GB201810219D0 (en) * 2018-06-21 2018-08-08 Micromass Ltd Ion source
CN109297800B (zh) * 2018-11-05 2021-02-02 中国工程物理研究院材料研究所 一种激光剥蚀吹扫池
CN110864959A (zh) * 2019-10-28 2020-03-06 散裂中子源科学中心 一种用于低温环境设备的换样方法、系统及应用
US20230408542A1 (en) * 2022-06-09 2023-12-21 Elemental Scientific, Inc. Automated inline nanoparticle standard material addition

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JP2005114384A (ja) * 2003-10-03 2005-04-28 Hitachi High-Technologies Corp 欠陥の元素分析方法およびその装置
WO2009054064A1 (ja) * 2007-10-26 2009-04-30 Shimadzu Corporation 基板ロード装置
WO2010025777A1 (en) * 2008-09-08 2010-03-11 Agilent Technologies, Inc. Method transfer between fluidic devices considering deviations from ideal behavior

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US8274735B2 (en) 2007-09-14 2012-09-25 Fry Robert C Analytical laser ablation of solid samples for ICP, ICP-MS, and FAG-MS analysis
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JP2001085342A (ja) * 1999-09-17 2001-03-30 Sony Corp ガスライン自動パージシステム
JP2005114384A (ja) * 2003-10-03 2005-04-28 Hitachi High-Technologies Corp 欠陥の元素分析方法およびその装置
WO2009054064A1 (ja) * 2007-10-26 2009-04-30 Shimadzu Corporation 基板ロード装置
WO2010025777A1 (en) * 2008-09-08 2010-03-11 Agilent Technologies, Inc. Method transfer between fluidic devices considering deviations from ideal behavior

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021527200A (ja) * 2018-06-05 2021-10-11 エレメンタル・サイエンティフィック・レーザーズ・リミテッド・ライアビリティ・カンパニーＥｌｅｍｅｎｔａｌ Ｓｃｉｅｎｔｉｆｉｃ Ｌａｓｅｒｓ， Ｌｌｃ レーザアシスト分光法でサンプルチャンバをバイパスする装置及び方法
JP7365058B2 (ja) 2018-06-05 2023-10-19 エレメンタル・サイエンティフィック・レーザーズ・リミテッド・ライアビリティ・カンパニー レーザアシスト分光法でサンプルチャンバをバイパスする装置及び方法
JP2022151404A (ja) * 2021-03-25 2022-10-07 インスティチュート オブ ジオロジー アンド ジオフィジックス， チャイニーズ アカデミー オブ サイエンシズ 流体包有物のｌａ－ｉｃｐ－ｍｓ分析に用いられるダブルチャンバー冷凍アブレーションセル装置およびそのアブレーション方法

Also Published As

Publication number Publication date
US20110240839A1 (en) 2011-10-06
EP2553709A2 (en) 2013-02-06
US8710435B2 (en) 2014-04-29
CN103098168A (zh) 2013-05-08
TW201142270A (en) 2011-12-01
US20130042703A1 (en) 2013-02-21
WO2011123664A3 (en) 2012-02-23
US8319176B2 (en) 2012-11-27
WO2011123664A2 (en) 2011-10-06
KR20130018710A (ko) 2013-02-25

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