JP2013509731A5 - - Google Patents

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Publication number
JP2013509731A5
JP2013509731A5 JP2012537175A JP2012537175A JP2013509731A5 JP 2013509731 A5 JP2013509731 A5 JP 2013509731A5 JP 2012537175 A JP2012537175 A JP 2012537175A JP 2012537175 A JP2012537175 A JP 2012537175A JP 2013509731 A5 JP2013509731 A5 JP 2013509731A5
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JP
Japan
Prior art keywords
drain
region
effect transistor
field effect
source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2012537175A
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English (en)
Japanese (ja)
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JP2013509731A (ja
JP5481562B2 (ja
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Publication date
Priority claimed from US12/611,055 external-priority patent/US8390039B2/en
Application filed filed Critical
Publication of JP2013509731A publication Critical patent/JP2013509731A/ja
Publication of JP2013509731A5 publication Critical patent/JP2013509731A5/ja
Application granted granted Critical
Publication of JP5481562B2 publication Critical patent/JP5481562B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2012537175A 2009-11-02 2010-11-01 接合型電界効果トランジスタおよびその製造方法 Active JP5481562B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/611,055 US8390039B2 (en) 2009-11-02 2009-11-02 Junction field effect transistor
US12/611,055 2009-11-02
PCT/US2010/055007 WO2011053932A1 (en) 2009-11-02 2010-11-01 Junction field effect transistor and method of manufacturing the same

Publications (3)

Publication Number Publication Date
JP2013509731A JP2013509731A (ja) 2013-03-14
JP2013509731A5 true JP2013509731A5 (enExample) 2013-10-24
JP5481562B2 JP5481562B2 (ja) 2014-04-23

Family

ID=43608374

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012537175A Active JP5481562B2 (ja) 2009-11-02 2010-11-01 接合型電界効果トランジスタおよびその製造方法

Country Status (5)

Country Link
US (1) US8390039B2 (enExample)
EP (1) EP2497117B1 (enExample)
JP (1) JP5481562B2 (enExample)
CN (1) CN102714225B (enExample)
WO (1) WO2011053932A1 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8193046B2 (en) 2009-11-02 2012-06-05 Analog Devices, Inc. Junction field effect transistor
US9559203B2 (en) * 2013-07-15 2017-01-31 Analog Devices, Inc. Modular approach for reducing flicker noise of MOSFETs
US9202934B2 (en) * 2013-10-16 2015-12-01 Analog Devices Global Junction field effect transistor, and method of manufacture thereof
US10784372B2 (en) 2015-04-03 2020-09-22 Magnachip Semiconductor, Ltd. Semiconductor device with high voltage field effect transistor and junction field effect transistor
KR101975630B1 (ko) * 2015-04-03 2019-08-29 매그나칩 반도체 유한회사 접합 트랜지스터와 고전압 트랜지스터 구조를 포함한 반도체 소자 및 그 제조 방법
KR102406116B1 (ko) * 2018-04-27 2022-06-07 현대자동차 주식회사 반도체 소자 및 그 제조 방법
GB2606922A (en) * 2020-12-09 2022-11-23 Search For The Next Ltd A transistor device
GB2612643A (en) * 2021-11-08 2023-05-10 Search For The Next Ltd A novel transistor device
CN115995463A (zh) * 2022-11-11 2023-04-21 天狼芯半导体(成都)有限公司 半导体器件、半导体器件的制备方法及电子设备

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS526076B1 (enExample) 1971-04-28 1977-02-18
JPS5368581A (en) * 1976-12-01 1978-06-19 Hitachi Ltd Semiconductor device
US4452646A (en) 1981-09-28 1984-06-05 Mcdonnell Douglas Corporation Method of making planar III-V compound device by ion implantation
US4648174A (en) 1985-02-05 1987-03-10 General Electric Company Method of making high breakdown voltage semiconductor device
JPS6417480A (en) * 1987-07-13 1989-01-20 Toshiba Corp Junction type field-effect transistor
JPH01243475A (ja) * 1988-03-25 1989-09-28 Hitachi Ltd 半導体素子
JPH0320047A (ja) * 1989-06-16 1991-01-29 Matsushita Electron Corp 半導体装置
US5008719A (en) * 1989-10-20 1991-04-16 Harris Corporation Dual layer surface gate JFET having enhanced gate-channel breakdown voltage
JP3039200B2 (ja) 1993-06-07 2000-05-08 日本電気株式会社 Mosトランジスタおよびその製造方法
GB9326344D0 (en) 1993-12-23 1994-02-23 Texas Instruments Ltd High voltage transistor for sub micron cmos processes
US5543643A (en) 1995-07-13 1996-08-06 Lsi Logic Corporation Combined JFET and MOS transistor device, circuit
US5939752A (en) * 1995-12-12 1999-08-17 Siliconix Incorporated Low voltage MOSFET with low on-resistance and high breakdown voltage
FR2776832B1 (fr) 1998-03-31 2000-06-16 Sgs Thomson Microelectronics Procede de fabrication de transistors jfet
JP3454734B2 (ja) 1998-12-08 2003-10-06 三洋電機株式会社 半導体集積回路の製造方法
JP3812421B2 (ja) * 2001-06-14 2006-08-23 住友電気工業株式会社 横型接合型電界効果トランジスタ
US6740907B2 (en) * 2002-10-04 2004-05-25 Rohm Co., Ltd. Junction field-effect transistor
US6927153B2 (en) 2003-02-25 2005-08-09 Xerox Corporation Ion implantation with multiple concentration levels
JP4610865B2 (ja) * 2003-05-30 2011-01-12 パナソニック株式会社 半導体装置及びその製造方法
JP5168773B2 (ja) * 2005-11-14 2013-03-27 住友電気工業株式会社 横型接合型電界効果トランジスタ
TWI267984B (en) * 2005-12-07 2006-12-01 Richtek Technology Corp Lateral DMOS device insensitive to the corner oxide
US7411231B2 (en) * 2005-12-22 2008-08-12 Analog Devices, Inc. JFET with drain and/or source modification implant

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