JP2013113782A5 - - Google Patents

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Publication number
JP2013113782A5
JP2013113782A5 JP2011262147A JP2011262147A JP2013113782A5 JP 2013113782 A5 JP2013113782 A5 JP 2013113782A5 JP 2011262147 A JP2011262147 A JP 2011262147A JP 2011262147 A JP2011262147 A JP 2011262147A JP 2013113782 A5 JP2013113782 A5 JP 2013113782A5
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JP
Japan
Prior art keywords
ray
sample
fluorescent
detector
crystal
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JP2011262147A
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English (en)
Japanese (ja)
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JP5990734B2 (ja
JP2013113782A (ja
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Publication of JP2013113782A5 publication Critical patent/JP2013113782A5/ja
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JP2011262147A 2011-11-30 2011-11-30 蛍光ｘ線分析装置 Active JP5990734B2 (ja)

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Application Number Priority Date Filing Date Title
JP2011262147A JP5990734B2 (ja) 2011-11-30 2011-11-30 蛍光ｘ線分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011262147A JP5990734B2 (ja) 2011-11-30 2011-11-30 蛍光ｘ線分析装置

Publications (3)

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JP2013113782A JP2013113782A (ja) 2013-06-10
JP2013113782A5 true JP2013113782A5 (enExample) 2014-12-04
JP5990734B2 JP5990734B2 (ja) 2016-09-14

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JP2011262147A Active JP5990734B2 (ja) 2011-11-30 2011-11-30 蛍光ｘ線分析装置

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Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016017759A (ja) * 2014-07-04 2016-02-01 株式会社リガク Ｘ線測定モジュールおよびそれを複数備える蛍光ｘ線分析装置
CN104264228A (zh) * 2014-10-09 2015-01-07 北京安科慧生科技有限公司 双曲面弯晶、组合式双曲面弯晶及单波长色散 x 射线荧光光谱仪
CN105115999B (zh) * 2015-09-08 2019-07-19 北京安科慧生科技有限公司 一种高灵敏度单色激发多元素x射线荧光光谱仪
KR102056556B1 (ko) * 2016-09-30 2019-12-16 가부시키가이샤 리가쿠 파장 분산형 형광 x선 분석 장치, 및 그것을 사용하는 형광 x선 분석 방법
JP7195341B2 (ja) * 2018-06-04 2022-12-23 シグレイ、インコーポレイテッド 波長分散型ｘ線分光計
US11215572B2 (en) 2020-05-18 2022-01-04 Sigray, Inc. System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements
US11549895B2 (en) 2020-09-17 2023-01-10 Sigray, Inc. System and method using x-rays for depth-resolving metrology and analysis
US12480892B2 (en) 2020-12-07 2025-11-25 Sigray, Inc. High throughput 3D x-ray imaging system using a transmission x-ray source
US11686692B2 (en) 2020-12-07 2023-06-27 Sigray, Inc. High throughput 3D x-ray imaging system using a transmission x-ray source
US11796491B2 (en) 2021-01-05 2023-10-24 Shimadzu Corporation X-ray spectroscopic analysis apparatus and elemental analysis method
US12360067B2 (en) 2022-03-02 2025-07-15 Sigray, Inc. X-ray fluorescence system and x-ray source with electrically insulative target material
US11992350B2 (en) 2022-03-15 2024-05-28 Sigray, Inc. System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector
US11885755B2 (en) 2022-05-02 2024-01-30 Sigray, Inc. X-ray sequential array wavelength dispersive spectrometer
US12209977B2 (en) 2023-02-16 2025-01-28 Sigray, Inc. X-ray detector system with at least two stacked flat Bragg diffractors
CN116067998B (zh) * 2023-02-23 2025-05-09 中国工程物理研究院激光聚变研究中心 双通道多支路门控晶体谱仪
US12181423B1 (en) 2023-09-07 2024-12-31 Sigray, Inc. Secondary image removal using high resolution x-ray transmission sources
WO2025101530A1 (en) 2023-11-07 2025-05-15 Sigray, Inc. System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes
US12429436B2 (en) 2024-01-08 2025-09-30 Sigray, Inc. X-ray analysis system with focused x-ray beam and non-x-ray microscope
WO2025174966A1 (en) 2024-02-15 2025-08-21 Sigray, Inc. System and method for generating a focused x‑ray beam

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002156343A (ja) * 2000-11-17 2002-05-31 Rigaku Industrial Co 蛍光ｘ線分析装置
WO2002103710A2 (en) * 2001-06-19 2002-12-27 X-Ray Optical Systems, Inc. Wavelength dispersive xrf system using focusing optic for excitation and a focusing monochromator for collection
JP4330981B2 (ja) * 2003-11-21 2009-09-16 株式会社リガク 蛍光ｘ線分析装置
US8058621B2 (en) * 2009-10-26 2011-11-15 General Electric Company Elemental composition detection system and method

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