JP2012108126A5 - - Google Patents
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- Publication number
- JP2012108126A5 JP2012108126A5 JP2011244597A JP2011244597A JP2012108126A5 JP 2012108126 A5 JP2012108126 A5 JP 2012108126A5 JP 2011244597 A JP2011244597 A JP 2011244597A JP 2011244597 A JP2011244597 A JP 2011244597A JP 2012108126 A5 JP2012108126 A5 JP 2012108126A5
- Authority
- JP
- Japan
- Prior art keywords
- diffractometer
- sample
- sample stage
- crystal
- ray beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000013078 crystal Substances 0.000 claims description 30
- 238000000034 method Methods 0.000 claims description 22
- 239000000843 powder Substances 0.000 claims description 16
- 238000013480 data collection Methods 0.000 claims description 9
- 239000000853 adhesive Substances 0.000 claims description 4
- 230000001070 adhesive effect Effects 0.000 claims description 4
- 239000000463 material Substances 0.000 claims description 4
- 238000005259 measurement Methods 0.000 claims description 4
- 238000009304 pastoral farming Methods 0.000 claims description 3
- 238000001514 detection method Methods 0.000 description 4
- 238000000691 measurement method Methods 0.000 description 1
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/949,539 US8488740B2 (en) | 2010-11-18 | 2010-11-18 | Diffractometer |
| US12/949,539 | 2010-11-18 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2012108126A JP2012108126A (ja) | 2012-06-07 |
| JP2012108126A5 true JP2012108126A5 (enExample) | 2014-12-11 |
| JP6009156B2 JP6009156B2 (ja) | 2016-10-19 |
Family
ID=44925381
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011244597A Active JP6009156B2 (ja) | 2010-11-18 | 2011-11-08 | 回折装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US8488740B2 (enExample) |
| EP (1) | EP2455747B1 (enExample) |
| JP (1) | JP6009156B2 (enExample) |
| CN (1) | CN102565108B (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105758880B (zh) * | 2016-04-11 | 2019-02-05 | 西北核技术研究所 | 基于闪光x光机的超快x射线衍射成像方法及系统 |
| EP3469352B1 (en) | 2017-12-15 | 2020-02-05 | Tankbots, Inc. | Methods for performing tasks in a tank containing hazardous substances |
| US11614414B2 (en) * | 2018-10-19 | 2023-03-28 | Commonwealth Scientific And Industrial Research Organisation | Energy-dispersive X-ray diffraction analyser comprising a substantially X-ray transparent member having an improved reflection geometry |
| CN109374660B (zh) * | 2018-11-22 | 2024-09-06 | 北京科技大学 | 用于排笔光束的高通量粉末衍射的装置 |
| MX2021004777A (es) | 2019-02-20 | 2021-06-08 | Tankbots Inc | Metodos para realizar tareas inherentemente de manera segura en un tanque que contiene sustancias peligrosas. |
| US12436115B2 (en) | 2022-02-25 | 2025-10-07 | Proto Patents Ltd. | Transmission X-ray diffraction apparatus and related method |
Family Cites Families (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SE322066B (enExample) * | 1968-01-25 | 1970-03-23 | Incentive Res & Dev Ab | |
| JPS58165045A (ja) * | 1982-03-26 | 1983-09-30 | Hitachi Ltd | 結晶方位迅速測定装置 |
| JPH02107952A (ja) | 1988-10-15 | 1990-04-19 | Sumitomo Metal Ind Ltd | 粉末のｘ線回析測定方法 |
| US4928294A (en) | 1989-03-24 | 1990-05-22 | U.S. Government As Represented By The Director, National Security Agency | Method and apparatus for line-modified asymmetric crystal topography |
| EP0553911A1 (en) * | 1992-01-27 | 1993-08-04 | Koninklijke Philips Electronics N.V. | Position-sensitive X-ray analysis |
| JPH06194498A (ja) * | 1992-08-31 | 1994-07-15 | Hitachi Ltd | マイクロｘ線回折装置 |
| US5923720A (en) | 1997-06-17 | 1999-07-13 | Molecular Metrology, Inc. | Angle dispersive x-ray spectrometer |
| DE29716107U1 (de) | 1997-09-08 | 1997-10-30 | Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V., 80539 München | Strahlführungssystem für Neutronen zur Grenzflächenuntersuchung |
| JP3734366B2 (ja) * | 1998-03-20 | 2006-01-11 | 株式会社リガク | Ｘ線分析装置 |
| JP2002530671A (ja) * | 1998-11-25 | 2002-09-17 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 放物状のｘ線ミラーと水晶モノクロメータを含むｘ線分析装置 |
| US7430277B2 (en) * | 2002-06-19 | 2008-09-30 | Xeoncs | Optical device for X-ray applications |
| JP4178399B2 (ja) * | 2003-09-25 | 2008-11-12 | 株式会社島津製作所 | Ｘ線ｃｔ装置 |
| JP4498089B2 (ja) * | 2004-06-21 | 2010-07-07 | 株式会社リコー | 静電荷現像用トナー評価方法及び静電荷現像用トナー |
| EP1720006A1 (en) * | 2005-05-02 | 2006-11-08 | F. Hoffmann-La Roche Ag | Method and apparatus for x-ray diffraction analysis |
| JP4685877B2 (ja) | 2005-11-02 | 2011-05-18 | 株式会社リガク | 微結晶粒の方位分布測定方法及びその装置 |
| JP4278108B2 (ja) * | 2006-07-07 | 2009-06-10 | 株式会社リガク | 超小角ｘ線散乱測定装置 |
| JP2009109447A (ja) * | 2007-11-01 | 2009-05-21 | Rigaku Corp | Ｘ線検査装置およびｘ線検査方法 |
| US8080791B2 (en) * | 2008-12-12 | 2011-12-20 | Fei Company | X-ray detector for electron microscope |
| JP4971383B2 (ja) * | 2009-03-25 | 2012-07-11 | 株式会社リガク | Ｘ線回折方法及びｘ線回折装置 |
-
2010
- 2010-11-18 US US12/949,539 patent/US8488740B2/en active Active
-
2011
- 2011-11-03 EP EP11187695.9A patent/EP2455747B1/en active Active
- 2011-11-08 JP JP2011244597A patent/JP6009156B2/ja active Active
- 2011-11-18 CN CN201110368861.1A patent/CN102565108B/zh active Active
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