FR2959344B1 - Dispositif optique pour analyser un echantillon par diffusion d'un faisceau de rayon x, dispositif de collimation et collimateur associes - Google Patents

Dispositif optique pour analyser un echantillon par diffusion d'un faisceau de rayon x, dispositif de collimation et collimateur associes

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Publication number
FR2959344B1
FR2959344B1 FR1001774A FR1001774A FR2959344B1 FR 2959344 B1 FR2959344 B1 FR 2959344B1 FR 1001774 A FR1001774 A FR 1001774A FR 1001774 A FR1001774 A FR 1001774A FR 2959344 B1 FR2959344 B1 FR 2959344B1
Authority
FR
France
Prior art keywords
collimator
therefor
diffusion
analyzing
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR1001774A
Other languages
English (en)
Other versions
FR2959344A1 (fr
Inventor
Olivier Tache
Olivier Spalla
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Xenocs Fr
Original Assignee
Commissariat a lEnergie Atomique CEA
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to FR1001774A priority Critical patent/FR2959344B1/fr
Application filed by Commissariat a lEnergie Atomique CEA, Commissariat a lEnergie Atomique et aux Energies Alternatives CEA filed Critical Commissariat a lEnergie Atomique CEA
Priority to JP2013506791A priority patent/JP2013525794A/ja
Priority to CN201180021391.XA priority patent/CN102971801B/zh
Priority to PCT/IB2011/051805 priority patent/WO2011135510A1/fr
Priority to US13/643,407 priority patent/US9153351B2/en
Priority to EP18215683.6A priority patent/EP3486922A1/fr
Priority to EP11722906.2A priority patent/EP2564398B1/fr
Publication of FR2959344A1 publication Critical patent/FR2959344A1/fr
Application granted granted Critical
Publication of FR2959344B1 publication Critical patent/FR2959344B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/025—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using multiple collimators, e.g. Bucky screens; other devices for eliminating undesired or dispersed radiation
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/062—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements the element being a crystal
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/067—Construction details
FR1001774A 2010-04-26 2010-04-26 Dispositif optique pour analyser un echantillon par diffusion d'un faisceau de rayon x, dispositif de collimation et collimateur associes Active FR2959344B1 (fr)

Priority Applications (7)

Application Number Priority Date Filing Date Title
FR1001774A FR2959344B1 (fr) 2010-04-26 2010-04-26 Dispositif optique pour analyser un echantillon par diffusion d'un faisceau de rayon x, dispositif de collimation et collimateur associes
CN201180021391.XA CN102971801B (zh) 2010-04-26 2011-04-26 用于通过x射线束的散射来分析样品的光学设备及相关的准直设备和准直仪
PCT/IB2011/051805 WO2011135510A1 (fr) 2010-04-26 2011-04-26 Dispositif optique pour analyser un echantillon par diffusion d'un faisceau de rayons x, dispositif de collimation et collimateur associes.
US13/643,407 US9153351B2 (en) 2010-04-26 2011-04-26 Optical device for analyzing a specimen by the scattering of an X-ray beam and associated collimation device and collimator
JP2013506791A JP2013525794A (ja) 2010-04-26 2011-04-26 Ｘ線ビームの散乱によって試料を分析するための光学デバイス、ならびに関連するコリメーションデバイスおよびコリメータ
EP18215683.6A EP3486922A1 (fr) 2010-04-26 2011-04-26 Dispositif optique pour analyser un echantillon par diffusion d'un faisceau de rayons x, dispositif de collimation et collimateur associes
EP11722906.2A EP2564398B1 (fr) 2010-04-26 2011-04-26 Collimateur pour un faisceau de rayons x

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1001774A FR2959344B1 (fr) 2010-04-26 2010-04-26 Dispositif optique pour analyser un echantillon par diffusion d'un faisceau de rayon x, dispositif de collimation et collimateur associes

Publications (2)

Publication Number Publication Date
FR2959344A1 FR2959344A1 (fr) 2011-10-28
FR2959344B1 true FR2959344B1 (fr) 2013-03-22

Family

ID=43065708

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1001774A Active FR2959344B1 (fr) 2010-04-26 2010-04-26 Dispositif optique pour analyser un echantillon par diffusion d'un faisceau de rayon x, dispositif de collimation et collimateur associes

Country Status (6)

Country Link
US (1) US9153351B2 (fr)
EP (2) EP3486922A1 (fr)
JP (1) JP2013525794A (fr)
CN (1) CN102971801B (fr)
FR (1) FR2959344B1 (fr)
WO (1) WO2011135510A1 (fr)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102012208710B3 (de) * 2012-05-24 2013-09-19 Incoatec Gmbh Verfahren zur Herstellung einer einkristallinen Röntgenblende und Röntgenanalysegerät mit einkristalliner Röntgenblende
US9575017B2 (en) * 2014-02-24 2017-02-21 Rigaku Innovative Technologies, Inc. High performance Kratky assembly
JP6392850B2 (ja) 2014-03-27 2018-09-19 株式会社リガク ビーム生成ユニットおよびｘ線小角散乱装置
CN104599735B (zh) * 2014-11-24 2017-02-08 中国船舶重工集团公司第七一九研究所 一种用于参考γ辐射场的γ射线准直器
CN106979957B (zh) * 2017-05-23 2023-10-31 中国科学院上海应用物理研究所 一种利用真空冷热台进行掠入射x射线小角散射实验的方法
CN110993142B (zh) * 2019-12-16 2022-03-11 中国原子能科学研究院 用于准单能中子参考辐射场的准直器

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6119752U (ja) * 1984-07-11 1986-02-05 理学電機株式会社 Ｘ線誘導筒
SU1744610A1 (ru) * 1989-12-13 1992-06-30 Московский Геологоразведочный Институт Им.Серго Орджоникидзе Коллиматор устройства дл ретгенофлуоресцентного анализа
JPH05107400A (ja) * 1991-10-15 1993-04-27 Nikon Corp 位置合わせの簡単なｘ線顕微鏡用の試料ホルダ
JPH0643300A (ja) * 1992-03-13 1994-02-18 Agency Of Ind Science & Technol Ｘ線顕微鏡を用いた観察方法及びそれに使用され る試料ホルダ
DE4212077A1 (de) * 1992-04-10 1993-10-14 Fraunhofer Ges Forschung Piezoelektrisch verstellbares Ventil und Verfahren zu ihrer Herstellung
JP3918104B2 (ja) * 1997-10-02 2007-05-23 日本政策投資銀行 蛍光ｘ線分析装置および蛍光ｘ線検出器
JP2002250704A (ja) * 2001-02-26 2002-09-06 Rigaku Corp Ｘ線測定装置及びｘ線測定方法
US6594341B1 (en) * 2001-08-30 2003-07-15 Koninklijke Philips Electronics, N.V. Liquid-free x-ray insert window
JP4561312B2 (ja) * 2004-07-08 2010-10-13 富士電機ホールディングス株式会社 Ｘ線画像再構成装置
JP4589882B2 (ja) * 2006-02-14 2010-12-01 株式会社リガク 背面反射ｘ線回折像観察装置
US7400703B2 (en) * 2006-08-11 2008-07-15 General Electric Company Method and system for controlling radiation intensity of an imaging system
JP5074105B2 (ja) * 2007-06-08 2012-11-14 株式会社島津製作所 エネルギ分散型ｘ線検出装置
US7742574B2 (en) * 2008-04-11 2010-06-22 Mats Danielsson Approach and device for focusing x-rays
US8223925B2 (en) * 2010-04-15 2012-07-17 Bruker Axs Handheld, Inc. Compact collimating device

Also Published As

Publication number Publication date
CN102971801B (zh) 2016-06-01
EP2564398A1 (fr) 2013-03-06
FR2959344A1 (fr) 2011-10-28
US9153351B2 (en) 2015-10-06
WO2011135510A1 (fr) 2011-11-03
EP3486922A1 (fr) 2019-05-22
US20130064354A1 (en) 2013-03-14
EP2564398B1 (fr) 2019-05-22
JP2013525794A (ja) 2013-06-20
CN102971801A (zh) 2013-03-13

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