JP2013113637A5 - - Google Patents
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- JP2013113637A5 JP2013113637A5 JP2011258147A JP2011258147A JP2013113637A5 JP 2013113637 A5 JP2013113637 A5 JP 2013113637A5 JP 2011258147 A JP2011258147 A JP 2011258147A JP 2011258147 A JP2011258147 A JP 2011258147A JP 2013113637 A5 JP2013113637 A5 JP 2013113637A5
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- JP
- Japan
- Prior art keywords
- surface potential
- test
- voltage
- output voltage
- mirror
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005259 measurement Methods 0.000 claims description 34
- 238000012360 testing method Methods 0.000 claims description 32
- 239000013078 crystal Substances 0.000 claims description 29
- 238000000034 method Methods 0.000 claims description 16
- 238000004587 chromatography analysis Methods 0.000 claims description 2
- 230000005684 electric field Effects 0.000 claims 3
- 238000001514 detection method Methods 0.000 description 1
Priority Applications (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011258147A JP6192890B2 (ja) | 2011-11-25 | 2011-11-25 | 表面電位分布計測装置および表面電位分布計測方法 |
| EP12852419.6A EP2784526B1 (en) | 2011-11-25 | 2012-11-21 | Surface potential distribution measuring device and surface potential distribution measuring method |
| PCT/JP2012/007467 WO2013076975A1 (ja) | 2011-11-25 | 2012-11-21 | 表面電位分布計測装置および表面電位分布計測方法 |
| US14/355,760 US9702915B2 (en) | 2011-11-25 | 2012-11-21 | Surface potential distribution measuring device and surface potential distribution measuring method |
| CA2856201A CA2856201C (en) | 2011-11-25 | 2012-11-21 | Surface potential distribution measuring device and surface potential distribution measuring method |
| CN201280057715.XA CN104024874B (zh) | 2011-11-25 | 2012-11-21 | 表面电位分布测量装置和表面电位分布测量方法 |
| BR112014012354A BR112014012354A8 (pt) | 2011-11-25 | 2012-11-21 | dispositivo de medição de distribuição de potencial de superfície e método de medição de distribuição de potencial de superfície |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011258147A JP6192890B2 (ja) | 2011-11-25 | 2011-11-25 | 表面電位分布計測装置および表面電位分布計測方法 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016156280A Division JP6159857B2 (ja) | 2016-08-09 | 2016-08-09 | 表面電位分布計測装置および表面電位分布計測方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2013113637A JP2013113637A (ja) | 2013-06-10 |
| JP2013113637A5 true JP2013113637A5 (enExample) | 2015-06-25 |
| JP6192890B2 JP6192890B2 (ja) | 2017-09-06 |
Family
ID=48469440
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011258147A Active JP6192890B2 (ja) | 2011-11-25 | 2011-11-25 | 表面電位分布計測装置および表面電位分布計測方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US9702915B2 (enExample) |
| EP (1) | EP2784526B1 (enExample) |
| JP (1) | JP6192890B2 (enExample) |
| CN (1) | CN104024874B (enExample) |
| BR (1) | BR112014012354A8 (enExample) |
| CA (1) | CA2856201C (enExample) |
| WO (1) | WO2013076975A1 (enExample) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20130054162A1 (en) | 2011-08-31 | 2013-02-28 | Tollgrade Communications, Inc. | Methods and apparatus for determining conditions of power lines |
| US9562925B2 (en) | 2012-02-14 | 2017-02-07 | Tollgrade Communications, Inc. | Power line management system |
| JP6159793B2 (ja) * | 2013-03-19 | 2017-07-05 | 東芝三菱電機産業システム株式会社 | 表面電位分布計測装置 |
| US9972989B2 (en) | 2014-03-31 | 2018-05-15 | Aclara Technologies Llc | Optical voltage sensing for underground medium voltage wires |
| CN106461707B (zh) * | 2014-06-06 | 2019-03-05 | 东芝三菱电机产业系统株式会社 | 三维表面电位分布测量装置 |
| EP3186646B1 (en) | 2014-08-29 | 2021-10-20 | Aclara Technologies LLC | Power extraction for a medium voltage sensor using a capacitive voltage divider |
| CA3013883C (en) | 2016-02-08 | 2022-08-23 | Toshiba Mitsubishi-Electric Industrial Systems Corporation | Three-dimensional surface potential distribution measurement system |
| CN107884632B (zh) * | 2017-10-18 | 2020-10-20 | 中国电力科学研究院 | 一种任意分裂直流线路导线表面电场的计算方法及系统 |
| CN109709408B (zh) * | 2019-03-08 | 2024-05-10 | 广东省职业病防治院 | 空间直流电场测量设备 |
| CN111721994B (zh) * | 2020-06-19 | 2022-09-06 | 贵州江源电力建设有限公司 | 一种分布式高压输电线路的电压检测系统 |
| CN116718915A (zh) * | 2023-08-10 | 2023-09-08 | 西门子电机(中国)有限公司 | 电机槽口电场强度检测方法、装置、电子设备和存储介质 |
Family Cites Families (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3272713D1 (en) * | 1981-06-12 | 1986-09-25 | Meidensha Electric Mfg Co Ltd | Electric field detector |
| US4786176A (en) * | 1986-01-06 | 1988-11-22 | Rank Taylor Hobson Limited | Metrological apparatus and method using polarization modulation |
| DE3740468A1 (de) * | 1987-11-28 | 1989-06-08 | Kernforschungsz Karlsruhe | Vorrichtung zur beruehrungslosen messung statischer und/oder zeitlich veraenderlicher elektrischer felder |
| CN1038277C (zh) * | 1987-12-28 | 1998-05-06 | 佳能公司 | 成象设备 |
| JP2733609B2 (ja) * | 1988-10-29 | 1998-03-30 | キヤノン株式会社 | 転写装置 |
| US4937457A (en) * | 1989-02-10 | 1990-06-26 | Slm Instruments, Inc. | Picosecond multi-harmonic fourier fluorometer |
| EP0392830B1 (en) * | 1989-04-12 | 1994-06-22 | Hamamatsu Photonics K.K. | Method and apparatus for detecting voltage |
| DE69206654T2 (de) * | 1991-03-26 | 1996-07-11 | Hamamatsu Photonics Kk | Optischer Spannungsdetektor |
| FI915818A0 (fi) * | 1991-12-11 | 1991-12-11 | Imatran Voima Oy | Optisk rf-givare foer maetning av spaenning och elfaelt. |
| JPH05196672A (ja) * | 1992-01-21 | 1993-08-06 | Sharp Corp | 電位計の校正方法及び異常検知方法 |
| JP3264450B2 (ja) * | 1992-03-04 | 2002-03-11 | 株式会社リコー | 感光体表面の電界測定方法及びその装置 |
| JPH06342017A (ja) * | 1993-05-28 | 1994-12-13 | Ricoh Co Ltd | 電界強度測定装置 |
| JPH07181211A (ja) * | 1993-12-24 | 1995-07-21 | Ricoh Co Ltd | 表面電位計測装置 |
| US6057677A (en) * | 1996-04-24 | 2000-05-02 | Fujitsu Limited | Electrooptic voltage waveform measuring method and apparatus |
| CN2289357Y (zh) * | 1997-03-14 | 1998-08-26 | 武汉大学 | X射线静电扫描仪 |
| EP1229337A1 (de) * | 2001-02-06 | 2002-08-07 | Abb Research Ltd. | Verfahren zur temparaturkompensierten elektro-optischen Messung einer elektrischen Spannung |
| US20050084801A1 (en) * | 2001-07-20 | 2005-04-21 | Idriss El-Hafidi | Photonics data storage system using a polypeptide material and method for making same |
| KR100467599B1 (ko) * | 2002-07-24 | 2005-01-24 | 삼성전자주식회사 | 표면전위 측정기를 구비하는 화상 형성 장치 및 이를이용한 현상 전압 제어 방법 |
| JP4751389B2 (ja) * | 2005-06-20 | 2011-08-17 | 日本電信電話株式会社 | ビーム偏向器 |
| DE102005061716A1 (de) * | 2005-12-22 | 2007-07-05 | BME Meßgeräte Entwicklung KG | Pockelszellen-Ansteuerschaltung zur schnellen Variation der Pulsamplitude von kurzen oder ultrakurzen Laserpulsen |
| US7929579B2 (en) * | 2006-08-02 | 2011-04-19 | Cynosure, Inc. | Picosecond laser apparatus and methods for its operation and use |
| JP2009274104A (ja) * | 2008-05-15 | 2009-11-26 | Fujitsu Component Ltd | 座標検出装置の製造装置 |
| JP5072916B2 (ja) * | 2009-07-16 | 2012-11-14 | 株式会社日立製作所 | 回転電機の固定子コイルの非線形抵抗測定方法、および、非線形抵抗測定装置 |
-
2011
- 2011-11-25 JP JP2011258147A patent/JP6192890B2/ja active Active
-
2012
- 2012-11-21 BR BR112014012354A patent/BR112014012354A8/pt not_active Application Discontinuation
- 2012-11-21 WO PCT/JP2012/007467 patent/WO2013076975A1/ja not_active Ceased
- 2012-11-21 US US14/355,760 patent/US9702915B2/en active Active
- 2012-11-21 EP EP12852419.6A patent/EP2784526B1/en active Active
- 2012-11-21 CN CN201280057715.XA patent/CN104024874B/zh active Active
- 2012-11-21 CA CA2856201A patent/CA2856201C/en active Active
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