JP2013113637A5 - - Google Patents

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Publication number
JP2013113637A5
JP2013113637A5 JP2011258147A JP2011258147A JP2013113637A5 JP 2013113637 A5 JP2013113637 A5 JP 2013113637A5 JP 2011258147 A JP2011258147 A JP 2011258147A JP 2011258147 A JP2011258147 A JP 2011258147A JP 2013113637 A5 JP2013113637 A5 JP 2013113637A5
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JP
Japan
Prior art keywords
surface potential
test
voltage
output voltage
mirror
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JP2011258147A
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English (en)
Japanese (ja)
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JP2013113637A (ja
JP6192890B2 (ja
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Priority claimed from JP2011258147A external-priority patent/JP6192890B2/ja
Priority to JP2011258147A priority Critical patent/JP6192890B2/ja
Priority to CA2856201A priority patent/CA2856201C/en
Priority to PCT/JP2012/007467 priority patent/WO2013076975A1/ja
Priority to US14/355,760 priority patent/US9702915B2/en
Priority to EP12852419.6A priority patent/EP2784526B1/en
Priority to CN201280057715.XA priority patent/CN104024874B/zh
Priority to BR112014012354A priority patent/BR112014012354A8/pt
Publication of JP2013113637A publication Critical patent/JP2013113637A/ja
Publication of JP2013113637A5 publication Critical patent/JP2013113637A5/ja
Publication of JP6192890B2 publication Critical patent/JP6192890B2/ja
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JP2011258147A 2011-11-25 2011-11-25 表面電位分布計測装置および表面電位分布計測方法 Active JP6192890B2 (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2011258147A JP6192890B2 (ja) 2011-11-25 2011-11-25 表面電位分布計測装置および表面電位分布計測方法
EP12852419.6A EP2784526B1 (en) 2011-11-25 2012-11-21 Surface potential distribution measuring device and surface potential distribution measuring method
PCT/JP2012/007467 WO2013076975A1 (ja) 2011-11-25 2012-11-21 表面電位分布計測装置および表面電位分布計測方法
US14/355,760 US9702915B2 (en) 2011-11-25 2012-11-21 Surface potential distribution measuring device and surface potential distribution measuring method
CA2856201A CA2856201C (en) 2011-11-25 2012-11-21 Surface potential distribution measuring device and surface potential distribution measuring method
CN201280057715.XA CN104024874B (zh) 2011-11-25 2012-11-21 表面电位分布测量装置和表面电位分布测量方法
BR112014012354A BR112014012354A8 (pt) 2011-11-25 2012-11-21 dispositivo de medição de distribuição de potencial de superfície e método de medição de distribuição de potencial de superfície

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011258147A JP6192890B2 (ja) 2011-11-25 2011-11-25 表面電位分布計測装置および表面電位分布計測方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2016156280A Division JP6159857B2 (ja) 2016-08-09 2016-08-09 表面電位分布計測装置および表面電位分布計測方法

Publications (3)

Publication Number Publication Date
JP2013113637A JP2013113637A (ja) 2013-06-10
JP2013113637A5 true JP2013113637A5 (enExample) 2015-06-25
JP6192890B2 JP6192890B2 (ja) 2017-09-06

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ID=48469440

Family Applications (1)

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JP2011258147A Active JP6192890B2 (ja) 2011-11-25 2011-11-25 表面電位分布計測装置および表面電位分布計測方法

Country Status (7)

Country Link
US (1) US9702915B2 (enExample)
EP (1) EP2784526B1 (enExample)
JP (1) JP6192890B2 (enExample)
CN (1) CN104024874B (enExample)
BR (1) BR112014012354A8 (enExample)
CA (1) CA2856201C (enExample)
WO (1) WO2013076975A1 (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130054162A1 (en) 2011-08-31 2013-02-28 Tollgrade Communications, Inc. Methods and apparatus for determining conditions of power lines
US9562925B2 (en) 2012-02-14 2017-02-07 Tollgrade Communications, Inc. Power line management system
JP6159793B2 (ja) * 2013-03-19 2017-07-05 東芝三菱電機産業システム株式会社 表面電位分布計測装置
US9972989B2 (en) 2014-03-31 2018-05-15 Aclara Technologies Llc Optical voltage sensing for underground medium voltage wires
CN106461707B (zh) * 2014-06-06 2019-03-05 东芝三菱电机产业系统株式会社 三维表面电位分布测量装置
EP3186646B1 (en) 2014-08-29 2021-10-20 Aclara Technologies LLC Power extraction for a medium voltage sensor using a capacitive voltage divider
CA3013883C (en) 2016-02-08 2022-08-23 Toshiba Mitsubishi-Electric Industrial Systems Corporation Three-dimensional surface potential distribution measurement system
CN107884632B (zh) * 2017-10-18 2020-10-20 中国电力科学研究院 一种任意分裂直流线路导线表面电场的计算方法及系统
CN109709408B (zh) * 2019-03-08 2024-05-10 广东省职业病防治院 空间直流电场测量设备
CN111721994B (zh) * 2020-06-19 2022-09-06 贵州江源电力建设有限公司 一种分布式高压输电线路的电压检测系统
CN116718915A (zh) * 2023-08-10 2023-09-08 西门子电机(中国)有限公司 电机槽口电场强度检测方法、装置、电子设备和存储介质

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3272713D1 (en) * 1981-06-12 1986-09-25 Meidensha Electric Mfg Co Ltd Electric field detector
US4786176A (en) * 1986-01-06 1988-11-22 Rank Taylor Hobson Limited Metrological apparatus and method using polarization modulation
DE3740468A1 (de) * 1987-11-28 1989-06-08 Kernforschungsz Karlsruhe Vorrichtung zur beruehrungslosen messung statischer und/oder zeitlich veraenderlicher elektrischer felder
CN1038277C (zh) * 1987-12-28 1998-05-06 佳能公司 成象设备
JP2733609B2 (ja) * 1988-10-29 1998-03-30 キヤノン株式会社 転写装置
US4937457A (en) * 1989-02-10 1990-06-26 Slm Instruments, Inc. Picosecond multi-harmonic fourier fluorometer
EP0392830B1 (en) * 1989-04-12 1994-06-22 Hamamatsu Photonics K.K. Method and apparatus for detecting voltage
DE69206654T2 (de) * 1991-03-26 1996-07-11 Hamamatsu Photonics Kk Optischer Spannungsdetektor
FI915818A0 (fi) * 1991-12-11 1991-12-11 Imatran Voima Oy Optisk rf-givare foer maetning av spaenning och elfaelt.
JPH05196672A (ja) * 1992-01-21 1993-08-06 Sharp Corp 電位計の校正方法及び異常検知方法
JP3264450B2 (ja) * 1992-03-04 2002-03-11 株式会社リコー 感光体表面の電界測定方法及びその装置
JPH06342017A (ja) * 1993-05-28 1994-12-13 Ricoh Co Ltd 電界強度測定装置
JPH07181211A (ja) * 1993-12-24 1995-07-21 Ricoh Co Ltd 表面電位計測装置
US6057677A (en) * 1996-04-24 2000-05-02 Fujitsu Limited Electrooptic voltage waveform measuring method and apparatus
CN2289357Y (zh) * 1997-03-14 1998-08-26 武汉大学 X射线静电扫描仪
EP1229337A1 (de) * 2001-02-06 2002-08-07 Abb Research Ltd. Verfahren zur temparaturkompensierten elektro-optischen Messung einer elektrischen Spannung
US20050084801A1 (en) * 2001-07-20 2005-04-21 Idriss El-Hafidi Photonics data storage system using a polypeptide material and method for making same
KR100467599B1 (ko) * 2002-07-24 2005-01-24 삼성전자주식회사 표면전위 측정기를 구비하는 화상 형성 장치 및 이를이용한 현상 전압 제어 방법
JP4751389B2 (ja) * 2005-06-20 2011-08-17 日本電信電話株式会社 ビーム偏向器
DE102005061716A1 (de) * 2005-12-22 2007-07-05 BME Meßgeräte Entwicklung KG Pockelszellen-Ansteuerschaltung zur schnellen Variation der Pulsamplitude von kurzen oder ultrakurzen Laserpulsen
US7929579B2 (en) * 2006-08-02 2011-04-19 Cynosure, Inc. Picosecond laser apparatus and methods for its operation and use
JP2009274104A (ja) * 2008-05-15 2009-11-26 Fujitsu Component Ltd 座標検出装置の製造装置
JP5072916B2 (ja) * 2009-07-16 2012-11-14 株式会社日立製作所 回転電機の固定子コイルの非線形抵抗測定方法、および、非線形抵抗測定装置

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