BR112014012354A8 - dispositivo de medição de distribuição de potencial de superfície e método de medição de distribuição de potencial de superfície - Google Patents
dispositivo de medição de distribuição de potencial de superfície e método de medição de distribuição de potencial de superfícieInfo
- Publication number
- BR112014012354A8 BR112014012354A8 BR112014012354A BR112014012354A BR112014012354A8 BR 112014012354 A8 BR112014012354 A8 BR 112014012354A8 BR 112014012354 A BR112014012354 A BR 112014012354A BR 112014012354 A BR112014012354 A BR 112014012354A BR 112014012354 A8 BR112014012354 A8 BR 112014012354A8
- Authority
- BR
- Brazil
- Prior art keywords
- surface potential
- distribution measuring
- potential distribution
- measuring device
- voltage
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/12—Measuring electrostatic fields or voltage-potential
- G01R29/14—Measuring field distribution
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
- G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
- G01R15/242—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption based on the Pockels effect, i.e. linear electro-optic effect
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/34—Testing dynamo-electric machines
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Circuit Breakers, Generators, And Electric Motors (AREA)
- Measurement Of Current Or Voltage (AREA)
- Insulation, Fastening Of Motor, Generator Windings (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
Abstract
resumo patente de invenção: "dispositivo de medição de distribuição de potencial de superfície e método de medição de distribuição de potencial de superfície". em um dispositivo de medição de distribuição de potencial de superfície (1) para sistema de redução de campo elétrico (3) de uma máquina elétrica giratória, um cristal pockels (25) é usado entre um laser (21) e a superfície (local de teste (l)) do sistema de redução de campo elétrico (3). assim, a intensidade de luz de um feixe laser refletido em um espelho (24) fornecido entre o cristal pockels (23) e o local de teste (l) corresponde a uma tensão de saída que é a diferença de tensão entre as primeira e segunda superfícies de extremidade do cristal pockels. mesmo quando uma tensão de inversor é gerada, usando-se detector de luz (25) tendo uma faixa de frequência capaz de seguir componentes de alta frequência da tensão de pulso do inversor, intensidade de luz é detectada pelo detector de luz. portanto, da intensidade de luz (tensão de saída), o dispositivo de medição (1) pode medir o potencial de superfície do sistema de redução de campo elétrico (3) no qual uma tensão de pulso do inversor é gerada.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2011258147A JP6192890B2 (ja) | 2011-11-25 | 2011-11-25 | 表面電位分布計測装置および表面電位分布計測方法 |
PCT/JP2012/007467 WO2013076975A1 (ja) | 2011-11-25 | 2012-11-21 | 表面電位分布計測装置および表面電位分布計測方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
BR112014012354A2 BR112014012354A2 (pt) | 2017-06-13 |
BR112014012354A8 true BR112014012354A8 (pt) | 2017-06-20 |
Family
ID=48469440
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BR112014012354A BR112014012354A8 (pt) | 2011-11-25 | 2012-11-21 | dispositivo de medição de distribuição de potencial de superfície e método de medição de distribuição de potencial de superfície |
Country Status (7)
Country | Link |
---|---|
US (1) | US9702915B2 (pt) |
EP (1) | EP2784526B1 (pt) |
JP (1) | JP6192890B2 (pt) |
CN (1) | CN104024874B (pt) |
BR (1) | BR112014012354A8 (pt) |
CA (1) | CA2856201C (pt) |
WO (1) | WO2013076975A1 (pt) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20130054162A1 (en) | 2011-08-31 | 2013-02-28 | Tollgrade Communications, Inc. | Methods and apparatus for determining conditions of power lines |
EP2815479B1 (en) | 2012-02-14 | 2017-01-04 | Tollgrade Communications, Inc. | Power line management system |
CA2907558C (en) * | 2013-03-19 | 2018-05-01 | Toshiba Mitsubishi-Electric Industrial Systems Corporation | Surface potential distribution measuring device |
WO2015153539A2 (en) * | 2014-03-31 | 2015-10-08 | Tollgrade Communication, Inc. | Optical voltage sensing for underground medium voltage wires |
US10041980B2 (en) | 2014-06-06 | 2018-08-07 | Toshiba Mitsubishi-Electric Industrial Systems Corporation | Three-dimensional surface potential distribution measurement apparatus |
US10203355B2 (en) | 2014-08-29 | 2019-02-12 | Aclara Technologies Llc | Power extraction for a medium voltage sensor using a capacitive voltage divider |
BR112018016078B1 (pt) | 2016-02-08 | 2023-05-02 | The University Of Tokyo | Sistema de medição de distribuição de potencial de superfície tridimensional |
CN107884632B (zh) * | 2017-10-18 | 2020-10-20 | 中国电力科学研究院 | 一种任意分裂直流线路导线表面电场的计算方法及系统 |
CN109709408B (zh) * | 2019-03-08 | 2024-05-10 | 广东省职业病防治院 | 空间直流电场测量设备 |
CN111721994B (zh) * | 2020-06-19 | 2022-09-06 | 贵州江源电力建设有限公司 | 一种分布式高压输电线路的电压检测系统 |
CN116718915A (zh) * | 2023-08-10 | 2023-09-08 | 西门子电机(中国)有限公司 | 电机槽口电场强度检测方法、装置、电子设备和存储介质 |
Family Cites Families (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0067683B1 (en) * | 1981-06-12 | 1986-08-20 | Kabushiki Kaisha Meidensha | Electric field detector |
EP0230345A1 (en) * | 1986-01-06 | 1987-07-29 | Rank Taylor Hobson Limited | Metrological apparatus and method using polarisation modulation |
DE3740468A1 (de) * | 1987-11-28 | 1989-06-08 | Kernforschungsz Karlsruhe | Vorrichtung zur beruehrungslosen messung statischer und/oder zeitlich veraenderlicher elektrischer felder |
CN1038277C (zh) * | 1987-12-28 | 1998-05-06 | 佳能公司 | 成象设备 |
JP2733609B2 (ja) * | 1988-10-29 | 1998-03-30 | キヤノン株式会社 | 転写装置 |
US4937457A (en) * | 1989-02-10 | 1990-06-26 | Slm Instruments, Inc. | Picosecond multi-harmonic fourier fluorometer |
US5055770A (en) * | 1989-04-12 | 1991-10-08 | Hamamatsu Photonics K. K. | Method and apparatus for detecting voltage |
DE69206654T2 (de) * | 1991-03-26 | 1996-07-11 | Hamamatsu Photonics Kk | Optischer Spannungsdetektor |
FI915818A0 (fi) | 1991-12-11 | 1991-12-11 | Imatran Voima Oy | Optisk rf-givare foer maetning av spaenning och elfaelt. |
JPH05196672A (ja) * | 1992-01-21 | 1993-08-06 | Sharp Corp | 電位計の校正方法及び異常検知方法 |
JP3264450B2 (ja) * | 1992-03-04 | 2002-03-11 | 株式会社リコー | 感光体表面の電界測定方法及びその装置 |
JPH06342017A (ja) * | 1993-05-28 | 1994-12-13 | Ricoh Co Ltd | 電界強度測定装置 |
JPH07181211A (ja) * | 1993-12-24 | 1995-07-21 | Ricoh Co Ltd | 表面電位計測装置 |
US6057677A (en) | 1996-04-24 | 2000-05-02 | Fujitsu Limited | Electrooptic voltage waveform measuring method and apparatus |
CN2289357Y (zh) * | 1997-03-14 | 1998-08-26 | 武汉大学 | X射线静电扫描仪 |
EP1229337A1 (de) * | 2001-02-06 | 2002-08-07 | Abb Research Ltd. | Verfahren zur temparaturkompensierten elektro-optischen Messung einer elektrischen Spannung |
ATE284569T1 (de) * | 2001-07-20 | 2004-12-15 | Res Investment Network Inc | Photonisches datenaufzeichnungssystem unter verwendung von polypeptidmaterial, und verfahren zur dessen herstellung |
KR100467599B1 (ko) * | 2002-07-24 | 2005-01-24 | 삼성전자주식회사 | 표면전위 측정기를 구비하는 화상 형성 장치 및 이를이용한 현상 전압 제어 방법 |
KR20080007372A (ko) * | 2005-06-20 | 2008-01-18 | 니폰덴신뎅와 가부시키가이샤 | 전기 광학 소자 |
DE102005061716A1 (de) * | 2005-12-22 | 2007-07-05 | BME Meßgeräte Entwicklung KG | Pockelszellen-Ansteuerschaltung zur schnellen Variation der Pulsamplitude von kurzen oder ultrakurzen Laserpulsen |
US7929579B2 (en) * | 2006-08-02 | 2011-04-19 | Cynosure, Inc. | Picosecond laser apparatus and methods for its operation and use |
JP2009274104A (ja) * | 2008-05-15 | 2009-11-26 | Fujitsu Component Ltd | 座標検出装置の製造装置 |
JP5072916B2 (ja) * | 2009-07-16 | 2012-11-14 | 株式会社日立製作所 | 回転電機の固定子コイルの非線形抵抗測定方法、および、非線形抵抗測定装置 |
-
2011
- 2011-11-25 JP JP2011258147A patent/JP6192890B2/ja active Active
-
2012
- 2012-11-21 BR BR112014012354A patent/BR112014012354A8/pt not_active Application Discontinuation
- 2012-11-21 WO PCT/JP2012/007467 patent/WO2013076975A1/ja active Application Filing
- 2012-11-21 CA CA2856201A patent/CA2856201C/en active Active
- 2012-11-21 EP EP12852419.6A patent/EP2784526B1/en active Active
- 2012-11-21 US US14/355,760 patent/US9702915B2/en active Active
- 2012-11-21 CN CN201280057715.XA patent/CN104024874B/zh active Active
Also Published As
Publication number | Publication date |
---|---|
CN104024874A (zh) | 2014-09-03 |
CA2856201A1 (en) | 2013-05-30 |
EP2784526A1 (en) | 2014-10-01 |
CN104024874B (zh) | 2017-03-29 |
WO2013076975A1 (ja) | 2013-05-30 |
EP2784526A4 (en) | 2015-07-22 |
EP2784526B1 (en) | 2022-08-17 |
US20140300368A1 (en) | 2014-10-09 |
BR112014012354A2 (pt) | 2017-06-13 |
CA2856201C (en) | 2018-08-14 |
JP2013113637A (ja) | 2013-06-10 |
US9702915B2 (en) | 2017-07-11 |
JP6192890B2 (ja) | 2017-09-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
B06F | Objections, documents and/or translations needed after an examination request according [chapter 6.6 patent gazette] | ||
B06U | Preliminary requirement: requests with searches performed by other patent offices: procedure suspended [chapter 6.21 patent gazette] | ||
B07A | Application suspended after technical examination (opinion) [chapter 7.1 patent gazette] | ||
B350 | Update of information on the portal [chapter 15.35 patent gazette] | ||
B09B | Patent application refused [chapter 9.2 patent gazette] | ||
B12B | Appeal against refusal [chapter 12.2 patent gazette] |