CA2856201C - Surface potential distribution measuring device and surface potential distribution measuring method - Google Patents
Surface potential distribution measuring device and surface potential distribution measuring method Download PDFInfo
- Publication number
- CA2856201C CA2856201C CA2856201A CA2856201A CA2856201C CA 2856201 C CA2856201 C CA 2856201C CA 2856201 A CA2856201 A CA 2856201A CA 2856201 A CA2856201 A CA 2856201A CA 2856201 C CA2856201 C CA 2856201C
- Authority
- CA
- Canada
- Prior art keywords
- surface potential
- voltage
- mirror
- test
- laser light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000000034 method Methods 0.000 title claims description 7
- 238000012360 testing method Methods 0.000 claims abstract description 92
- 239000013078 crystal Substances 0.000 claims abstract description 82
- 230000005684 electric field Effects 0.000 claims abstract description 70
- 238000012545 processing Methods 0.000 claims description 59
- 238000005259 measurement Methods 0.000 claims description 43
- 238000001514 detection method Methods 0.000 claims description 22
- 230000010287 polarization Effects 0.000 claims description 3
- 241001125929 Trisopterus luscus Species 0.000 description 15
- 239000004020 conductor Substances 0.000 description 8
- 239000000523 sample Substances 0.000 description 5
- 230000005697 Pockels effect Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 230000020169 heat generation Effects 0.000 description 4
- 239000007769 metal material Substances 0.000 description 3
- 238000004590 computer program Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000004593 Epoxy Substances 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000010248 power generation Methods 0.000 description 1
- 230000001902 propagating effect Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/12—Measuring electrostatic fields or voltage-potential
- G01R29/14—Measuring field distribution
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
- G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
- G01R15/242—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption based on the Pockels effect, i.e. linear electro-optic effect
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/34—Testing dynamo-electric machines
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Circuit Breakers, Generators, And Electric Motors (AREA)
- Measurement Of Current Or Voltage (AREA)
- Insulation, Fastening Of Motor, Generator Windings (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011-258147 | 2011-11-25 | ||
| JP2011258147A JP6192890B2 (ja) | 2011-11-25 | 2011-11-25 | 表面電位分布計測装置および表面電位分布計測方法 |
| PCT/JP2012/007467 WO2013076975A1 (ja) | 2011-11-25 | 2012-11-21 | 表面電位分布計測装置および表面電位分布計測方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CA2856201A1 CA2856201A1 (en) | 2013-05-30 |
| CA2856201C true CA2856201C (en) | 2018-08-14 |
Family
ID=48469440
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA2856201A Active CA2856201C (en) | 2011-11-25 | 2012-11-21 | Surface potential distribution measuring device and surface potential distribution measuring method |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US9702915B2 (enExample) |
| EP (1) | EP2784526B1 (enExample) |
| JP (1) | JP6192890B2 (enExample) |
| CN (1) | CN104024874B (enExample) |
| BR (1) | BR112014012354A8 (enExample) |
| CA (1) | CA2856201C (enExample) |
| WO (1) | WO2013076975A1 (enExample) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20130054162A1 (en) | 2011-08-31 | 2013-02-28 | Tollgrade Communications, Inc. | Methods and apparatus for determining conditions of power lines |
| CA2864096C (en) | 2012-02-14 | 2021-03-23 | Tollgrade Communications, Inc. | Power line management system |
| EP2977775B1 (en) * | 2013-03-19 | 2017-11-08 | Toshiba Mitsubishi-Electric Industrial Systems Corporation | Surface-potential distribution measuring device |
| CA3171513C (en) * | 2014-03-31 | 2025-09-09 | Aclara Technologies Llc | OPTICAL VOLTAGE DETECTION FOR MEDIUM VOLTAGE UNDERGROUND CABLES |
| CA2951382C (en) * | 2014-06-06 | 2018-11-20 | Toshiba Mitsubishi-Electric Industrial Systems Corporation | Three-dimensional surface potential distribution measurement apparatus |
| WO2016033443A1 (en) | 2014-08-29 | 2016-03-03 | Tollgrade Communications, Inc. | Power extraction for a medium voltage sensor using a capacitive voltage divider |
| EP3415933B1 (en) * | 2016-02-08 | 2024-08-07 | TMEIC Corporation | Three-dimensional surface potential distribution measurement system |
| CN107884632B (zh) * | 2017-10-18 | 2020-10-20 | 中国电力科学研究院 | 一种任意分裂直流线路导线表面电场的计算方法及系统 |
| CN109709408B (zh) * | 2019-03-08 | 2024-05-10 | 广东省职业病防治院 | 空间直流电场测量设备 |
| CN111721994B (zh) * | 2020-06-19 | 2022-09-06 | 贵州江源电力建设有限公司 | 一种分布式高压输电线路的电压检测系统 |
| CN116718915A (zh) * | 2023-08-10 | 2023-09-08 | 西门子电机(中国)有限公司 | 电机槽口电场强度检测方法、装置、电子设备和存储介质 |
Family Cites Families (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3272713D1 (en) * | 1981-06-12 | 1986-09-25 | Meidensha Electric Mfg Co Ltd | Electric field detector |
| IN165491B (enExample) * | 1986-01-06 | 1989-11-04 | Rank Taylor Hobson Ltd | |
| DE3740468A1 (de) * | 1987-11-28 | 1989-06-08 | Kernforschungsz Karlsruhe | Vorrichtung zur beruehrungslosen messung statischer und/oder zeitlich veraenderlicher elektrischer felder |
| CN1038277C (zh) * | 1987-12-28 | 1998-05-06 | 佳能公司 | 成象设备 |
| JP2733609B2 (ja) * | 1988-10-29 | 1998-03-30 | キヤノン株式会社 | 転写装置 |
| US4937457A (en) * | 1989-02-10 | 1990-06-26 | Slm Instruments, Inc. | Picosecond multi-harmonic fourier fluorometer |
| DE69010053T2 (de) * | 1989-04-12 | 1994-10-13 | Hamamatsu Photonics Kk | Methode und Vorrichtung zum Nachweis einer Spannung. |
| EP0506357B1 (en) * | 1991-03-26 | 1995-12-13 | Hamamatsu Photonics K.K. | Optical voltage detector |
| FI915818A0 (fi) | 1991-12-11 | 1991-12-11 | Imatran Voima Oy | Optisk rf-givare foer maetning av spaenning och elfaelt. |
| JPH05196672A (ja) * | 1992-01-21 | 1993-08-06 | Sharp Corp | 電位計の校正方法及び異常検知方法 |
| JP3264450B2 (ja) * | 1992-03-04 | 2002-03-11 | 株式会社リコー | 感光体表面の電界測定方法及びその装置 |
| JPH06342017A (ja) * | 1993-05-28 | 1994-12-13 | Ricoh Co Ltd | 電界強度測定装置 |
| JPH07181211A (ja) * | 1993-12-24 | 1995-07-21 | Ricoh Co Ltd | 表面電位計測装置 |
| US6057677A (en) * | 1996-04-24 | 2000-05-02 | Fujitsu Limited | Electrooptic voltage waveform measuring method and apparatus |
| CN2289357Y (zh) * | 1997-03-14 | 1998-08-26 | 武汉大学 | X射线静电扫描仪 |
| EP1229337A1 (de) * | 2001-02-06 | 2002-08-07 | Abb Research Ltd. | Verfahren zur temparaturkompensierten elektro-optischen Messung einer elektrischen Spannung |
| WO2003010762A1 (en) * | 2001-07-20 | 2003-02-06 | Discovision Associates | Photonics data storage system using a polypeptide material and method for making same |
| KR100467599B1 (ko) * | 2002-07-24 | 2005-01-24 | 삼성전자주식회사 | 표면전위 측정기를 구비하는 화상 형성 장치 및 이를이용한 현상 전압 제어 방법 |
| KR20080007372A (ko) * | 2005-06-20 | 2008-01-18 | 니폰덴신뎅와 가부시키가이샤 | 전기 광학 소자 |
| DE102005061716A1 (de) * | 2005-12-22 | 2007-07-05 | BME Meßgeräte Entwicklung KG | Pockelszellen-Ansteuerschaltung zur schnellen Variation der Pulsamplitude von kurzen oder ultrakurzen Laserpulsen |
| US7929579B2 (en) * | 2006-08-02 | 2011-04-19 | Cynosure, Inc. | Picosecond laser apparatus and methods for its operation and use |
| JP2009274104A (ja) * | 2008-05-15 | 2009-11-26 | Fujitsu Component Ltd | 座標検出装置の製造装置 |
| JP5072916B2 (ja) * | 2009-07-16 | 2012-11-14 | 株式会社日立製作所 | 回転電機の固定子コイルの非線形抵抗測定方法、および、非線形抵抗測定装置 |
-
2011
- 2011-11-25 JP JP2011258147A patent/JP6192890B2/ja active Active
-
2012
- 2012-11-21 WO PCT/JP2012/007467 patent/WO2013076975A1/ja not_active Ceased
- 2012-11-21 EP EP12852419.6A patent/EP2784526B1/en active Active
- 2012-11-21 US US14/355,760 patent/US9702915B2/en active Active
- 2012-11-21 CN CN201280057715.XA patent/CN104024874B/zh active Active
- 2012-11-21 BR BR112014012354A patent/BR112014012354A8/pt not_active Application Discontinuation
- 2012-11-21 CA CA2856201A patent/CA2856201C/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| US20140300368A1 (en) | 2014-10-09 |
| CN104024874B (zh) | 2017-03-29 |
| US9702915B2 (en) | 2017-07-11 |
| BR112014012354A8 (pt) | 2017-06-20 |
| JP2013113637A (ja) | 2013-06-10 |
| CA2856201A1 (en) | 2013-05-30 |
| WO2013076975A1 (ja) | 2013-05-30 |
| EP2784526B1 (en) | 2022-08-17 |
| CN104024874A (zh) | 2014-09-03 |
| JP6192890B2 (ja) | 2017-09-06 |
| EP2784526A1 (en) | 2014-10-01 |
| BR112014012354A2 (pt) | 2017-06-13 |
| EP2784526A4 (en) | 2015-07-22 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EEER | Examination request |
Effective date: 20150120 |