CN104024874B - 表面电位分布测量装置和表面电位分布测量方法 - Google Patents

表面电位分布测量装置和表面电位分布测量方法 Download PDF

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Publication number
CN104024874B
CN104024874B CN201280057715.XA CN201280057715A CN104024874B CN 104024874 B CN104024874 B CN 104024874B CN 201280057715 A CN201280057715 A CN 201280057715A CN 104024874 B CN104024874 B CN 104024874B
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China
Prior art keywords
surface potential
voltage
output voltage
electric field
pockels crystal
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CN201280057715.XA
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English (en)
Chinese (zh)
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CN104024874A (zh
Inventor
坪井雄
坪井雄一
山田慎郎
山田慎一郎
吉满哲夫
日高邦彦
熊田亚纪子
池田久利
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Toshiba Mitsubishi Electric Industrial Systems Corp
University of Tokyo NUC
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Toshiba Mitsubishi Electric Industrial Systems Corp
University of Tokyo NUC
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/12—Measuring electrostatic fields or voltage-potential
    • G01R29/14—Measuring field distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
    • G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
    • G01R15/242—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption based on the Pockels effect, i.e. linear electro-optic effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/34—Testing dynamo-electric machines

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Circuit Breakers, Generators, And Electric Motors (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Insulation, Fastening Of Motor, Generator Windings (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
CN201280057715.XA 2011-11-25 2012-11-21 表面电位分布测量装置和表面电位分布测量方法 Active CN104024874B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2011-258147 2011-11-25
JP2011258147A JP6192890B2 (ja) 2011-11-25 2011-11-25 表面電位分布計測装置および表面電位分布計測方法
PCT/JP2012/007467 WO2013076975A1 (ja) 2011-11-25 2012-11-21 表面電位分布計測装置および表面電位分布計測方法

Publications (2)

Publication Number Publication Date
CN104024874A CN104024874A (zh) 2014-09-03
CN104024874B true CN104024874B (zh) 2017-03-29

Family

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CN201280057715.XA Active CN104024874B (zh) 2011-11-25 2012-11-21 表面电位分布测量装置和表面电位分布测量方法

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Country Link
US (1) US9702915B2 (enExample)
EP (1) EP2784526B1 (enExample)
JP (1) JP6192890B2 (enExample)
CN (1) CN104024874B (enExample)
BR (1) BR112014012354A8 (enExample)
CA (1) CA2856201C (enExample)
WO (1) WO2013076975A1 (enExample)

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US20130054162A1 (en) 2011-08-31 2013-02-28 Tollgrade Communications, Inc. Methods and apparatus for determining conditions of power lines
CA2864096C (en) 2012-02-14 2021-03-23 Tollgrade Communications, Inc. Power line management system
EP2977775B1 (en) * 2013-03-19 2017-11-08 Toshiba Mitsubishi-Electric Industrial Systems Corporation Surface-potential distribution measuring device
CA3171513C (en) * 2014-03-31 2025-09-09 Aclara Technologies Llc OPTICAL VOLTAGE DETECTION FOR MEDIUM VOLTAGE UNDERGROUND CABLES
CA2951382C (en) * 2014-06-06 2018-11-20 Toshiba Mitsubishi-Electric Industrial Systems Corporation Three-dimensional surface potential distribution measurement apparatus
WO2016033443A1 (en) 2014-08-29 2016-03-03 Tollgrade Communications, Inc. Power extraction for a medium voltage sensor using a capacitive voltage divider
EP3415933B1 (en) * 2016-02-08 2024-08-07 TMEIC Corporation Three-dimensional surface potential distribution measurement system
CN107884632B (zh) * 2017-10-18 2020-10-20 中国电力科学研究院 一种任意分裂直流线路导线表面电场的计算方法及系统
CN109709408B (zh) * 2019-03-08 2024-05-10 广东省职业病防治院 空间直流电场测量设备
CN111721994B (zh) * 2020-06-19 2022-09-06 贵州江源电力建设有限公司 一种分布式高压输电线路的电压检测系统
CN116718915A (zh) * 2023-08-10 2023-09-08 西门子电机(中国)有限公司 电机槽口电场强度检测方法、装置、电子设备和存储介质

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CN1036463A (zh) * 1987-12-28 1989-10-18 佳能公司 成象设备
CN1042427A (zh) * 1988-10-29 1990-05-23 佳能公司 转移机构和用该转移机构的影象成型机构
WO1993012435A1 (en) * 1991-12-11 1993-06-24 Imatran Voima Oy Optical voltage and electric field sensor based on the pockels effect
CN2289357Y (zh) * 1997-03-14 1998-08-26 武汉大学 X射线静电扫描仪
CN1479177A (zh) * 2002-07-24 2004-03-03 三星电子株式会社 具有表面电位测量部件的成像设备和控制显影电压的方法
JP2004525361A (ja) * 2001-02-06 2004-08-19 アーベーベー・リサーチ・リミテッド 温度補償した形で電圧を電気光学的に測定する方法とその方法を実施するための装置
CN101582003A (zh) * 2008-05-15 2009-11-18 富士通电子零件有限公司 坐标检测设备的制造装置

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CN1036463A (zh) * 1987-12-28 1989-10-18 佳能公司 成象设备
CN1042427A (zh) * 1988-10-29 1990-05-23 佳能公司 转移机构和用该转移机构的影象成型机构
WO1993012435A1 (en) * 1991-12-11 1993-06-24 Imatran Voima Oy Optical voltage and electric field sensor based on the pockels effect
CN2289357Y (zh) * 1997-03-14 1998-08-26 武汉大学 X射线静电扫描仪
JP2004525361A (ja) * 2001-02-06 2004-08-19 アーベーベー・リサーチ・リミテッド 温度補償した形で電圧を電気光学的に測定する方法とその方法を実施するための装置
CN1479177A (zh) * 2002-07-24 2004-03-03 三星电子株式会社 具有表面电位测量部件的成像设备和控制显影电压的方法
CN101582003A (zh) * 2008-05-15 2009-11-18 富士通电子零件有限公司 坐标检测设备的制造装置

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Electric Field and Voltage Measurement by Using Electro-Optic Sensor;Kunihiko Hidaka et al.;《HIGH VOLTAGE ENGINEERING,1999.ELEVENTH INTERNATIONAL SYMPOSIUM ON (C ONF. PUBL. NO. 467)》;19990823;第2卷;第1-14页 *

Also Published As

Publication number Publication date
US20140300368A1 (en) 2014-10-09
US9702915B2 (en) 2017-07-11
BR112014012354A8 (pt) 2017-06-20
JP2013113637A (ja) 2013-06-10
CA2856201A1 (en) 2013-05-30
WO2013076975A1 (ja) 2013-05-30
EP2784526B1 (en) 2022-08-17
CN104024874A (zh) 2014-09-03
JP6192890B2 (ja) 2017-09-06
EP2784526A1 (en) 2014-10-01
BR112014012354A2 (pt) 2017-06-13
CA2856201C (en) 2018-08-14
EP2784526A4 (en) 2015-07-22

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