JP2013111717A - 弾性膜 - Google Patents
弾性膜 Download PDFInfo
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B3/00—Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form
- B32B3/02—Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form characterised by features of form at particular places, e.g. in edge regions
- B32B3/08—Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form characterised by features of form at particular places, e.g. in edge regions characterised by added members at particular parts
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B3/00—Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form
- B32B3/10—Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form characterised by a discontinuous layer, i.e. formed of separate pieces of material
- B32B3/18—Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form characterised by a discontinuous layer, i.e. formed of separate pieces of material characterised by an internal layer formed of separate pieces of material which are juxtaposed side-by-side
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B27/00—Layered products comprising a layer of synthetic resin
- B32B27/12—Layered products comprising a layer of synthetic resin next to a fibrous or filamentary layer
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/21—Circular sheet or circular blank
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
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- Y10T428/24174—Structurally defined web or sheet [e.g., overall dimension, etc.] including sheet or component perpendicular to plane of web or sheet
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24802—Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.]
- Y10T428/24851—Intermediate layer is discontinuous or differential
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- Engineering & Computer Science (AREA)
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- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Abstract
【解決手段】基板Wの外周部にリテーナリング3を位置させて基板Wを保持する基板保持装置1に用いられる弾性膜4であって、基板Wと当接する当接面42aを有する当接部42と、当接部42の外周端に連接されて上方に延びる第1周壁部44と、第1周壁部44の内側で当接部42に連接されて上方に延び、外側に第1圧力室5が、内側に第2圧力室7がそれぞれ形成される第2周壁部46とを備え、当接部42は、そのほぼ全域に亘って、弾性膜4より剛性の高い補強部材50により補強されている。
【選択図】図3
Description
不織布または織布により弾性膜の当接部を補強する場合、等方的な性状を持つ不織布または織布を使用することが望ましい。また、シート状の樹脂板により弾性膜の当接部を補強する場合、樹脂板の厚さは、1mm以下であることが望ましい。これにより、当接部自体の当接面に沿った変形(伸び)を抑制しつつ、当接部自体の当接面に垂直な方向への変形を極力阻害しないようにすることができる。
これにより、第1周壁部と第2周壁部の少なくとも一方と当接部との間の伸縮性を確保しつつ、第1周壁部と第2周壁部の少なくとも一方を第2補強部材で当接部と分離して補強することができる。
このように、当接部の外周端に配置した第1周壁部の外側面に低摩擦部材を取り付けることにより、弾性膜の当接部の伸びにより第1周壁部とリテーナリングが接触した場合でも、リテーナリングの基板の外周部への押圧力の損失を低減させることができる。
尚、樹脂板50等の補強部材は、弾性膜4の基板Wとの当接面およびリテーナリング3に対峙する外周面(流体圧力をかける面と反対の面)に露出しないように配置する必要がある。弾性膜4の基板Wとの当接面や側壁外周面などの表面に補強部材の繊維等が露出していると繊維等からの発塵が懸念され、また、弾性膜4の表面に露出した繊維等にスラリーが固着し、そのスラリー固着物が基板Wへのスクラッチソースになる可能性があるためである。
このように、弾性膜4gの第1周壁部44の外側面にコーティング皮膜72を形成することで、第1周壁部44の厚みが増加してしまうことを防止することができる。
2 装置本体
3 リテーナリング
4,4a,4b,4c,4d,4e,4f,4g,4h 弾性膜
5 第1圧力室
7 第2圧力室
42 当接部
42a 当接面
44 第1周壁部
46 第2周壁部
50 樹脂板(補強部材)
52,54,56,58 糸状部材(補強部材)
60a,60b 樹脂板(第2補強部材)
62a,62b 糸状部材(第2補強部材)
70 低摩擦部材
72 コーティング皮膜
100 研磨テーブル
101 研磨パッド
101a 研磨面
Claims (16)
- 基板の外周部にリテーナリングを位置させて基板を保持する基板保持装置に用いられる弾性膜であって、
基板と当接する当接面を有する当接部と、
前記当接部の外周端に連接されて上方に延びる第1周壁部と、
前記第1周壁部の内側で前記当接部に連接されて上方に延び、外側に第1圧力室が、内側に第2圧力室がそれぞれ形成される第2周壁部とを備え、
前記当接部は、そのほぼ全域に亘って、弾性膜より剛性の高い補強部材により補強されていることを特徴とする弾性膜。 - 前記当接部は円形で、前記補強部材は、前記当接部のほぼ全域に放射状に配置された糸状部材から成ることを特徴とする請求項1記載の弾性膜。
- 前記当接部は円形で、前記補強部材は、前記当接部のほぼ全域に同心円状に配置された糸状部材から成ることを特徴とする請求項1記載の弾性膜。
- 前記当接部は円形で、前記補強部材は、前記当接部のほぼ全域に渦巻き状に配置された糸状部材から成ることを特徴とする請求項1記載の弾性膜。
- 前記補強部材は、前記当接部のほぼ全域に格子状に配置された糸状部材から成ることを特徴とする請求項1記載の弾性膜。
- 前記補強部材は、前記当接部のほぼ全域に配置された不織布または織布から成ることを特徴とする請求項1記載の弾性膜。
- 前記補強部材は、前記当接部のほぼ全域に配置された樹脂板から成ることを特徴とする請求項1記載の弾性膜。
- 前記当接部には、吸着穴が設けられ、前記補強部材は、前記吸着穴及びその周囲を除く領域に配置されていることを特徴とする請求項1乃至7のいずれかに記載の弾性膜。
- 前記第1周壁部と前記第2周壁部の少なくとも一方は、弾性膜より剛性の高い第2補強部材により補強されていることを特徴とする請求項1乃至8のいずれかに記載の弾性膜。
- 前記第2補強部材は、高さ方向に沿って所定間隔離間して配置された糸状部材から成ることを特徴とする請求項9記載の弾性膜。
- 前記第2補強部材は、コイル状の糸状部材から成ることを特徴とする請求項9記載の弾性膜。
- 前記第2補強部材は、樹脂板、不織布または織布から成ることを特徴とする請求項9記載の弾性膜。
- 前記第1周壁部の外側面に低摩擦部材が取り付けられていることを特徴とする請求項1乃至12のいずれかに記載の弾性膜。
- 前記低摩擦部材は、コーティング皮膜であることを特徴とする請求項13記載の弾性膜。
- 前記コーティング皮膜は、含浸コーティング皮膜であることを特徴とする請求項14記載の弾性膜。
- 前記コーティング皮膜は、フッ素樹脂から成ることを特徴とする請求項14記載の弾性膜。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2011261327A JP5635482B2 (ja) | 2011-11-30 | 2011-11-30 | 弾性膜 |
TW101141747A TWI527700B (zh) | 2011-11-30 | 2012-11-09 | Elastic film |
US13/687,263 US8859070B2 (en) | 2011-11-30 | 2012-11-28 | Elastic membrane |
KR20120137040A KR101495964B1 (ko) | 2011-11-30 | 2012-11-29 | 탄성막 |
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JP2011261327A JP5635482B2 (ja) | 2011-11-30 | 2011-11-30 | 弾性膜 |
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JP2013111717A true JP2013111717A (ja) | 2013-06-10 |
JP2013111717A5 JP2013111717A5 (ja) | 2014-10-16 |
JP5635482B2 JP5635482B2 (ja) | 2014-12-03 |
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JP2011261327A Active JP5635482B2 (ja) | 2011-11-30 | 2011-11-30 | 弾性膜 |
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US (1) | US8859070B2 (ja) |
JP (1) | JP5635482B2 (ja) |
KR (1) | KR101495964B1 (ja) |
TW (1) | TWI527700B (ja) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
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WO2017073318A1 (ja) * | 2015-10-30 | 2017-05-04 | 株式会社Sumco | ウェーハ研磨装置およびこれに用いる研磨ヘッド |
JP2021122896A (ja) * | 2020-02-05 | 2021-08-30 | 三菱電線工業株式会社 | 弾性膜 |
KR20230033605A (ko) | 2021-09-01 | 2023-03-08 | 가부시키가이샤 에바라 세이사꾸쇼 | 탄성막 및 탄성막의 제조 방법 |
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JP6158637B2 (ja) * | 2012-08-28 | 2017-07-05 | 株式会社荏原製作所 | 弾性膜及び基板保持装置 |
USD770990S1 (en) * | 2013-05-15 | 2016-11-08 | Ebara Corporation | Elastic membrane for semiconductor wafer polishing apparatus |
USD808349S1 (en) | 2013-05-15 | 2018-01-23 | Ebara Corporation | Elastic membrane for semiconductor wafer polishing apparatus |
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US20140357161A1 (en) * | 2013-05-31 | 2014-12-04 | Sunedison Semiconductor Limited | Center flex single side polishing head |
EP2910189B1 (en) * | 2014-02-21 | 2016-09-14 | Samsung Electronics Co., Ltd | X-ray grid structure and x-ray apparatus including the same |
KR102110489B1 (ko) * | 2014-03-04 | 2020-05-13 | 주식회사 케이씨텍 | 화학 기계적 연마 장치의 캐리어 헤드의 멤브레인 |
KR20160013461A (ko) * | 2014-07-25 | 2016-02-04 | 삼성전자주식회사 | 캐리어 헤드 및 화학적 기계식 연마 장치 |
US10029346B2 (en) * | 2015-10-16 | 2018-07-24 | Applied Materials, Inc. | External clamp ring for a chemical mechanical polishing carrier head |
CN107813220A (zh) * | 2016-09-13 | 2018-03-20 | 清华大学 | 压力加载膜 |
USD839224S1 (en) | 2016-12-12 | 2019-01-29 | Ebara Corporation | Elastic membrane for semiconductor wafer polishing |
USD859332S1 (en) * | 2017-06-29 | 2019-09-10 | Ebara Corporation | Elastic membrane for semiconductor wafer polishing |
USD918161S1 (en) * | 2017-12-19 | 2021-05-04 | Ebara Corporation | Elastic membrane |
JP7003838B2 (ja) * | 2018-05-17 | 2022-01-21 | 株式会社Sumco | 研磨ヘッド及びこれを用いたウェーハ研磨装置及び研磨方法 |
EP3993951A4 (en) * | 2019-07-01 | 2023-08-09 | Axus Technology, LLC | TEMPERATURE REGULATED SUBSTRATE HOLDER AND POLISHING COMPONENTS |
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JP4515047B2 (ja) | 2003-06-06 | 2010-07-28 | 株式会社荏原製作所 | 弾性膜、基板保持装置、研磨装置、及び研磨方法 |
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JP2009131920A (ja) | 2007-11-29 | 2009-06-18 | Ebara Corp | 研磨装置及び方法 |
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2011
- 2011-11-30 JP JP2011261327A patent/JP5635482B2/ja active Active
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2012
- 2012-11-09 TW TW101141747A patent/TWI527700B/zh active
- 2012-11-28 US US13/687,263 patent/US8859070B2/en active Active
- 2012-11-29 KR KR20120137040A patent/KR101495964B1/ko active IP Right Grant
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2017073318A1 (ja) * | 2015-10-30 | 2017-05-04 | 株式会社Sumco | ウェーハ研磨装置およびこれに用いる研磨ヘッド |
JP2017085045A (ja) * | 2015-10-30 | 2017-05-18 | 株式会社Sumco | ウェーハ研磨装置およびこれに用いる研磨ヘッド |
KR20180056742A (ko) * | 2015-10-30 | 2018-05-29 | 가부시키가이샤 사무코 | 웨이퍼 연마 장치 및 이것에 이용하는 연마 헤드 |
KR102024130B1 (ko) | 2015-10-30 | 2019-09-23 | 가부시키가이샤 사무코 | 웨이퍼 연마 장치 및 이것에 이용하는 연마 헤드 |
US10710209B2 (en) | 2015-10-30 | 2020-07-14 | Sumco Corporation | Wafer polishing apparatus and polishing head used for same |
JP2021122896A (ja) * | 2020-02-05 | 2021-08-30 | 三菱電線工業株式会社 | 弾性膜 |
JP7061144B2 (ja) | 2020-02-05 | 2022-04-27 | 三菱電線工業株式会社 | 弾性膜 |
KR20230033605A (ko) | 2021-09-01 | 2023-03-08 | 가부시키가이샤 에바라 세이사꾸쇼 | 탄성막 및 탄성막의 제조 방법 |
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JP5635482B2 (ja) | 2014-12-03 |
US20130136884A1 (en) | 2013-05-30 |
KR20130061097A (ko) | 2013-06-10 |
TW201341187A (zh) | 2013-10-16 |
US8859070B2 (en) | 2014-10-14 |
TWI527700B (zh) | 2016-04-01 |
KR101495964B1 (ko) | 2015-02-25 |
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