JP2012519271A - ２次元検出器表面におけるナノ粒子の高分解能検出のための方法 - Google Patents

２次元検出器表面におけるナノ粒子の高分解能検出のための方法 Download PDF

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JP2012519271A
JP2012519271A JP2011551477A JP2011551477A JP2012519271A JP 2012519271 A JP2012519271 A JP 2012519271A JP 2011551477 A JP2011551477 A JP 2011551477A JP 2011551477 A JP2011551477 A JP 2011551477A JP 2012519271 A JP2012519271 A JP 2012519271A
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plasmon resonance
sensor surface
resonance spectrometer
surface plasmon
sensor
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JP2012519271A5 (enExample
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ジビン，アレクサンダー
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ライブニッツ−インスティテュート・フュア・アナリティシェ・ビッセンシャフテン−イー・エス・アー・エス−アインゲトラーゲナー・フェライン
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Publication of JP2012519271A publication Critical patent/JP2012519271A/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1429—Signal processing
    • G01N15/1433—Signal processing using image recognition
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0008—Microscopes having a simple construction, e.g. portable microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/008—Details of detection or image processing, including general computer control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N2015/0038—Investigating nanoparticles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/01—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials specially adapted for biological cells, e.g. blood cells
    • G01N2015/019—Biological contaminants; Fouling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons
    • G01N21/554—Attenuated total reflection and using surface plasmons detecting the surface plasmon resonance of nanostructured metals, e.g. localised surface plasmon resonance

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Dispersion Chemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2011551477A 2009-02-27 2010-02-23 ２次元検出器表面におけるナノ粒子の高分解能検出のための方法 Pending JP2012519271A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102009003548.6 2009-02-27
DE102009003548A DE102009003548A1 (de) 2009-02-27 2009-02-27 Verfahren zur hochaufgelösten Erfassung von Nanopartikeln auf zweidimensionalen Messflächen
PCT/EP2010/052229 WO2010097369A1 (de) 2009-02-27 2010-02-23 Verfahren zur hochaufgelösten erfassung von nanopartikeln auf zweidimensionalen messflächen

Publications (2)

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JP2012519271A true JP2012519271A (ja) 2012-08-23
JP2012519271A5 JP2012519271A5 (enExample) 2013-03-21

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JP2011551477A Pending JP2012519271A (ja) 2009-02-27 2010-02-23 ２次元検出器表面におけるナノ粒子の高分解能検出のための方法

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US (1) US8587786B2 (enExample)
EP (1) EP2401602A1 (enExample)
JP (1) JP2012519271A (enExample)
DE (1) DE102009003548A1 (enExample)
WO (1) WO2010097369A1 (enExample)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102009003548A1 (de) 2009-02-27 2010-09-02 Leibniz-Institut für Analytische Wissenschaften-ISAS-e.V. Verfahren zur hochaufgelösten Erfassung von Nanopartikeln auf zweidimensionalen Messflächen
WO2012076640A1 (de) * 2010-12-09 2012-06-14 Fachhochschule Jena Verfahren und anordnung zur bestimmung des brechzahlgradienten eines materials
EP2702392B1 (en) 2011-04-28 2019-10-30 Koninklijke Philips N.V. Evaluating assays with optical inhomogeneities
DE102014202844A1 (de) * 2014-02-17 2015-08-20 Robert Bosch Gmbh Plasmonische Sensorvorrichtung und Verfahren zur Oberflächenplasmonen-Resonanzspektroskopie
DE102017104379A1 (de) 2017-03-02 2018-09-06 Osram Opto Semiconductors Gmbh Optoelektronischer partikelsensor
DE102017116055A1 (de) 2017-07-17 2019-01-17 Leibniz - Institut Für Analytische Wissenschaften - Isas - E.V. Verfahren zur optischen Erfassung einzelner Nanoobjekte
FR3093807B1 (fr) * 2019-03-13 2021-04-16 Myriade Dispositif et procédé pour l’observation de microparticules et de nanoparticules.
US10551313B1 (en) * 2019-04-15 2020-02-04 The Florida International University Board Of Trustees Surface plasmon resonance based mechanical sensing of beating heart cells
CN112557262B (zh) * 2019-09-26 2022-12-09 中国科学院微电子研究所 一种单个纳米颗粒的探测方法及探测装置
FR3139916B1 (fr) * 2022-09-19 2024-09-20 Inst Doptique Graduate School Microscope optique avec résonateur

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JPH10267841A (ja) * 1997-03-24 1998-10-09 Kokuritsu Shintai Shogaisha Rehabilitation Center Souchiyou 表面プラズモン共鳴センシングデバイス
JP2006125860A (ja) * 2004-10-26 2006-05-18 Fujikura Ltd 表面プラズモンセンサ及び表面プラズモン測定装置
JP2006308321A (ja) * 2005-04-26 2006-11-09 Toyobo Co Ltd 表面プラズモン共鳴センサ用チップ
JP2009042112A (ja) * 2007-08-09 2009-02-26 Fujifilm Corp センシング装置およびこれを用いたセンシング方法

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DE4024476C1 (enExample) 1990-08-02 1992-02-27 Boehringer Mannheim Gmbh, 6800 Mannheim, De
DE19615366B4 (de) * 1996-04-19 2006-02-09 Carl Zeiss Jena Gmbh Verfahren und Einrichtung zum Nachweis physikalischer, chemischer, biologischer oder biochemischer Reaktionen und Wechselwirkungen
GB2326229A (en) * 1997-06-13 1998-12-16 Robert Jeffrey Geddes Carr Detecting and analysing submicron particles
JP2003514224A (ja) 1999-11-12 2003-04-15 サーロメッド・インコーポレーテッド 表面プラズモン共鳴を使用するバイオセンシング
DE102004033869B3 (de) 2004-07-13 2006-03-30 Gesellschaft zur Förderung der Spektrochemie und angewandten Spektroskopie e.V. Verfahren zur Bestimmung von Oberflächenplasmonenresonanzen an zweidimensionalen Messflächen
DE102005054495A1 (de) * 2005-11-16 2007-05-24 Mivitec Gmbh Verteilte Sensor- und Referenzspots für Chemo- und Biosensoren
US7233396B1 (en) 2006-04-17 2007-06-19 Alphasniffer Llc Polarization based interferometric detector
DE112008000507T5 (de) * 2007-02-26 2010-02-18 Wisconsin Alumni Research Foundation, Madison Mit Oberflächen-Plasmon-Resonanz kompatible Kohlenstoff-Dünnschichten
DE102009003548A1 (de) 2009-02-27 2010-09-02 Leibniz-Institut für Analytische Wissenschaften-ISAS-e.V. Verfahren zur hochaufgelösten Erfassung von Nanopartikeln auf zweidimensionalen Messflächen

Patent Citations (4)

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JPH10267841A (ja) * 1997-03-24 1998-10-09 Kokuritsu Shintai Shogaisha Rehabilitation Center Souchiyou 表面プラズモン共鳴センシングデバイス
JP2006125860A (ja) * 2004-10-26 2006-05-18 Fujikura Ltd 表面プラズモンセンサ及び表面プラズモン測定装置
JP2006308321A (ja) * 2005-04-26 2006-11-09 Toyobo Co Ltd 表面プラズモン共鳴センサ用チップ
JP2009042112A (ja) * 2007-08-09 2009-02-26 Fujifilm Corp センシング装置およびこれを用いたセンシング方法

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JPN6013051103; Ｇｉｅｂｅｌ　Ｋ　Ｆ　，　ｅｔ．ａｌ．: 'Ｉｍａｇｉｎｇ　ｏｆ　Ｃｅｌｌ／Ｓｕｂｓｔｒａｔｅ　Ｃｏｎｔａｃｔｓ　ｏｆ　Ｌｉｖｉｎｇ　Ｃｅｌｌｓ　ｗｉｔｈ　Ｓｕｒｆａｃｅ　Ｐｌａｓｍｏｎ　Ｒｅｓｏｎａｎｃｅ　Ｍｉｃｒｏｓｃｏｐｙ' Ｂｉｏｐｈｙｓｉｃａｌ　Ｊｏｕｒｎａｌ Ｖｏｌ．７６，　Ｎｏ．１, 199901, ｐｐ．５０９-５１６ *

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Publication number Publication date
US8587786B2 (en) 2013-11-19
DE102009003548A1 (de) 2010-09-02
WO2010097369A1 (de) 2010-09-02
US20110311962A1 (en) 2011-12-22
EP2401602A1 (de) 2012-01-04

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