JP2012519271A5 - - Google Patents
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- Publication number
- JP2012519271A5 JP2012519271A5 JP2011551477A JP2011551477A JP2012519271A5 JP 2012519271 A5 JP2012519271 A5 JP 2012519271A5 JP 2011551477 A JP2011551477 A JP 2011551477A JP 2011551477 A JP2011551477 A JP 2011551477A JP 2012519271 A5 JP2012519271 A5 JP 2012519271A5
- Authority
- JP
- Japan
- Prior art keywords
- sensor surface
- particles
- radiation
- radiation source
- detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 claims 12
- 239000002245 particle Substances 0.000 claims 11
- 230000005855 radiation Effects 0.000 claims 10
- 230000003287 optical effect Effects 0.000 claims 4
- 238000001514 detection method Methods 0.000 claims 3
- 239000002105 nanoparticle Substances 0.000 claims 3
- 238000002198 surface plasmon resonance spectroscopy Methods 0.000 claims 3
- 230000005284 excitation Effects 0.000 claims 2
- 239000013078 crystal Substances 0.000 claims 1
- 230000010460 detection of virus Effects 0.000 claims 1
- 239000011521 glass Substances 0.000 claims 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims 1
- 239000010931 gold Substances 0.000 claims 1
- 229910052737 gold Inorganic materials 0.000 claims 1
- 238000003384 imaging method Methods 0.000 claims 1
- 230000009191 jumping Effects 0.000 claims 1
- 238000005259 measurement Methods 0.000 claims 1
- 239000002082 metal nanoparticle Substances 0.000 claims 1
- 230000000737 periodic effect Effects 0.000 claims 1
- 230000003612 virological effect Effects 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102009003548A DE102009003548A1 (de) | 2009-02-27 | 2009-02-27 | Verfahren zur hochaufgelösten Erfassung von Nanopartikeln auf zweidimensionalen Messflächen |
| DE102009003548.6 | 2009-02-27 | ||
| PCT/EP2010/052229 WO2010097369A1 (de) | 2009-02-27 | 2010-02-23 | Verfahren zur hochaufgelösten erfassung von nanopartikeln auf zweidimensionalen messflächen |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2012519271A JP2012519271A (ja) | 2012-08-23 |
| JP2012519271A5 true JP2012519271A5 (enExample) | 2013-03-21 |
Family
ID=42111598
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011551477A Pending JP2012519271A (ja) | 2009-02-27 | 2010-02-23 | ２次元検出器表面におけるナノ粒子の高分解能検出のための方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8587786B2 (enExample) |
| EP (1) | EP2401602A1 (enExample) |
| JP (1) | JP2012519271A (enExample) |
| DE (1) | DE102009003548A1 (enExample) |
| WO (1) | WO2010097369A1 (enExample) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102009003548A1 (de) | 2009-02-27 | 2010-09-02 | Leibniz-Institut für Analytische Wissenschaften-ISAS-e.V. | Verfahren zur hochaufgelösten Erfassung von Nanopartikeln auf zweidimensionalen Messflächen |
| DE102011087978A1 (de) * | 2010-12-09 | 2012-07-05 | Fachhochschule Jena | Verfahren und Anordnung zur Bestimmung des Brechzahlgradienten eines Materials |
| CN103620392B (zh) * | 2011-04-28 | 2017-05-17 | 皇家飞利浦有限公司 | 具有光学不均匀性的测定的评估方法及装置 |
| DE102014202844A1 (de) * | 2014-02-17 | 2015-08-20 | Robert Bosch Gmbh | Plasmonische Sensorvorrichtung und Verfahren zur Oberflächenplasmonen-Resonanzspektroskopie |
| DE102017104379A1 (de) | 2017-03-02 | 2018-09-06 | Osram Opto Semiconductors Gmbh | Optoelektronischer partikelsensor |
| DE102017116055A1 (de) | 2017-07-17 | 2019-01-17 | Leibniz - Institut Für Analytische Wissenschaften - Isas - E.V. | Verfahren zur optischen Erfassung einzelner Nanoobjekte |
| FR3093807B1 (fr) * | 2019-03-13 | 2021-04-16 | Myriade | Dispositif et procédé pour l’observation de microparticules et de nanoparticules. |
| US10551313B1 (en) * | 2019-04-15 | 2020-02-04 | The Florida International University Board Of Trustees | Surface plasmon resonance based mechanical sensing of beating heart cells |
| CN112557262B (zh) * | 2019-09-26 | 2022-12-09 | 中国科学院微电子研究所 | 一种单个纳米颗粒的探测方法及探测装置 |
| FR3139916B1 (fr) * | 2022-09-19 | 2024-09-20 | Inst Doptique Graduate School | Microscope optique avec résonateur |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4024476C1 (enExample) | 1990-08-02 | 1992-02-27 | Boehringer Mannheim Gmbh, 6800 Mannheim, De | |
| DE19615366B4 (de) * | 1996-04-19 | 2006-02-09 | Carl Zeiss Jena Gmbh | Verfahren und Einrichtung zum Nachweis physikalischer, chemischer, biologischer oder biochemischer Reaktionen und Wechselwirkungen |
| JPH10267841A (ja) * | 1997-03-24 | 1998-10-09 | Kokuritsu Shintai Shogaisha Rehabilitation Center Souchiyou | 表面プラズモン共鳴センシングデバイス |
| GB2326229A (en) * | 1997-06-13 | 1998-12-16 | Robert Jeffrey Geddes Carr | Detecting and analysing submicron particles |
| WO2001035081A1 (en) | 1999-11-12 | 2001-05-17 | Surromed, Inc. | Biosensing using surface plasmon resonance |
| DE102004033869B3 (de) | 2004-07-13 | 2006-03-30 | Gesellschaft zur Förderung der Spektrochemie und angewandten Spektroskopie e.V. | Verfahren zur Bestimmung von Oberflächenplasmonenresonanzen an zweidimensionalen Messflächen |
| JP2006125860A (ja) * | 2004-10-26 | 2006-05-18 | Fujikura Ltd | 表面プラズモンセンサ及び表面プラズモン測定装置 |
| JP2006308321A (ja) * | 2005-04-26 | 2006-11-09 | Toyobo Co Ltd | 表面プラズモン共鳴センサ用チップ |
| DE102005054495A1 (de) * | 2005-11-16 | 2007-05-24 | Mivitec Gmbh | Verteilte Sensor- und Referenzspots für Chemo- und Biosensoren |
| US7233396B1 (en) | 2006-04-17 | 2007-06-19 | Alphasniffer Llc | Polarization based interferometric detector |
| GB2459604B (en) * | 2007-02-26 | 2011-07-06 | Wisconsin Alumni Res Found | Surface plasmon resonance compatible carbon thin films |
| JP2009042112A (ja) * | 2007-08-09 | 2009-02-26 | Fujifilm Corp | センシング装置およびこれを用いたセンシング方法 |
| DE102009003548A1 (de) | 2009-02-27 | 2010-09-02 | Leibniz-Institut für Analytische Wissenschaften-ISAS-e.V. | Verfahren zur hochaufgelösten Erfassung von Nanopartikeln auf zweidimensionalen Messflächen |
-
2009
- 2009-02-27 DE DE102009003548A patent/DE102009003548A1/de not_active Ceased
-
2010
- 2010-02-23 JP JP2011551477A patent/JP2012519271A/ja active Pending
- 2010-02-23 EP EP10706196A patent/EP2401602A1/de not_active Withdrawn
- 2010-02-23 WO PCT/EP2010/052229 patent/WO2010097369A1/de not_active Ceased
-
2011
- 2011-08-26 US US13/218,804 patent/US8587786B2/en not_active Expired - Fee Related
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