JP2012516739A5 - - Google Patents

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JP2012516739A5
JP2012516739A5 JP2011548673A JP2011548673A JP2012516739A5 JP 2012516739 A5 JP2012516739 A5 JP 2012516739A5 JP 2011548673 A JP2011548673 A JP 2011548673A JP 2011548673 A JP2011548673 A JP 2011548673A JP 2012516739 A5 JP2012516739 A5 JP 2012516739A5
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grating
ray
beam splitter
analyzer
image
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JP2011548673A
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JP2012516739A (ja
JP5606455B2 (ja
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Priority claimed from PCT/EP2010/051291 external-priority patent/WO2010089319A1/en
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JP2011548673A 2009-02-05 2010-02-03 逆投影のためのイメージング装置及びその作動方法 Expired - Fee Related JP5606455B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP09100099.2 2009-02-05
EP09100099 2009-02-05
PCT/EP2010/051291 WO2010089319A1 (en) 2009-02-05 2010-02-03 Low dose single step grating based x-ray phase contrast imaging

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JP2012516739A JP2012516739A (ja) 2012-07-26
JP2012516739A5 true JP2012516739A5 (cg-RX-API-DMAC7.html) 2013-01-31
JP5606455B2 JP5606455B2 (ja) 2014-10-15

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JP2011548673A Expired - Fee Related JP5606455B2 (ja) 2009-02-05 2010-02-03 逆投影のためのイメージング装置及びその作動方法

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US (1) US8972191B2 (cg-RX-API-DMAC7.html)
EP (1) EP2400891B1 (cg-RX-API-DMAC7.html)
JP (1) JP5606455B2 (cg-RX-API-DMAC7.html)
CN (1) CN102325498B (cg-RX-API-DMAC7.html)
AU (1) AU2010210169B2 (cg-RX-API-DMAC7.html)
CA (1) CA2751442C (cg-RX-API-DMAC7.html)
WO (1) WO2010089319A1 (cg-RX-API-DMAC7.html)

Families Citing this family (71)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2821145A1 (en) 2010-12-13 2012-06-21 Paul Scherrer Institut A method and a system for image integration using constrained optimization for phase contrast imaging with an arrangement of gratings
JP2012130586A (ja) * 2010-12-22 2012-07-12 Fujifilm Corp 放射線画像検出装置、放射線撮影装置、及び放射線撮影システム
JP2012157690A (ja) * 2011-01-14 2012-08-23 Fujifilm Corp 放射線画像撮影装置および放射線画像検出器
AU2012264596B2 (en) 2011-06-01 2015-07-30 Total Sa An x-ray tomography device
BR112013030648B1 (pt) * 2011-06-01 2021-08-10 Total Sa Dispositivo de tomografia de raio x
US9117296B2 (en) 2011-07-28 2015-08-25 Paul Scherrer Institut Method for image fusion based on principal component analysis
US20150117599A1 (en) 2013-10-31 2015-04-30 Sigray, Inc. X-ray interferometric imaging system
WO2013111050A1 (en) * 2012-01-24 2013-08-01 Koninklijke Philips N.V. Multi-directional phase contrast x-ray imaging
AU2013224308B2 (en) 2012-02-24 2017-08-03 Paul Scherrer Institut A system for non-invasively classification of different types of micro-calcifications in human tissue
US10578563B2 (en) 2012-12-21 2020-03-03 Carestream Health, Inc. Phase contrast imaging computed tomography scanner
US9357975B2 (en) * 2013-12-30 2016-06-07 Carestream Health, Inc. Large FOV phase contrast imaging based on detuned configuration including acquisition and reconstruction techniques
US10096098B2 (en) 2013-12-30 2018-10-09 Carestream Health, Inc. Phase retrieval from differential phase contrast imaging
KR102060659B1 (ko) * 2013-03-20 2019-12-30 삼성전자주식회사 영상 처리를 위한 투사 및 역투사 방법 및 그 영상 처리 장치
WO2014154188A1 (en) * 2013-03-26 2014-10-02 Institute Of Experimental And Applied Physics Method of phase gradient radiography and arrangement of an imaging system for application of the method
CN103164863B (zh) * 2013-04-02 2016-03-02 中国科学院高能物理研究所 用于重建正电子发射计算机断层成像图像的方法
WO2014180901A1 (de) 2013-05-10 2014-11-13 Siemens Aktiengesellschaft Phasenkontrast-röntgenbildgebungsvorrichtung und brechungsgitter für eine solche
EP2999409B1 (de) 2013-05-22 2017-09-13 Siemens Healthcare GmbH Phasenkontrast-röntgenbildgebungsvorrichtung
US10269528B2 (en) 2013-09-19 2019-04-23 Sigray, Inc. Diverging X-ray sources using linear accumulation
US10297359B2 (en) 2013-09-19 2019-05-21 Sigray, Inc. X-ray illumination system with multiple target microstructures
US10416099B2 (en) 2013-09-19 2019-09-17 Sigray, Inc. Method of performing X-ray spectroscopy and X-ray absorption spectrometer system
US10295485B2 (en) 2013-12-05 2019-05-21 Sigray, Inc. X-ray transmission spectrometer system
USRE48612E1 (en) 2013-10-31 2021-06-29 Sigray, Inc. X-ray interferometric imaging system
US10304580B2 (en) 2013-10-31 2019-05-28 Sigray, Inc. Talbot X-ray microscope
US9719947B2 (en) * 2013-10-31 2017-08-01 Sigray, Inc. X-ray interferometric imaging system
JP2015118081A (ja) * 2013-11-12 2015-06-25 キヤノン株式会社 放射線検出システムおよび放射線撮像装置
EP3105763B1 (en) * 2014-02-14 2019-09-11 Canon Kabushiki Kaisha X-ray talbot interferometer and x-ray talbot interferometer system
EP3129813B1 (en) * 2014-04-09 2020-06-03 Rambus Inc. Low-power image change detector
CN103900502B (zh) * 2014-04-16 2017-01-04 中国科学技术大学 基于x射线几何投影莫尔条纹的精密位移测量装置及方法
US10401309B2 (en) 2014-05-15 2019-09-03 Sigray, Inc. X-ray techniques using structured illumination
CN107076682B (zh) * 2014-05-15 2021-02-02 斯格瑞公司 用于测量、表征和分析周期性结构的x射线方法
JP2016106721A (ja) * 2014-12-03 2016-06-20 キヤノン株式会社 画像処理装置および画像処理方法
US10352880B2 (en) 2015-04-29 2019-07-16 Sigray, Inc. Method and apparatus for x-ray microscopy
WO2016207423A1 (en) * 2015-06-26 2016-12-29 Koninklijke Philips N.V. Robust reconstruction for dark-field and phase contrast ct
US10295486B2 (en) 2015-08-18 2019-05-21 Sigray, Inc. Detector for X-rays with high spatial and high spectral resolution
CN115047511B (zh) * 2015-09-24 2025-07-29 棱镜传感器公司 模块化的x射线检测器
CN105675631A (zh) * 2016-01-05 2016-06-15 合肥泰禾光电科技股份有限公司 一种快速扇束几何相位衬度ct成像装置和方法
CN107807139B (zh) * 2016-09-05 2020-04-24 天津工业大学 一种无步进装置的双能x射线相衬成像系统及其实现方法
US10247683B2 (en) 2016-12-03 2019-04-02 Sigray, Inc. Material measurement techniques using multiple X-ray micro-beams
CN106618623B (zh) * 2017-01-11 2019-08-30 合肥工业大学 一次曝光的硬x射线光栅干涉仪的成像方法
US10598612B2 (en) 2017-02-01 2020-03-24 Washington University Single-shot method for edge illumination X-ray phase-contrast tomography
JP6943090B2 (ja) * 2017-09-05 2021-09-29 株式会社島津製作所 X線イメージング装置
EP3494885A1 (en) * 2017-12-07 2019-06-12 Koninklijke Philips N.V. Apparatus for presentation of dark field x-ray image information
US10578566B2 (en) 2018-04-03 2020-03-03 Sigray, Inc. X-ray emission spectrometer system
DE112019002822T5 (de) 2018-06-04 2021-02-18 Sigray, Inc. Wellenlängendispersives röntgenspektrometer
US10658145B2 (en) 2018-07-26 2020-05-19 Sigray, Inc. High brightness x-ray reflection source
US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
DE112019004433B4 (de) 2018-09-04 2024-09-12 Sigray, Inc. System und verfahren für röntgenstrahlfluoreszenz mit filterung
DE112019004478T5 (de) 2018-09-07 2021-07-08 Sigray, Inc. System und verfahren zur röntgenanalyse mit wählbarer tiefe
CN110095481B (zh) * 2019-05-24 2021-03-05 清华大学 X射线光栅成像系统与成像方法
US11143605B2 (en) 2019-09-03 2021-10-12 Sigray, Inc. System and method for computed laminography x-ray fluorescence imaging
CN110916712B (zh) * 2019-11-29 2022-04-29 清华大学 光栅成像系统及其扫描方法
CN110916713B (zh) * 2019-11-29 2022-04-29 清华大学 光栅成像系统及其扫描方法
NL2024368B1 (en) * 2019-12-03 2021-08-31 Xeikon Prepress Nv Method and system for processing a raster image file
US11175243B1 (en) 2020-02-06 2021-11-16 Sigray, Inc. X-ray dark-field in-line inspection for semiconductor samples
JP7395775B2 (ja) 2020-05-18 2023-12-11 シグレイ、インコーポレイテッド 結晶解析装置及び複数の検出器素子を使用するx線吸収分光法のためのシステム及び方法
WO2022061347A1 (en) 2020-09-17 2022-03-24 Sigray, Inc. System and method using x-rays for depth-resolving metrology and analysis
DE112021006348T5 (de) 2020-12-07 2023-09-21 Sigray, Inc. 3d-röntgenbildgebungssystem mit hohem durchsatz, das eine transmissionsröntgenquelle verwendet
US12480892B2 (en) 2020-12-07 2025-11-25 Sigray, Inc. High throughput 3D x-ray imaging system using a transmission x-ray source
CN112568923B (zh) * 2020-12-10 2022-08-19 中国科学院深圳先进技术研究院 X射线相位衬度图像提取方法、装置、终端及存储介质
CN113237901A (zh) * 2021-05-07 2021-08-10 中国科学院上海应用物理研究所 一种生物特征识别系统及生物特征识别方法
CN114137002B (zh) * 2021-11-18 2023-07-14 北京航空航天大学 一种基于衬度间增强的低剂量x射线差分相位衬度成像方法
US12360067B2 (en) 2022-03-02 2025-07-15 Sigray, Inc. X-ray fluorescence system and x-ray source with electrically insulative target material
DE112023001408T5 (de) 2022-03-15 2025-02-13 Sigray, Inc. System und verfahren für die kompakte laminographie unter verwendung einer mikrofokus-transmissionsröntgenquelle und eines röntgendetektors mit variabler vergrösserung
DE112023002079T5 (de) 2022-05-02 2025-02-27 Sigray, Inc. Sequenzielles wellenlängendispersives röntgenspektrometer
CN115684222B (zh) * 2022-12-21 2023-04-11 济南汉江光电科技有限公司 一种快速低剂量的x射线多模态ct系统及成像方法
WO2024173256A1 (en) 2023-02-16 2024-08-22 Sigray, Inc. X-ray detector system with at least two stacked flat bragg diffractors
US12181423B1 (en) 2023-09-07 2024-12-31 Sigray, Inc. Secondary image removal using high resolution x-ray transmission sources
US12429437B2 (en) 2023-11-07 2025-09-30 Sigray, Inc. System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes
US12429436B2 (en) 2024-01-08 2025-09-30 Sigray, Inc. X-ray analysis system with focused x-ray beam and non-x-ray microscope
US12431256B2 (en) 2024-02-15 2025-09-30 Sigray, Inc. System and method for generating a focused x-ray beam
CN119228625B (zh) * 2024-12-02 2025-07-15 沐曦集成电路(上海)股份有限公司 光栅模块验证方法、装置、设备、存储介质和程序产品

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000098449A (ja) 1998-09-21 2000-04-07 Canon Inc 露出制御装置及び露出制御方法及び電子カメラ
JP2003135438A (ja) 2001-11-02 2003-05-13 Fuji Photo Film Co Ltd 画像生成方法および装置並びにプログラム
JP2004203066A (ja) 2002-12-24 2004-07-22 Kobe Steel Ltd 自動車のバンパー装置
WO2006045439A2 (en) 2004-10-22 2006-05-04 Paul Scherrer Institut A system and a method for generating periodic and/or quasi-periodic pattern on a sample
EP1731099A1 (en) * 2005-06-06 2006-12-13 Paul Scherrer Institut Interferometer for quantitative phase contrast imaging and tomography with an incoherent polychromatic x-ray source
DE102006017290B4 (de) 2006-02-01 2017-06-22 Siemens Healthcare Gmbh Fokus/Detektor-System einer Röntgenapparatur, Röntgen-System und Verfahren zur Erzeugung von Phasenkontrastaufnahmen
DE102006037281A1 (de) * 2006-02-01 2007-08-09 Siemens Ag Röntgenoptisches Durchstrahlungsgitter einer Fokus-Detektor-Anordnung einer Röntgenapparatur zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen von einem Untersuchungsobjekt
CN101011250B (zh) * 2006-02-01 2011-07-06 西门子公司 X射线设备的用于产生相位对比照片的焦点-检测器装置
DE102006063048B3 (de) 2006-02-01 2018-03-29 Siemens Healthcare Gmbh Fokus/Detektor-System einer Röntgenapparatur zur Erzeugung von Phasenkontrastaufnahmen
EP1879020A1 (en) * 2006-07-12 2008-01-16 Paul Scherrer Institut X-ray interferometer for phase contrast imaging
JP5273955B2 (ja) * 2007-06-26 2013-08-28 株式会社日立製作所 X線撮像装置及びx線撮像方法
WO2009076700A1 (en) * 2007-12-14 2009-06-25 Commonwealth Scientific And Industrial Research Organisation Phase-contrast imaging method and apparatus
US7949095B2 (en) * 2009-03-02 2011-05-24 University Of Rochester Methods and apparatus for differential phase-contrast fan beam CT, cone-beam CT and hybrid cone-beam CT
US8760817B2 (en) * 2009-05-22 2014-06-24 HGST Netherlands B.V. Three-terminal design for spin accumulation magnetic sensor

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