JP2012242106A5 - - Google Patents

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Publication number
JP2012242106A5
JP2012242106A5 JP2011109243A JP2011109243A JP2012242106A5 JP 2012242106 A5 JP2012242106 A5 JP 2012242106A5 JP 2011109243 A JP2011109243 A JP 2011109243A JP 2011109243 A JP2011109243 A JP 2011109243A JP 2012242106 A5 JP2012242106 A5 JP 2012242106A5
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Japan
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JP2011109243A
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English (en)
Japanese (ja)
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JP2012242106A (ja
JP5714410B2 (ja
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Priority claimed from JP2011109243A external-priority patent/JP5714410B2/ja
Priority to JP2011109243A priority Critical patent/JP5714410B2/ja
Priority to EP12785409.9A priority patent/EP2711716B1/en
Priority to CN201280023931.2A priority patent/CN103547928B/zh
Priority to US14/117,723 priority patent/US9696331B2/en
Priority to PCT/JP2012/062408 priority patent/WO2012157642A1/ja
Publication of JP2012242106A publication Critical patent/JP2012242106A/ja
Publication of JP2012242106A5 publication Critical patent/JP2012242106A5/ja
Publication of JP5714410B2 publication Critical patent/JP5714410B2/ja
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JP2011109243A 2011-05-16 2011-05-16 自動分析装置及び方法 Active JP5714410B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2011109243A JP5714410B2 (ja) 2011-05-16 2011-05-16 自動分析装置及び方法
PCT/JP2012/062408 WO2012157642A1 (ja) 2011-05-16 2012-05-15 自動分析装置及び方法
CN201280023931.2A CN103547928B (zh) 2011-05-16 2012-05-15 自动分析装置以及方法
US14/117,723 US9696331B2 (en) 2011-05-16 2012-05-15 Automatic analytical device and method
EP12785409.9A EP2711716B1 (en) 2011-05-16 2012-05-15 Automatic analytical device and method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011109243A JP5714410B2 (ja) 2011-05-16 2011-05-16 自動分析装置及び方法

Publications (3)

Publication Number Publication Date
JP2012242106A JP2012242106A (ja) 2012-12-10
JP2012242106A5 true JP2012242106A5 (enExample) 2014-01-23
JP5714410B2 JP5714410B2 (ja) 2015-05-07

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Family Applications (1)

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JP2011109243A Active JP5714410B2 (ja) 2011-05-16 2011-05-16 自動分析装置及び方法

Country Status (5)

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US (1) US9696331B2 (enExample)
EP (1) EP2711716B1 (enExample)
JP (1) JP5714410B2 (enExample)
CN (1) CN103547928B (enExample)
WO (1) WO2012157642A1 (enExample)

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JP2015087329A (ja) * 2013-10-31 2015-05-07 シスメックス株式会社 吸引部の位置調整方法及び検体処理装置
EP2977767B1 (de) * 2014-07-21 2021-08-25 Siemens Healthcare Diagnostics Products GmbH Vorrichtung zur Positionsbestimmung einer automatisch verfahrbaren Lehre
CN104535512B (zh) * 2014-12-15 2017-04-12 哈尔滨工程大学 一种可实现多种液体物理组合透射吸收光谱测试的装置
JP6858204B2 (ja) * 2016-05-12 2021-04-14 シーメンス・ヘルスケア・ダイアグノスティックス・インコーポレーテッドＳｉｅｍｅｎｓ Ｈｅａｌｔｈｃａｒｅ Ｄｉａｇｎｏｓｔｉｃｓ Ｉｎｃ． 臨床分析装置のプローブクラッシュ検出機構及び方法
CN105865807B (zh) * 2016-06-01 2018-04-13 杭州电子科技大学 一种汽车座椅水平驱动器自动夹装故障检测机构
CN111279202B (zh) 2018-02-28 2023-09-12 株式会社日立高新技术 自动分析装置
US11506677B2 (en) 2018-12-21 2022-11-22 Opentrons LabWorks Inc. Systems and methods for pipette robots
JP7309637B2 (ja) * 2020-03-09 2023-07-18 株式会社日立ハイテク 自動分析装置
CN111484921B (zh) * 2020-04-26 2023-07-28 广东康盾创新产业集团股份公司 一种细胞质控装置
WO2022040598A1 (en) * 2020-08-21 2022-02-24 Beckman Coulter, Inc. Systems and methods for framing workspaces of robotic fluid handling systems
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CN116806314A (zh) * 2021-03-16 2023-09-26 株式会社日立高新技术 自动分析装置
WO2023120088A1 (ja) * 2021-12-24 2023-06-29 株式会社日立ハイテク 自動分析装置およびその制御方法
DE102022103659A1 (de) * 2022-02-16 2023-08-17 Agilent Technologies, Inc. Rotierbar gelagerte Probennadel für Analysegerät
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JPWO2024150570A1 (enExample) * 2023-01-13 2024-07-18
EP4528282A1 (en) * 2023-09-20 2025-03-26 Tecan Trading AG Pipette tip positioning with guiding frame
WO2025239054A1 (ja) * 2024-05-17 2025-11-20 株式会社日立ハイテク 自動分析装置

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JP6029971B2 (ja) * 2012-12-21 2016-11-24 シスメックス株式会社 検体分析装置およびピアサーの位置調整方法

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