CN103547928B - 自动分析装置以及方法 - Google Patents

自动分析装置以及方法 Download PDF

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Publication number
CN103547928B
CN103547928B CN201280023931.2A CN201280023931A CN103547928B CN 103547928 B CN103547928 B CN 103547928B CN 201280023931 A CN201280023931 A CN 201280023931A CN 103547928 B CN103547928 B CN 103547928B
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China
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mentioned
dispensing probe
point
drive shaft
contact
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CN201280023931.2A
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English (en)
Chinese (zh)
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CN103547928A (zh
Inventor
平野匡章
中村和弘
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Hitachi High Tech Corp
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Hitachi High Technologies Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N35/1009—Characterised by arrangements for controlling the aspiration or dispense of liquids
    • G01N35/1011—Control of the position or alignment of the transfer device

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
CN201280023931.2A 2011-05-16 2012-05-15 自动分析装置以及方法 Active CN103547928B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2011109243A JP5714410B2 (ja) 2011-05-16 2011-05-16 自動分析装置及び方法
JP2011-109243 2011-05-16
PCT/JP2012/062408 WO2012157642A1 (ja) 2011-05-16 2012-05-15 自動分析装置及び方法

Publications (2)

Publication Number Publication Date
CN103547928A CN103547928A (zh) 2014-01-29
CN103547928B true CN103547928B (zh) 2016-09-21

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201280023931.2A Active CN103547928B (zh) 2011-05-16 2012-05-15 自动分析装置以及方法

Country Status (5)

Country Link
US (1) US9696331B2 (enExample)
EP (1) EP2711716B1 (enExample)
JP (1) JP5714410B2 (enExample)
CN (1) CN103547928B (enExample)
WO (1) WO2012157642A1 (enExample)

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JP2015087329A (ja) * 2013-10-31 2015-05-07 シスメックス株式会社 吸引部の位置調整方法及び検体処理装置
EP2977767B1 (de) * 2014-07-21 2021-08-25 Siemens Healthcare Diagnostics Products GmbH Vorrichtung zur Positionsbestimmung einer automatisch verfahrbaren Lehre
CN104535512B (zh) * 2014-12-15 2017-04-12 哈尔滨工程大学 一种可实现多种液体物理组合透射吸收光谱测试的装置
JP6858204B2 (ja) * 2016-05-12 2021-04-14 シーメンス・ヘルスケア・ダイアグノスティックス・インコーポレーテッドＳｉｅｍｅｎｓ Ｈｅａｌｔｈｃａｒｅ Ｄｉａｇｎｏｓｔｉｃｓ Ｉｎｃ． 臨床分析装置のプローブクラッシュ検出機構及び方法
CN105865807B (zh) * 2016-06-01 2018-04-13 杭州电子科技大学 一种汽车座椅水平驱动器自动夹装故障检测机构
CN111279202B (zh) * 2018-02-28 2023-09-12 株式会社日立高新技术 自动分析装置
US11506677B2 (en) 2018-12-21 2022-11-22 Opentrons LabWorks Inc. Systems and methods for pipette robots
JP7309637B2 (ja) * 2020-03-09 2023-07-18 株式会社日立ハイテク 自動分析装置
CN111484921B (zh) * 2020-04-26 2023-07-28 广东康盾创新产业集团股份公司 一种细胞质控装置
WO2022040598A1 (en) * 2020-08-21 2022-02-24 Beckman Coulter, Inc. Systems and methods for framing workspaces of robotic fluid handling systems
EP4270014A4 (en) * 2020-12-24 2025-02-12 Hitachi High-Tech Corporation AUTOMATIC ANALYSIS DEVICE, POSITION ADJUSTMENT JIG AND POSITION ADJUSTMENT METHOD
WO2022196272A1 (ja) * 2021-03-16 2022-09-22 株式会社日立ハイテク 自動分析装置
WO2023120088A1 (ja) * 2021-12-24 2023-06-29 株式会社日立ハイテク 自動分析装置およびその制御方法
DE102022103659A1 (de) * 2022-02-16 2023-08-17 Agilent Technologies, Inc. Rotierbar gelagerte Probennadel für Analysegerät
WO2023175960A1 (ja) * 2022-03-18 2023-09-21 株式会社日立ハイテク 電気泳動装置
WO2024150570A1 (ja) * 2023-01-13 2024-07-18 株式会社日立ハイテク 自動分析装置
EP4528282A1 (en) * 2023-09-20 2025-03-26 Tecan Trading AG Pipette tip positioning with guiding frame
WO2025239054A1 (ja) * 2024-05-17 2025-11-20 株式会社日立ハイテク 自動分析装置

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JP2003322656A (ja) * 2002-03-29 2003-11-14 Ortho-Clinical Diagnostics Inc 臨床分析機の校正方法および臨床分析機のディスペンサーの自動整合方法
JP2007285957A (ja) * 2006-04-19 2007-11-01 Toshiba Corp 自動分析装置及びその停止位置設定方法
CN101308155A (zh) * 2007-03-14 2008-11-19 奥索临床诊断有限公司 机械臂校准
JP2008256566A (ja) * 2007-04-05 2008-10-23 Olympus Corp 分注装置および自動分析装置
CN101526542A (zh) * 2008-03-04 2009-09-09 希森美康株式会社 标本分析仪及其控制系统
JP2009300152A (ja) * 2008-06-11 2009-12-24 Hitachi High-Technologies Corp 自動分析装置

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Also Published As

Publication number Publication date
EP2711716A1 (en) 2014-03-26
US20140093426A1 (en) 2014-04-03
CN103547928A (zh) 2014-01-29
US9696331B2 (en) 2017-07-04
EP2711716B1 (en) 2017-08-23
EP2711716A4 (en) 2014-10-29
JP5714410B2 (ja) 2015-05-07
WO2012157642A1 (ja) 2012-11-22
JP2012242106A (ja) 2012-12-10

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