JP2012215499A5 - - Google Patents

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Publication number
JP2012215499A5
JP2012215499A5 JP2011081807A JP2011081807A JP2012215499A5 JP 2012215499 A5 JP2012215499 A5 JP 2012215499A5 JP 2011081807 A JP2011081807 A JP 2011081807A JP 2011081807 A JP2011081807 A JP 2011081807A JP 2012215499 A5 JP2012215499 A5 JP 2012215499A5
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JP
Japan
Prior art keywords
magnetic field
gas cell
measured
measurement unit
measurement
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JP2011081807A
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English (en)
Japanese (ja)
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JP5799553B2 (ja
JP2012215499A (ja
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Priority to JP2011081807A priority Critical patent/JP5799553B2/ja
Priority claimed from JP2011081807A external-priority patent/JP5799553B2/ja
Priority to US13/434,972 priority patent/US9024634B2/en
Publication of JP2012215499A publication Critical patent/JP2012215499A/ja
Publication of JP2012215499A5 publication Critical patent/JP2012215499A5/ja
Priority to US14/602,635 priority patent/US9958514B2/en
Application granted granted Critical
Publication of JP5799553B2 publication Critical patent/JP5799553B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2011081807A 2011-04-01 2011-04-01 磁場測定装置、磁場測定システムおよび磁場測定方法 Expired - Fee Related JP5799553B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2011081807A JP5799553B2 (ja) 2011-04-01 2011-04-01 磁場測定装置、磁場測定システムおよび磁場測定方法
US13/434,972 US9024634B2 (en) 2011-04-01 2012-03-30 Magnetic field measurement apparatus, magnetic field measurement system and magnetic field measurement method
US14/602,635 US9958514B2 (en) 2011-04-01 2015-01-22 Magnetic field measurement apparatus, magnetic field measurement system and magnetic field measurement method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011081807A JP5799553B2 (ja) 2011-04-01 2011-04-01 磁場測定装置、磁場測定システムおよび磁場測定方法

Related Child Applications (1)

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JP2015167070A Division JP2015212715A (ja) 2015-08-26 2015-08-26 磁場測定装置、磁場測定システムおよび磁場測定方法

Publications (3)

Publication Number Publication Date
JP2012215499A JP2012215499A (ja) 2012-11-08
JP2012215499A5 true JP2012215499A5 (enExample) 2014-05-15
JP5799553B2 JP5799553B2 (ja) 2015-10-28

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JP2011081807A Expired - Fee Related JP5799553B2 (ja) 2011-04-01 2011-04-01 磁場測定装置、磁場測定システムおよび磁場測定方法

Country Status (2)

Country Link
US (2) US9024634B2 (enExample)
JP (1) JP5799553B2 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5223794B2 (ja) * 2009-06-26 2013-06-26 セイコーエプソン株式会社 磁気センサー
JP5539099B2 (ja) * 2010-08-13 2014-07-02 キヤノン株式会社 磁気勾配計、および磁気センシング方法
JP6300381B2 (ja) * 2013-12-03 2018-04-04 株式会社日立製作所 磁場計測装置
JP2015143669A (ja) * 2014-01-31 2015-08-06 セイコーエプソン株式会社 磁場計測装置
JP2016080613A (ja) * 2014-10-21 2016-05-16 セイコーエプソン株式会社 磁気計測装置、ガスセル、磁気計測装置の製造方法、およびガスセルの製造方法
KR101624482B1 (ko) * 2014-10-24 2016-05-26 한국표준과학연구원 원자 자력계 및 그 동작 방법
JP2017191040A (ja) * 2016-04-14 2017-10-19 セイコーエプソン株式会社 磁場計測装置及び磁場計測方法
JP6825237B2 (ja) * 2016-06-14 2021-02-03 セイコーエプソン株式会社 磁場計測装置、磁場計測装置の製造方法
JP6825241B2 (ja) * 2016-06-21 2021-02-03 セイコーエプソン株式会社 磁場計測装置、磁場計測装置の製造方法
CN111289924B (zh) 2018-12-10 2025-06-17 中科知影(北京)科技有限公司 多通道原子磁探测器

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3214683A (en) * 1960-03-25 1965-10-26 Trw Inc Optically pumped gyromagnetic apparatus
US3243721A (en) * 1962-10-08 1966-03-29 Trw Inc Temperature controlled filter gas cell in gas cell frequency standard
US3513381A (en) * 1967-07-17 1970-05-19 Varian Associates Off-resonant light as a probe of optically pumped alkali vapors
US5189368A (en) * 1976-09-24 1993-02-23 Lockheed Sanders, Inc. Magnetometer
JPS5925726A (ja) * 1982-07-31 1984-02-09 株式会社島津製作所 診断用観測装置
US4788428A (en) * 1985-03-04 1988-11-29 The United States Of America As Represented By The Secretary Of The Navy Thermodynamics infrared imaging sensor
FR2663430B1 (fr) * 1990-06-14 1992-10-02 Commissariat Energie Atomique Magnetometre a resonance et a pompage optique utilisant un faisceau lumineux a polarisation asservie.
US5227722A (en) * 1991-04-08 1993-07-13 Cae Electronics Ltd. Dead-zone free optically pumped MZ magnetometer
JPH0810250B2 (ja) 1991-05-13 1996-01-31 大同ほくさん株式会社 スクイドを用いた磁気雑音除去装置
JP4218128B2 (ja) 1999-05-20 2009-02-04 株式会社島津製作所 磁気遮蔽装置
US6295834B1 (en) * 1999-06-30 2001-10-02 Medi-Physics, Inc. NMR polarization monitoring coils, hyperpolarizers with same, and methods for determining the polarization level of accumulated hyperpolarized noble gases during production
JP2001051035A (ja) 1999-08-10 2001-02-23 Kansai Research Institute 磁界検出装置
JP4377566B2 (ja) 2002-05-16 2009-12-02 特許機器株式会社 アクティブ磁場キャンセラ
JP2007170880A (ja) 2005-12-20 2007-07-05 Yokogawa Electric Corp 磁場検出装置
WO2008127720A2 (en) * 2007-04-13 2008-10-23 University Of Florida Research Foundation, Inc. Atomic magnetometer sensor array magnetoencephalogram systems and methods
JP4919873B2 (ja) 2007-05-10 2012-04-18 株式会社竹中工務店 磁気シールド装置
JP5178187B2 (ja) * 2007-12-28 2013-04-10 キヤノン株式会社 原子磁気センサ、及び磁気センシング方法
JP5264242B2 (ja) * 2008-03-26 2013-08-14 キヤノン株式会社 原子磁力計及び磁力計測方法
JP5375279B2 (ja) * 2008-06-18 2013-12-25 セイコーエプソン株式会社 原子発振器
US8237514B2 (en) * 2009-02-06 2012-08-07 Seiko Epson Corporation Quantum interference device, atomic oscillator, and magnetic sensor
JP5223794B2 (ja) * 2009-06-26 2013-06-26 セイコーエプソン株式会社 磁気センサー
JP5640335B2 (ja) * 2009-06-26 2014-12-17 セイコーエプソン株式会社 磁気センサー
JP2011051035A (ja) 2009-08-31 2011-03-17 Seiko Epson Corp ロボット用信号伝達装置およびそれを備えたロボット
JP5655647B2 (ja) * 2011-03-14 2015-01-21 セイコーエプソン株式会社 ガスセルユニット、原子発振器および電子装置
JP2012191138A (ja) * 2011-03-14 2012-10-04 Seiko Epson Corp ガスセルユニット、原子発振器および電子装置
JP2013030513A (ja) * 2011-07-26 2013-02-07 Seiko Epson Corp ガスセルユニットおよび原子発振器

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