JP2012160247A5 - - Google Patents
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- Publication number
- JP2012160247A5 JP2012160247A5 JP2011182321A JP2011182321A JP2012160247A5 JP 2012160247 A5 JP2012160247 A5 JP 2012160247A5 JP 2011182321 A JP2011182321 A JP 2011182321A JP 2011182321 A JP2011182321 A JP 2011182321A JP 2012160247 A5 JP2012160247 A5 JP 2012160247A5
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- JP
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- Prior art keywords
- wiring
- transistor
- electrically connected
- source
- drain
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 239000004065 semiconductor Substances 0.000 claims 11
- 239000003990 capacitor Substances 0.000 claims 4
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011182321A JP5774413B2 (ja) | 2010-08-26 | 2011-08-24 | 半導体装置の駆動方法 |
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010189587 | 2010-08-26 | ||
| JP2010189587 | 2010-08-26 | ||
| JP2011005766 | 2011-01-14 | ||
| JP2011005766 | 2011-01-14 | ||
| JP2011182321A JP5774413B2 (ja) | 2010-08-26 | 2011-08-24 | 半導体装置の駆動方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2012160247A JP2012160247A (ja) | 2012-08-23 |
| JP2012160247A5 true JP2012160247A5 (enExample) | 2014-09-25 |
| JP5774413B2 JP5774413B2 (ja) | 2015-09-09 |
Family
ID=45697090
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011182321A Expired - Fee Related JP5774413B2 (ja) | 2010-08-26 | 2011-08-24 | 半導体装置の駆動方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8339837B2 (enExample) |
| JP (1) | JP5774413B2 (enExample) |
| KR (1) | KR101903785B1 (enExample) |
| CN (1) | CN102385929B (enExample) |
| TW (1) | TWI539609B (enExample) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101851817B1 (ko) | 2010-09-03 | 2018-04-24 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 구동 방법 |
| JP2013137853A (ja) | 2011-12-02 | 2013-07-11 | Semiconductor Energy Lab Co Ltd | 記憶装置および記憶装置の駆動方法 |
| JP6012450B2 (ja) | 2011-12-23 | 2016-10-25 | 株式会社半導体エネルギー研究所 | 半導体装置の駆動方法 |
| WO2014142043A1 (en) * | 2013-03-14 | 2014-09-18 | Semiconductor Energy Laboratory Co., Ltd. | Method for driving semiconductor device and semiconductor device |
| CN104299651B (zh) * | 2013-07-16 | 2017-06-06 | 上海华虹宏力半导体制造有限公司 | 闪存的位线选择管电路 |
| CN105960633B (zh) * | 2014-02-07 | 2020-06-19 | 株式会社半导体能源研究所 | 半导体装置、装置及电子设备 |
| KR102367921B1 (ko) | 2014-03-14 | 2022-02-25 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 회로 시스템 |
| WO2018158650A1 (ja) * | 2017-03-03 | 2018-09-07 | 株式会社半導体エネルギー研究所 | 半導体装置、および半導体装置の駆動方法 |
| WO2019102293A1 (en) * | 2017-11-24 | 2019-05-31 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and dynamic logic circuit |
| US11158371B2 (en) * | 2017-12-27 | 2021-10-26 | Semiconductor Energy Laboratory Co., Ltd. | Memory device |
| JP2019164868A (ja) * | 2018-03-20 | 2019-09-26 | 東芝メモリ株式会社 | 半導体記憶装置 |
| KR20240152426A (ko) | 2018-03-29 | 2024-10-21 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 기억 장치 및 전자 기기 |
| US11167375B2 (en) | 2018-08-10 | 2021-11-09 | The Research Foundation For The State University Of New York | Additive manufacturing processes and additively manufactured products |
| CN109887536A (zh) * | 2019-02-13 | 2019-06-14 | 上海新储集成电路有限公司 | 一种非易失性存储单元结构 |
| US10872666B2 (en) * | 2019-02-22 | 2020-12-22 | Micron Technology, Inc. | Source line management for memory cells with floating gates |
| WO2021041567A1 (en) | 2019-08-28 | 2021-03-04 | Micron Technology, Inc. | Memory device having 2-transistor memory cell and access line plate |
| CN114303241B (zh) * | 2019-08-28 | 2025-11-18 | 美光科技公司 | 具有双晶体管垂直存储器单元及共享沟道区域的存储器装置 |
| CN118251010B (zh) * | 2024-05-11 | 2025-02-28 | 北京超弦存储器研究院 | 半导体器件及其制造方法、电子设备 |
Family Cites Families (27)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6034199B2 (ja) | 1980-12-20 | 1985-08-07 | 株式会社東芝 | 半導体記憶装置 |
| EP0053878B1 (en) | 1980-12-08 | 1985-08-14 | Kabushiki Kaisha Toshiba | Semiconductor memory device |
| JPS6257245A (ja) * | 1985-09-06 | 1987-03-12 | Nec Corp | 半導体メモリセル |
| JP4103968B2 (ja) | 1996-09-18 | 2008-06-18 | 株式会社半導体エネルギー研究所 | 絶縁ゲイト型半導体装置 |
| US6016268A (en) * | 1997-02-18 | 2000-01-18 | Richard Mann | Three transistor multi-state dynamic memory cell for embedded CMOS logic applications |
| JP2000113683A (ja) * | 1998-10-02 | 2000-04-21 | Hitachi Ltd | 半導体装置 |
| JP2001093988A (ja) * | 1999-07-22 | 2001-04-06 | Sony Corp | 半導体記憶装置 |
| JP2001053167A (ja) * | 1999-08-04 | 2001-02-23 | Sony Corp | 半導体記憶装置 |
| JP2001093989A (ja) * | 1999-09-22 | 2001-04-06 | Sony Corp | 半導体装置 |
| DE10125800B4 (de) * | 2001-05-26 | 2006-11-02 | Infineon Technologies Ag | Speicherbaustein mit einer Speicherzelle und Verfahren zur Herstellung eines Speicherbausteins |
| US6982897B2 (en) * | 2003-10-07 | 2006-01-03 | International Business Machines Corporation | Nondestructive read, two-switch, single-charge-storage device RAM devices |
| US7088606B2 (en) * | 2004-03-10 | 2006-08-08 | Altera Corporation | Dynamic RAM storage techniques |
| JP5781720B2 (ja) | 2008-12-15 | 2015-09-24 | ルネサスエレクトロニクス株式会社 | 半導体装置及び半導体装置の製造方法 |
| KR102321812B1 (ko) | 2009-10-29 | 2021-11-03 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
| WO2011062058A1 (en) | 2009-11-20 | 2011-05-26 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| WO2011062075A1 (en) | 2009-11-20 | 2011-05-26 | Semiconductor Energy Laboratory Co., Ltd. | Nonvolatile latch circuit and logic circuit, and semiconductor device using the same |
| WO2011065183A1 (en) | 2009-11-24 | 2011-06-03 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device including memory cell |
| WO2011065258A1 (en) | 2009-11-27 | 2011-06-03 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| CN105655340B (zh) | 2009-12-18 | 2020-01-21 | 株式会社半导体能源研究所 | 半导体装置 |
| KR101434948B1 (ko) | 2009-12-25 | 2014-08-28 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
| KR101994632B1 (ko) | 2009-12-25 | 2019-07-02 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
| WO2011080998A1 (en) | 2009-12-28 | 2011-07-07 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| CN102656691B (zh) | 2009-12-28 | 2015-07-29 | 株式会社半导体能源研究所 | 存储器装置和半导体装置 |
| EP2519969A4 (en) | 2009-12-28 | 2016-07-06 | Semiconductor Energy Lab | SEMICONDUCTOR COMPONENT |
| CN102742002B (zh) * | 2010-02-12 | 2015-01-28 | 株式会社半导体能源研究所 | 半导体器件及其驱动方法 |
| US8582348B2 (en) * | 2010-08-06 | 2013-11-12 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for driving semiconductor device |
| US8422272B2 (en) * | 2010-08-06 | 2013-04-16 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and driving method thereof |
-
2011
- 2011-08-10 US US13/206,547 patent/US8339837B2/en active Active
- 2011-08-22 TW TW100129959A patent/TWI539609B/zh not_active IP Right Cessation
- 2011-08-24 JP JP2011182321A patent/JP5774413B2/ja not_active Expired - Fee Related
- 2011-08-25 KR KR1020110085242A patent/KR101903785B1/ko not_active Expired - Fee Related
- 2011-08-26 CN CN201110257348.5A patent/CN102385929B/zh not_active Expired - Fee Related
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