JP2012154735A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2012154735A5 JP2012154735A5 JP2011013201A JP2011013201A JP2012154735A5 JP 2012154735 A5 JP2012154735 A5 JP 2012154735A5 JP 2011013201 A JP2011013201 A JP 2011013201A JP 2011013201 A JP2011013201 A JP 2011013201A JP 2012154735 A5 JP2012154735 A5 JP 2012154735A5
- Authority
- JP
- Japan
- Prior art keywords
- imaging
- image acquisition
- incident surface
- scintillation light
- acquisition apparatus
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000003384 imaging method Methods 0.000 claims description 47
- 230000005855 radiation Effects 0.000 claims description 16
- 230000003287 optical effect Effects 0.000 claims description 10
- 238000006243 chemical reaction Methods 0.000 claims description 8
- 239000004065 semiconductor Substances 0.000 claims description 8
- 238000007689 inspection Methods 0.000 claims description 3
- 230000009977 dual effect Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011013201A JP5890099B2 (ja) | 2011-01-25 | 2011-01-25 | 放射線画像取得装置 |
| PCT/JP2011/074331 WO2012101881A1 (ja) | 2011-01-25 | 2011-10-21 | 放射線画像取得装置 |
| EP11857135.5A EP2669666A4 (en) | 2011-01-25 | 2011-10-21 | Radiation image acquisition device |
| US13/981,490 US9268039B2 (en) | 2011-01-25 | 2011-10-21 | Radiation image acquisition device |
| CN201190001002.2U CN203396722U (zh) | 2011-01-25 | 2011-10-21 | 放射线图像取得装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011013201A JP5890099B2 (ja) | 2011-01-25 | 2011-01-25 | 放射線画像取得装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2012154735A JP2012154735A (ja) | 2012-08-16 |
| JP2012154735A5 true JP2012154735A5 (enrdf_load_stackoverflow) | 2014-03-06 |
| JP5890099B2 JP5890099B2 (ja) | 2016-03-22 |
Family
ID=46580468
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011013201A Active JP5890099B2 (ja) | 2011-01-25 | 2011-01-25 | 放射線画像取得装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US9268039B2 (enrdf_load_stackoverflow) |
| EP (1) | EP2669666A4 (enrdf_load_stackoverflow) |
| JP (1) | JP5890099B2 (enrdf_load_stackoverflow) |
| CN (1) | CN203396722U (enrdf_load_stackoverflow) |
| WO (1) | WO2012101881A1 (enrdf_load_stackoverflow) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5792472B2 (ja) | 2011-01-25 | 2015-10-14 | 浜松ホトニクス株式会社 | 放射線画像取得装置 |
| JP5944254B2 (ja) * | 2012-07-20 | 2016-07-05 | 浜松ホトニクス株式会社 | 放射線画像取得装置 |
| US10617891B2 (en) | 2015-04-23 | 2020-04-14 | Sun Nuclear Corporation | Radiation detector calibration |
| KR102529855B1 (ko) * | 2015-09-30 | 2023-05-09 | 하마마츠 포토닉스 가부시키가이샤 | 방사선 화상 취득 시스템 및 방사선 화상 취득 방법 |
| DE102017101729A1 (de) * | 2017-01-30 | 2018-08-02 | Osram Opto Semiconductors Gmbh | Strahlungsemittierende Vorrichtung |
| EP3589366A1 (en) | 2017-02-28 | 2020-01-08 | Sun Nuclear Corporation | Radiation therapy treatment verification with electronic portal imaging device transit images |
| JP6738363B2 (ja) | 2018-03-09 | 2020-08-12 | 浜松ホトニクス株式会社 | 画像取得システムおよび画像取得方法 |
| US11278744B2 (en) | 2018-09-28 | 2022-03-22 | Sun Nuclear Corporation | Systems and methods to account for tilt of a radiation measurement system |
| US12011616B2 (en) | 2019-07-10 | 2024-06-18 | Sun Nuclear Corporation | Image-based radiation therapy quality assurance |
| US11600004B2 (en) | 2019-07-10 | 2023-03-07 | Sun Nuclear Corporation | Image-based radiation therapy quality assurance |
| US11378700B2 (en) | 2019-07-10 | 2022-07-05 | Sun Nuclear Corporation | Scintillator-based radiation therapy quality assurance |
| JP7235646B2 (ja) * | 2019-11-29 | 2023-03-08 | 富士フイルム株式会社 | 撮像装置 |
| JP6985557B2 (ja) * | 2020-07-17 | 2021-12-22 | 浜松ホトニクス株式会社 | 画像取得システムおよび画像取得方法 |
| JP7250891B2 (ja) * | 2020-07-17 | 2023-04-03 | 浜松ホトニクス株式会社 | 画像取得システムおよび画像取得方法 |
| WO2022113507A1 (ja) * | 2020-11-25 | 2022-06-02 | 浜松ホトニクス株式会社 | 撮像ユニット及び撮像システム |
| US12201850B2 (en) | 2022-06-16 | 2025-01-21 | Sun Nuclear Corporation | High dose rate radiation therapy systems and dosimetry |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4578803A (en) * | 1981-12-07 | 1986-03-25 | Albert Macovski | Energy-selective x-ray recording and readout system |
| JPH0795100B2 (ja) * | 1986-09-24 | 1995-10-11 | 株式会社日立メデイコ | Ｘ線荷物検査装置 |
| US5864146A (en) * | 1996-11-13 | 1999-01-26 | University Of Massachusetts Medical Center | System for quantitative radiographic imaging |
| JPH05152391A (ja) * | 1991-12-02 | 1993-06-18 | Fujitsu Ltd | Ｘ線検査装置 |
| JPH05312734A (ja) * | 1992-05-11 | 1993-11-22 | Fujitsu Ltd | Ｘ線検出方法 |
| JPH0727866A (ja) * | 1993-07-14 | 1995-01-31 | Fuji Photo Film Co Ltd | 放射線検出器 |
| JPH0861941A (ja) | 1994-08-23 | 1996-03-08 | Toshiba Corp | 放射線検査装置 |
| US6180946B1 (en) * | 1997-04-17 | 2001-01-30 | Lexitek, Inc. | Radiation camera with high spatial, temporal, and energy resolution |
| JP2000298198A (ja) * | 1999-02-08 | 2000-10-24 | Fuji Photo Film Co Ltd | 放射線画像データ取得方法および装置 |
| US6392237B1 (en) * | 1999-02-08 | 2002-05-21 | Fuji Photo Film Co., Ltd. | Method and apparatus for obtaining radiation image data |
| JP2001004561A (ja) * | 1999-06-17 | 2001-01-12 | On Denshi Kk | 基板検査装置 |
| JP4494026B2 (ja) * | 2004-01-21 | 2010-06-30 | 名古屋電機工業株式会社 | Ｘ線検査装置、ｘ線検査方法およびｘ線検査装置の制御プログラム |
| JP2007155653A (ja) * | 2005-12-08 | 2007-06-21 | Olympus Corp | 放射線観察装置 |
| US7405406B1 (en) | 2006-04-21 | 2008-07-29 | Radiation Monitoring Devices, Inc. | Two-sided scintillation detectors and related methods |
| JP4853964B2 (ja) * | 2006-12-28 | 2012-01-11 | 株式会社Ｉｈｉ検査計測 | Ｘ線検査装置用のｘ線センサ |
| JP2007327967A (ja) | 2007-07-30 | 2007-12-20 | Toshiba Corp | 放射線弁別測定装置 |
-
2011
- 2011-01-25 JP JP2011013201A patent/JP5890099B2/ja active Active
- 2011-10-21 US US13/981,490 patent/US9268039B2/en active Active
- 2011-10-21 WO PCT/JP2011/074331 patent/WO2012101881A1/ja active Application Filing
- 2011-10-21 CN CN201190001002.2U patent/CN203396722U/zh not_active Expired - Lifetime
- 2011-10-21 EP EP11857135.5A patent/EP2669666A4/en not_active Withdrawn