JP2011511929A - 四重極または飛行時間型質量分光計を用いた化学イオン化反応または陽子移動反応質量分光分析 - Google Patents

四重極または飛行時間型質量分光計を用いた化学イオン化反応または陽子移動反応質量分光分析 Download PDF

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JP2011511929A
JP2011511929A JP2010528930A JP2010528930A JP2011511929A JP 2011511929 A JP2011511929 A JP 2011511929A JP 2010528930 A JP2010528930 A JP 2010528930A JP 2010528930 A JP2010528930 A JP 2010528930A JP 2011511929 A JP2011511929 A JP 2011511929A
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ions
reagent
mass
reagent ions
chamber
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JP2011511929A5 (ko
Inventor
ロビンソン，ティモシー・ロジャー
アットウッド，マーク
チェン，ズィン
ホルバー，ウィリアム・エム
ロングソン，マーク・フィリップ
パーク，ジョナサン・ヘンリー
シャジー，アリ
スミス，ジョン・エイ
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MKS Instruments Inc
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MKS Instruments Inc
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Priority claimed from US11/869,978 external-priority patent/US8003935B2/en
Priority claimed from US11/869,980 external-priority patent/US8003936B2/en
Priority claimed from US12/026,799 external-priority patent/US8334505B2/en
Application filed by MKS Instruments Inc filed Critical MKS Instruments Inc
Publication of JP2011511929A publication Critical patent/JP2011511929A/ja
Publication of JP2011511929A5 publication Critical patent/JP2011511929A5/ja
Abandoned legal-status Critical Current

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/145—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using chemical ionisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2010528930A 2007-10-10 2008-09-23 四重極または飛行時間型質量分光計を用いた化学イオン化反応または陽子移動反応質量分光分析 Abandoned JP2011511929A (ja)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US11/869,978 US8003935B2 (en) 2007-10-10 2007-10-10 Chemical ionization reaction or proton transfer reaction mass spectrometry with a quadrupole mass spectrometer
US11/869,980 US8003936B2 (en) 2007-10-10 2007-10-10 Chemical ionization reaction or proton transfer reaction mass spectrometry with a time-of-flight mass spectrometer
US12/026,799 US8334505B2 (en) 2007-10-10 2008-02-06 Chemical ionization reaction or proton transfer reaction mass spectrometry
PCT/US2008/077365 WO2009048739A2 (en) 2007-10-10 2008-09-23 Chemical ionization reaction or proton transfer reaction mass spectrometry with a quadrupole or time-of-flight mass spectrometer

Related Child Applications (2)

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JP2011209079A Division JP2012054239A (ja) 2007-10-10 2011-09-26 四重極または飛行時間型質量分光計を用いた化学イオン化反応または陽子移動反応質量分光分析
JP2011209061A Division JP2012037529A (ja) 2007-10-10 2011-09-26 四重極または飛行時間型質量分光計を用いた化学イオン化反応または陽子移動反応質量分光分析

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JP2011511929A true JP2011511929A (ja) 2011-04-14
JP2011511929A5 JP2011511929A5 (ko) 2011-11-10

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JP2010528930A Abandoned JP2011511929A (ja) 2007-10-10 2008-09-23 四重極または飛行時間型質量分光計を用いた化学イオン化反応または陽子移動反応質量分光分析
JP2011209061A Abandoned JP2012037529A (ja) 2007-10-10 2011-09-26 四重極または飛行時間型質量分光計を用いた化学イオン化反応または陽子移動反応質量分光分析
JP2011209079A Abandoned JP2012054239A (ja) 2007-10-10 2011-09-26 四重極または飛行時間型質量分光計を用いた化学イオン化反応または陽子移動反応質量分光分析

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JP2011209061A Abandoned JP2012037529A (ja) 2007-10-10 2011-09-26 四重極または飛行時間型質量分光計を用いた化学イオン化反応または陽子移動反応質量分光分析
JP2011209079A Abandoned JP2012054239A (ja) 2007-10-10 2011-09-26 四重極または飛行時間型質量分光計を用いた化学イオン化反応または陽子移動反応質量分光分析

Country Status (6)

Country Link
EP (1) EP2212903B1 (ko)
JP (3) JP2011511929A (ko)
KR (2) KR101260631B1 (ko)
CN (1) CN101855700B (ko)
TW (1) TWI368249B (ko)
WO (1) WO2009048739A2 (ko)

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EP2421024A1 (en) 2010-08-18 2012-02-22 Ionicon Analytik Gesellschaft m.b.h. Ionisation method for a universal gas analyzer
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FR2994271B1 (fr) * 2012-08-03 2014-09-05 Commissariat Energie Atomique Systeme d'analyse de gaz
US9955898B2 (en) 2012-12-26 2018-05-01 Jeong-Chan Ra Cancer diagnosis method using respiratory gas
CN103337445B (zh) * 2013-06-15 2015-10-28 中国科学院合肥物质科学研究院 一种负离子质子反转移反应质谱的有机物检测装置及检测方法
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CN104538275B (zh) * 2014-12-25 2016-11-30 华南师范大学 一种激光辅助辉光放电电离装置
CN106158574A (zh) * 2015-04-09 2016-11-23 中国科学院生态环境研究中心 光诱导离子源质子转移反应质谱仪
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CN105548341B (zh) * 2015-12-15 2018-11-09 南京信息工程大学 一种恶臭气体监测方法及监测仪
CN106024572B (zh) * 2016-07-22 2017-09-19 中国科学院合肥物质科学研究院 一种双极性质子转移反应质谱的有机物检测装置及检测方法
CN106546656A (zh) * 2016-10-09 2017-03-29 中国科学院化学研究所 一种化学电离直链烷烃的方法
KR20190119106A (ko) * 2017-02-21 2019-10-21 칼 짜이스 에스엠티 게엠베하 공정의 실시간 모니터링 방법 및 질량 분광계
GB2560160B (en) * 2017-02-23 2021-08-18 Thermo Fisher Scient Bremen Gmbh Methods in mass spectrometry using collision gas as ion source
CN109243960B (zh) * 2017-07-10 2020-11-17 株式会社岛津制作所 一种质子转移反应质谱仪
US10217621B2 (en) * 2017-07-18 2019-02-26 Applied Materials Israel Ltd. Cleanliness monitor and a method for monitoring a cleanliness of a vacuum chamber
EP3474311A1 (en) * 2017-10-20 2019-04-24 Tofwerk AG Ion molecule reactor
GB201808912D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808932D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808892D0 (en) * 2018-05-31 2018-07-18 Micromass Ltd Mass spectrometer
EP3629365A1 (en) 2018-09-28 2020-04-01 Ionicon Analytik Gesellschaft m.b.H. Imr-ms reaction chamber
CN110110743B (zh) * 2019-03-26 2019-12-31 中国检验检疫科学研究院 一种七类质谱谱图自动识别系统与方法
DE102019215319A1 (de) * 2019-10-07 2021-04-08 Leybold Gmbh Einlasssystem für ein Massenspektrometer
EP3819611B1 (en) * 2019-11-05 2024-03-27 Hitachi High-Tech Analytical Science GmbH An easily adjustable optical emission spectrometer
CN111220697A (zh) * 2020-01-21 2020-06-02 北京雪迪龙科技股份有限公司 大气中气体的检测方法、检测系统及检测设备
WO2021173853A1 (en) * 2020-02-28 2021-09-02 Kaveh Jorabchi Apparatus and methods for detection and quantification of elements in molecules
CN112347155B (zh) * 2020-10-29 2023-11-21 南京大学 基于数据挖掘的场地污染特征因子识别和监测指标优化方法
WO2022173451A1 (en) * 2021-02-15 2022-08-18 Boronse Adrien A device for detecting explosive materials, or weapons or firearms, or knives or substances
CN113192818B (zh) * 2021-03-26 2022-07-08 广东省科学院测试分析研究所(中国广州分析测试中心) 微波等离子体炬-固相微萃取-飞行时间质谱联用系统
CN113447618B (zh) * 2021-06-29 2023-11-03 重庆大学 多传感器电子鼻的阶梯形气室、双进样检测系统及方法
WO2023013161A1 (ja) * 2021-08-02 2023-02-09 株式会社島津製作所 質量分析装置及び質量分析方法

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KR20150068991A (ko) * 2013-01-30 2015-06-22 칼 짜이스 에스엠티 게엠베하 혼합 가스의 질량 분석 검사 방법 및 그 질량 분석계
JP2016512647A (ja) * 2013-01-30 2016-04-28 カール・ツァイス・エスエムティー・ゲーエムベーハー ガス混合物の質量分析試験のための方法および質量分析計
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Also Published As

Publication number Publication date
KR20100083785A (ko) 2010-07-22
KR101260631B1 (ko) 2013-05-06
CN101855700A (zh) 2010-10-06
EP2212903A2 (en) 2010-08-04
CN101855700B (zh) 2012-12-05
EP2212903B1 (en) 2014-08-27
KR101260566B1 (ko) 2013-05-06
TWI368249B (en) 2012-07-11
KR20120107010A (ko) 2012-09-27
TW200937487A (en) 2009-09-01
JP2012054239A (ja) 2012-03-15
WO2009048739A3 (en) 2009-11-26
JP2012037529A (ja) 2012-02-23
WO2009048739A2 (en) 2009-04-16

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