JP2011191555A - 光フィルターの製造方法、分析機器および光機器 - Google Patents

光フィルターの製造方法、分析機器および光機器 Download PDF

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Publication number
JP2011191555A
JP2011191555A JP2010058302A JP2010058302A JP2011191555A JP 2011191555 A JP2011191555 A JP 2011191555A JP 2010058302 A JP2010058302 A JP 2010058302A JP 2010058302 A JP2010058302 A JP 2010058302A JP 2011191555 A JP2011191555 A JP 2011191555A
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JP
Japan
Prior art keywords
film
bonding
substrate
films
barrier
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2010058302A
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English (en)
Japanese (ja)
Other versions
JP2011191555A5 (enrdf_load_stackoverflow
Inventor
Seiji Yamazaki
成二 山▲崎▼
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP2010058302A priority Critical patent/JP2011191555A/ja
Priority to EP11157860A priority patent/EP2369396A1/en
Priority to US13/045,607 priority patent/US8512493B2/en
Priority to TW100108370A priority patent/TW201137392A/zh
Priority to KR1020110022297A priority patent/KR20110103874A/ko
Priority to CN2011100649348A priority patent/CN102193185A/zh
Publication of JP2011191555A publication Critical patent/JP2011191555A/ja
Publication of JP2011191555A5 publication Critical patent/JP2011191555A5/ja
Withdrawn legal-status Critical Current

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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/20—Filters
    • G02B5/26—Reflecting filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G02B1/105—
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
    • G02B1/10—Optical coatings produced by application to, or surface treatment of, optical elements
    • G02B1/14—Protective coatings, e.g. hard coatings
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/001—Optical devices or arrangements for the control of light using movable or deformable optical elements based on interference in an adjustable optical cavity
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/08—Mirrors
    • G02B5/0808—Mirrors having a single reflecting layer
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/08—Mirrors
    • G02B5/0816—Multilayer mirrors, i.e. having two or more reflecting layers
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00—Constructional details of devices covered by this subclass
    • H10F77/30—Coatings
    • H10F77/306—Coatings for devices having potential barriers
    • H10F77/331—Coatings for devices having potential barriers for filtering or shielding light, e.g. multicolour filters for photodetectors
    • H10F77/337—Coatings for devices having potential barriers for filtering or shielding light, e.g. multicolour filters for photodetectors using interference filters, e.g. multilayer dielectric filters

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Micromachines (AREA)
  • Mechanical Light Control Or Optical Switches (AREA)
  • Optical Filters (AREA)
  • Surface Treatment Of Optical Elements (AREA)
  • Spectrometry And Color Measurement (AREA)
JP2010058302A 2010-03-15 2010-03-15 光フィルターの製造方法、分析機器および光機器 Withdrawn JP2011191555A (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2010058302A JP2011191555A (ja) 2010-03-15 2010-03-15 光フィルターの製造方法、分析機器および光機器
EP11157860A EP2369396A1 (en) 2010-03-15 2011-03-11 Method of manufacturing optical filter, analytical instrument, and optical apparatus
US13/045,607 US8512493B2 (en) 2010-03-15 2011-03-11 Method of manufacturing optical filter, analytical instrument, and optical apparatus
TW100108370A TW201137392A (en) 2010-03-15 2011-03-11 Method of manufacturing optical filter, analytical instrument, and optical apparatus
KR1020110022297A KR20110103874A (ko) 2010-03-15 2011-03-14 광 필터의 제조방법, 분석 기기 및 광 기기
CN2011100649348A CN102193185A (zh) 2010-03-15 2011-03-14 滤光器的制造方法、分析设备及光设备

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010058302A JP2011191555A (ja) 2010-03-15 2010-03-15 光フィルターの製造方法、分析機器および光機器

Publications (2)

Publication Number Publication Date
JP2011191555A true JP2011191555A (ja) 2011-09-29
JP2011191555A5 JP2011191555A5 (enrdf_load_stackoverflow) 2012-12-06

Family

ID=44168497

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010058302A Withdrawn JP2011191555A (ja) 2010-03-15 2010-03-15 光フィルターの製造方法、分析機器および光機器

Country Status (6)

Country Link
US (1) US8512493B2 (enrdf_load_stackoverflow)
EP (1) EP2369396A1 (enrdf_load_stackoverflow)
JP (1) JP2011191555A (enrdf_load_stackoverflow)
KR (1) KR20110103874A (enrdf_load_stackoverflow)
CN (1) CN102193185A (enrdf_load_stackoverflow)
TW (1) TW201137392A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013148644A (ja) * 2012-01-18 2013-08-01 Seiko Epson Corp 干渉フィルター、光学モジュールおよび電子機器
JP2014058010A (ja) * 2012-09-14 2014-04-03 Ricoh Co Ltd 半導体装置の製造方法

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5919728B2 (ja) * 2011-10-26 2016-05-18 セイコーエプソン株式会社 分光測定装置
JP5811789B2 (ja) * 2011-11-09 2015-11-11 セイコーエプソン株式会社 分光測定装置
JP5966405B2 (ja) * 2012-02-14 2016-08-10 セイコーエプソン株式会社 光学フィルターデバイス、及び光学フィルターデバイスの製造方法
JP6098051B2 (ja) 2012-07-04 2017-03-22 セイコーエプソン株式会社 分光測定装置
JP6251956B2 (ja) * 2013-01-22 2017-12-27 セイコーエプソン株式会社 光学素子収納用パッケージ、光学フィルターデバイス、光学モジュール、および電子機器
JP6175898B2 (ja) * 2013-05-22 2017-08-09 セイコーエプソン株式会社 回折光学素子、回折光学素子の製造方法、及び電子機器
JP6496973B2 (ja) * 2013-08-07 2019-04-10 セイコーエプソン株式会社 光フィルター、光学モジュール、電子機器
TWI502176B (zh) * 2013-09-23 2015-10-01 Ind Tech Res Inst 可調式濾光元件及其製作方法
US10401377B2 (en) * 2014-02-13 2019-09-03 Micatu Inc. Optical sensor system and methods of use thereof
US12392945B2 (en) * 2020-04-28 2025-08-19 Viavi Solutions Inc. Induced transmission filter with hydrogenated silicon, silver, and silicon dioxide

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008162289A (ja) * 1995-06-26 2008-07-17 3M Co 追加のコーティングまたは層を備えた多層ポリマーフィルム
JP2008275737A (ja) * 2007-04-26 2008-11-13 Toppan Printing Co Ltd 光学薄膜積層体
JP2009134028A (ja) * 2007-11-29 2009-06-18 Seiko Epson Corp 光学デバイス、波長可変フィルタモジュール、および光スペクトラムアナライザ
JP2010003853A (ja) * 2008-06-19 2010-01-07 Seiko Epson Corp 接合膜付き基材、接合方法および接合体

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04337935A (ja) 1991-05-15 1992-11-25 Fujitsu Ltd データ切替方式
US6498683B2 (en) 1999-11-22 2002-12-24 3M Innovative Properties Company Multilayer optical bodies
JPH11142752A (ja) 1997-11-05 1999-05-28 Yokogawa Electric Corp 透過波長可変干渉フィルタ及びこれを用いた分光器
EP1154289A1 (de) * 2000-05-09 2001-11-14 Alcan Technology & Management AG Reflektor
US20030008148A1 (en) * 2001-07-03 2003-01-09 Sasa Bajt Optimized capping layers for EUV multilayers
US6816636B2 (en) * 2001-09-12 2004-11-09 Honeywell International Inc. Tunable optical filter
JP4210245B2 (ja) * 2004-07-09 2009-01-14 セイコーエプソン株式会社 波長可変フィルタ及び検出装置
JP4603489B2 (ja) * 2005-01-28 2010-12-22 セイコーエプソン株式会社 波長可変フィルタ
JP4561728B2 (ja) 2006-11-02 2010-10-13 セイコーエプソン株式会社 光学デバイス、光学デバイスの製造方法、波長可変フィルタ、波長可変フィルタモジュール、および光スペクトラムアナライザ
JP2009035721A (ja) 2007-07-11 2009-02-19 Seiko Epson Corp 接合膜付き基材、接合方法および接合体

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008162289A (ja) * 1995-06-26 2008-07-17 3M Co 追加のコーティングまたは層を備えた多層ポリマーフィルム
JP2008275737A (ja) * 2007-04-26 2008-11-13 Toppan Printing Co Ltd 光学薄膜積層体
JP2009134028A (ja) * 2007-11-29 2009-06-18 Seiko Epson Corp 光学デバイス、波長可変フィルタモジュール、および光スペクトラムアナライザ
JP2010003853A (ja) * 2008-06-19 2010-01-07 Seiko Epson Corp 接合膜付き基材、接合方法および接合体

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013148644A (ja) * 2012-01-18 2013-08-01 Seiko Epson Corp 干渉フィルター、光学モジュールおよび電子機器
US9322966B2 (en) 2012-01-18 2016-04-26 Seiko Epson Corporation Interference filter having Ag—Bi—Nd alloy film
JP2014058010A (ja) * 2012-09-14 2014-04-03 Ricoh Co Ltd 半導体装置の製造方法

Also Published As

Publication number Publication date
US8512493B2 (en) 2013-08-20
TW201137392A (en) 2011-11-01
KR20110103874A (ko) 2011-09-21
US20110222160A1 (en) 2011-09-15
CN102193185A (zh) 2011-09-21
EP2369396A1 (en) 2011-09-28

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