JP2011077522A - 熱および寸法安定性ポリイミドフィルム、電極および光吸収層を備えるアセンブリ、ならびに、これに関する方法 - Google Patents
熱および寸法安定性ポリイミドフィルム、電極および光吸収層を備えるアセンブリ、ならびに、これに関する方法 Download PDFInfo
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- JP2011077522A JP2011077522A JP2010209827A JP2010209827A JP2011077522A JP 2011077522 A JP2011077522 A JP 2011077522A JP 2010209827 A JP2010209827 A JP 2010209827A JP 2010209827 A JP2010209827 A JP 2010209827A JP 2011077522 A JP2011077522 A JP 2011077522A
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- Prior art keywords
- polyimide film
- polyimide
- assembly
- dianhydride
- filler
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 229920001721 polyimide Polymers 0.000 title claims abstract description 164
- 238000000034 method Methods 0.000 title abstract description 29
- 230000031700 light absorption Effects 0.000 title abstract description 5
- 239000004642 Polyimide Substances 0.000 claims abstract description 81
- 239000000945 filler Substances 0.000 claims abstract description 47
- GTDPSWPPOUPBNX-UHFFFAOYSA-N ac1mqpva Chemical compound CC12C(=O)OC(=O)C1(C)C1(C)C2(C)C(=O)OC1=O GTDPSWPPOUPBNX-UHFFFAOYSA-N 0.000 claims abstract description 39
- 150000004985 diamines Chemical class 0.000 claims abstract description 22
- 150000004984 aromatic diamines Chemical class 0.000 claims abstract description 12
- 125000003118 aryl group Chemical group 0.000 claims abstract description 10
- CBCKQZAAMUWICA-UHFFFAOYSA-N 1,4-phenylenediamine Chemical group NC1=CC=C(N)C=C1 CBCKQZAAMUWICA-UHFFFAOYSA-N 0.000 claims description 27
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical group O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 22
- 239000000203 mixture Substances 0.000 claims description 21
- VLDPXPPHXDGHEW-UHFFFAOYSA-N 1-chloro-2-dichlorophosphoryloxybenzene Chemical compound ClC1=CC=CC=C1OP(Cl)(Cl)=O VLDPXPPHXDGHEW-UHFFFAOYSA-N 0.000 claims description 16
- 239000007822 coupling agent Substances 0.000 claims description 7
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- 239000002270 dispersing agent Substances 0.000 claims description 5
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- 230000004580 weight loss Effects 0.000 claims description 3
- NVKGJHAQGWCWDI-UHFFFAOYSA-N 4-[4-amino-2-(trifluoromethyl)phenyl]-3-(trifluoromethyl)aniline Chemical compound FC(F)(F)C1=CC(N)=CC=C1C1=CC=C(N)C=C1C(F)(F)F NVKGJHAQGWCWDI-UHFFFAOYSA-N 0.000 claims description 2
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- WKDNYTOXBCRNPV-UHFFFAOYSA-N bpda Chemical compound C1=C2C(=O)OC(=O)C2=CC(C=2C=C3C(=O)OC(C3=CC=2)=O)=C1 WKDNYTOXBCRNPV-UHFFFAOYSA-N 0.000 claims description 2
- 238000004891 communication Methods 0.000 claims description 2
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- OKBVMLGZPNDWJK-UHFFFAOYSA-N naphthalene-1,4-diamine Chemical compound C1=CC=C2C(N)=CC=C(N)C2=C1 OKBVMLGZPNDWJK-UHFFFAOYSA-N 0.000 claims description 2
- 125000002023 trifluoromethyl group Chemical group FC(F)(F)* 0.000 claims description 2
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- 238000001035 drying Methods 0.000 description 4
- ANSXAPJVJOKRDJ-UHFFFAOYSA-N furo[3,4-f][2]benzofuran-1,3,5,7-tetrone Chemical compound C1=C2C(=O)OC(=O)C2=CC2=C1C(=O)OC2=O ANSXAPJVJOKRDJ-UHFFFAOYSA-N 0.000 description 4
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 4
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- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 4
- BWGNESOTFCXPMA-UHFFFAOYSA-N Dihydrogen disulfide Chemical compound SS BWGNESOTFCXPMA-UHFFFAOYSA-N 0.000 description 3
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 3
- DNIAPMSPPWPWGF-UHFFFAOYSA-N Propylene glycol Chemical compound CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 3
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- PFNQVRZLDWYSCW-UHFFFAOYSA-N (fluoren-9-ylideneamino) n-naphthalen-1-ylcarbamate Chemical compound C12=CC=CC=C2C2=CC=CC=C2C1=NOC(=O)NC1=CC=CC2=CC=CC=C12 PFNQVRZLDWYSCW-UHFFFAOYSA-N 0.000 description 2
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- YEJRWHAVMIAJKC-UHFFFAOYSA-N 4-Butyrolactone Chemical compound O=C1CCCO1 YEJRWHAVMIAJKC-UHFFFAOYSA-N 0.000 description 2
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- QQGYZOYWNCKGEK-UHFFFAOYSA-N 5-[(1,3-dioxo-2-benzofuran-5-yl)oxy]-2-benzofuran-1,3-dione Chemical compound C1=C2C(=O)OC(=O)C2=CC(OC=2C=C3C(=O)OC(C3=CC=2)=O)=C1 QQGYZOYWNCKGEK-UHFFFAOYSA-N 0.000 description 2
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Classifications
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0256—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
- H01L31/0264—Inorganic materials
- H01L31/032—Inorganic materials including, apart from doping materials or other impurities, only compounds not provided for in groups H01L31/0272 - H01L31/0312
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J5/00—Manufacture of articles or shaped materials containing macromolecular substances
- C08J5/18—Manufacture of films or sheets
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L79/00—Compositions of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing nitrogen with or without oxygen or carbon only, not provided for in groups C08L61/00 - C08L77/00
- C08L79/04—Polycondensates having nitrogen-containing heterocyclic rings in the main chain; Polyhydrazides; Polyamide acids or similar polyimide precursors
- C08L79/08—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0256—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
- H01L31/0264—Inorganic materials
- H01L31/032—Inorganic materials including, apart from doping materials or other impurities, only compounds not provided for in groups H01L31/0272 - H01L31/0312
- H01L31/0322—Inorganic materials including, apart from doping materials or other impurities, only compounds not provided for in groups H01L31/0272 - H01L31/0312 comprising only AIBIIICVI chalcopyrite compounds, e.g. Cu In Se2, Cu Ga Se2, Cu In Ga Se2
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/036—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes
- H01L31/0392—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/036—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes
- H01L31/0392—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate
- H01L31/03925—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate including AIIBVI compound materials, e.g. CdTe, CdS
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/036—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes
- H01L31/0392—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate
- H01L31/03926—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate comprising a flexible substrate
- H01L31/03928—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate comprising a flexible substrate including AIBIIICVI compound, e.g. CIS, CIGS deposited on metal or polymer foils
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Abstract
【解決手段】 本発明のアセンブリは、電極、光吸収層およびポリイミドフィルムを備える。ポリイミドフィルムは:i.少なくとも1種の芳香族二無水物であって、その少なくとも約85モルパーセントが剛性ロッドタイプ二無水物であるこのような芳香族二無水物、およびii.少なくとも1種の芳香族ジアミンであって、その少なくとも約85モルパーセントが剛性ロッドタイプジアミンであるこのような芳香族ジアミンから誘導される約40〜約95重量パーセントのポリイミドを含有する。本開示のポリイミドフィルムは:i.すべての寸法において約100ナノメートル未満であり;およびii.ポリイミドフィルムの総重量の約5〜約60重量パーセントの量で存在する充填材をさらに含む。
【選択図】図1
Description
「フィルム」は、基板上の自立フィルムまたはコーティングを意味することが意図される。「フィルム」という用語は用語「層」と同義的に用いられ、所望する領域を覆っていることを指す。
i.低表面粗度、すなわち、400、350、300、275または100ナノメートル未満の平均表面粗度(Ra);
ii.低レベルの表面欠陥;および/または
iii.他の有用な表面形態、
をもたらして、電気的短絡などの不要な欠陥を低減させるか抑制する。
1.すべての寸法において、(数値平均として)100ナノメートル未満(および、いくつかの実施形態においては、80、75、65、60、55、50、45、40、35、30、25、または20ナノメートル未満)の平均直径を有し;および
2.以下の割合:ポリイミドフィルムの総重量を基準として、5、10、15、20、25、30、35、40、45、50、55、および60重量パーセントの、任意によりその両端を含むいずれか2つの間の量で存在する。
・125℃(30分間)
・125℃〜350℃(4℃/分での昇温)
・350℃(30分間)
・350℃〜450℃(5℃/分での昇温)
・450℃(20分間)
・450℃〜40℃(8℃/分での冷却)
93.865グラムの無水DMAC溶剤を添加し、続いて、14.480gのBPDAを添加した。次いで、36.224グラムのナノシリカを添加すると共に、混合物を約30分間攪拌させた。ナノシリカコロイドは、既に、乾燥分子ふるいで保管してすべての残存水を除去しておいた。
以下の違いを伴って、実施例1に記載の手法を用いた。BPDA/PPD「プレポリマー」(69.3gの、無水DMAC中の17.5重量%溶液)を用いた。「プレポリマー」は、わずかの化学量論的過剰量のPPDモノマー(約2%;BPDA:PPD=0.98:1)によって形成した低分子量ポリマーを指す。
・125℃(30分間)
・125℃〜350℃(4℃/分での昇温)
・350℃(30分間)
・350℃〜450℃(5℃/分での昇温)
・450℃(20分間)
・450℃〜40℃(8℃/分での冷却)
モリブデン層を基板上に適用しなかったこと以外は実施例2に記載のものと同一の手法を用いた。熱機械的性能が表1にまとめられている。
モリブデン層を基板上に適用しなかったこと以外は実施例3に記載のものと同一の手法を用いた。熱機械的性能が表1にまとめられている。
モリブデン層を基板上に適用しなかったこと以外は実施例4に記載のものと同一の手法を用いた。熱機械的性能が表1にまとめられている。
・125℃(30分間)
・125℃〜350℃(4℃/分での昇温)
・350℃(30分間)
・350℃〜450℃(5℃/分での昇温)
・450℃(20分間)
・450℃〜40℃(8℃/分での冷却)
以下の違いを伴って比較例Aに記載の手法を用いた。この比較例においては、モリブデン層をポリイミド複合体上でスパッタリングさせず、および、ポリイミド中のナノシリカ充填量は20重量%(ポリイミド中に0.134体積率ナノシリカ)であった。
12 可撓性ポリイミドフィルム基板
14 半導体光吸収層
16 下部電極
22 II/VIフィルム
23 透明導電性酸化物層
24 グリッド端子
Claims (12)
- A)
a)ポリイミドフィルムの40〜95重量パーセントの量のポリイミドであって:
i)少なくとも1種の芳香族二無水物であって、その少なくとも85モルパーセントが剛性ロッドタイプ二無水物である芳香族二無水物、および
ii)少なくとも1種の芳香族ジアミンであって、その少なくとも85モルパーセントが剛性ロッドタイプジアミンである芳香族ジアミン
から誘導されるポリイミド;ならびに
b)充填材であって:
i)すべての寸法において100ナノメートル未満の平均直径を有し;且つ
ii)ポリイミドフィルムの総重量の5〜60重量パーセントの量で存在する
充填材を含み、
8〜150ミクロンの厚さを有するポリイミドフィルム、
B)光吸収層、ならびに
C)前記ポリイミドフィルムによって支持されている電極であって、
光吸収層とポリイミドフィルムとの間にあり、且つ、光吸収層と電気的に連通している電極、
を備えるアセンブリ。 - 光吸収層がCIGS/CIS光吸収層である、請求項1に記載のアセンブリ。
- アセンブリが、複数の一体集積型CIGS/CIS光起電力電池をさらに備える、請求項1に記載のアセンブリ。
- 充填材が、すべての寸法で60nm未満であり、および、アセンブリが、複数の一体集積型CIGS/CIS光起電力電池をさらに備える、請求項1に記載のアセンブリ。
- 充填材が無機酸化物であり、および、アセンブリが、複数の一体集積型CIGS/CIS光起電力電池をさらに備える、請求項1に記載のアセンブリ。
- 充填材が酸化ケイ素である、請求項5に記載のアセンブリ。
- a)剛性ロッドタイプ二無水物が、3,3’,4,4’−ビフェニルテトラカルボン酸二無水物(BPDA)、ピロメリト酸二無水物(PMDA)、およびこれらの混合物からなる群から選択され;ならびに
b)剛性ロッドタイプジアミンが、1,4−ジアミノベンゼン(PPD)、4,4’−ジアミノビフェニル、2,2’−ビス(トリフルオロメチル)ベンジデン(TFMB)、1,5−ナフタレンジアミン、1,4−ナフタレンジアミン、およびこれらの混合物から選択される、請求項1に記載のアセンブリ。 - ポリイミドフィルムが、カップリング剤、分散剤またはこれらの組み合わせを含む、請求項1に記載のアセンブリ。
- 充填材が無機酸化物であり、ポリイミドフィルムが、以下の特性:(i)300℃を超えるTg、(ii)500ボルト/25.4ミクロンを超える誘電強度、(iii)不活性条件下において、500℃で30分間の間に2%未満の等温性重量損失、および(iv)7.4〜8MPaで1.05%未満のemaxを有する、請求項1に記載のアセンブリ。
- ポリイミドフィルムが2つ以上の層を備える、請求項1に記載のアセンブリ。
- ポリイミドフィルムが、熱安定性の無機物:織物、紙、シート、スクリムまたはこれらの組み合わせで強化されている、請求項1に記載のアセンブリ。
- A)
a)ポリイミドフィルムの40〜95重量パーセントの量のポリイミドであって:
i)少なくとも1種の芳香族二無水物であって、その少なくとも85モルパーセントが剛性ロッドタイプ二無水物である芳香族二無水物、および
ii)少なくとも1種の芳香族ジアミンであって、その少なくとも85モルパーセントが剛性ロッドタイプジアミンである芳香族ジアミン
から誘導されるポリイミド;ならびに
b)充填材であって:
i)すべての寸法において100ナノメートル未満の平均直径を有し;且つ
ii)ポリイミドフィルムの総重量の5〜60重量パーセントの量で存在する
充填材を含み、
8〜150ミクロンの厚さを有するポリイミドフィルム、
B)前記ポリイミドフィルムによって支持されている電極
を備えるアセンブリ。
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US24340409P | 2009-09-17 | 2009-09-17 | |
US61/243,404 | 2009-09-17 |
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JP2010209827A Active JP5485847B2 (ja) | 2009-09-17 | 2010-09-17 | 熱および寸法安定性ポリイミドフィルム、電極および光吸収層を備えるアセンブリ、ならびに、これに関する方法 |
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US8288471B2 (en) * | 2010-10-18 | 2012-10-16 | Taimide Technology, Inc. | White polyimide film and manufacture thereof |
TWI459869B (zh) * | 2012-04-16 | 2014-11-01 | Ind Tech Res Inst | 軟性基板、複合層在太陽能電池之應用、及太陽能電池 |
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