JP2011109110A - 光起電力構成物またはその前駆体、およびこれに関する方法 - Google Patents
光起電力構成物またはその前駆体、およびこれに関する方法 Download PDFInfo
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- JP2011109110A JP2011109110A JP2010259974A JP2010259974A JP2011109110A JP 2011109110 A JP2011109110 A JP 2011109110A JP 2010259974 A JP2010259974 A JP 2010259974A JP 2010259974 A JP2010259974 A JP 2010259974A JP 2011109110 A JP2011109110 A JP 2011109110A
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- polyimide
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Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
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- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/036—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes
- H01L31/0392—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
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Abstract
【解決手段】少なくとも1つの光起電力構成要素を基板上に形成するための方法が記載されている。基板は、ポリイミドおよびサブミクロン充填材を含む。ポリイミドは、剛性ロッドモノマーおよび少なくとも3:1のアスペクト比を有するサブミクロン充填材から実質的にまたは完全に誘導される。本開示の基板は、少なくとも部分的に、引湿性膨張に対する高い耐性および比較的高いレベルの熱および寸法安定性により光起電力用途に特に好適である。
【選択図】図1
Description
「フィルム」は、基板上の自立フィルムまたはコーティングを意味することが意図される。「フィルム」という用語は用語「層」と同義的に用いられ、所望する領域を覆っていることを指す。
1.第IV族半導体(ケイ素、ゲルマニウム、ダイアモンド);
2.第IV族化合物半導体(SiGe、SiC);
3.第III−V族半導体(AlSb、AlAs、AlN、AlP、BN、BP、BAs、GaSb、GaAs、GaN、GaP、InSb、InAs、InN、InP);
4.第III−V族半導体合金(AlGaAs、InGaAs、InGaP、AlInAs、AlInAs、AlInSb、GaAsN、GaAsP、AlGaN、AlGaP、InGaN、InAsSb、InGaSb);
5.III−V四元半導体合金(AlGaInP、AlGaAsP、InGaAsP、InGaAsP、AlInAsP、AlGaAsN、InGaAsN、InAlAsN、GaAsSbN);
6.III−V四元半導体合金(GaInNAsSb、GaInAsSbP):
7.II−VI半導体(CdSe、CdS、CdTe、ZnO、ZnSe、ZnS、ZnTe);
8.II−VI三元合金半導体(CdZnTe、HgCdTe、HgZnTe、HgZnSe);
9.I−VII半導体(CuCl);
10.IV−VI半導体(PbSe、PbS、PbTe、SnS、SnTe);
11.IV−VI三元半導体(PbSnTe、Tl2SnTe5,Tl2GeTe5);
12.V−VI半導体(Bi2Te3);
13.II−V半導体(Cd3P2、Cd3As2、Cd3Sb2、Zn3P2、Zn3As2、Zn3Sb2);
14.成層半導体(PbI2、MoS2、GaSe、SnS、Bi2S3);
15.他の(CuInGaSe2、CuInGaS2、CuZnSnS4、PtSi、BiI3、HgI2、TlBr);
16.等。
i.低表面粗さ、すなわち、1000、750、500、400、350、300または275ナノメートル未満の平均表面粗さ(Ra);
ii.低レベルの表面欠陥;および/または
iii.他の有用な表面形態、
をもたらして、電気的短絡などの不要な欠陥を低減させるか抑制する。
1.800ナノメートル未満(および、いくつかの実施形態においては、750、650、600、550、500、475、450、425、400、375、350、325、300、275、250、225、または200ナノメートル未満)の寸法を少なくとも1つの寸法(充填材は任意の寸法で多様な形状を有することが可能であるため、および、充填材形状は任意の寸法に沿って様々であることが可能であるため、「少なくとも1つの寸法」は、その寸法に沿った数値平均を意図する)において有し;
2.3、4、5、6、7、8、9、10、11、12、13、14、または15対1を超えるアスペクト比を有し;
3.すべての寸法において、フィルムの厚さの100、95、90、85、80、75、70、65、60、55、50、45、40、35、30、25、20、15または10パーセント未満であり;ならびに、
4.以下の割合:フィルムの総重量を基準として、5、10、15、20、25、30、35、40、45、50、55、および60重量パーセントの、任意によりその両端を含むいずれか2つの間の量で存在する。
本明細書において用いられるところ、「減圧チャンバ」は、技術分野において公知である手段を通じて圧力が制御可能であるチャンバを包含することを意味する。本明細書において用いられるところ、「光起電力素子」は、動作環境において、適切にリード線および接続線を伴って、光の電気への変換を可能とするために必要な最低数の層を有する多層構造を意味する。好ましくは、この素子は、少なくとも以下の層を順番に含有する:基板/電極層/吸光体層/ウインドウ層およびTCO(透明導電性酸化物)層。
BPDA/PPDプレポリマー(69.3gの、無水DMAC中の17.5重量%溶液)を5.62gの針状のTiO2(FTL−110、Ishihara Corporation、USA)と組み合わせると共に、得られたスラリーを24時間攪拌した。個別の容器内に、ピロメリト酸無水物(PMDA)の6重量%溶液を、0.9gのPMDA(Aldrich 412287、Allentown,PA)および15mLのDMACを組み合わせることにより調製した。
・125℃(30分間)
・125℃〜350℃(4℃/分での昇温)
・350℃(30分間)
・350℃〜450℃(5℃/分での昇温)
・450℃(20分間)
・450℃〜40℃(8℃/分での冷却)
TiO2充填材をプレポリマー溶液に添加しなかったこと以外は、実施例1に記載のものと同等の手法を用いた。キャスティング前の最終粘度は993ポアズであった。
69.4gのBPDA/PPDプレポリマー(DMAC中に17.5重量%)を、5.85gのTiO2(FTL−200、Ishihara USA)と組み合わせたこと以外は、実施例1に記載のものと同一の手法を用いた。キャスティング前の配合物の最終粘度は524ポアズであった。
69.4gのBPDA/PPDプレポリマーを5.85gの針状のTiO2(FTL−300、Ishihara USA)と組み合わせたこと以外は、実施例1に記載のものと同一の手法を用いた。キャスティング前の最終粘度は394ポアズであった。
69.3gのBPDA/PPDプレポリマー(DMAC中に17.5重量%)を、5.62gの針状のTiO2(FTL−100、Ishihara USA)と組み合わせたこと以外は、実施例1に記載のものと同一の手法を用いた。
139gのBPDA/PPDプレポリマー(DMAC中に17.5重量%)を、11.3gの針状のTiO2(FTL−100)と組み合わせたこと以外は、実施例1に記載のものと同一の手法に従った。BPDA/PPDプレポリマーと針状のTiO2(FTL−110)との混合物を小さな容器に入れた。矩形孔、高せん断スクリーンを備えるSilverson Model L4RT高せん断ミキサ(Silverson Machines,LTD、Chesham Baucks,England)を用いて、配合物を20分間混合した(およそ4000rpmのブレード速度で)。氷浴を用いて混合操作の間、配合物を冷却し続けた。
133.03gのBPDA/PPDプレポリマー(DMAC中に17.5重量%)を、6.96gの針状のTiO2(FTL−110)と組み合わせたこと以外は、実施例4に記載のものと同一の手法を用いた。
159.28gのBPDA/PPDプレポリマーを10.72gの針状のTiO2(FTL−110)と混合したこと以外は、実施例5に記載のものと同一の手法を用いた。材料を高せん断ミキサで5〜10分間混合した。
157.3gのBPDA/PPDプレポリマーを12.72グラムの針状のTiO2(FTL−110)と混合したこと以外は、実施例5に記載のものと同一の手法を用いた。材料を、高せん断ミキサでおよそ10分間ブレンドした。
140.5gのDMACを24.92gのTiO2(FTL−110)と混合したこと以外は実施例5に記載したものと同様の手法を用いた。このスラリーを、高せん断ミキサをおよそ10分間用いてブレンドした。
140.49gのDMACを24.89gのタルク(Flex Talc610、Kish Company、Mentor,OH)と混合したこと以外は、実施例8に記載のものと同一の手法を用いた。材料を実施例8に記載の高せん断混合手法を用いてブレンドした。
この配合物は同様の体積%(TiO2で、FTL−110)で調製して、実施例9と比較した。実施例1に記載のものと同一の手法を用いた。67.01gのBPDA/PPDプレポリマー(17.5重量%)を、79.05グラムの針状のTiO2(FTL−110)粉末と組み合わせた。
以下の違いを伴って実施例8に記載のものと同一の手法を用いた。145.06gのBPDA/PPDプレポリマーを用いた(DMAC中に17.5重量%)。
DMA(TA Instruments Q800モデル)を、張力およびカスタマイズした力制御モードにおけるフィルム試料のクリープ/回復研究に用いた。6〜6.4mm幅、0.03〜0.05mm厚さおよび10mm長さのプレスしたフィルムを、固定されたジョーと可動式のジョーとの間に、3in−lbトルク重で固定した。長さ方向における静的な力は0.005Nであった。フィルムを20℃/分の速度で460℃に加熱すると共に、460℃で150分間保持した。クリーププログラムを2MPaに20分間設定し、続いて、初期の静的な力(0.005N)以外の追加的な力を加えずに30分回復させた。クリープ/回復プログラムを、4MPaおよび8MPaについて、2MPaと同じ時間間隔で反復した。
ポリイミドの密度に対して1.42g/cc;針状のTiO2の密度に対して4.2g/cc;タルクの密度に対して2.75g/cc;および珪灰石に対して2.84g/cc
を用いて対応する重量分率から算出した。
わずかに過剰量のPPD(DMAC中に15重量%PAA)で、DMAC(ジメチルアセタミド)中のBPDAおよびPPDから調製した168.09グラムのポリアミド酸(PAA)プレポリマー溶液を、10.05グラムのFlextalc610タルクと、Thinky ARE−250遠心ミキサ中で2分間ブレンドして、PAA溶液中の充填材のオフホワイトの分散体を得た。
わずかに過剰量のPPD(DMAC中に15重量%PAA)で、DMAC中のBPDAおよびPPDから調製した200グラムのポリアミド酸(PAA)プレポリマー溶液を計量した。その後、小量のPMDA(DMAC中に6重量%)を数回に分けてThinky ARE−250遠心ミキサに追加して、分子量、これにより、溶液粘度を約1650ポアズに高めた。次いで、溶液を減圧下で脱気して気泡を除去し、次いで、この溶液をDuosubstrate(登録商標)アルミニウム剥離シート(約9mil厚)片にコートし、ホットプレート上に置き、および約80〜100℃で30分間〜1時間乾燥させて、不粘着性のフィルムとした。その後、フィルムを注意深く基板から剥がすと共にピンフレーム上に置き、次いで、窒素パージしたオーブン中に入れ、約70分間かけて40℃から320℃に昇温させ、320℃で30分間保持し、次いで、16分間かけて450℃に昇温させると共に450℃で4分間保持し、続いて冷却させた。ピンフレーム上のフィルムをオーブンから取り出すと共にピンフレームから剥がして、充填ポリイミドフィルム(0重量%充填材)を得た。
実施例11と同様に、Flextalc610を約30重量%で含むポリアミド酸ポリマーを5milポリエステルフィルム上にキャストした。ポリエステル上にキャストしたフィルムを、およそ等量の無水酢酸と3−ピコリンとを室温で含有する浴中に入れた。キャストフィルムが浴中でイミド化されるに伴い、ポリエステルから剥がれ始めた。この時点で、キャストフィルムを浴中から取り出すと共にポリエステルから剥がし、ピンフレーム上に置き、次いで、オーブン中に入れて、実施例11に記載のとおり昇温させた。得られたタルク−充填ポリイミドフィルムは、それぞれ、キャストおよび交差方向に9ppm/℃および6ppm/℃のTMAによるCTE(実施例11のとおり)を示した。
2 供給ロール
3 巻き取りローラ
4蒸発型堆積源
Claims (7)
- 少なくとも1つの光起電力電池または光起電力電池前駆体を基板上に形成する方法であって:
透明導電性酸化物層、
電極層、
吸光体層、
ウインドウ層、および
コレクタ層
からなる群の少なくとも1つを基板に堆積させる工程を含み、
基板が:
a)層の40〜95重量パーセントの量のポリイミドであって:
i)少なくとも1種の芳香族二無水物であって、その少なくとも85モルパーセントが剛性ロッドタイプ二無水物である芳香族二無水物、および
ii)少なくとも1種の芳香族ジアミンであって、その少なくとも85モルパーセントが剛性ロッドタイプジアミンである芳香族ジアミン
から誘導されるポリイミド、および
b)充填材であって:
a)少なくとも1つの寸法が800ナノメートル未満であり;
b)3:1を超えるアスペクト比を有し;
c)すべての寸法がフィルムの厚さ未満であり;および
d)フィルムの総重量の5〜60重量パーセントの量で存在する
充填材
を含み、
基板が4〜150ミクロンの厚さを有し、
堆積が基板の連続ウェブ上で実施される、方法。 - 基板の連続ウェブがリールツーリールプロセスの要素である、請求項1に記載の方法。
- 充填材が小板、針様または繊維状であると共に、半導体材料が非晶質ケイ素である、請求項1に記載の方法。
- 充填材が針状の二酸化チタンを含む、請求項1に記載の方法。
- a)剛性ロッドタイプ二無水物が、3,3’,4,4’−ビフェニルテトラカルボン酸二無水物(BPDA)、ピロメリト酸二無水物(PMDA)、およびこれらの混合物からなる群から選択され;ならびに
b)剛性ロッドタイプジアミンが、1,4−ジアミノベンゼン(PPD)、4,4’−ジアミノビフェニル、2,2’−ビス(トリフルオロメチル)ベンジデン(TFMB)、1,5−ナフタレンジアミン、1,4−ナフタレンジアミン、およびこれらの混合物から選択される、
請求項1に記載の方法。 - ジアミンの少なくとも25モルパーセントが1,5−ナフタレンジアミンである、請求項1に記載の方法。
- フィルムが、熱安定性の無機物:織物、紙、シート、スクリムまたはこれらの組み合わせで強化されている、請求項1に記載の方法。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/623,212 US20110120545A1 (en) | 2009-11-20 | 2009-11-20 | Photovoltaic compositions or precursors thereto, and methods relating thereto |
US12/623,212 | 2009-11-20 |
Publications (1)
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JP2011109110A true JP2011109110A (ja) | 2011-06-02 |
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JP2010259974A Ceased JP2011109110A (ja) | 2009-11-20 | 2010-11-22 | 光起電力構成物またはその前駆体、およびこれに関する方法 |
Country Status (4)
Country | Link |
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US (1) | US20110120545A1 (ja) |
JP (1) | JP2011109110A (ja) |
CN (1) | CN102122680A (ja) |
DE (1) | DE102010051815A1 (ja) |
Cited By (2)
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JP2014082456A (ja) * | 2012-09-26 | 2014-05-08 | Toshiba Corp | 光電変換素子および太陽電池 |
JP2014093370A (ja) * | 2012-11-01 | 2014-05-19 | Toyota Central R&D Labs Inc | 光電素子 |
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KR101114099B1 (ko) * | 2010-07-30 | 2012-02-22 | 엘지이노텍 주식회사 | 태양광 발전장치 및 이의 제조방법 |
ES2527644B1 (es) | 2012-02-29 | 2016-04-27 | Alliance For Sustainable Energy, Llc | SISTEMAS Y MÉTODOS PARA FORMAR CÉLULAS SOLARES CON PELÍCULAS DE CuInSe2 y Cu(In,Ga)Se2 |
US20130319502A1 (en) * | 2012-05-31 | 2013-12-05 | Aqt Solar, Inc. | Bifacial Stack Structures for Thin-Film Photovoltaic Cells |
DE102016101856B4 (de) | 2016-02-03 | 2017-11-30 | Ctf Solar Gmbh | Verfahren zum Abscheiden einer CdTe-Schicht auf einem Substrat |
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Also Published As
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US20110120545A1 (en) | 2011-05-26 |
CN102122680A (zh) | 2011-07-13 |
DE102010051815A1 (de) | 2011-05-26 |
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