JP2011053077A - 熱分析装置 - Google Patents

熱分析装置 Download PDF

Info

Publication number
JP2011053077A
JP2011053077A JP2009202092A JP2009202092A JP2011053077A JP 2011053077 A JP2011053077 A JP 2011053077A JP 2009202092 A JP2009202092 A JP 2009202092A JP 2009202092 A JP2009202092 A JP 2009202092A JP 2011053077 A JP2011053077 A JP 2011053077A
Authority
JP
Japan
Prior art keywords
sample
heating furnace
thermal analysis
thermal
observation window
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2009202092A
Other languages
English (en)
Japanese (ja)
Other versions
JP2011053077A5 (enExample
Inventor
Kentaro Yamada
健太郎 山田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Science Corp
Original Assignee
SII NanoTechnology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SII NanoTechnology Inc filed Critical SII NanoTechnology Inc
Priority to JP2009202092A priority Critical patent/JP2011053077A/ja
Priority to US12/806,997 priority patent/US8359180B2/en
Priority to CN201010287191.6A priority patent/CN102004117B/zh
Publication of JP2011053077A publication Critical patent/JP2011053077A/ja
Publication of JP2011053077A5 publication Critical patent/JP2011053077A5/ja
Pending legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K17/00—Measuring quantity of heat
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/20—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
    • G01N25/48—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation
    • G01N25/4846—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation for a motionless, e.g. solid sample
    • G01N25/4866—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation for a motionless, e.g. solid sample by using a differential method

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Combustion & Propulsion (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
JP2009202092A 2009-09-01 2009-09-01 熱分析装置 Pending JP2011053077A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2009202092A JP2011053077A (ja) 2009-09-01 2009-09-01 熱分析装置
US12/806,997 US8359180B2 (en) 2009-09-01 2010-08-25 Thermal analysis apparatus
CN201010287191.6A CN102004117B (zh) 2009-09-01 2010-09-01 热分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009202092A JP2011053077A (ja) 2009-09-01 2009-09-01 熱分析装置

Publications (2)

Publication Number Publication Date
JP2011053077A true JP2011053077A (ja) 2011-03-17
JP2011053077A5 JP2011053077A5 (enExample) 2012-08-30

Family

ID=43626111

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009202092A Pending JP2011053077A (ja) 2009-09-01 2009-09-01 熱分析装置

Country Status (3)

Country Link
US (1) US8359180B2 (enExample)
JP (1) JP2011053077A (enExample)
CN (1) CN102004117B (enExample)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011227046A (ja) * 2010-03-29 2011-11-10 Sii Nanotechnology Inc 熱分析装置
JP2015108540A (ja) * 2013-12-04 2015-06-11 株式会社日立ハイテクサイエンス 熱分析装置
JP2016161384A (ja) * 2015-03-02 2016-09-05 株式会社日立ハイテクサイエンス 熱分析装置
WO2017033526A1 (ja) * 2015-08-26 2017-03-02 株式会社リガク 熱分析装置
JP2017187455A (ja) * 2016-04-08 2017-10-12 株式会社日立ハイテクサイエンス 熱分析装置、及び試料分析システム
JP2024137832A (ja) * 2023-03-21 2024-10-07 ネッチ ゲレーテバウ ゲーエムベーハー 測定装置の制御方法、測定装置及びシステム
JP7666800B1 (ja) * 2024-12-11 2025-04-22 ハイソル株式会社 チャンバおよびプローバ

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2925163B1 (fr) * 2007-12-12 2010-02-26 Centre Nat Rech Scient Procede et appareil d'analyse thermique
CN103196910B (zh) * 2013-01-21 2016-03-30 北京空间飞行器总体设计部 一种测试火工药剂性能随温度变化的方法
CN103091364B (zh) * 2013-01-30 2014-11-19 北京空间飞行器总体设计部 一种火工药剂高温环境适应性试验方法
JP6057812B2 (ja) * 2013-04-02 2017-01-11 株式会社神戸製鋼所 処理装置及びワークの温度計測方法
JP6212416B2 (ja) * 2014-03-13 2017-10-11 株式会社日立ハイテクサイエンス 熱分析装置用撮像装置、及びそれを備えた熱分析装置
CN103954534A (zh) * 2014-04-14 2014-07-30 上海大学 同步测量金属在基底上的润湿角和dsc曲线的装置
WO2017000972A1 (en) * 2015-07-02 2017-01-05 Knauf Gips Kg Apparatus for simultaneously and continuously determining a change in length and a change in weight of heated samples and method therefore
CN106324033A (zh) * 2016-08-16 2017-01-11 西安近代化学研究所 一种可视化炸药烤燃及气体产物分析装置
CN106872077A (zh) * 2017-03-06 2017-06-20 中国工程物理研究院材料研究所 量热结构及量热装置
JP6841425B2 (ja) * 2017-05-26 2021-03-10 株式会社リガク 熱分析装置
JP6682485B2 (ja) * 2017-09-12 2020-04-15 エスペック株式会社 熱容量測定装置及び熱容量測定方法
CN107894441B (zh) * 2017-11-27 2023-09-01 洛阳西格马高温电炉有限公司 一种激光局部加热抗氧化性能测试设备及测试方法
CN108896602B (zh) * 2018-08-20 2021-06-18 常州扬鹏科技有限公司 热传导测温装置及应用其的测温方法
US11474054B2 (en) * 2018-10-22 2022-10-18 Equistar Chemicals, Lp Temperature control apparatuses and methods
JP7365278B2 (ja) * 2019-06-19 2023-10-19 株式会社日立ハイテクサイエンス 熱分析装置
JP7338408B2 (ja) * 2019-11-01 2023-09-05 株式会社島津製作所 熱分析装置
JP7407051B2 (ja) * 2020-03-12 2023-12-28 株式会社日立ハイテクサイエンス 熱分析装置
JP2021156862A (ja) * 2020-03-26 2021-10-07 株式会社日立ハイテクサイエンス 熱分析用試料容器およびそれを用いた熱分析装置
IT202000014695A1 (it) 2020-06-19 2021-12-19 Duedi S R L Apparecchiatura per l'analisi di leghe metalliche non ferrose e particolarmente per analisi di tipo 's.t.a.', sistema per il controllo della qualita' di leghe leggere comprendente tale apparecchiatura e metodo di funzionamento di tale apparecchiatura
CN113433022B (zh) * 2021-05-21 2022-05-31 中国科学院金属研究所 一种可实现高精度初期稳定测量的热重分析系统
CN113740377A (zh) * 2021-09-03 2021-12-03 杭州泰默检测技术有限公司 一种基于热成像的平板状样品导热性能测试装置

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62176824U (enExample) * 1986-04-30 1987-11-10
JPH05215667A (ja) * 1992-02-07 1993-08-24 Tabai Espec Corp 防曇観測窓
JPH08327573A (ja) * 1995-05-31 1996-12-13 Shimadzu Corp 熱分析装置
JP2001033410A (ja) * 1999-07-16 2001-02-09 Fujisawa Pharmaceut Co Ltd 示差熱分析装置
JP2001183319A (ja) * 1999-12-27 2001-07-06 Shimadzu Corp 熱分析装置
JP2002107317A (ja) * 2000-10-02 2002-04-10 Sanyo Seiko Kk 高温観察装置
JP2005227188A (ja) * 2004-02-13 2005-08-25 Cores:Kk 観察装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61175557A (ja) * 1985-01-30 1986-08-07 Shimadzu Corp 熱分析装置
US5893051A (en) * 1994-09-27 1999-04-06 Matsushita Electric Industrial Co., Ltd. Method of estimating temperature inside material to be cooked and cooking apparatus for effecting same
JP2003307458A (ja) * 2002-04-15 2003-10-31 Akifumi Ito 基材の温度測定方法および温度測定装置

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62176824U (enExample) * 1986-04-30 1987-11-10
JPH05215667A (ja) * 1992-02-07 1993-08-24 Tabai Espec Corp 防曇観測窓
JPH08327573A (ja) * 1995-05-31 1996-12-13 Shimadzu Corp 熱分析装置
JP2001033410A (ja) * 1999-07-16 2001-02-09 Fujisawa Pharmaceut Co Ltd 示差熱分析装置
JP2001183319A (ja) * 1999-12-27 2001-07-06 Shimadzu Corp 熱分析装置
JP2002107317A (ja) * 2000-10-02 2002-04-10 Sanyo Seiko Kk 高温観察装置
JP2005227188A (ja) * 2004-02-13 2005-08-25 Cores:Kk 観察装置

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011227046A (ja) * 2010-03-29 2011-11-10 Sii Nanotechnology Inc 熱分析装置
US8708556B2 (en) 2010-03-29 2014-04-29 Sii Nanotechnology Thermal analyzer
JP2015108540A (ja) * 2013-12-04 2015-06-11 株式会社日立ハイテクサイエンス 熱分析装置
US10088402B2 (en) 2013-12-04 2018-10-02 Hitachi High-Tech Science Corporation Thermo-gravimetric apparatus
DE102014117356B4 (de) 2013-12-04 2021-12-09 Hitachi High-Tech Science Corporation Thermoanalysator
JP2016161384A (ja) * 2015-03-02 2016-09-05 株式会社日立ハイテクサイエンス 熱分析装置
WO2017033526A1 (ja) * 2015-08-26 2017-03-02 株式会社リガク 熱分析装置
JPWO2017033526A1 (ja) * 2015-08-26 2018-06-07 株式会社リガク 熱分析装置
JP2017187455A (ja) * 2016-04-08 2017-10-12 株式会社日立ハイテクサイエンス 熱分析装置、及び試料分析システム
JP2024137832A (ja) * 2023-03-21 2024-10-07 ネッチ ゲレーテバウ ゲーエムベーハー 測定装置の制御方法、測定装置及びシステム
JP7666800B1 (ja) * 2024-12-11 2025-04-22 ハイソル株式会社 チャンバおよびプローバ

Also Published As

Publication number Publication date
CN102004117A (zh) 2011-04-06
US20110054829A1 (en) 2011-03-03
US8359180B2 (en) 2013-01-22
CN102004117B (zh) 2013-10-30

Similar Documents

Publication Publication Date Title
JP2011053077A (ja) 熱分析装置
JP2011053077A5 (enExample)
TWI592656B (zh) Thermogravimetric device
CN102235987B (zh) 热分析装置
CN103308416B (zh) 热分析装置
JP2011501135A5 (enExample)
JP2011180123A (ja) 示差走査熱量計
CN111189552A (zh) 一种甲烷水合物火焰温度测试装置及测温修正方法
JP2021144016A (ja) 熱分析装置
JP6706522B2 (ja) 試料容器及び熱分析装置
JP7365278B2 (ja) 熱分析装置
JP5843951B2 (ja) 熱分析装置
JP2001183319A (ja) 熱分析装置
JP2005140546A (ja) 低温拡散反射測定装置及びそれに用いる試料ホルダ、低温拡散反射スペクトル測定方法
JP5345861B2 (ja) Ｘ線分析及び熱分析同時分析装置
US7642096B2 (en) Liquid expansion thermometer and microcalorimeter
JP5492945B2 (ja) 特定温度下における被検体の計測装置
Furstenberg et al. Infrared microthermography of microfabricated devices
CN204044067U (zh) 冷滤点测定仪
CN107727692A (zh) 一种检测真空玻璃真空度的装置及其检测方法
JP3387453B2 (ja) 熱分析装置
CN113503989A (zh) 一种双氧弹绝热式热量计及燃烧热测量方法
CN116718509A (zh) 一种低温热重分析仪
JP6166096B2 (ja) 光測定方法および装置
US20160362778A1 (en) Vacuum Evaporation Apparatus

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20120711

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20120711

RD03 Notification of appointment of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7423

Effective date: 20121122

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20130523

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20130528

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20131001