JP2010540914A5 - - Google Patents

Download PDF

Info

Publication number
JP2010540914A5
JP2010540914A5 JP2010526220A JP2010526220A JP2010540914A5 JP 2010540914 A5 JP2010540914 A5 JP 2010540914A5 JP 2010526220 A JP2010526220 A JP 2010526220A JP 2010526220 A JP2010526220 A JP 2010526220A JP 2010540914 A5 JP2010540914 A5 JP 2010540914A5
Authority
JP
Japan
Prior art keywords
individual measurement
individual
motomeko
measurement beam
short
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2010526220A
Other languages
English (en)
Japanese (ja)
Other versions
JP5571558B2 (ja
JP2010540914A (ja
Filing date
Publication date
Priority claimed from DE102007046507.8A external-priority patent/DE102007046507B4/de
Application filed filed Critical
Publication of JP2010540914A publication Critical patent/JP2010540914A/ja
Publication of JP2010540914A5 publication Critical patent/JP2010540914A5/ja
Application granted granted Critical
Publication of JP5571558B2 publication Critical patent/JP5571558B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2010526220A 2007-09-28 2008-09-26 ショート・コヒーレンス干渉計 Expired - Fee Related JP5571558B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102007046507.8 2007-09-28
DE102007046507.8A DE102007046507B4 (de) 2007-09-28 2007-09-28 Kurzkoheränz-Interferometer
PCT/EP2008/008230 WO2009043557A1 (de) 2007-09-28 2008-09-26 Kurzkohärenz-interferometer

Publications (3)

Publication Number Publication Date
JP2010540914A JP2010540914A (ja) 2010-12-24
JP2010540914A5 true JP2010540914A5 (cg-RX-API-DMAC7.html) 2011-11-10
JP5571558B2 JP5571558B2 (ja) 2014-08-13

Family

ID=40184925

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010526220A Expired - Fee Related JP5571558B2 (ja) 2007-09-28 2008-09-26 ショート・コヒーレンス干渉計

Country Status (6)

Country Link
US (1) US8717576B2 (cg-RX-API-DMAC7.html)
EP (1) EP2193328A1 (cg-RX-API-DMAC7.html)
JP (1) JP5571558B2 (cg-RX-API-DMAC7.html)
CN (1) CN101878410B (cg-RX-API-DMAC7.html)
DE (1) DE102007046507B4 (cg-RX-API-DMAC7.html)
WO (1) WO2009043557A1 (cg-RX-API-DMAC7.html)

Families Citing this family (48)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010017954A2 (de) 2008-08-12 2010-02-18 Carl Zeiss Meditec Ag Tiefenauflösende optische kohärenzreflektrometrie
JP5618533B2 (ja) * 2008-12-26 2014-11-05 キヤノン株式会社 光干渉断層情報取得装置、撮像装置及び撮像方法
JP5558735B2 (ja) * 2009-04-13 2014-07-23 キヤノン株式会社 光断層撮像装置及びその制御方法
US8345257B2 (en) * 2009-04-20 2013-01-01 D4D Technologies, Llc Swept source optical coherence tomography (OCT) method and system
JP5550258B2 (ja) * 2009-05-08 2014-07-16 キヤノン株式会社 光干渉断層撮像装置
DE102009022958A1 (de) * 2009-05-28 2010-12-02 Carl Zeiss Meditec Ag Vorrichtung und Verfahren zur optischen Messung von Relativabständen
DE102009041996A1 (de) 2009-09-18 2011-03-24 Carl Zeiss Meditec Ag Ophthalmologisches Biometrie- oder Bilderzeugungssystem und Verfahren zur Erfassung und Auswertung von Messdaten
DE102009041995A1 (de) 2009-09-18 2011-03-24 Carl Zeiss Meditec Ag Optische Ablenkeinheit für scannende, ophthalmologische Mess- und Therapiesysteme
EP2415393B1 (en) * 2010-08-05 2016-07-27 Nidek Co., Ltd. Ophthalmic apparatus
US20120057172A1 (en) * 2010-09-08 2012-03-08 Andrei Brunfeld Optical measuring system with illumination provided through a void in a collecting lens
DE102010055350A1 (de) * 2010-12-20 2012-06-21 Carl Zeiss Meditec Ag Vorrichtung zur interferometrischen Vermessung der Augenlänge und des vorderen Augenabschnitts
US8851675B2 (en) * 2011-01-26 2014-10-07 Josh N. Hogan Hybrid OCT scanning device
EP2485009A1 (de) * 2011-02-04 2012-08-08 Haag-Streit Ag Frequenzbereichs-OCT
EP2574273B1 (en) * 2011-06-23 2014-09-24 Nidek Co., Ltd. Optical coherence tomography apparatus
EP2822452A4 (en) * 2012-03-07 2016-03-02 Optovue Inc IMPROVED BIOMETRY BY OPTICAL COHERENCE TOMOGRAPHY
CN102934986B (zh) * 2012-12-04 2014-08-27 天津迈达医学科技股份有限公司 基于gpu平台的眼科频域oct系统和处理方法
US9400169B2 (en) 2012-12-06 2016-07-26 Lehigh University Apparatus and method for space-division multiplexing optical coherence tomography
CN104854423B (zh) * 2012-12-06 2018-09-18 周超 空分复用光学相干断层扫描设备及方法
USRE49680E1 (en) 2013-08-12 2023-10-03 Adelos, Llc Systems and methods for spread spectrum distributed acoustic sensor monitoring
US9200888B2 (en) * 2013-11-01 2015-12-01 Tomey Corporation Multi-channel optical coherence tomography
EP3097382B1 (en) * 2014-01-21 2022-10-12 Santec Corporation Optical coherence tomography system with multiple sample paths
US10869623B2 (en) 2014-05-28 2020-12-22 Santec Corporation Non-invasive optical measurement of blood analyte
CN104068825B (zh) * 2014-06-24 2015-11-11 东北大学 一种短相干光干涉测量方法及装置
WO2016033199A1 (en) * 2014-08-28 2016-03-03 Adelos, Inc. Real-time fiber optic interferometry controller
JP6481521B2 (ja) * 2014-09-03 2019-03-13 住友電気工業株式会社 干渉型光ファイバセンサシステム及び干渉型光ファイバセンサヘッド
CA2979149C (en) * 2015-03-11 2021-08-31 Synaptive Medical (Barbados) Inc. An optical coherence tomography system with dual optical coherence tomography probes
US10548520B2 (en) 2015-04-01 2020-02-04 Santec Corporation Non-invasive optical measurement of blood analyte
JP6713149B2 (ja) 2015-06-01 2020-06-24 サンテック株式会社 2つの波長を合成する光コヒーレンストモグラフィーシステム
US10677580B2 (en) 2016-04-27 2020-06-09 Santec Corporation Optical coherence tomography system using polarization switching
US9993153B2 (en) 2016-07-06 2018-06-12 Santec Corporation Optical coherence tomography system and method with multiple apertures
FI20165576A (fi) * 2016-07-11 2018-01-12 Photono Oy Laite ja menetelmä kerroksen optisen paksuuden mittaamiseksi
CN106840007A (zh) * 2017-04-07 2017-06-13 赵�怡 一种结合可调激光测距探头阵列与智能终端的空间扫描系统及方法
US10426337B2 (en) 2017-06-01 2019-10-01 Santec Corporation Flow imaging in an optical coherence tomography (OCT) system
US10408600B2 (en) 2017-06-22 2019-09-10 Santec Corporation Optical coherence tomography with a fizeau-type interferometer
US10206567B2 (en) 2017-07-12 2019-02-19 Santec Corporation Dual wavelength resampling system and method
US10502546B2 (en) 2017-11-07 2019-12-10 Santec Corporation Systems and methods for variable-range fourier domain imaging
US11213200B2 (en) 2018-03-22 2022-01-04 Santec Corporation Topographical imaging using combined sensing inputs
US10838047B2 (en) 2018-04-17 2020-11-17 Santec Corporation Systems and methods for LIDAR scanning of an environment over a sweep of wavelengths
US11067671B2 (en) 2018-04-17 2021-07-20 Santec Corporation LIDAR sensing arrangements
DE102018118501A1 (de) * 2018-07-31 2020-02-06 Precitec Gmbh & Co. Kg Messvorrichtung zur Bestimmung eines Abstands zwischen einem Laserbearbeitungskopf und einem Werkstück, Laserbearbeitungssystem mit derselben und Verfahren zur Bestimmung eines Abstands zwischen einem Laserbearbeitungskopf und einem Werkstück
ES3007235T3 (en) * 2018-11-28 2025-03-19 Alcon Inc Optical coherence tomography receiver
US12292697B2 (en) 2019-05-30 2025-05-06 Asml Holding N.V. Self-referencing interferometer and dual self-referencing interferometer devices
DE102019007147A1 (de) * 2019-10-09 2021-04-15 Carl Zeiss Meditec Ag Anordnung zur Laser-Vitreolyse
WO2021192047A1 (ja) * 2020-03-24 2021-09-30 日本電気株式会社 光干渉断層撮像装置、撮像方法、及び、撮像プログラムが格納された非一時的なコンピュータ可読媒体
JP7606699B2 (ja) * 2021-03-01 2024-12-26 国立大学法人 筑波大学 眼科データ処理方法、眼科データ処理装置、その制御方法、眼科検査装置、その制御方法、プログラム、及び記録媒体
WO2023275929A1 (ja) * 2021-06-28 2023-01-05 日本電気株式会社 光干渉断層撮像装置、光干渉断層撮像方法、及び記録媒体
DE102022133951A1 (de) * 2022-12-19 2024-06-20 Heidelberg Engineering Gmbh Einrichtung zur Messung der Augenlänge
US12313883B2 (en) 2023-03-03 2025-05-27 santec Holdings Corporation Photonic beam steering device with wavelength sweep

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH024310A (ja) 1988-06-16 1990-01-09 Kowa Co 眼科診断方法および装置
JP2994441B2 (ja) * 1990-08-13 1999-12-27 株式会社トプコン 生体眼の寸法測定装置
DE69227902T3 (de) 1991-04-29 2010-04-22 Massachusetts Institute Of Technology, Cambridge Vorrichtung für optische abbildung und messung
US5795295A (en) * 1996-06-25 1998-08-18 Carl Zeiss, Inc. OCT-assisted surgical microscope with multi-coordinate manipulator
US6198540B1 (en) 1997-03-26 2001-03-06 Kowa Company, Ltd. Optical coherence tomography have plural reference beams of differing modulations
US6836546B1 (en) 1999-11-03 2004-12-28 Advanced Micro Devices, Inc. Apparatus and method of coupling home network signals between an analog phone line and a digital bus
AU1377601A (en) * 1999-11-24 2001-06-04 Haag-Streit Ag Method and device for measuring the optical properties of at least two regions located at a distance from one another in a transparent and/or diffuse object
DE10042751A1 (de) * 2000-08-31 2002-03-14 Thomas Hellmuth System zur berührungslosen Vermessung der optischen Abbildungsqualität eines Auges
US6654127B2 (en) 2001-03-01 2003-11-25 Carl Zeiss Ophthalmic Systems, Inc. Optical delay line
US20050140981A1 (en) 2002-04-18 2005-06-30 Rudolf Waelti Measurement of optical properties
WO2003086180A2 (de) * 2002-04-18 2003-10-23 Haag-Streit Ag Messung optischer eigenschaften
GB0210213D0 (en) * 2002-05-03 2002-06-12 Univ Cranfield 9Improved fizean interferometer designs fpr optical coherence tomography
WO2004111661A2 (en) 2003-05-30 2004-12-23 Duke University System and method for low coherence broadband quadrature interferometry
WO2005047813A1 (en) * 2003-10-27 2005-05-26 The General Hospital Corporation Method and apparatus for performing optical imaging using frequency-domain interferometry
WO2005077256A1 (en) 2004-02-06 2005-08-25 Optovue, Inc. Optical apparatus and methods for performing eye examinations
WO2005077257A1 (en) * 2004-02-10 2005-08-25 Optovue, Inc. High efficiency low coherence interferometry
US7126693B2 (en) 2004-03-29 2006-10-24 Carl Zeiss Meditec, Inc. Simple high efficiency optical coherence domain reflectometer design
EP1602320B1 (en) 2004-06-03 2013-09-04 Nidek Co., Ltd. Ophthalmic apparatus
US7388672B2 (en) * 2004-11-19 2008-06-17 Carl Ziess Meditec, Inc. High efficiency balanced detection interferometer
US7330270B2 (en) 2005-01-21 2008-02-12 Carl Zeiss Meditec, Inc. Method to suppress artifacts in frequency-domain optical coherence tomography
JP4378533B2 (ja) 2005-10-04 2009-12-09 国立大学法人 筑波大学 光コヒーレンストモグラフィーの構成機器の較正方法
US7400410B2 (en) 2005-10-05 2008-07-15 Carl Zeiss Meditec, Inc. Optical coherence tomography for eye-length measurement
JP4850495B2 (ja) * 2005-10-12 2012-01-11 株式会社トプコン 眼底観察装置及び眼底観察プログラム
EP1785690A1 (de) 2005-11-10 2007-05-16 Haag-Streit Ag Verfahren und Vorrichtung zur Ermittlung geometrischer Werte an einem Gegenstand
DE102005058220A1 (de) * 2005-12-06 2007-06-14 Carl Zeiss Meditec Ag Interferometrische Probenmessung
US7982881B2 (en) * 2005-12-06 2011-07-19 Carl Zeiss Meditec Ag Apparatus and method for interferometric measurement of a sample
WO2007084750A2 (en) 2006-01-19 2007-07-26 Optovue, Inc. A fourier-domain optical coherence tomography imager

Similar Documents

Publication Publication Date Title
JP2010540914A5 (cg-RX-API-DMAC7.html)
JP5571558B2 (ja) ショート・コヒーレンス干渉計
JP5882674B2 (ja) 多波長干渉計、計測装置および計測方法
US10663281B2 (en) Systems and methods for optimizing focus for imaging-based overlay metrology
JP5550258B2 (ja) 光干渉断層撮像装置
AU2012378957B2 (en) Imaging technique for optical coherence tomography
Ahmad et al. Ultra-short longitudinal spatial coherence length of laser light with the combined effect of spatial, angular, and temporal diversity
US20090128824A1 (en) Optical imaging system with extended depth of focus
EP2719324B1 (en) Optical coherence tomography device
JP5610063B2 (ja) 観察装置および観察方法
JP5675268B2 (ja) 光干渉断層撮像装置、光干渉断層撮像方法、補償方法およびプログラム
JP5965167B2 (ja) 白色光干渉測定装置
JP7120400B2 (ja) 光干渉断層撮像器
JP2023508289A (ja) マルチビーム光コヒーレンストモグラフィのためのシステム、方法及び媒体
WO2013141229A1 (ja) 網膜用3次元画像生成装置
US10437050B2 (en) Phase-modulation-element adjustment system and method for decreasing wavefront aberration
JP2012088249A5 (ja) 光干渉断層撮像装置、光干渉断層撮像方法、補償方法およびプログラム
WO2017158695A1 (ja) 点像分布関数の測定装置、測定方法、画像取得装置および画像取得方法
JP4659019B2 (ja) 波面センサ
JP5772783B2 (ja) 光断層画像取得装置
JP2018521326A (ja) 抑制された多重散乱クロストークを有する複数の干渉計を用いる高速光干渉断層撮影
US20140160490A1 (en) Interference measuring apparatus and interference measuring method
WO2010113985A1 (ja) 干渉計
JP3934131B2 (ja) 同軸型空間光干渉断層画像計測装置
JP6953673B2 (ja) 光測定装置および光軸調整方法