JP2010540914A5 - - Google Patents

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Publication number
JP2010540914A5
JP2010540914A5 JP2010526220A JP2010526220A JP2010540914A5 JP 2010540914 A5 JP2010540914 A5 JP 2010540914A5 JP 2010526220 A JP2010526220 A JP 2010526220A JP 2010526220 A JP2010526220 A JP 2010526220A JP 2010540914 A5 JP2010540914 A5 JP 2010540914A5
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individual measurement
individual
motomeko
measurement beam
short
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JP2010526220A
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Japanese (ja)
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JP2010540914A (ja
JP5571558B2 (ja
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Priority claimed from DE102007046507.8A external-priority patent/DE102007046507B4/de
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Publication of JP5571558B2 publication Critical patent/JP5571558B2/ja
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JP2010526220A 2007-09-28 2008-09-26 ショート・コヒーレンス干渉計 Expired - Fee Related JP5571558B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102007046507.8 2007-09-28
DE102007046507.8A DE102007046507B4 (de) 2007-09-28 2007-09-28 Kurzkoheränz-Interferometer
PCT/EP2008/008230 WO2009043557A1 (de) 2007-09-28 2008-09-26 Kurzkohärenz-interferometer

Publications (3)

Publication Number Publication Date
JP2010540914A JP2010540914A (ja) 2010-12-24
JP2010540914A5 true JP2010540914A5 (OSRAM) 2011-11-10
JP5571558B2 JP5571558B2 (ja) 2014-08-13

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JP2010526220A Expired - Fee Related JP5571558B2 (ja) 2007-09-28 2008-09-26 ショート・コヒーレンス干渉計

Country Status (6)

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US (1) US8717576B2 (OSRAM)
EP (1) EP2193328A1 (OSRAM)
JP (1) JP5571558B2 (OSRAM)
CN (1) CN101878410B (OSRAM)
DE (1) DE102007046507B4 (OSRAM)
WO (1) WO2009043557A1 (OSRAM)

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