JP2010518600A5 - - Google Patents

Download PDF

Info

Publication number
JP2010518600A5
JP2010518600A5 JP2009548319A JP2009548319A JP2010518600A5 JP 2010518600 A5 JP2010518600 A5 JP 2010518600A5 JP 2009548319 A JP2009548319 A JP 2009548319A JP 2009548319 A JP2009548319 A JP 2009548319A JP 2010518600 A5 JP2010518600 A5 JP 2010518600A5
Authority
JP
Japan
Prior art keywords
thermoelectric
thermoelectric film
film
growth surface
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2009548319A
Other languages
English (en)
Japanese (ja)
Other versions
JP5642970B2 (ja
JP2010518600A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/US2008/001395 external-priority patent/WO2008097484A2/en
Publication of JP2010518600A publication Critical patent/JP2010518600A/ja
Publication of JP2010518600A5 publication Critical patent/JP2010518600A5/ja
Application granted granted Critical
Publication of JP5642970B2 publication Critical patent/JP5642970B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2009548319A 2007-02-02 2008-02-01 クラックおよび/または表面欠陥密度が減少したエピタキシャル熱電膜を堆積させる方法および関連する装置 Expired - Fee Related JP5642970B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US88796407P 2007-02-02 2007-02-02
US60/887,964 2007-02-02
PCT/US2008/001395 WO2008097484A2 (en) 2007-02-02 2008-02-01 Methods of depositing epitaxial thermoelectric films having reduced crack and/or surface defect densities and related devices

Publications (3)

Publication Number Publication Date
JP2010518600A JP2010518600A (ja) 2010-05-27
JP2010518600A5 true JP2010518600A5 (enExample) 2011-03-10
JP5642970B2 JP5642970B2 (ja) 2014-12-17

Family

ID=39494339

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009548319A Expired - Fee Related JP5642970B2 (ja) 2007-02-02 2008-02-01 クラックおよび/または表面欠陥密度が減少したエピタキシャル熱電膜を堆積させる方法および関連する装置

Country Status (6)

Country Link
US (1) US7804019B2 (enExample)
EP (3) EP2423991B1 (enExample)
JP (1) JP5642970B2 (enExample)
KR (1) KR101537359B1 (enExample)
CA (1) CA2676089A1 (enExample)
WO (1) WO2008097484A2 (enExample)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090199887A1 (en) * 2008-02-08 2009-08-13 North Carolina State University And Nextreme Thermal Solutions, Inc. Methods of forming thermoelectric devices including epitaxial thermoelectric elements of different conductivity types on a same substrate and related structures
US20090205696A1 (en) * 2008-02-15 2009-08-20 Nextreme Thermal Solutions, Inc. Thermoelectric Heat Pumps Providing Active Thermal Barriers and Related Devices and Methods
DE102009000333A1 (de) 2009-01-20 2010-07-22 Ihp Gmbh - Innovations For High Performance Microelectronics / Leibniz-Institut Für Innovative Mikroelektronik Thermoelektrisches Halbleiterbauelement
JP5750945B2 (ja) * 2010-11-15 2015-07-22 ヤマハ株式会社 熱電素子
US9070816B2 (en) * 2011-05-19 2015-06-30 Fuji Electric Co., Ltd. Thermoelectric conversion structure and method of manufacturing same
WO2012157369A1 (ja) * 2011-05-19 2012-11-22 富士電機株式会社 熱電変換構造体およびその製造方法
WO2013119293A2 (en) * 2011-11-22 2013-08-15 Research Triangle Institute Nanoscale, ultra-thin films for excellent thermoelectric figure of merit
KR101956278B1 (ko) 2011-12-30 2019-03-11 삼성전자주식회사 그래핀 함유 복합 적층체, 이를 포함하는 열전재료, 열전모듈과 열전 장치
US9190592B2 (en) * 2012-11-06 2015-11-17 Nextreme Thermal Solutions, Inc. Thin film thermoelectric devices having favorable crystal tilt
WO2015178929A1 (en) 2014-05-23 2015-11-26 Laird Durham, Inc. Thermoelectric heating/cooling devices including resistive heaters
KR102299362B1 (ko) * 2014-08-21 2021-09-08 삼성전자주식회사 경사진 c-plane 상의 4성분계 양자우물을 포함하는 그린광 발광소자
WO2017041221A1 (en) * 2015-09-08 2017-03-16 Shenzhen Xpectvision Technology Co., Ltd. Methods for making an x-ray detector
KR102382321B1 (ko) * 2016-02-01 2022-04-04 엘지이노텍 주식회사 열전 소자 및 이의 제조 방법
TWI785106B (zh) * 2018-08-28 2022-12-01 晶元光電股份有限公司 半導體裝置
US12382830B2 (en) * 2021-06-23 2025-08-05 The Johns Hopkins University Large area scalable fabrication methodologies for versatile thermoelectric device modules
TWI825886B (zh) * 2022-05-05 2023-12-11 環球晶圓股份有限公司 磊晶結構及其製造方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63226918A (ja) * 1987-03-16 1988-09-21 Shin Etsu Handotai Co Ltd 燐化砒化ガリウム混晶エピタキシヤルウエ−ハ
US4994408A (en) * 1989-02-06 1991-02-19 Motorola Inc. Epitaxial film growth using low pressure MOCVD
EP0437654A1 (de) * 1990-01-16 1991-07-24 Reinhard Dr. Dahlberg Thermoelement-Schenkel mit richtungsabhängiger Quantisierung der Ladungsträger
WO1998042033A1 (en) * 1997-03-17 1998-09-24 Massachusetts Institute Of Technology Si/SiGe SUPERLATTICE STRUCTURES FOR USE IN THERMOELECTRIC DEVICES
US6300150B1 (en) * 1997-03-31 2001-10-09 Research Triangle Institute Thin-film thermoelectric device and fabrication method of same
US7342169B2 (en) * 2001-10-05 2008-03-11 Nextreme Thermal Solutions Phonon-blocking, electron-transmitting low-dimensional structures
DE10230080B4 (de) * 2002-06-27 2008-12-24 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren zur Herstellung einer thermoelektrischen Schichtenstruktur und Bauelemente mit einer thermoelektrischen Schichtenstruktur

Similar Documents

Publication Publication Date Title
JP2010518600A5 (enExample)
US8981382B2 (en) Semiconductor structure including buffer with strain compensation layers
Zhang et al. A review of GaN-based optoelectronic devices on silicon substrate
CN104726935B (zh) Ga2O3系晶体膜的成膜方法和晶体层叠结构体
US20060154455A1 (en) Gallium nitride-based devices and manufacturing process
EP2423991B1 (en) Methods of depositing epitaxial thermoelectric films having reduced crack and/or surface defect densities
JPWO2013125126A1 (ja) 半導体素子および半導体素子の製造方法
TW201000696A (en) Method of manufacturing III nitride crystal, III nitride crystal substrate, and semiconductor device
JPWO2011135963A1 (ja) エピタキシャル基板およびエピタキシャル基板の製造方法
CN102859695A (zh) 外延基板以及外延基板的制造方法
TW200810155A (en) ZnO-based semiconductor element
TW201220361A (en) Epitaxial substrate, semiconductor light-emitting device using such epitaxial substrate and fabrication thereof
TW201222872A (en) Limiting strain relaxation in III-nitride heterostructures by substrate and epitaxial layer patterning
WO2006026932A1 (fr) Semi-conducteur au nitrure du groupe iiia dote d'un contact ohmique de faible impedance
US8395184B2 (en) Semiconductor device based on the cubic silicon carbide single crystal thin film
JP4749583B2 (ja) 半導体基板の製造方法
WO2011122322A1 (ja) エピタキシャル基板およびエピタキシャル基板の製造方法
CN111433889A (zh) 化合物半导体基板
JP5596653B2 (ja) 電界効果トランジスタおよびその製造方法
US10332975B2 (en) Epitaxial substrate for semiconductor device and method for manufacturing same
KR102510589B1 (ko) 반도체 장치 및 이의 제조 방법
JP2002299253A5 (enExample)
CN103137801A (zh) 在钻石基板上形成的磊晶层结构及其制造方法
JP4559586B2 (ja) 単結晶薄膜材料
CN101461046A (zh) 半导体器件