JP2010204122A5 - - Google Patents

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Publication number
JP2010204122A5
JP2010204122A5 JP2010133539A JP2010133539A JP2010204122A5 JP 2010204122 A5 JP2010204122 A5 JP 2010204122A5 JP 2010133539 A JP2010133539 A JP 2010133539A JP 2010133539 A JP2010133539 A JP 2010133539A JP 2010204122 A5 JP2010204122 A5 JP 2010204122A5
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JP
Japan
Prior art keywords
probe
needle tip
probes
inspected
storage device
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Application number
JP2010133539A
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English (en)
Japanese (ja)
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JP5530261B2 (ja
JP2010204122A (ja
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Priority to JP2010133539A priority Critical patent/JP5530261B2/ja
Priority claimed from JP2010133539A external-priority patent/JP5530261B2/ja
Publication of JP2010204122A publication Critical patent/JP2010204122A/ja
Publication of JP2010204122A5 publication Critical patent/JP2010204122A5/ja
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Publication of JP5530261B2 publication Critical patent/JP5530261B2/ja
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JP2010133539A 2010-06-11 2010-06-11 被検査体の通電試験方法 Active JP5530261B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2010133539A JP5530261B2 (ja) 2010-06-11 2010-06-11 被検査体の通電試験方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010133539A JP5530261B2 (ja) 2010-06-11 2010-06-11 被検査体の通電試験方法

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP2006002177A Division JP2007183193A (ja) 2006-01-10 2006-01-10 プロービング装置

Publications (3)

Publication Number Publication Date
JP2010204122A JP2010204122A (ja) 2010-09-16
JP2010204122A5 true JP2010204122A5 (enExample) 2011-11-10
JP5530261B2 JP5530261B2 (ja) 2014-06-25

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ID=42965714

Family Applications (1)

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JP2010133539A Active JP5530261B2 (ja) 2010-06-11 2010-06-11 被検査体の通電試験方法

Country Status (1)

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JP (1) JP5530261B2 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013125001A (ja) * 2011-12-16 2013-06-24 Mitsubishi Electric Corp プローブクリーニング装置
DE102012014812A1 (de) * 2012-07-26 2014-01-30 Etel S.A. Vorrichtung zum Testen von Wafern
JP7421990B2 (ja) 2020-04-08 2024-01-25 株式会社日本マイクロニクス 電気的接続装置および検査方法
CN113805025B (zh) * 2020-06-01 2024-10-11 均豪精密工业股份有限公司 光电检测系统与检测晶粒方法
CN119644232B (zh) * 2025-02-11 2025-06-24 杭州长川科技股份有限公司 探针卡的调平方法、装置、设备及存储介质

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3163221B2 (ja) * 1993-08-25 2001-05-08 東京エレクトロン株式会社 プローブ装置
JPH08306747A (ja) * 1995-04-28 1996-11-22 Matsushita Electric Ind Co Ltd 半導体装置の検査方法及びその検査に用いるプローブカード
JP4163365B2 (ja) * 1999-04-14 2008-10-08 株式会社日本マイクロニクス プローブカードの検査装置

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