JP2010164490A5 - - Google Patents

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Publication number
JP2010164490A5
JP2010164490A5 JP2009008181A JP2009008181A JP2010164490A5 JP 2010164490 A5 JP2010164490 A5 JP 2010164490A5 JP 2009008181 A JP2009008181 A JP 2009008181A JP 2009008181 A JP2009008181 A JP 2009008181A JP 2010164490 A5 JP2010164490 A5 JP 2010164490A5
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JP
Japan
Prior art keywords
disposed
wiring
test apparatus
wiring board
electrically connected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2009008181A
Other languages
English (en)
Japanese (ja)
Other versions
JP5258590B2 (ja
JP2010164490A (ja
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Publication date
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Priority to JP2009008181A priority Critical patent/JP5258590B2/ja
Priority claimed from JP2009008181A external-priority patent/JP5258590B2/ja
Publication of JP2010164490A publication Critical patent/JP2010164490A/ja
Publication of JP2010164490A5 publication Critical patent/JP2010164490A5/ja
Application granted granted Critical
Publication of JP5258590B2 publication Critical patent/JP5258590B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2009008181A 2009-01-16 2009-01-16 集積回路の試験装置 Active JP5258590B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2009008181A JP5258590B2 (ja) 2009-01-16 2009-01-16 集積回路の試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009008181A JP5258590B2 (ja) 2009-01-16 2009-01-16 集積回路の試験装置

Publications (3)

Publication Number Publication Date
JP2010164490A JP2010164490A (ja) 2010-07-29
JP2010164490A5 true JP2010164490A5 (zh) 2012-01-26
JP5258590B2 JP5258590B2 (ja) 2013-08-07

Family

ID=42580768

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009008181A Active JP5258590B2 (ja) 2009-01-16 2009-01-16 集積回路の試験装置

Country Status (1)

Country Link
JP (1) JP5258590B2 (zh)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5928203B2 (ja) 2012-07-10 2016-06-01 三菱電機株式会社 検査装置
CN103795340A (zh) * 2014-02-14 2014-05-14 苏州众显电子科技有限公司 一种聚光型便携光源的功率表测试高倍聚光电池片装置
CN105353253B (zh) * 2015-11-28 2018-04-10 南通华夏飞机工程技术股份有限公司 航空风扇测试电路
JP7157410B2 (ja) * 2018-02-21 2022-10-20 国立大学法人大阪大学 半導体検査装置及び半導体検査方法
KR20220146304A (ko) 2021-04-23 2022-11-01 삼성전자주식회사 전원변환부를 갖는 프로브 카드 및 이를 포함하는 테스트 시스템

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1243302B (it) * 1990-06-19 1994-05-26 St Microelectronics Srl Connessione universale multicontatto tra scheda portasonde ews e scheda di prova per una stazione di collaudo su fetta di dispositivi a semiconduttore.
JP4794777B2 (ja) * 2001-09-13 2011-10-19 オリンパス株式会社 内視鏡用光源装置の回転フィルタ
JP4439360B2 (ja) * 2004-09-14 2010-03-24 株式会社日本マイクロニクス 電気的接続装置
KR101025895B1 (ko) * 2006-06-08 2011-03-30 니혼 하츠쵸 가부시키가이샤 프로브 카드
JP2008128838A (ja) * 2006-11-21 2008-06-05 Shinko Electric Ind Co Ltd プローブ装置
JP4981525B2 (ja) * 2007-06-04 2012-07-25 日本電子材料株式会社 半導体検査装置

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