JP2010164490A5 - - Google Patents
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- Publication number
- JP2010164490A5 JP2010164490A5 JP2009008181A JP2009008181A JP2010164490A5 JP 2010164490 A5 JP2010164490 A5 JP 2010164490A5 JP 2009008181 A JP2009008181 A JP 2009008181A JP 2009008181 A JP2009008181 A JP 2009008181A JP 2010164490 A5 JP2010164490 A5 JP 2010164490A5
- Authority
- JP
- Japan
- Prior art keywords
- disposed
- wiring
- test apparatus
- wiring board
- electrically connected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009008181A JP5258590B2 (ja) | 2009-01-16 | 2009-01-16 | 集積回路の試験装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009008181A JP5258590B2 (ja) | 2009-01-16 | 2009-01-16 | 集積回路の試験装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2010164490A JP2010164490A (ja) | 2010-07-29 |
JP2010164490A5 true JP2010164490A5 (zh) | 2012-01-26 |
JP5258590B2 JP5258590B2 (ja) | 2013-08-07 |
Family
ID=42580768
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2009008181A Active JP5258590B2 (ja) | 2009-01-16 | 2009-01-16 | 集積回路の試験装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP5258590B2 (zh) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5928203B2 (ja) | 2012-07-10 | 2016-06-01 | 三菱電機株式会社 | 検査装置 |
CN103795340A (zh) * | 2014-02-14 | 2014-05-14 | 苏州众显电子科技有限公司 | 一种聚光型便携光源的功率表测试高倍聚光电池片装置 |
CN105353253B (zh) * | 2015-11-28 | 2018-04-10 | 南通华夏飞机工程技术股份有限公司 | 航空风扇测试电路 |
JP7157410B2 (ja) * | 2018-02-21 | 2022-10-20 | 国立大学法人大阪大学 | 半導体検査装置及び半導体検査方法 |
KR20220146304A (ko) | 2021-04-23 | 2022-11-01 | 삼성전자주식회사 | 전원변환부를 갖는 프로브 카드 및 이를 포함하는 테스트 시스템 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
IT1243302B (it) * | 1990-06-19 | 1994-05-26 | St Microelectronics Srl | Connessione universale multicontatto tra scheda portasonde ews e scheda di prova per una stazione di collaudo su fetta di dispositivi a semiconduttore. |
JP4794777B2 (ja) * | 2001-09-13 | 2011-10-19 | オリンパス株式会社 | 内視鏡用光源装置の回転フィルタ |
JP4439360B2 (ja) * | 2004-09-14 | 2010-03-24 | 株式会社日本マイクロニクス | 電気的接続装置 |
KR101025895B1 (ko) * | 2006-06-08 | 2011-03-30 | 니혼 하츠쵸 가부시키가이샤 | 프로브 카드 |
JP2008128838A (ja) * | 2006-11-21 | 2008-06-05 | Shinko Electric Ind Co Ltd | プローブ装置 |
JP4981525B2 (ja) * | 2007-06-04 | 2012-07-25 | 日本電子材料株式会社 | 半導体検査装置 |
-
2009
- 2009-01-16 JP JP2009008181A patent/JP5258590B2/ja active Active
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