JP2010163690A5 - - Google Patents
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- Publication number
- JP2010163690A5 JP2010163690A5 JP2010045946A JP2010045946A JP2010163690A5 JP 2010163690 A5 JP2010163690 A5 JP 2010163690A5 JP 2010045946 A JP2010045946 A JP 2010045946A JP 2010045946 A JP2010045946 A JP 2010045946A JP 2010163690 A5 JP2010163690 A5 JP 2010163690A5
- Authority
- JP
- Japan
- Prior art keywords
- main body
- chamber
- plasma
- separation
- substrate stage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000926 separation method Methods 0.000 claims description 12
- 239000000758 substrate Substances 0.000 claims description 10
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010045946A JP5189609B2 (ja) | 2008-07-31 | 2010-03-02 | プラズマ処理装置 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008197582 | 2008-07-31 | ||
| JP2008197582 | 2008-07-31 | ||
| JP2010045946A JP5189609B2 (ja) | 2008-07-31 | 2010-03-02 | プラズマ処理装置 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010504100A Division JP4580040B2 (ja) | 2008-07-31 | 2009-07-30 | プラズマ処理装置および電子デバイスの製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2010163690A JP2010163690A (ja) | 2010-07-29 |
| JP2010163690A5 true JP2010163690A5 (https=) | 2011-05-26 |
| JP5189609B2 JP5189609B2 (ja) | 2013-04-24 |
Family
ID=41610190
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010504100A Active JP4580040B2 (ja) | 2008-07-31 | 2009-07-30 | プラズマ処理装置および電子デバイスの製造方法 |
| JP2010045946A Active JP5189609B2 (ja) | 2008-07-31 | 2010-03-02 | プラズマ処理装置 |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010504100A Active JP4580040B2 (ja) | 2008-07-31 | 2009-07-30 | プラズマ処理装置および電子デバイスの製造方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8303785B2 (https=) |
| JP (2) | JP4580040B2 (https=) |
| KR (1) | KR101216790B1 (https=) |
| CN (1) | CN102105618B (https=) |
| WO (1) | WO2010013476A1 (https=) |
Families Citing this family (36)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9287092B2 (en) | 2009-05-01 | 2016-03-15 | Advanced Energy Industries, Inc. | Method and apparatus for controlling ion energy distribution |
| US9435029B2 (en) * | 2010-08-29 | 2016-09-06 | Advanced Energy Industries, Inc. | Wafer chucking system for advanced plasma ion energy processing systems |
| US9767988B2 (en) | 2010-08-29 | 2017-09-19 | Advanced Energy Industries, Inc. | Method of controlling the switched mode ion energy distribution system |
| US9287086B2 (en) | 2010-04-26 | 2016-03-15 | Advanced Energy Industries, Inc. | System, method and apparatus for controlling ion energy distribution |
| US11615941B2 (en) | 2009-05-01 | 2023-03-28 | Advanced Energy Industries, Inc. | System, method, and apparatus for controlling ion energy distribution in plasma processing systems |
| US9309594B2 (en) | 2010-04-26 | 2016-04-12 | Advanced Energy Industries, Inc. | System, method and apparatus for controlling ion energy distribution of a projected plasma |
| US9362089B2 (en) | 2010-08-29 | 2016-06-07 | Advanced Energy Industries, Inc. | Method of controlling the switched mode ion energy distribution system |
| JP5458177B2 (ja) | 2010-12-28 | 2014-04-02 | キヤノンアネルバ株式会社 | 半導体装置の製造方法および装置 |
| WO2012109104A2 (en) * | 2011-02-09 | 2012-08-16 | Applied Materials, Inc. | Uniformity tuning capable esc grounding kit for rf pvd chamber |
| JP5654939B2 (ja) * | 2011-04-20 | 2015-01-14 | 株式会社アルバック | 成膜装置 |
| TW201325326A (zh) * | 2011-10-05 | 2013-06-16 | 應用材料股份有限公司 | 電漿處理設備及其基板支撐組件 |
| KR101909571B1 (ko) | 2012-08-28 | 2018-10-19 | 어드밴스드 에너지 인더스트리즈 인코포레이티드 | 넓은 다이내믹 레인지 이온 에너지 바이어스 제어； 고속 이온 에너지 스위칭； 이온 에너지 제어와 펄스동작 바이어스 서플라이； 및 가상 전면 패널 |
| US9685297B2 (en) | 2012-08-28 | 2017-06-20 | Advanced Energy Industries, Inc. | Systems and methods for monitoring faults, anomalies, and other characteristics of a switched mode ion energy distribution system |
| US9210790B2 (en) | 2012-08-28 | 2015-12-08 | Advanced Energy Industries, Inc. | Systems and methods for calibrating a switched mode ion energy distribution system |
| DE102013005868A1 (de) | 2013-04-05 | 2014-10-09 | Leybold Optics Gmbh | Vorrichtung zur Vakuumbehandlung von Substraten |
| SG11201700850QA (en) | 2014-08-08 | 2017-03-30 | Canon Anelva Corp | Sputtering apparatus and processing apparatus |
| EP3387162A4 (en) * | 2015-12-09 | 2019-07-24 | Applied Materials, Inc. | SYSTEM WITH CONFIGURATION FOR SPUTTER SEPARATION ON A SUBSTRATE, SHIELDING DEVICE FOR A SPUTTER SEPARATION CHAMBER, AND METHOD FOR PRODUCING AN ELECTRIC SHIELDING IN A SPUTTER SEPARATION CHAMBER |
| CN109473331B (zh) * | 2017-09-08 | 2022-11-25 | 北京北方华创微电子装备有限公司 | 腔室屏蔽装置和半导体处理腔 |
| US12505986B2 (en) | 2017-11-17 | 2025-12-23 | Advanced Energy Industries, Inc. | Synchronization of plasma processing components |
| US11437221B2 (en) | 2017-11-17 | 2022-09-06 | Advanced Energy Industries, Inc. | Spatial monitoring and control of plasma processing environments |
| WO2019099870A1 (en) | 2017-11-17 | 2019-05-23 | Advanced Energy Industries, Inc. | Synchronized pulsing of plasma processing source and substrate bias |
| JP7289313B2 (ja) | 2017-11-17 | 2023-06-09 | エーイーエス グローバル ホールディングス， プライベート リミテッド | プラズマ処理のためのイオンバイアス電圧の空間的および時間的制御 |
| US12230476B2 (en) | 2017-11-17 | 2025-02-18 | Advanced Energy Industries, Inc. | Integrated control of a plasma processing system |
| KR20250153883A (ko) | 2017-11-17 | 2025-10-27 | 에이이에스 글로벌 홀딩스 피티이 리미티드 | 플라즈마 프로세싱 시스템에서 변조 공급기들의 개선된 적용 |
| CN111602235B (zh) | 2018-01-29 | 2025-03-14 | 应用材料公司 | 用于在pvd处理中减少颗粒的处理配件几何形状 |
| KR102071807B1 (ko) * | 2018-10-31 | 2020-01-30 | 동국대학교 경주캠퍼스 산학협력단 | 듀오플라즈마트론의 교체형 중간전극판 |
| KR102458281B1 (ko) * | 2018-12-27 | 2022-10-24 | 가부시키가이샤 아루박 | 방착부재 및 진공처리장치 |
| TW202536923A (zh) | 2019-07-12 | 2025-09-16 | 新加坡商Aes 全球公司 | 具有控制開關之偏壓供應器 |
| US12125674B2 (en) | 2020-05-11 | 2024-10-22 | Advanced Energy Industries, Inc. | Surface charge and power feedback and control using a switch mode bias system |
| US20210391146A1 (en) * | 2020-06-11 | 2021-12-16 | Applied Materials, Inc. | Rf frequency control and ground path return in semiconductor process chambers |
| US11670487B1 (en) | 2022-01-26 | 2023-06-06 | Advanced Energy Industries, Inc. | Bias supply control and data processing |
| US11942309B2 (en) | 2022-01-26 | 2024-03-26 | Advanced Energy Industries, Inc. | Bias supply with resonant switching |
| US12046448B2 (en) | 2022-01-26 | 2024-07-23 | Advanced Energy Industries, Inc. | Active switch on time control for bias supply |
| JP7776233B2 (ja) * | 2022-06-16 | 2025-11-26 | 東京エレクトロン株式会社 | 成膜装置 |
| US11978613B2 (en) | 2022-09-01 | 2024-05-07 | Advanced Energy Industries, Inc. | Transition control in a bias supply |
| US12567572B2 (en) | 2023-07-11 | 2026-03-03 | Advanced Energy Industries, Inc. | Plasma behaviors predicted by current measurements during asymmetric bias waveform application |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3086095B2 (ja) * | 1992-12-22 | 2000-09-11 | キヤノン株式会社 | スパッタリング装置 |
| JP3563095B2 (ja) * | 1993-10-28 | 2004-09-08 | 株式会社ルネサステクノロジ | 半導体装置の製造方法 |
| JP2954028B2 (ja) * | 1996-08-16 | 1999-09-27 | 山形日本電気株式会社 | スパッタリング装置 |
| JP4108354B2 (ja) * | 2001-03-30 | 2008-06-25 | キヤノンアネルバ株式会社 | スパッタリング装置 |
| JP4406188B2 (ja) * | 2002-06-12 | 2010-01-27 | キヤノンアネルバ株式会社 | 成膜装置 |
| JP4451684B2 (ja) * | 2004-03-17 | 2010-04-14 | キヤノンアネルバ株式会社 | 真空処理装置 |
| CN1315150C (zh) * | 2004-11-12 | 2007-05-09 | 哈尔滨工业大学 | 等离子体脉冲注入的装置 |
| JP4418032B2 (ja) * | 2007-09-11 | 2010-02-17 | キヤノンアネルバ株式会社 | 静電チャック |
| WO2009078094A1 (ja) * | 2007-12-18 | 2009-06-25 | Canon Anelva Corporation | プラズマ処理装置 |
| JP5324251B2 (ja) * | 2008-05-16 | 2013-10-23 | キヤノンアネルバ株式会社 | 基板保持装置 |
-
2009
- 2009-07-30 WO PCT/JP2009/003612 patent/WO2010013476A1/ja not_active Ceased
- 2009-07-30 KR KR1020107014755A patent/KR101216790B1/ko active Active
- 2009-07-30 CN CN2009801292803A patent/CN102105618B/zh active Active
- 2009-07-30 JP JP2010504100A patent/JP4580040B2/ja active Active
-
2010
- 2010-03-02 JP JP2010045946A patent/JP5189609B2/ja active Active
- 2010-12-28 US US12/979,968 patent/US8303785B2/en active Active
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