JP2010153827A5 - - Google Patents

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Publication number
JP2010153827A5
JP2010153827A5 JP2009263770A JP2009263770A JP2010153827A5 JP 2010153827 A5 JP2010153827 A5 JP 2010153827A5 JP 2009263770 A JP2009263770 A JP 2009263770A JP 2009263770 A JP2009263770 A JP 2009263770A JP 2010153827 A5 JP2010153827 A5 JP 2010153827A5
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JP
Japan
Prior art keywords
semiconductor region
semiconductor
impurity
crystalline
amorphous
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Application number
JP2009263770A
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English (en)
Japanese (ja)
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JP5503946B2 (ja
JP2010153827A (ja
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Priority to JP2009263770A priority Critical patent/JP5503946B2/ja
Priority claimed from JP2009263770A external-priority patent/JP5503946B2/ja
Publication of JP2010153827A publication Critical patent/JP2010153827A/ja
Publication of JP2010153827A5 publication Critical patent/JP2010153827A5/ja
Application granted granted Critical
Publication of JP5503946B2 publication Critical patent/JP5503946B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2009263770A 2008-11-28 2009-11-19 光電変換装置 Expired - Fee Related JP5503946B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2009263770A JP5503946B2 (ja) 2008-11-28 2009-11-19 光電変換装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2008303441 2008-11-28
JP2008303441 2008-11-28
JP2009263770A JP5503946B2 (ja) 2008-11-28 2009-11-19 光電変換装置

Publications (3)

Publication Number Publication Date
JP2010153827A JP2010153827A (ja) 2010-07-08
JP2010153827A5 true JP2010153827A5 (enExample) 2012-12-27
JP5503946B2 JP5503946B2 (ja) 2014-05-28

Family

ID=42229734

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009263770A Expired - Fee Related JP5503946B2 (ja) 2008-11-28 2009-11-19 光電変換装置

Country Status (4)

Country Link
US (1) US20100139766A1 (enExample)
JP (1) JP5503946B2 (enExample)
CN (1) CN101752433B (enExample)
TW (1) TWI488317B (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8704083B2 (en) * 2010-02-11 2014-04-22 Semiconductor Energy Laboratory Co., Ltd. Photoelectric conversion device and fabrication method thereof
US9076909B2 (en) * 2010-06-18 2015-07-07 Semiconductor Energy Laboratory Co., Ltd. Photoelectric conversion device and method for manufacturing the same
US9159939B2 (en) * 2011-07-21 2015-10-13 Semiconductor Energy Laboratory Co., Ltd. Photoelectric conversion device
JP5933495B2 (ja) * 2012-09-28 2016-06-08 富士フイルム株式会社 有機電界発光素子及び有機電界発光素子の製造方法
US9905837B2 (en) * 2014-08-21 2018-02-27 Sony Corporation Imaging element, solid-state imaging device, and electronic device
JP6139731B2 (ja) * 2016-03-23 2017-05-31 株式会社半導体エネルギー研究所 光電変換装置の作製方法
CN108987522A (zh) * 2018-07-25 2018-12-11 京东方科技集团股份有限公司 一种光电传感器、光电传感组件及其制作方法
CN113860410B (zh) * 2021-09-30 2022-06-10 海南大学 一种全角度太阳能高效驱动水蒸发仿生材料及其制备方法

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4878097A (en) * 1984-05-15 1989-10-31 Eastman Kodak Company Semiconductor photoelectric conversion device and method for making same
US6413805B1 (en) * 1993-03-12 2002-07-02 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device forming method
US5677236A (en) * 1995-02-24 1997-10-14 Mitsui Toatsu Chemicals, Inc. Process for forming a thin microcrystalline silicon semiconductor film
US6472248B2 (en) * 1999-07-04 2002-10-29 Canon Kabushiki Kaisha Microcrystalline series photovoltaic element and process for fabrication of same
US6204156B1 (en) * 1999-09-02 2001-03-20 Micron Technology, Inc. Method to fabricate an intrinsic polycrystalline silicon film
US6858308B2 (en) * 2001-03-12 2005-02-22 Canon Kabushiki Kaisha Semiconductor element, and method of forming silicon-based film
KR100627203B1 (ko) * 2001-08-14 2006-09-22 제이에스알 가부시끼가이샤 실란 조성물, 실리콘막의 형성법 및 태양 전지의 제조법
JP4240984B2 (ja) * 2002-10-08 2009-03-18 三洋電機株式会社 光電変換装置
US20050236030A1 (en) * 2003-11-27 2005-10-27 Kyocera Corporation Photoelectric conversion device and method for manufacturing the same
TWI273719B (en) * 2005-12-30 2007-02-11 Ind Tech Res Inst Nanocrystal and photovoltaics applying the same
US8049103B2 (en) * 2006-01-18 2011-11-01 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
US8278739B2 (en) * 2006-03-20 2012-10-02 Semiconductor Energy Laboratory Co., Ltd. Crystalline semiconductor film, semiconductor device, and method for manufacturing thereof
CN101043058A (zh) * 2006-03-20 2007-09-26 上海太阳能科技有限公司 非晶硅-晶体硅异质结太阳电池
TWM323112U (en) * 2006-12-28 2007-12-01 Advance Design Technology Inc Thin film solar-cell with multi level microcrystalline silicon
TW200832714A (en) * 2007-01-29 2008-08-01 Innolux Display Corp Fabricating method for low temperatyue polysilicon thin film
KR100861548B1 (ko) * 2007-04-27 2008-10-02 엘지전자 주식회사 박막형 태양전지와 그의 제조방법

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