JP2010119846A5 - - Google Patents

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Publication number
JP2010119846A5
JP2010119846A5 JP2009262227A JP2009262227A JP2010119846A5 JP 2010119846 A5 JP2010119846 A5 JP 2010119846A5 JP 2009262227 A JP2009262227 A JP 2009262227A JP 2009262227 A JP2009262227 A JP 2009262227A JP 2010119846 A5 JP2010119846 A5 JP 2010119846A5
Authority
JP
Japan
Prior art keywords
electrode
probe
unidirectional
piezoelectric
conduction part
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2009262227A
Other languages
English (en)
Japanese (ja)
Other versions
JP2010119846A (ja
Filing date
Publication date
Priority claimed from KR1020080115410A external-priority patent/KR101133462B1/ko
Application filed filed Critical
Publication of JP2010119846A publication Critical patent/JP2010119846A/ja
Publication of JP2010119846A5 publication Critical patent/JP2010119846A5/ja
Pending legal-status Critical Current

Links

JP2009262227A 2008-11-19 2009-11-17 超音波診断装置用プローブ及びその製造方法 Pending JP2010119846A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020080115410A KR101133462B1 (ko) 2008-11-19 2008-11-19 초음파 진단장치용 프로브 및 그 제조방법

Publications (2)

Publication Number Publication Date
JP2010119846A JP2010119846A (ja) 2010-06-03
JP2010119846A5 true JP2010119846A5 (enExample) 2013-07-18

Family

ID=41334584

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009262227A Pending JP2010119846A (ja) 2008-11-19 2009-11-17 超音波診断装置用プローブ及びその製造方法

Country Status (4)

Country Link
US (1) US20100125208A1 (enExample)
EP (1) EP2190008A1 (enExample)
JP (1) JP2010119846A (enExample)
KR (1) KR101133462B1 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101196214B1 (ko) 2010-09-06 2012-11-05 삼성메디슨 주식회사 초음파 진단장치용 프로브
KR101491510B1 (ko) 2011-10-05 2015-02-09 가부시키가이샤 무라타 세이사쿠쇼 초음파 센서
KR102627726B1 (ko) * 2016-05-10 2024-01-23 삼성메디슨 주식회사 초음파 프로브
EP3694007A1 (en) * 2019-02-05 2020-08-12 Koninklijke Philips N.V. Sensor comprising an interconnect having a carrier film
JP7336877B2 (ja) * 2019-05-21 2023-09-01 東京エレクトロン株式会社 基板処理装置および基板処理方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5760488U (enExample) * 1980-09-29 1982-04-09
JPS61288700A (ja) * 1985-06-17 1986-12-18 Fujitsu Ltd 超音波探触子
JP2615517B2 (ja) * 1991-07-25 1997-05-28 松下電器産業株式会社 超音波探触子の製造方法
JP3673035B2 (ja) * 1996-10-25 2005-07-20 株式会社東芝 超音波トランスジューサ
US6043590A (en) * 1997-04-18 2000-03-28 Atl Ultrasound Composite transducer with connective backing block
JP2000125393A (ja) * 1998-10-20 2000-04-28 Olympus Optical Co Ltd 超音波トランスデューサー
JP4408974B2 (ja) * 1998-12-09 2010-02-03 株式会社東芝 超音波トランスジューサ及びその製造方法
US6640634B2 (en) * 2000-03-31 2003-11-04 Kabushiki Kaisha Toshiba Ultrasonic probe, method of manufacturing the same and ultrasonic diagnosis apparatus
US6558323B2 (en) * 2000-11-29 2003-05-06 Olympus Optical Co., Ltd. Ultrasound transducer array
JP3940683B2 (ja) * 2003-02-24 2007-07-04 株式会社東芝 超音波探触子及びその製造方法
JP4256309B2 (ja) * 2003-09-29 2009-04-22 株式会社東芝 超音波プローブおよび超音波診断装置
JP4253334B2 (ja) * 2006-07-12 2009-04-08 株式会社東芝 ２次元アレイ型超音波プローブ

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