JP2010091341A5 - - Google Patents
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- JP2010091341A5 JP2010091341A5 JP2008259986A JP2008259986A JP2010091341A5 JP 2010091341 A5 JP2010091341 A5 JP 2010091341A5 JP 2008259986 A JP2008259986 A JP 2008259986A JP 2008259986 A JP2008259986 A JP 2008259986A JP 2010091341 A5 JP2010091341 A5 JP 2010091341A5
- Authority
- JP
- Japan
- Prior art keywords
- light
- led
- light path
- shutter
- support
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 230000003287 optical Effects 0.000 claims description 27
- 230000000875 corresponding Effects 0.000 claims description 14
- 239000000758 substrate Substances 0.000 description 16
- 239000011295 pitch Substances 0.000 description 7
- 239000011159 matrix material Substances 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 229910001111 Fine metal Inorganic materials 0.000 description 1
- 230000000903 blocking Effects 0.000 description 1
- 230000001808 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000012447 hatching Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000006011 modification reaction Methods 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008259986A JP5239716B2 (ja) | 2008-10-06 | 2008-10-06 | Ledの試験装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008259986A JP5239716B2 (ja) | 2008-10-06 | 2008-10-06 | Ledの試験装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2010091341A JP2010091341A (ja) | 2010-04-22 |
JP2010091341A5 true JP2010091341A5 (ko) | 2011-11-10 |
JP5239716B2 JP5239716B2 (ja) | 2013-07-17 |
Family
ID=42254209
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008259986A Expired - Fee Related JP5239716B2 (ja) | 2008-10-06 | 2008-10-06 | Ledの試験装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP5239716B2 (ko) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8404341B2 (en) | 2006-01-26 | 2013-03-26 | Outlast Technologies, LLC | Microcapsules and other containment structures for articles incorporating functional polymeric phase change materials |
US9234059B2 (en) | 2008-07-16 | 2016-01-12 | Outlast Technologies, LLC | Articles containing functional polymeric phase change materials and methods of manufacturing the same |
US20100015430A1 (en) | 2008-07-16 | 2010-01-21 | Outlast Technologies, Inc. | Heat Regulating Article With Moisture Enhanced Temperature Control |
US8221910B2 (en) | 2008-07-16 | 2012-07-17 | Outlast Technologies, LLC | Thermal regulating building materials and other construction components containing polymeric phase change materials |
JP5665324B2 (ja) * | 2010-01-27 | 2015-02-04 | パナソニック株式会社 | 全光量測定システム、全光量測定装置、および、全光量測定方法 |
JP5307080B2 (ja) * | 2010-06-30 | 2013-10-02 | パナソニック株式会社 | 全光量測定システム、全光量測定装置、全光量測定方法 |
US8673448B2 (en) | 2011-03-04 | 2014-03-18 | Outlast Technologies Llc | Articles containing precisely branched functional polymeric phase change materials |
KR101311923B1 (ko) * | 2012-01-31 | 2013-10-14 | 주식회사 에타맥스 | 발광다이오드 테스트 모듈 |
JP5567223B2 (ja) * | 2012-07-31 | 2014-08-06 | パイオニア株式会社 | 光量測定装置及び光量測定方法 |
WO2014020713A1 (ja) * | 2012-07-31 | 2014-02-06 | パイオニア株式会社 | 光量測定装置及び光量測定方法 |
US10003053B2 (en) | 2015-02-04 | 2018-06-19 | Global Web Horizons, Llc | Systems, structures and materials for electrochemical device thermal management |
US10431858B2 (en) | 2015-02-04 | 2019-10-01 | Global Web Horizons, Llc | Systems, structures and materials for electrochemical device thermal management |
CN113281629B (zh) * | 2021-04-10 | 2022-07-01 | 深圳市永而佳实业有限公司 | 一种发光二极管阵列检测装置及其使用方法 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61239680A (ja) * | 1985-04-16 | 1986-10-24 | Hitachi Cable Ltd | 発光ダイオ−ドアレイの試験方法 |
JPS62119644U (ko) * | 1986-01-23 | 1987-07-29 | ||
JPS63177033A (ja) * | 1987-01-19 | 1988-07-21 | Alps Electric Co Ltd | 発光ダイオ−ドヘツドの測定方法および測定装置 |
JP2520387B2 (ja) * | 1990-08-06 | 1996-07-31 | 富士通株式会社 | Ledアレイの光ビ―ム径測定装置 |
JPH0560651A (ja) * | 1991-09-03 | 1993-03-12 | Nikko Kyodo Co Ltd | 光素子評価装置 |
JP3375752B2 (ja) * | 1994-09-07 | 2003-02-10 | 星和電機株式会社 | Ledチップ光学特性計測センサ |
JP2004287368A (ja) * | 2003-01-27 | 2004-10-14 | Tokyo Electron Ltd | 検査装置 |
JP2006250656A (ja) * | 2005-03-10 | 2006-09-21 | Fuji Photo Film Co Ltd | 発光素子アレイの照度むら測定方法及び装置 |
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2008
- 2008-10-06 JP JP2008259986A patent/JP5239716B2/ja not_active Expired - Fee Related
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