JP2010091341A5 - - Google Patents

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Publication number
JP2010091341A5
JP2010091341A5 JP2008259986A JP2008259986A JP2010091341A5 JP 2010091341 A5 JP2010091341 A5 JP 2010091341A5 JP 2008259986 A JP2008259986 A JP 2008259986A JP 2008259986 A JP2008259986 A JP 2008259986A JP 2010091341 A5 JP2010091341 A5 JP 2010091341A5
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JP
Japan
Prior art keywords
light
led
light path
shutter
support
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Application number
JP2008259986A
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English (en)
Japanese (ja)
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JP2010091341A (ja
JP5239716B2 (ja
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Priority to JP2008259986A priority Critical patent/JP5239716B2/ja
Priority claimed from JP2008259986A external-priority patent/JP5239716B2/ja
Publication of JP2010091341A publication Critical patent/JP2010091341A/ja
Publication of JP2010091341A5 publication Critical patent/JP2010091341A5/ja
Application granted granted Critical
Publication of JP5239716B2 publication Critical patent/JP5239716B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2008259986A 2008-10-06 2008-10-06 Ledの試験装置 Expired - Fee Related JP5239716B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2008259986A JP5239716B2 (ja) 2008-10-06 2008-10-06 Ledの試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008259986A JP5239716B2 (ja) 2008-10-06 2008-10-06 Ledの試験装置

Publications (3)

Publication Number Publication Date
JP2010091341A JP2010091341A (ja) 2010-04-22
JP2010091341A5 true JP2010091341A5 (ko) 2011-11-10
JP5239716B2 JP5239716B2 (ja) 2013-07-17

Family

ID=42254209

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008259986A Expired - Fee Related JP5239716B2 (ja) 2008-10-06 2008-10-06 Ledの試験装置

Country Status (1)

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JP (1) JP5239716B2 (ko)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8404341B2 (en) 2006-01-26 2013-03-26 Outlast Technologies, LLC Microcapsules and other containment structures for articles incorporating functional polymeric phase change materials
US9234059B2 (en) 2008-07-16 2016-01-12 Outlast Technologies, LLC Articles containing functional polymeric phase change materials and methods of manufacturing the same
US20100015430A1 (en) 2008-07-16 2010-01-21 Outlast Technologies, Inc. Heat Regulating Article With Moisture Enhanced Temperature Control
US8221910B2 (en) 2008-07-16 2012-07-17 Outlast Technologies, LLC Thermal regulating building materials and other construction components containing polymeric phase change materials
JP5665324B2 (ja) * 2010-01-27 2015-02-04 パナソニック株式会社 全光量測定システム、全光量測定装置、および、全光量測定方法
JP5307080B2 (ja) * 2010-06-30 2013-10-02 パナソニック株式会社 全光量測定システム、全光量測定装置、全光量測定方法
US8673448B2 (en) 2011-03-04 2014-03-18 Outlast Technologies Llc Articles containing precisely branched functional polymeric phase change materials
KR101311923B1 (ko) * 2012-01-31 2013-10-14 주식회사 에타맥스 발광다이오드 테스트 모듈
JP5567223B2 (ja) * 2012-07-31 2014-08-06 パイオニア株式会社 光量測定装置及び光量測定方法
WO2014020713A1 (ja) * 2012-07-31 2014-02-06 パイオニア株式会社 光量測定装置及び光量測定方法
US10003053B2 (en) 2015-02-04 2018-06-19 Global Web Horizons, Llc Systems, structures and materials for electrochemical device thermal management
US10431858B2 (en) 2015-02-04 2019-10-01 Global Web Horizons, Llc Systems, structures and materials for electrochemical device thermal management
CN113281629B (zh) * 2021-04-10 2022-07-01 深圳市永而佳实业有限公司 一种发光二极管阵列检测装置及其使用方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61239680A (ja) * 1985-04-16 1986-10-24 Hitachi Cable Ltd 発光ダイオ−ドアレイの試験方法
JPS62119644U (ko) * 1986-01-23 1987-07-29
JPS63177033A (ja) * 1987-01-19 1988-07-21 Alps Electric Co Ltd 発光ダイオ−ドヘツドの測定方法および測定装置
JP2520387B2 (ja) * 1990-08-06 1996-07-31 富士通株式会社 Ledアレイの光ビ―ム径測定装置
JPH0560651A (ja) * 1991-09-03 1993-03-12 Nikko Kyodo Co Ltd 光素子評価装置
JP3375752B2 (ja) * 1994-09-07 2003-02-10 星和電機株式会社 Ledチップ光学特性計測センサ
JP2004287368A (ja) * 2003-01-27 2004-10-14 Tokyo Electron Ltd 検査装置
JP2006250656A (ja) * 2005-03-10 2006-09-21 Fuji Photo Film Co Ltd 発光素子アレイの照度むら測定方法及び装置

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