JP2010085396A5 - - Google Patents

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Publication number
JP2010085396A5
JP2010085396A5 JP2009201802A JP2009201802A JP2010085396A5 JP 2010085396 A5 JP2010085396 A5 JP 2010085396A5 JP 2009201802 A JP2009201802 A JP 2009201802A JP 2009201802 A JP2009201802 A JP 2009201802A JP 2010085396 A5 JP2010085396 A5 JP 2010085396A5
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JP
Japan
Prior art keywords
circuit
function
generating
current
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2009201802A
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English (en)
Japanese (ja)
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JP2010085396A (ja
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Publication date
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Priority to JP2009201802A priority Critical patent/JP2010085396A/ja
Priority claimed from JP2009201802A external-priority patent/JP2010085396A/ja
Publication of JP2010085396A publication Critical patent/JP2010085396A/ja
Publication of JP2010085396A5 publication Critical patent/JP2010085396A5/ja
Withdrawn legal-status Critical Current

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JP2009201802A 2008-09-04 2009-09-01 光検出装置 Withdrawn JP2010085396A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2009201802A JP2010085396A (ja) 2008-09-04 2009-09-01 光検出装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2008226774 2008-09-04
JP2009201802A JP2010085396A (ja) 2008-09-04 2009-09-01 光検出装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2014123045A Division JP5897647B2 (ja) 2008-09-04 2014-06-16 光検出装置

Publications (2)

Publication Number Publication Date
JP2010085396A JP2010085396A (ja) 2010-04-15
JP2010085396A5 true JP2010085396A5 (enExample) 2012-10-11

Family

ID=41723892

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2009201802A Withdrawn JP2010085396A (ja) 2008-09-04 2009-09-01 光検出装置
JP2014123045A Expired - Fee Related JP5897647B2 (ja) 2008-09-04 2014-06-16 光検出装置

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2014123045A Expired - Fee Related JP5897647B2 (ja) 2008-09-04 2014-06-16 光検出装置

Country Status (2)

Country Link
US (1) US8106346B2 (enExample)
JP (2) JP2010085396A (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7923800B2 (en) * 2006-12-27 2011-04-12 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and electronic device
US8106346B2 (en) * 2008-09-04 2012-01-31 Semiconductor Energy Laboratory Co., Ltd. Photodetector
US9117958B2 (en) 2010-06-25 2015-08-25 Semiconductor Energy Laboratory Co., Ltd. Photoelectric conversion device comprising photoelectric conversion element
JP5744463B2 (ja) * 2010-10-14 2015-07-08 キヤノン株式会社 光電変換装置
US9885605B2 (en) * 2014-05-19 2018-02-06 Infineon Technologies Ag Photocell devices, systems and methods
JP6499031B2 (ja) * 2015-06-30 2019-04-10 エイブリック株式会社 電子機器
WO2018235819A1 (ja) * 2017-06-23 2018-12-27 パイオニア株式会社 電磁波検出装置
WO2018235817A1 (ja) * 2017-06-23 2018-12-27 パイオニア株式会社 電磁波検出装置
US11474921B2 (en) * 2020-07-13 2022-10-18 Micron Technology, Inc. Log compression
CN113091900A (zh) * 2021-03-01 2021-07-09 北京大学 一种读出电路和一种红外成像仪

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5737221A (en) * 1980-08-19 1982-03-01 Ricoh Co Ltd Thermal compensation system for light measuring circuit
JPS63205527A (ja) * 1987-02-20 1988-08-25 Sanyo Electric Co Ltd 測光回路
JPH03136026A (ja) * 1989-10-23 1991-06-10 Mitsubishi Electric Corp 色温度情報記録カメラおよび色温度情報記録方法
JPH03216523A (ja) * 1990-01-22 1991-09-24 Olympus Optical Co Ltd 測光回路
JPH04252923A (ja) * 1991-01-29 1992-09-08 Toshiba Corp 光検波回路
JPH06313840A (ja) 1993-04-30 1994-11-08 Fuji Film Micro Device Kk 測光装置と測光方法
US5850195A (en) * 1993-09-09 1998-12-15 Texas Instruments Incorporated Monolithic light-to-digital signal converter
JP3329680B2 (ja) * 1996-05-16 2002-09-30 株式会社デンソー 光センサ
JP2000266790A (ja) * 1999-03-19 2000-09-29 Toshiba Corp 周波数測定装置
JP2002131854A (ja) 2000-10-24 2002-05-09 Fuji Photo Film Co Ltd 放射線画像情報読取装置
US6504168B2 (en) * 2000-06-14 2003-01-07 Fuji Photo Film Co., Ltd. Radiation image read-out method and apparatus
JP4831892B2 (ja) * 2001-07-30 2011-12-07 株式会社半導体エネルギー研究所 半導体装置
US6556155B1 (en) * 2002-02-19 2003-04-29 Texas Advanced Optoelectronic Solutions, Inc. Method and integrated circuit for temperature coefficient compensation
JP4234485B2 (ja) * 2003-04-28 2009-03-04 浜松ホトニクス株式会社 Ｉ／ｆ変換装置および光検出装置
JP2005129909A (ja) * 2003-09-19 2005-05-19 Semiconductor Energy Lab Co Ltd 光センサー装置および電子機器
JP2007052569A (ja) * 2005-08-17 2007-03-01 Rohm Co Ltd 定電流回路およびそれを用いたインバータならびに発振回路
JP4201808B2 (ja) * 2006-11-08 2008-12-24 シャープ株式会社 光電流検出回路ならびにそれを備えた光センサおよび電子機器
US7612322B2 (en) * 2007-02-15 2009-11-03 Avago Technologies Ecbu Ip (Singapore) Pte. Ltd. Temperature-compensated high dynamic range optical receiver
US8106346B2 (en) * 2008-09-04 2012-01-31 Semiconductor Energy Laboratory Co., Ltd. Photodetector
US7969223B1 (en) * 2010-04-30 2011-06-28 Analog Devices, Inc. Temperature compensation for logarithmic circuits

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