JP2010061779A5 - - Google Patents

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Publication number
JP2010061779A5
JP2010061779A5 JP2009080470A JP2009080470A JP2010061779A5 JP 2010061779 A5 JP2010061779 A5 JP 2010061779A5 JP 2009080470 A JP2009080470 A JP 2009080470A JP 2009080470 A JP2009080470 A JP 2009080470A JP 2010061779 A5 JP2010061779 A5 JP 2010061779A5
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JP
Japan
Prior art keywords
signal
count
latch
crossing circuit
unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2009080470A
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English (en)
Japanese (ja)
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JP2010061779A (ja
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Publication date
Priority claimed from KR1020080087783A external-priority patent/KR100925393B1/ko
Application filed filed Critical
Publication of JP2010061779A publication Critical patent/JP2010061779A/ja
Publication of JP2010061779A5 publication Critical patent/JP2010061779A5/ja
Pending legal-status Critical Current

Links

JP2009080470A 2008-09-05 2009-03-27 半導体メモリ装置のドメインクロシング回路 Pending JP2010061779A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020080087783A KR100925393B1 (ko) 2008-09-05 2008-09-05 반도체 메모리 장치의 도메인 크로싱 회로

Publications (2)

Publication Number Publication Date
JP2010061779A JP2010061779A (ja) 2010-03-18
JP2010061779A5 true JP2010061779A5 (enExample) 2012-05-24

Family

ID=41561294

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009080470A Pending JP2010061779A (ja) 2008-09-05 2009-03-27 半導体メモリ装置のドメインクロシング回路

Country Status (3)

Country Link
US (1) US8099620B2 (enExample)
JP (1) JP2010061779A (enExample)
KR (1) KR100925393B1 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8326364B2 (en) * 2010-05-13 2012-12-04 Texas Instruments Incorporated High resolution, low power design for CPRI/OBSAI latency measurement
US8977881B2 (en) * 2011-08-12 2015-03-10 Apple Inc. Controller core time base synchronization
DE102016104767B4 (de) * 2016-03-15 2017-10-12 Pilz Gmbh & Co. Kg Vorrichtung und Verfahren zum Steuern einer automatisierten Anlage
KR102491691B1 (ko) * 2018-02-23 2023-01-27 에스케이하이닉스 주식회사 읽기 타임아웃 관리부 및 이를 포함하는 메모리 시스템과, 읽기 타임아웃 관리방법
KR20190134037A (ko) * 2018-05-24 2019-12-04 에스케이하이닉스 주식회사 도메인 크로싱 기능을 갖는 반도체 장치
US12449835B2 (en) * 2023-08-02 2025-10-21 Xilinx, Inc. Measuring and compensating for clock tree variation
WO2025136397A1 (en) * 2023-12-21 2025-06-26 Google Llc Clock domain crossing for time tracking

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3078934B2 (ja) 1992-12-28 2000-08-21 富士通株式会社 同期型ランダムアクセスメモリ
KR100532441B1 (ko) * 2003-06-09 2005-11-30 삼성전자주식회사 레이턴시 회로를 구비하는 반도체 메모리 장치 및 그데이터 출력 제어 방법
KR100522433B1 (ko) 2003-04-29 2005-10-20 주식회사 하이닉스반도체 도메인 크로싱 회로
TWI267871B (en) * 2004-01-10 2006-12-01 Hynix Semiconductor Inc Domain crossing device
US7084680B2 (en) * 2004-08-31 2006-08-01 Micron Technology, Inc. Method and apparatus for timing domain crossing
KR100625296B1 (ko) * 2004-12-30 2006-09-19 주식회사 하이닉스반도체 고주파수 동작을 위한 동기식 반도체 장치의 레이턴시제어장치 및 그 제어방법
KR100829455B1 (ko) 2006-11-13 2008-05-15 주식회사 하이닉스반도체 반도체 메모리 장치의 데이터 출력 제어신호 생성회로 및방법

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