JP2010054601A5 - - Google Patents
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- Publication number
- JP2010054601A5 JP2010054601A5 JP2008216873A JP2008216873A JP2010054601A5 JP 2010054601 A5 JP2010054601 A5 JP 2010054601A5 JP 2008216873 A JP2008216873 A JP 2008216873A JP 2008216873 A JP2008216873 A JP 2008216873A JP 2010054601 A5 JP2010054601 A5 JP 2010054601A5
- Authority
- JP
- Japan
- Prior art keywords
- objective lens
- phase difference
- microscope
- difference objective
- detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008216873A JP5132480B2 (ja) | 2008-08-26 | 2008-08-26 | 顕微鏡 |
| US12/486,420 US8094371B2 (en) | 2008-08-26 | 2009-06-17 | Microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008216873A JP5132480B2 (ja) | 2008-08-26 | 2008-08-26 | 顕微鏡 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2010054601A JP2010054601A (ja) | 2010-03-11 |
| JP2010054601A5 true JP2010054601A5 (enExample) | 2011-09-15 |
| JP5132480B2 JP5132480B2 (ja) | 2013-01-30 |
Family
ID=41725060
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008216873A Expired - Fee Related JP5132480B2 (ja) | 2008-08-26 | 2008-08-26 | 顕微鏡 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US8094371B2 (enExample) |
| JP (1) | JP5132480B2 (enExample) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012048026A (ja) * | 2010-08-27 | 2012-03-08 | Sony Corp | 顕微鏡及びフィルタ挿入方法 |
| JP5201185B2 (ja) * | 2010-09-14 | 2013-06-05 | オムロン株式会社 | 観察光学系およびレーザ加工装置 |
| WO2013089258A1 (ja) * | 2011-12-15 | 2013-06-20 | 株式会社ニコン | 顕微鏡及び刺激装置 |
| US20130162800A1 (en) * | 2011-12-22 | 2013-06-27 | General Electric Company | Quantitative phase microscopy for label-free high-contrast cell imaging using frequency domain phase shift |
| US9097900B2 (en) * | 2012-06-14 | 2015-08-04 | General Electric Company | Quantitative phase microscopy for high-contrast cell imaging using frequency domain phase shift |
| JP6381437B2 (ja) * | 2014-12-24 | 2018-08-29 | オリンパス株式会社 | 位相差顕微鏡 |
| JP6784773B2 (ja) | 2016-11-17 | 2020-11-11 | オリンパス株式会社 | 標本観察装置 |
| DE102017110638B3 (de) * | 2017-05-16 | 2018-09-27 | Leica Microsystems Cms Gmbh | Mikroskop und Mikroskopbeleuchtungsverfahren |
| JP7112686B2 (ja) * | 2018-07-18 | 2022-08-04 | 株式会社エビデント | 標本観察装置 |
| JP7641528B2 (ja) * | 2021-05-21 | 2025-03-07 | パナソニックIpマネジメント株式会社 | 位相差顕微鏡 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5241364A (en) * | 1990-10-19 | 1993-08-31 | Fuji Photo Film Co., Ltd. | Confocal scanning type of phase contrast microscope and scanning microscope |
| US5751475A (en) * | 1993-12-17 | 1998-05-12 | Olympus Optical Co., Ltd. | Phase contrast microscope |
| JP3708246B2 (ja) * | 1996-09-19 | 2005-10-19 | オリンパス株式会社 | 光制御部材を有する光学顕微鏡 |
| JP3841523B2 (ja) | 1997-09-11 | 2006-11-01 | オリンパス株式会社 | 位相差顕微鏡 |
| JP4222877B2 (ja) | 2003-05-28 | 2009-02-12 | オリンパス株式会社 | 顕微鏡観察方法及びそれに用いる顕微鏡 |
| US7564622B2 (en) | 2003-12-12 | 2009-07-21 | Olympus Corporation | Methods for implement microscopy and microscopic measurement as well as microscope and apparatus for implementing them |
| JP4582762B2 (ja) | 2003-12-12 | 2010-11-17 | オリンパス株式会社 | 顕微鏡観察方法及びそれを用いるための顕微鏡 |
-
2008
- 2008-08-26 JP JP2008216873A patent/JP5132480B2/ja not_active Expired - Fee Related
-
2009
- 2009-06-17 US US12/486,420 patent/US8094371B2/en not_active Expired - Fee Related
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