JP5132480B2 - 顕微鏡 - Google Patents

顕微鏡 Download PDF

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Publication number
JP5132480B2
JP5132480B2 JP2008216873A JP2008216873A JP5132480B2 JP 5132480 B2 JP5132480 B2 JP 5132480B2 JP 2008216873 A JP2008216873 A JP 2008216873A JP 2008216873 A JP2008216873 A JP 2008216873A JP 5132480 B2 JP5132480 B2 JP 5132480B2
Authority
JP
Japan
Prior art keywords
objective lens
phase difference
difference objective
microscope
phase
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2008216873A
Other languages
English (en)
Japanese (ja)
Other versions
JP2010054601A (ja
JP2010054601A5 (enExample
Inventor
大介 西脇
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp filed Critical Olympus Corp
Priority to JP2008216873A priority Critical patent/JP5132480B2/ja
Priority to US12/486,420 priority patent/US8094371B2/en
Publication of JP2010054601A publication Critical patent/JP2010054601A/ja
Publication of JP2010054601A5 publication Critical patent/JP2010054601A5/ja
Application granted granted Critical
Publication of JP5132480B2 publication Critical patent/JP5132480B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/14—Condensers affording illumination for phase-contrast observation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0056—Optical details of the image generation based on optical coherence, e.g. phase-contrast arrangements, interference arrangements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
JP2008216873A 2008-08-26 2008-08-26 顕微鏡 Expired - Fee Related JP5132480B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2008216873A JP5132480B2 (ja) 2008-08-26 2008-08-26 顕微鏡
US12/486,420 US8094371B2 (en) 2008-08-26 2009-06-17 Microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008216873A JP5132480B2 (ja) 2008-08-26 2008-08-26 顕微鏡

Publications (3)

Publication Number Publication Date
JP2010054601A JP2010054601A (ja) 2010-03-11
JP2010054601A5 JP2010054601A5 (enExample) 2011-09-15
JP5132480B2 true JP5132480B2 (ja) 2013-01-30

Family

ID=41725060

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008216873A Expired - Fee Related JP5132480B2 (ja) 2008-08-26 2008-08-26 顕微鏡

Country Status (2)

Country Link
US (1) US8094371B2 (enExample)
JP (1) JP5132480B2 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012048026A (ja) * 2010-08-27 2012-03-08 Sony Corp 顕微鏡及びフィルタ挿入方法
JP5201185B2 (ja) * 2010-09-14 2013-06-05 オムロン株式会社 観察光学系およびレーザ加工装置
WO2013089258A1 (ja) * 2011-12-15 2013-06-20 株式会社ニコン 顕微鏡及び刺激装置
US20130162800A1 (en) * 2011-12-22 2013-06-27 General Electric Company Quantitative phase microscopy for label-free high-contrast cell imaging using frequency domain phase shift
US9097900B2 (en) * 2012-06-14 2015-08-04 General Electric Company Quantitative phase microscopy for high-contrast cell imaging using frequency domain phase shift
JP6381437B2 (ja) * 2014-12-24 2018-08-29 オリンパス株式会社 位相差顕微鏡
JP6784773B2 (ja) 2016-11-17 2020-11-11 オリンパス株式会社 標本観察装置
DE102017110638B3 (de) * 2017-05-16 2018-09-27 Leica Microsystems Cms Gmbh Mikroskop und Mikroskopbeleuchtungsverfahren
JP7112686B2 (ja) * 2018-07-18 2022-08-04 株式会社エビデント 標本観察装置
JP7641528B2 (ja) * 2021-05-21 2025-03-07 パナソニックＩｐマネジメント株式会社 位相差顕微鏡

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5241364A (en) * 1990-10-19 1993-08-31 Fuji Photo Film Co., Ltd. Confocal scanning type of phase contrast microscope and scanning microscope
US5751475A (en) * 1993-12-17 1998-05-12 Olympus Optical Co., Ltd. Phase contrast microscope
JP3708246B2 (ja) * 1996-09-19 2005-10-19 オリンパス株式会社 光制御部材を有する光学顕微鏡
JP3841523B2 (ja) 1997-09-11 2006-11-01 オリンパス株式会社 位相差顕微鏡
JP4222877B2 (ja) 2003-05-28 2009-02-12 オリンパス株式会社 顕微鏡観察方法及びそれに用いる顕微鏡
US7564622B2 (en) 2003-12-12 2009-07-21 Olympus Corporation Methods for implement microscopy and microscopic measurement as well as microscope and apparatus for implementing them
JP4582762B2 (ja) 2003-12-12 2010-11-17 オリンパス株式会社 顕微鏡観察方法及びそれを用いるための顕微鏡

Also Published As

Publication number Publication date
JP2010054601A (ja) 2010-03-11
US20100053740A1 (en) 2010-03-04
US8094371B2 (en) 2012-01-10

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