JP2009265074A5 - - Google Patents

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Publication number
JP2009265074A5
JP2009265074A5 JP2008211462A JP2008211462A JP2009265074A5 JP 2009265074 A5 JP2009265074 A5 JP 2009265074A5 JP 2008211462 A JP2008211462 A JP 2008211462A JP 2008211462 A JP2008211462 A JP 2008211462A JP 2009265074 A5 JP2009265074 A5 JP 2009265074A5
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JP
Japan
Prior art keywords
light
transistor
threshold
detection
unit
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JP2008211462A
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English (en)
Japanese (ja)
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JP2009265074A (ja
JP5057340B2 (ja
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Priority to JP2008211462A priority Critical patent/JP5057340B2/ja
Priority claimed from JP2008211462A external-priority patent/JP5057340B2/ja
Priority to US12/395,772 priority patent/US7885778B2/en
Priority to TW098108900A priority patent/TWI416484B/zh
Priority to CN200910132431.2A priority patent/CN101552278B/zh
Publication of JP2009265074A publication Critical patent/JP2009265074A/ja
Publication of JP2009265074A5 publication Critical patent/JP2009265074A5/ja
Application granted granted Critical
Publication of JP5057340B2 publication Critical patent/JP5057340B2/ja
Expired - Fee Related legal-status Critical Current
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JP2008211462A 2008-03-31 2008-08-20 光検出装置、電気光学装置及び電子機器 Expired - Fee Related JP5057340B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2008211462A JP5057340B2 (ja) 2008-03-31 2008-08-20 光検出装置、電気光学装置及び電子機器
US12/395,772 US7885778B2 (en) 2008-03-31 2009-03-02 Optical detection device, electro-optical device, electronic apparatus, and optical degradation correction method
TW098108900A TWI416484B (zh) 2008-03-31 2009-03-19 光檢測裝置、光電裝置與電子機器及光劣化修正方法
CN200910132431.2A CN101552278B (zh) 2008-03-31 2009-03-27 光检测装置、电光装置及电子设备以及光劣化修正方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2008089910 2008-03-31
JP2008089910 2008-03-31
JP2008211462A JP5057340B2 (ja) 2008-03-31 2008-08-20 光検出装置、電気光学装置及び電子機器

Publications (3)

Publication Number Publication Date
JP2009265074A JP2009265074A (ja) 2009-11-12
JP2009265074A5 true JP2009265074A5 (enExample) 2011-06-16
JP5057340B2 JP5057340B2 (ja) 2012-10-24

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008211462A Expired - Fee Related JP5057340B2 (ja) 2008-03-31 2008-08-20 光検出装置、電気光学装置及び電子機器

Country Status (4)

Country Link
US (1) US7885778B2 (enExample)
JP (1) JP5057340B2 (enExample)
CN (1) CN101552278B (enExample)
TW (1) TWI416484B (enExample)

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JP5154378B2 (ja) * 2008-11-21 2013-02-27 株式会社ジャパンディスプレイウェスト 表示装置
TWI416390B (zh) * 2009-12-28 2013-11-21 Au Optronics Corp 光感測裝置以及具該光感測裝置之顯示器
KR102056905B1 (ko) * 2011-07-25 2019-12-18 삼성전자주식회사 광센싱 장치 및 그 구동 방법, 광센싱 장치를 포함하는 광터치 스크린 장치
KR101652786B1 (ko) * 2010-04-22 2016-09-12 삼성전자주식회사 단순화된 광센싱 회로 및 상기 광센싱 회로를 채용한 리모트 광터치 패널 및 영상 획득 장치
US9891102B2 (en) * 2010-04-22 2018-02-13 Samsung Electronics Co., Ltd. Simplified light sensing circuit, light sensing apparatus including the light sensing circuit, method of driving the light sensing apparatus, and image acquisition apparatus and optical touch screen apparatus including the light sensing apparatus
JP5725168B2 (ja) * 2011-04-20 2015-05-27 富士通オプティカルコンポーネンツ株式会社 検出装置、光受信装置、検出方法および光受信方法
KR102032962B1 (ko) * 2012-10-26 2019-10-17 삼성디스플레이 주식회사 박막 트랜지스터 표시판 및 그 제조 방법
WO2014132438A1 (ja) * 2013-03-01 2014-09-04 Necディスプレイソリューションズ株式会社 光学測定装置、光学特性調整方法
CN103149722B (zh) * 2013-03-06 2016-12-28 深圳Tcl新技术有限公司 液晶显示处理方法、装置及液晶显示器
US9817137B2 (en) * 2014-01-15 2017-11-14 Sharp Kabushiki Kaisha Energy ray detector
JP6653997B2 (ja) * 2014-05-09 2020-02-26 株式会社半導体エネルギー研究所 表示補正回路及び表示装置
KR102650339B1 (ko) * 2016-12-27 2024-03-21 엘지디스플레이 주식회사 전계 발광 표시 장치
CN108446051B (zh) * 2018-03-16 2020-10-30 深圳市华星光电技术有限公司 阵列基板及触控显示装置
CN108391036B (zh) * 2018-03-28 2023-07-11 东风商用车有限公司 一种可检测感知功能降级的车载摄像装置及其检测方法
KR102808926B1 (ko) * 2019-03-13 2025-05-16 삼성디스플레이 주식회사 플렉시블 표시 장치와 그를 포함한 증강 현실 제공 장치
CN109859720B (zh) * 2019-04-02 2021-01-08 京东方科技集团股份有限公司 一种显示面板及其驱动方法和制作方法,以及显示装置
JP7293932B2 (ja) * 2019-07-17 2023-06-20 富士電機株式会社 半導体装置およびセンサ装置
KR102743340B1 (ko) * 2020-02-19 2024-12-18 삼성디스플레이 주식회사 표시 장치
JP6887044B1 (ja) * 2020-05-22 2021-06-16 ウィンボンド エレクトロニクス コーポレーション 半導体記憶装置および読出し方法
TWI778496B (zh) * 2021-01-15 2022-09-21 友達光電股份有限公司 主動元件及其製造方法
WO2022198393A1 (zh) * 2021-03-22 2022-09-29 京东方科技集团股份有限公司 一种显示装置
CN115235619B (zh) * 2021-04-23 2025-11-04 Oppo广东移动通信有限公司 一种光探测电路和光探测电路的驱动方法
CN114166342B (zh) * 2021-11-03 2023-11-10 北京易美新创科技有限公司 电子设备使用状态检测方法、装置、电子设备和存储介质
TW202332072A (zh) * 2022-01-19 2023-08-01 友達光電股份有限公司 感測裝置
CN114974170B (zh) * 2022-06-29 2025-04-18 上海中航光电子有限公司 光感传感器的修正方法、装置、设备及显示装置

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JP4955262B2 (ja) 2004-12-07 2012-06-20 サムスン エレクトロニクス カンパニー リミテッド 液晶表示装置、光感知素子、及びバックライト光源の照度制御装置
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JP4765852B2 (ja) * 2006-09-08 2011-09-07 ソニー株式会社 電気光学装置及び電子機器
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