JP2008544302A5 - - Google Patents

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JP2008544302A5
JP2008544302A5 JP2008515919A JP2008515919A JP2008544302A5 JP 2008544302 A5 JP2008544302 A5 JP 2008544302A5 JP 2008515919 A JP2008515919 A JP 2008515919A JP 2008515919 A JP2008515919 A JP 2008515919A JP 2008544302 A5 JP2008544302 A5 JP 2008544302A5
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JP
Japan
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polarization
liquid crystal
crystal cell
under test
cell under
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JP2008515919A
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Japanese (ja)
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JP2008544302A (ja
JP4425979B2 (ja
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Priority claimed from US11/150,363 external-priority patent/US7218398B2/en
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JP2008515919A 2005-06-10 2006-06-09 完全なミュラー行列測定から液晶セルパラメータを決定するための方法および装置 Active JP4425979B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/150,363 US7218398B2 (en) 2003-11-26 2005-06-10 Method and apparatus for determining liquid crystal cell parameters from full Mueller matrix measurements
PCT/US2006/022313 WO2006135681A2 (en) 2005-06-10 2006-06-09 Method and apparatus for determining liquid crystal cell parameters from full mueller matrix measurements

Publications (3)

Publication Number Publication Date
JP2008544302A JP2008544302A (ja) 2008-12-04
JP2008544302A5 true JP2008544302A5 (enExample) 2009-07-16
JP4425979B2 JP4425979B2 (ja) 2010-03-03

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JP2008515919A Active JP4425979B2 (ja) 2005-06-10 2006-06-09 完全なミュラー行列測定から液晶セルパラメータを決定するための方法および装置

Country Status (7)

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US (2) US7218398B2 (enExample)
EP (1) EP1889001A4 (enExample)
JP (1) JP4425979B2 (enExample)
KR (1) KR101301375B1 (enExample)
CN (2) CN101238350B (enExample)
IL (1) IL188000A (enExample)
WO (1) WO2006135681A2 (enExample)

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US7218398B2 (en) * 2003-11-26 2007-05-15 Smith Matthew H Method and apparatus for determining liquid crystal cell parameters from full Mueller matrix measurements
JP2006171683A (ja) * 2004-11-18 2006-06-29 Olympus Corp センサーユニット及び画像表示装置
US7274449B1 (en) * 2005-06-20 2007-09-25 United States Of America As Represented By The Secretary Of The Army System for determining stokes parameters
JP5185160B2 (ja) * 2009-03-03 2013-04-17 大塚電子株式会社 反射型液晶セルのチルト角測定方法及び装置
US8525993B2 (en) * 2009-10-07 2013-09-03 Nanometrics Incorporated Scatterometry measurement of asymmetric structures
TWI432715B (zh) * 2010-12-16 2014-04-01 Ind Tech Res Inst 測定液晶參數的方法及裝置
CN102607804B (zh) * 2011-01-25 2014-12-31 鸿富锦精密工业（深圳）有限公司 夹持组件及应用该夹持组件的背光模组测试装置
TWI467156B (zh) * 2011-12-21 2015-01-01 Ind Tech Res Inst 液晶胞特性測定裝置以及液晶胞特性測定方法
CN102519713A (zh) * 2011-12-26 2012-06-27 上海大学 基于最小二乘优化的全物理偏振参数的测量装置和方法
CN102539119A (zh) * 2011-12-27 2012-07-04 上海大学 基于可旋转波片的Mueller矩阵测试装置和方法
US10215642B2 (en) * 2012-05-17 2019-02-26 The University Of Akron System and method for polarimetric wavelet fractal detection and imaging
KR101344959B1 (ko) 2012-08-16 2013-12-24 김대환 편광필름 오토 체인지 시스템
US9419711B2 (en) * 2012-09-17 2016-08-16 Ofs Fitel, Llc Measuring in-band optical signal-to-noise ratio (OSNR)
US9234836B2 (en) * 2012-11-15 2016-01-12 Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.V. Measurement of a fiber direction of a carbon fiber material and fabrication of an object in carbon fiber composite technique
CN103049605B (zh) * 2012-12-13 2015-05-20 华中科技大学 一种基于穆勒矩阵的套刻误差提取方法
CN105492938A (zh) * 2013-08-30 2016-04-13 富士胶片株式会社 应力显示部件及使用应力显示部件的应变测定方法
US9989454B2 (en) 2013-10-04 2018-06-05 Axometrics, Inc. Method and apparatus for measuring parameters of optical anisotropy
JP6409612B2 (ja) * 2015-02-23 2018-10-24 日本ゼオン株式会社 配向角の測定方法、及び、複層フィルムの製造方法
KR20160130002A (ko) 2015-04-30 2016-11-10 삼성디스플레이 주식회사 액정 표시 장치의 제조 방법 및 검사 장치
CN106483075B (zh) * 2015-08-26 2019-04-16 南京理工大学 一种基于偏振菲涅尔反射比的主动偏振成像目标辨别方法
JP6584947B2 (ja) * 2015-12-25 2019-10-02 大塚電子株式会社 プレチルト角測定装置及びプレチルト角測定方法
CN105872403B (zh) * 2016-06-17 2018-12-07 杭州电子科技大学 Mueller矩阵成像的动态范围扩展方法
US11867891B2 (en) * 2016-12-22 2024-01-09 Advanced Optical Technologies, Inc. Polarimeter with multiple independent tunable channels and method for material orientation imaging
WO2018118073A1 (en) 2016-12-22 2018-06-28 Advanced Optical Technologies, Inc. Polarimeter with multiple independent tunable channels and method for material and object classification and recognition
US10816649B1 (en) * 2017-09-14 2020-10-27 The United States Of America As Represented By The Secretary Of The Air Force Temporally multiplexed LADAR polarimeter
JP7077199B2 (ja) * 2018-10-01 2022-05-30 富士フイルム株式会社 光学測定装置および配向度測定方法
WO2022002939A1 (en) * 2020-06-30 2022-01-06 Universiteit Gent A method to produce a matched pair of polarizing filters and a method and apparatus to determine the concentration of birefringent particles using a pair of polarizing filters
US12032192B2 (en) * 2022-08-09 2024-07-09 Dassault Systemes Americas Corp. Refractive index calculations for materials
CN117316337B (zh) * 2023-09-04 2024-03-29 中国人民解放军国防科技大学 应用于液晶系统中缺陷结构的数值模拟方法及装置
CN117826433B (zh) * 2024-01-17 2025-03-25 南京理工大学 一种产生部分相干全庞加莱光束的方法
ES3014233A1 (es) * 2024-11-15 2025-04-21 Univ Madrid Complutense Dispositivo y procedimiento para determinar simultaneamente los coeficientes de transmision minima y maxima y la retardancia de un polarizador lineal

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UA77409C2 (en) * 2003-09-12 2006-12-15 Swedish Lcd Ct Method for measuring the parameters of a transparent liquid-crystal cell
US7218398B2 (en) * 2003-11-26 2007-05-15 Smith Matthew H Method and apparatus for determining liquid crystal cell parameters from full Mueller matrix measurements

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