JP2008512851A - ウエハー水準でカメラモジュールを製造する方法 - Google Patents
ウエハー水準でカメラモジュールを製造する方法 Download PDFInfo
- Publication number
- JP2008512851A JP2008512851A JP2007529705A JP2007529705A JP2008512851A JP 2008512851 A JP2008512851 A JP 2008512851A JP 2007529705 A JP2007529705 A JP 2007529705A JP 2007529705 A JP2007529705 A JP 2007529705A JP 2008512851 A JP2008512851 A JP 2008512851A
- Authority
- JP
- Japan
- Prior art keywords
- unit substrate
- light
- substrate portion
- substrate
- front surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims description 53
- 238000004519 manufacturing process Methods 0.000 title claims description 8
- 239000000758 substrate Substances 0.000 claims abstract description 144
- 239000000463 material Substances 0.000 claims abstract description 38
- 239000004065 semiconductor Substances 0.000 claims abstract description 27
- 230000003287 optical effect Effects 0.000 claims abstract description 15
- 230000008569 process Effects 0.000 claims description 32
- 239000000853 adhesive Substances 0.000 claims description 16
- 230000001070 adhesive effect Effects 0.000 claims description 16
- 239000004593 Epoxy Substances 0.000 claims description 9
- 229920006332 epoxy adhesive Polymers 0.000 claims description 8
- 239000011521 glass Substances 0.000 claims description 8
- 239000002184 metal Substances 0.000 claims description 8
- 229910052751 metal Inorganic materials 0.000 claims description 8
- 238000002161 passivation Methods 0.000 claims description 8
- 238000000576 coating method Methods 0.000 claims description 7
- 239000011248 coating agent Substances 0.000 claims description 5
- 238000007789 sealing Methods 0.000 claims description 5
- 238000007639 printing Methods 0.000 claims description 3
- 230000008878 coupling Effects 0.000 claims 2
- 238000010168 coupling process Methods 0.000 claims 2
- 238000005859 coupling reaction Methods 0.000 claims 2
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims 2
- 238000002834 transmittance Methods 0.000 claims 2
- 238000004026 adhesive bonding Methods 0.000 claims 1
- 238000006263 metalation reaction Methods 0.000 claims 1
- 238000007650 screen-printing Methods 0.000 claims 1
- 229910000679 solder Inorganic materials 0.000 description 7
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 6
- 238000005516 engineering process Methods 0.000 description 5
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 4
- 229910052802 copper Inorganic materials 0.000 description 4
- 239000010949 copper Substances 0.000 description 4
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 4
- 229910052737 gold Inorganic materials 0.000 description 4
- 239000010931 gold Substances 0.000 description 4
- 238000000926 separation method Methods 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- 229910045601 alloy Inorganic materials 0.000 description 3
- 239000000956 alloy Substances 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 3
- 238000009713 electroplating Methods 0.000 description 3
- 229910052759 nickel Inorganic materials 0.000 description 3
- 230000004888 barrier function Effects 0.000 description 2
- 230000000903 blocking effect Effects 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 238000007598 dipping method Methods 0.000 description 2
- 238000004100 electronic packaging Methods 0.000 description 2
- 238000005272 metallurgy Methods 0.000 description 2
- 238000004806 packaging method and process Methods 0.000 description 2
- 238000003909 pattern recognition Methods 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 238000002083 X-ray spectrum Methods 0.000 description 1
- 230000000712 assembly Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 238000010923 batch production Methods 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000007772 electroless plating Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000002329 infrared spectrum Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000003550 marker Substances 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000002211 ultraviolet spectrum Methods 0.000 description 1
- 238000001429 visible spectrum Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14618—Containers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0203—Containers; Encapsulations, e.g. encapsulation of photodiodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0232—Optical elements or arrangements associated with the device
- H01L31/02325—Optical elements or arrangements associated with the device the optical elements not being integrated nor being directly associated with the device
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/57—Mechanical or electrical details of cameras or camera modules specially adapted for being embedded in other devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/0556—Disposition
- H01L2224/0557—Disposition the external layer being disposed on a via connection of the semiconductor or solid-state body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/0556—Disposition
- H01L2224/05571—Disposition the external layer being disposed in a recess of the surface
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/05573—Single external layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/05599—Material
- H01L2224/056—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/06—Polymers
- H01L2924/078—Adhesive characteristics other than chemical
- H01L2924/0781—Adhesive characteristics other than chemical being an ohmic electrical conductor
- H01L2924/07811—Extrinsic, i.e. with electrical conductive fillers
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Manufacturing & Machinery (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Studio Devices (AREA)
- Wire Bonding (AREA)
Abstract
【選択図】 図5
Description
Claims (20)
- 互いにダイシング(dicing)するために既に形成された光感知素子パッケージを複数有する組立体において、
(a)所定波長範囲内の光に対して実質的に透明な物質から形成され、夫々前面表面及びその対向側の背面表面を有する複数の単位基板部分を定義する基板;
(b)前記基板に結合される複数の光感知半導体台であって、夫々が前記背面表面に衝突(impinge)して前記単位基板部分を通過する光を収容するために一つの前記単位基板部分の前記前面表面に対向する少なくとも一つの光感知領域を定義する光感知半導体台;及び
(c)一つの前記単位基板部分の前記背面表面に夫々結合された複数のレンズハウジングであって、夫々が前記単位基板部分の前記前面表面上に配置された前記半導体台と光学的に整列されて配置された少なくとも一つのレンズ要素を含むレンズハウジングを含むことを特徴とする組立体。 - 夫々の前記レンズハウジングは一つの前記単位基板部分の前記背面表面に固定されるように付着された(adhesively attached)ことを特徴とする請求項1に記載の組立体。
- 夫々の前記レンズハウジングは一つの前記単位基板部分の前記背面表面にエポキシ接着剤接合によって付着されたことを特徴とする請求項2に記載の組立体。
- 前記所定波長範囲は可視波長範囲を含むことを特徴とする請求項1に記載の組立体。
- 前記基板は可視波長範囲の光に対して実質的に透明なガラス物質から形成され、夫々の前記光感知半導体台は一つの前記単位基板部分の前記前面表面から間隙を置いて離隔されたことを特徴とする請求項4に記載の組立体。
- 前記単位基板部分の前面表面の一部と前記光感知領域との間に密封された空洞を定義するように、前記間隙の周囲から延長されて前記間隙を包むように前記単位基板部分と夫々の前記光感知半導体台との間に配置された密封構造をさらに含むことを特徴とする請求項5に記載の組立体。
- 夫々の前記単位基板部分は前記所定波長範囲内の光の透過率を変化させる光学コーティングを含むことを特徴とする請求項1に記載の組立体。
- 夫々の前記単位基板部分は前記前面表面上に形成された少なくとも一つのパターニングされた金属層、及び前記パターニングされた金属層上に形成されて複数の接着パッドを定義する複数の開口を有する一つ以上のパターニングされたパッシベーション層を含むことを特徴とする請求項3に記載の組立体。
- 夫々の前記光感知半導体台上には複数のフリップチップバンプによって前記基板に接続された複数の接着パッドが形成されたことを特徴とする請求項8に記載の組立体。
- 複数の光感知素子パッケージを製造する方法において、
(a)所定波長範囲内の光に対して実質的に透明な物質から形成された基板を設定する段階;
(b)前記基板上に夫々前面表面及びその対向側の背面表面を有する複数の単位基板部分を定義する段階;
(c)夫々の光感知半導体台が前記背面表面に衝突(impinge)して前記単位基板部分を通過する光を収容するために一つの前記単位基板部分の前記前面表面に対向する少なくとも一つの光感知領域を定義する複数の前記光感知半導体台を前記基板に結合する段階;
(d)夫々が少なくとも一つのレンズ要素を含む複数のレンズハウジングを設定する段階;
(e)複数の前記光感知素子パッケージを予め形成するために前記基板に複数のレンズハウジングを結合する段階であって、夫々の前記レンズハウジングは一つの前記単位基板部分の前記背面表面上に配置され、夫々の前記レンズ要素は前記単位基板部分の前記前面表面上に配置された前記半導体台と光学的に整列されて配置されるようにする段階;及び
(f)前記複数の光感知素子パッケージを形成するために、前記各単位基板部分を互いに分離するように前記基板をダイシングする段階;を含むことを特徴とする方法。 - 前記段階(e)は夫々の前記レンズハウジングを一つの前記単位基板部分の前記背面表面にエポキシ接合によって付着する段階を含むことを特徴とする請求項10に記載の方法。
- 前記所定波長範囲は可視波長範囲を含むことを特徴とする請求項10に記載の方法。
- 前記基板は可視波長範囲の光に対して実質的に透明なガラス物質から形成されることを特徴とする請求項12に記載の方法。
- 夫々の前記光感知半導体台は一つの前記単位基板部分の前記前面表面から間隙を置いて離隔され、
前記単位基板部分の前面表面の一部と前記光感知領域との間に密封された空洞を定義するため、前記間隙の周囲から延長されて前記間隙を包むように前記単位基板部分と夫々の前記光感知半導体台との間に密封構造が形成されることを特徴とする請求項10に記載の方法。 - 前記段階(c)の前に、前記所定波長範囲内の光の透過率を変化させるために夫々の前記単位基板部分上に光学コーティングを適用する段階をさらに含むことを特徴とする請求項10に記載の方法。
- 前記段階(c)の前に、夫々の前記単位基板部分の前記前面表面上に少なくとも一つのパターニングされた金属層、及び複数の接着パッドを定義する複数の開口を有するように前記パターニングされた金属層上に少なくとも一つのパターニングされたパッシベーション層を形成する段階をさらに含むことを特徴とする請求項10に記載の方法。
- 前記段階(c)は夫々の前記光感知半導体台上に形成された複数の接着パッドを複数のフリップチップバンプによって前記基板に接続する段階を含むことを特徴とする請求項10に記載の方法。
- 複数の光感知素子パッケージを製造する方法において、
(a)可視波長範囲内の光に対して実質的に透明な物質から形成された基板を設定する段階;
(b)前記基板上に夫々前面表面及びその対向側の背面表面を有する複数の単位基板部分を定義する段階;
(c)夫々の前記単位基板部分上に複数の接着パッドを定義する少なくとも一セットのパターニングされた金属及びパッシベーション層を形成する段階;
(d)夫々複数の接着パッドを有する複数の光感知台を設定する段階;
(e)前記単位基板部分上に前記光感知半導体台を夫々フリップチップ装着する段階であって、夫々の前記光感知半導体台の前記接着パッドは前記基板にフリップチップバンプによって接続され、夫々の前記光感知半導体台は前記背面表面に衝突して前記単位基板部分を通過する光を収容するために一つの前記単位基板部分の前記前面表面に対向する少なくとも一つの光感知領域を定義するようにする段階;
(f)夫々が少なくとも一つのレンズ要素を含む複数のレンズハウジングを設定する段階;
(g)前記単位基板部分の前記背面表面上に前記レンズハウジングを夫々装着する段階であって、夫々の前記レンズハウジングの前記レンズ要素は前記単位基板部分の前記前面表面上に配置された前記半導体台と光学的に整列されて配置されるようにする段階;及び
(h)前記光感知素子パッケージを形成するために前記各単位基板部分が互いに分離されるように前記基板をダイシングする段階;を含むことを特徴とする方法。 - 前記レンズハウジングはスクリーン印刷工程、ステンシル印刷工程、ニードルディスフェンシング(needle dispensing)工程、及びスタンピング工程から成る群から選択された一つの工程を利用して形成されたエポキシ接合物質によって前記基板に装着されることを特徴とする請求項18に記載の方法。
- 前記レンズハウジングは前記単位基板上に連続的に装着され、夫々の前記レンズハウジングは一つの前記単位基板部分上に配置されるために自動的に取り上げられて(picked)エポキシ接合物質にデイッピングされ、前記エポキシ接着物質は前記レンズハウジングを前記単位基板部分に接合するために硬化される物質であることを特徴とする請求項18に記載の方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US60650004P | 2004-09-02 | 2004-09-02 | |
US11/095,456 US20060043513A1 (en) | 2004-09-02 | 2005-04-01 | Method of making camera module in wafer level |
PCT/KR2005/002892 WO2006025698A1 (en) | 2004-09-02 | 2005-09-01 | Method of making camera module in wafer level |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2008512851A true JP2008512851A (ja) | 2008-04-24 |
Family
ID=35941877
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007529705A Pending JP2008512851A (ja) | 2004-09-02 | 2005-09-01 | ウエハー水準でカメラモジュールを製造する方法 |
Country Status (5)
Country | Link |
---|---|
US (1) | US20060043513A1 (ja) |
JP (1) | JP2008512851A (ja) |
KR (1) | KR100839976B1 (ja) |
TW (1) | TWI263319B (ja) |
WO (1) | WO2006025698A1 (ja) |
Families Citing this family (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20060180888A1 (en) * | 2005-02-14 | 2006-08-17 | Advanpack Solutions Pte Ltd | Optical sensor package and method of manufacture |
KR20060131327A (ko) * | 2005-06-16 | 2006-12-20 | 엘지전자 주식회사 | 발광 다이오드의 제조 방법 |
US8092102B2 (en) * | 2006-05-31 | 2012-01-10 | Flextronics Ap Llc | Camera module with premolded lens housing and method of manufacture |
JP2008016653A (ja) * | 2006-07-06 | 2008-01-24 | Fujitsu Ltd | 半導体パッケージ、その製造方法、プリント基板及び電子機器 |
KR100817060B1 (ko) | 2006-09-22 | 2008-03-27 | 삼성전자주식회사 | 카메라 모듈 및 그 제조 방법 |
TWI320545B (en) * | 2006-10-05 | 2010-02-11 | Chipmos Technologies Inc | Film type package for fingerprint sensor |
UY30892A1 (es) | 2007-02-07 | 2008-09-02 | Smithkline Beckman Corp | Inhibidores de la actividad akt |
CA2685080A1 (en) * | 2007-04-24 | 2008-11-06 | Flextronics Ap Llc | Small form factor modules using wafer level optics with bottom cavity and flip-chip assembly |
JP2010525413A (ja) * | 2007-04-24 | 2010-07-22 | フレックストロニクス エーピー エルエルシー | ウエハーレベル光学部品を用いた自動焦点/ズームモジュール |
US20090032925A1 (en) * | 2007-07-31 | 2009-02-05 | England Luke G | Packaging with a connection structure |
KR100906841B1 (ko) * | 2007-10-01 | 2009-07-08 | 엘지이노텍 주식회사 | 카메라모듈 및 그 제작 방법 |
US9118825B2 (en) | 2008-02-22 | 2015-08-25 | Nan Chang O-Film Optoelectronics Technology Ltd. | Attachment of wafer level optics |
KR100952485B1 (ko) * | 2008-09-29 | 2010-04-13 | 삼성전기주식회사 | 카메라 모듈 제조 방법 |
EP2400964A4 (en) * | 2009-01-30 | 2012-08-01 | Glaxosmithkline Llc | CRYSTALLINE FORM OF N - {(1-5) -2-AMINO-1 - [(3-FLUOROPHENYL) METHYL] ETHYL} -5-CHLORO-4- (4-CHLORO-1-METHYL-1H-PYRAZOL) CHLOROHYDRATE 5-YL) -2-THIOPHENE CARBOXAMIDE |
CN101604674B (zh) * | 2009-06-26 | 2010-12-29 | 江阴长电先进封装有限公司 | 圆片级扇出芯片封装结构 |
US9419032B2 (en) | 2009-08-14 | 2016-08-16 | Nanchang O-Film Optoelectronics Technology Ltd | Wafer level camera module with molded housing and method of manufacturing |
US8545114B2 (en) | 2011-03-11 | 2013-10-01 | Digitaloptics Corporation | Auto focus-zoom actuator or camera module contamination reduction feature with integrated protective membrane |
WO2013079705A1 (en) * | 2011-11-30 | 2013-06-06 | Anteryon International Bv | Apparatus and method |
CN103679108B (zh) | 2012-09-10 | 2018-12-11 | 霍尼韦尔国际公司 | 具有多个图像传感器的光学标记读取装置 |
CN105378449B (zh) * | 2012-12-17 | 2019-02-05 | 胡文聪 | 取样组件、显微镜模块及显微镜装置 |
US20160025573A1 (en) * | 2013-03-15 | 2016-01-28 | Polaris Sensor Technologies, Inc. | Long wave infrared imaging polarimeter, and method of assembly |
US10009523B2 (en) * | 2015-05-11 | 2018-06-26 | Samsung Electro-Mechanics Co., Ltd. | Electronic module and method of manufacturing the same |
CN107851646A (zh) * | 2015-07-10 | 2018-03-27 | 凸版印刷株式会社 | 配线基板及其制造方法 |
US10164602B2 (en) | 2015-09-14 | 2018-12-25 | Samsung Electro-Mechanics Co., Ltd. | Acoustic wave device and method of manufacturing the same |
TWI672820B (zh) * | 2018-02-06 | 2019-09-21 | 華星光通科技股份有限公司 | 光接收器及其製備方法 |
JP2019140231A (ja) * | 2018-02-09 | 2019-08-22 | 株式会社デンソーウェーブ | 受光モジュール及び受光モジュールの検査方法 |
CN112394426A (zh) * | 2019-08-13 | 2021-02-23 | 巴奇尼资本私人有限公司 | 光学模组及其制造方法与焊接光学模组于电路板的方法 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09186308A (ja) * | 1995-12-28 | 1997-07-15 | Toshiba Corp | 固体撮像モジュールの製造方法 |
JP2001298050A (ja) * | 2000-04-14 | 2001-10-26 | Matsushita Electric Ind Co Ltd | 半導体装置およびその製造方法 |
JP2002009265A (ja) * | 2000-06-21 | 2002-01-11 | Sony Corp | 固体撮像装置 |
JP2003204053A (ja) * | 2001-03-05 | 2003-07-18 | Canon Inc | 撮像モジュール及び該撮像モジュールの製造方法、デジタルカメラ |
JP2004229167A (ja) * | 2003-01-27 | 2004-08-12 | Sanyo Electric Co Ltd | カメラモジュールの製造方法 |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3292240A (en) * | 1963-08-08 | 1966-12-20 | Ibm | Method of fabricating microminiature functional components |
DE3782201T2 (de) * | 1986-07-16 | 1993-04-15 | Canon Kk | Halbleiterphotosensor und verfahren zu dessen herstellung. |
US5302778A (en) * | 1992-08-28 | 1994-04-12 | Eastman Kodak Company | Semiconductor insulation for optical devices |
US5444520A (en) * | 1993-05-17 | 1995-08-22 | Kyocera Corporation | Image devices |
IL106892A0 (en) * | 1993-09-02 | 1993-12-28 | Pierre Badehi | Methods and apparatus for producing integrated circuit devices |
IL108359A (en) * | 1994-01-17 | 2001-04-30 | Shellcase Ltd | Method and device for creating integrated circular devices |
US6117707A (en) * | 1994-07-13 | 2000-09-12 | Shellcase Ltd. | Methods of producing integrated circuit devices |
US6117705A (en) * | 1997-04-18 | 2000-09-12 | Amkor Technology, Inc. | Method of making integrated circuit package having adhesive bead supporting planar lid above planar substrate |
US6566745B1 (en) * | 1999-03-29 | 2003-05-20 | Imec Vzw | Image sensor ball grid array package and the fabrication thereof |
JP2000286401A (ja) * | 1999-03-29 | 2000-10-13 | Miyota Kk | 固体撮像装置およびその製造方法 |
JP2001203913A (ja) * | 2000-01-21 | 2001-07-27 | Sony Corp | 撮像装置、カメラモジュール及びカメラシステム |
KR100464563B1 (ko) * | 2000-07-12 | 2004-12-31 | 앰코 테크놀로지 코리아 주식회사 | 반도체 패키지 및 그 제조방법 |
KR100343432B1 (ko) * | 2000-07-24 | 2002-07-11 | 한신혁 | 반도체 패키지 및 그 패키지 방법 |
JP4000507B2 (ja) * | 2001-10-04 | 2007-10-31 | ソニー株式会社 | 固体撮像装置の製造方法 |
US6747348B2 (en) * | 2001-10-16 | 2004-06-08 | Micron Technology, Inc. | Apparatus and method for leadless packaging of semiconductor devices |
US6885107B2 (en) * | 2002-08-29 | 2005-04-26 | Micron Technology, Inc. | Flip-chip image sensor packages and methods of fabrication |
US7583862B2 (en) * | 2003-11-26 | 2009-09-01 | Aptina Imaging Corporation | Packaged microelectronic imagers and methods of packaging microelectronic imagers |
-
2005
- 2005-04-01 US US11/095,456 patent/US20060043513A1/en not_active Abandoned
- 2005-08-31 TW TW094129875A patent/TWI263319B/zh active
- 2005-09-01 WO PCT/KR2005/002892 patent/WO2006025698A1/en active Application Filing
- 2005-09-01 JP JP2007529705A patent/JP2008512851A/ja active Pending
- 2005-09-01 KR KR1020077003375A patent/KR100839976B1/ko active IP Right Grant
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09186308A (ja) * | 1995-12-28 | 1997-07-15 | Toshiba Corp | 固体撮像モジュールの製造方法 |
JP2001298050A (ja) * | 2000-04-14 | 2001-10-26 | Matsushita Electric Ind Co Ltd | 半導体装置およびその製造方法 |
JP2002009265A (ja) * | 2000-06-21 | 2002-01-11 | Sony Corp | 固体撮像装置 |
JP2003204053A (ja) * | 2001-03-05 | 2003-07-18 | Canon Inc | 撮像モジュール及び該撮像モジュールの製造方法、デジタルカメラ |
JP2004229167A (ja) * | 2003-01-27 | 2004-08-12 | Sanyo Electric Co Ltd | カメラモジュールの製造方法 |
Also Published As
Publication number | Publication date |
---|---|
TW200618220A (en) | 2006-06-01 |
WO2006025698A1 (en) | 2006-03-09 |
US20060043513A1 (en) | 2006-03-02 |
KR20070041572A (ko) | 2007-04-18 |
TWI263319B (en) | 2006-10-01 |
KR100839976B1 (ko) | 2008-06-20 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR100839976B1 (ko) | 웨이퍼 수준에서 카메라 모듈을 제조하는 방법 | |
US6864116B1 (en) | Electronic package of photo-sensing semiconductor devices, and the fabrication and assembly thereof | |
KR100819535B1 (ko) | 이동 전화 카메라 모듈에 있는 포토 이미지 센서 전자 패키지 및 그 제조방법 | |
JP4575437B2 (ja) | 光感知素子パッケージ及びその製造方法 | |
KR100839975B1 (ko) | 기판의 배면 상에 패터닝된 층을 갖는 전자 패키지 및 그제조방법 | |
KR100753896B1 (ko) | 반도체 장치 모듈 및 반도체 장치 모듈의 제조방법 | |
JP4724145B2 (ja) | カメラモジュール | |
WO2019076189A1 (zh) | 图像传感器的封装方法、图像传感器封装结构和镜头模组 | |
CN101010807A (zh) | 制造晶片级摄像头模块的方法 | |
CN109815891B (zh) | 用于屏下光学指纹的识别模组及电子设备 | |
JP4314825B2 (ja) | 光モジュール及びその製造方法、回路基板並びに電子機器 | |
CN100472790C (zh) | 一种光感应的半导体器件的电子封装及其制作和组装 | |
JP4361300B2 (ja) | 光モジュール及びその製造方法並びに電子機器 | |
JP4292383B2 (ja) | 光デバイスの製造方法 | |
JP2009105459A (ja) | 光デバイス、光モジュール及び電子機器 | |
KR100694669B1 (ko) | 광 검출용 반도체 패키지 및 그 제작방법 | |
JP2004274165A (ja) | 光モジュール及びその製造方法並びに電子機器 | |
JP2004349369A (ja) | 固体撮像装置用半導体パッケージ及びその製造方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20101213 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20101221 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20120110 |
|
RD04 | Notification of resignation of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7424 Effective date: 20120529 |
|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20120619 |