JP2008501954A5 - - Google Patents
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- JP2008501954A5 JP2008501954A5 JP2007515559A JP2007515559A JP2008501954A5 JP 2008501954 A5 JP2008501954 A5 JP 2008501954A5 JP 2007515559 A JP2007515559 A JP 2007515559A JP 2007515559 A JP2007515559 A JP 2007515559A JP 2008501954 A5 JP2008501954 A5 JP 2008501954A5
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Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US57738904P | 2004-06-04 | 2004-06-04 | |
| US11/142,819 US7966155B2 (en) | 2004-06-04 | 2005-05-31 | Method and apparatus for improving detection limits in x-ray and nuclear spectroscopy systems |
| PCT/US2005/019355 WO2005121988A2 (en) | 2004-06-04 | 2005-06-02 | Method and apparatus for improving detection limits in x-ray and nuclear spectroscopy systems |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2008501954A JP2008501954A (ja) | 2008-01-24 |
| JP2008501954A5 true JP2008501954A5 (https=) | 2012-10-25 |
Family
ID=35503788
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007515559A Pending JP2008501954A (ja) | 2004-06-04 | 2005-06-02 | Ｘ線及び核分光システムにおける検出限界を向上するための方法及び装置 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7966155B2 (https=) |
| EP (1) | EP1754113B1 (https=) |
| JP (1) | JP2008501954A (https=) |
| AU (1) | AU2005253117B2 (https=) |
| SI (1) | SI1754113T1 (https=) |
| WO (1) | WO2005121988A2 (https=) |
Families Citing this family (63)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5022902B2 (ja) | 2004-09-16 | 2012-09-12 | サザン イノヴェーション インターナショナル プロプライアトリー リミテッド | 検出器出力データ内の個別信号分離装置および方法 |
| WO2006090138A2 (en) * | 2005-02-25 | 2006-08-31 | Micromass Uk Limited | Mass spectrometer |
| WO2008060670A2 (en) * | 2006-04-20 | 2008-05-22 | Multi-Dimensional Imaging, Inc. | Low noise voltage-to-frequency conversion apparatus and method for quantum measurements |
| WO2008157734A2 (en) * | 2007-06-20 | 2008-12-24 | Thermo Electron Scientific Instruments Llc | Processing of spectrometer pile-up events |
| WO2009020866A1 (en) * | 2007-08-03 | 2009-02-12 | Pulsetor, Llc | Adapting a high-performance pulse processor to an existing spectrometry system |
| JP5349476B2 (ja) * | 2007-08-03 | 2013-11-20 | パルセータ，エルエルシー | エネルギー分散型放射線分光分析システムにおけるフォトンを示すエッジを検出する方法、当該方法を実行するパルスプロセッサおよびエネルギー分散型放射線分光分析システム |
| CA2732754C (en) * | 2007-08-03 | 2015-12-08 | Pulsetor, Llc | Digital pulse processor slope correction |
| JP5043728B2 (ja) * | 2008-03-19 | 2012-10-10 | 日本電子株式会社 | 放射線計測用パルスプロセッサ |
| WO2009121131A1 (en) | 2008-03-31 | 2009-10-08 | Southern Innovation International Pty Ltd | Method and apparatus for borehole logging |
| CN101983331A (zh) | 2008-03-31 | 2011-03-02 | 南方创新国际股份有限公司 | 具有单个信号分辨率的辐射成像方法 |
| EP2260296A4 (en) | 2008-03-31 | 2016-04-06 | Southern Innovation Internat Pty Ltd | INSPECTION METHOD AND APPARATUS |
| US7807973B2 (en) * | 2008-08-01 | 2010-10-05 | Pulsetor, Llc | Pileup rejection in an energy-dispersive radiation spectrometry system |
| JP5581333B2 (ja) | 2008-12-18 | 2014-08-27 | サザン イノヴェーション インターナショナル プロプライアトリー リミテッド | 数学的変換を使用することによってパイルアップされたパルスを分離する方法および装置 |
| US8335363B2 (en) * | 2009-06-16 | 2012-12-18 | Jefferson Science Associates, Llc | Method for image reconstruction of moving radionuclide source distribution |
| KR101616056B1 (ko) * | 2009-08-19 | 2016-04-28 | 삼성전자주식회사 | 광자 계수 장치 및 방법 |
| US8450693B2 (en) * | 2009-12-11 | 2013-05-28 | General Electric Company | Method and system for fault-tolerant reconstruction of images |
| JP5427655B2 (ja) * | 2010-03-11 | 2014-02-26 | 株式会社日立製作所 | 放射線計測装置，核医学診断装置 |
| US8503748B2 (en) * | 2010-08-02 | 2013-08-06 | Toseh Sanaye Tasvirbardari Parto Negar Persia | Nonlinear recursive filter for medical image processing |
| EP2663879B1 (en) * | 2011-01-10 | 2017-08-02 | Koninklijke Philips N.V. | Detection device for detecting photons emitted by a radiation source |
| US8374814B2 (en) * | 2011-02-16 | 2013-02-12 | Rigaku Corporation | X-ray detection signal processing apparatus and method therefor |
| JP4880077B1 (ja) * | 2011-02-16 | 2012-02-22 | 株式会社リガク | Ｘ線検出信号処理装置および方法 |
| JP5076012B1 (ja) * | 2011-05-20 | 2012-11-21 | 株式会社リガク | 波長分散型蛍光ｘ線分析装置 |
| FR2978562B1 (fr) * | 2011-07-26 | 2013-09-20 | Multix Sa | Dispositif et procede de traitement pour une mesure spectrometrique d'un flux de photons |
| CN104350378B (zh) * | 2012-04-05 | 2017-10-03 | 瑞尼斯豪公司 | 用于测量光谱系统的性能的方法和设备 |
| EP2653891A1 (en) | 2012-04-19 | 2013-10-23 | Fei Company | Method for analyzing an EDS signal |
| US9128194B2 (en) * | 2013-04-19 | 2015-09-08 | Kabushiki Kaisha Toshiba | Pileup correction method for a photon-counting detector |
| JP6159144B2 (ja) * | 2013-05-10 | 2017-07-05 | 株式会社堀場製作所 | パルス波高検出装置、放射線検出装置、放射線分析装置、及びパルス波高検出方法 |
| JP6214031B2 (ja) * | 2013-07-19 | 2017-10-18 | 国立研究開発法人理化学研究所 | 放射線検出器のための信号データ処理方法、信号データ処理装置、および放射線検出システム |
| JP6179292B2 (ja) * | 2013-09-11 | 2017-08-16 | 株式会社島津製作所 | 放射線検出器 |
| WO2015079535A1 (ja) * | 2013-11-28 | 2015-06-04 | 株式会社島津製作所 | Ｘ線分析装置およびｘ線分析方法 |
| EP3062125A1 (en) | 2015-02-26 | 2016-08-31 | Fei Company | Pulse processing |
| US9869791B2 (en) | 2015-06-17 | 2018-01-16 | Baker Hughes, A Ge Company, Llc | Measurement of downhole radiation |
| US11099279B2 (en) * | 2015-09-18 | 2021-08-24 | Koninklijke Philips N.V. | Processing of a corrected X-ray detector signal |
| US10338235B2 (en) * | 2016-03-22 | 2019-07-02 | Shimadzu Corporation | Radiation detector |
| CN105866557B (zh) * | 2016-03-22 | 2018-08-10 | 成都理工大学 | 一种实现ghz脉冲通过率的时间、能量双谱同步测量系统 |
| EP3451024B1 (en) * | 2016-04-28 | 2026-03-04 | Horiba, Ltd. | Radiation detector and signal processor for radiation detection |
| US12399164B2 (en) | 2018-06-19 | 2025-08-26 | Seekops Inc. | Emissions estimate model algorithms and methods |
| EP3811172B1 (en) | 2018-06-19 | 2025-08-20 | SeekOps Inc. | Method and system for determining a gas source location |
| EP3811171B1 (en) | 2018-06-19 | 2025-02-26 | SeekOps Inc. | Emissions estimate model algorithms and methods |
| WO2020028353A1 (en) | 2018-07-30 | 2020-02-06 | Seekops Inc. | Ultra-lightweight, handheld gas leak detection device |
| US12281983B2 (en) | 2018-10-22 | 2025-04-22 | Seekops Inc. | UAV-borne, high-bandwidth, lightweight point sensor for quantifying greenhouse gases in atmospheric strata |
| DE102019104710B4 (de) * | 2019-02-25 | 2023-04-27 | Ketek Gmbh | Verfahren zum Betreiben eines Strahlungsdetektionssystems und Strahlungsdetektionssystem |
| JP6999593B2 (ja) * | 2019-03-14 | 2022-01-18 | 株式会社堀場製作所 | 検出装置及びスペクトル生成装置 |
| EP3948202A4 (en) | 2019-04-05 | 2023-01-04 | SeekOps Inc. | TIME AND DATA EFFICIENT LEAK DETECTION CONFIRMATION |
| WO2020206006A1 (en) | 2019-04-05 | 2020-10-08 | Seekops Inc. | Analog signal processing for a lightweight and compact laser-based trace gas sensor |
| EP4010246A4 (en) | 2019-08-05 | 2023-09-13 | SeekOps Inc. | UAS SYSTEM THAT CAN BE RAPIDLY DEPLOYED FOR AUTONOMOUS INSPECTION OPERATIONS USING A COMBINED PAYLOAD |
| WO2021055902A1 (en) * | 2019-09-20 | 2021-03-25 | Seekops Inc. | Spectral fitting of compact laser-based trace gas sensor measurements for high dynamic range (hdr) |
| EP4038357A4 (en) | 2019-10-04 | 2023-11-08 | SeekOps Inc. | GENERATION OF FLIGHT PATTERNS WITH A CLOSED SURFACE FOR FLUX LEVEL ASSESSMENT OF UNMANNED AERIAL VEHICLES (UAV) |
| US11614430B2 (en) | 2019-12-19 | 2023-03-28 | Seekops Inc. | Concurrent in-situ measurement of wind speed and trace gases on mobile platforms for localization and qualification of emissions |
| US11988598B2 (en) | 2019-12-31 | 2024-05-21 | Seekops Inc. | Optical cell cleaner |
| WO2021158916A1 (en) | 2020-02-05 | 2021-08-12 | Seekops Inc. | Multiple path length optical cell for trace gas measurement |
| US12055485B2 (en) | 2020-02-05 | 2024-08-06 | Seekops Inc. | Multispecies measurement platform using absorption spectroscopy for measurement of co-emitted trace gases |
| CN111487663B (zh) * | 2020-03-16 | 2022-06-03 | 中国石油天然气集团有限公司 | 一种核测井仪器能量电流谱获取方法 |
| WO2021195394A1 (en) | 2020-03-25 | 2021-09-30 | Seekops Inc. | Logarithmic demodulator for laser wavelength-modulaton spectroscopy |
| US11748866B2 (en) | 2020-07-17 | 2023-09-05 | Seekops Inc. | Systems and methods of automated detection of gas plumes using optical imaging |
| US12475798B2 (en) | 2020-07-17 | 2025-11-18 | Seekops Inc. | UAS work practice |
| WO2022093864A1 (en) | 2020-10-27 | 2022-05-05 | Seekops Inc. | Methods and apparatus for measuring methane emissions with an optical open-cavity methane sensor |
| WO2022122545A1 (en) * | 2020-12-09 | 2022-06-16 | Ams International Ag | Electric circuitry for baseline extraction in a photon counting system |
| US12161498B2 (en) | 2021-05-11 | 2024-12-10 | Analog Devices, Inc. | Baseline restoration technique for photon counting computed tomography using active reference |
| CN113466924B (zh) * | 2021-07-01 | 2023-05-05 | 成都理工大学 | 一种对称类弹头脉冲成形装置及方法 |
| CN114660650A (zh) * | 2022-03-14 | 2022-06-24 | 中国科学院微电子研究所 | 一种成形时间自适应的数字脉冲滤波方法、装置及电子设备 |
| US12571923B2 (en) * | 2022-12-13 | 2026-03-10 | Analog Devices, Inc. | Timer-based amplitude correction method for photon counting computed tomography |
| CN116381764A (zh) * | 2022-12-17 | 2023-07-04 | 苏州瑞派宁科技有限公司 | 脉冲甄别方法、装置、数字化设备及存储介质 |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL7110516A (https=) * | 1971-07-30 | 1973-02-01 | ||
| US5184017A (en) * | 1989-09-12 | 1993-02-02 | Sensors, Inc. | Method and apparatus for detecting a component gas in a sample |
| US5349193A (en) * | 1993-05-20 | 1994-09-20 | Princeton Gamma Tech, Inc. | Highly sensitive nuclear spectrometer apparatus and method |
| JP4083802B2 (ja) * | 1995-08-14 | 2008-04-30 | ワーバートン，ウィリアム，ケイ． | デジタルベースの高速ｘ線スペクトロメータについての方法 |
| US5870051A (en) * | 1995-08-14 | 1999-02-09 | William K. Warburton | Method and apparatus for analog signal conditioner for high speed, digital x-ray spectrometer |
| US5684850A (en) * | 1995-08-14 | 1997-11-04 | William K. Warburton | Method and apparatus for digitally based high speed x-ray spectrometer |
| US5873054A (en) * | 1995-08-14 | 1999-02-16 | William K. Warburton | Method and apparatus for combinatorial logic signal processor in a digitally based high speed x-ray spectrometer |
| JP2001524217A (ja) * | 1997-05-07 | 2001-11-27 | ボード・オヴ・リージェンツ，ザ・ユニヴァーシティ・オヴ・テキサス・システム | 信号のパイルアップを阻止するための方法および装置 |
| US7065473B2 (en) * | 1999-08-27 | 2006-06-20 | William K. Warburton | Method and apparatus for improving resolution in spectrometers processing output steps from non-ideal signal sources |
| US6587814B1 (en) * | 1999-08-27 | 2003-07-01 | William K. Warburton | Method and apparatus for improving resolution in spectrometers processing output steps from non-ideal signal sources |
| US6389102B2 (en) * | 1999-09-29 | 2002-05-14 | Jordan Valley Applied Radiation Ltd. | X-ray array detector |
| US6327549B1 (en) * | 1999-10-25 | 2001-12-04 | Perkinelmer, Inc. | Differential correction method and apparatus |
| JP2002022846A (ja) * | 2000-07-05 | 2002-01-23 | Seiko Instruments Inc | エネルギー分散型ｘ線分析装置 |
| JP4160275B2 (ja) * | 2001-05-28 | 2008-10-01 | 浜松ホトニクス株式会社 | エネルギー測定方法及び測定装置 |
| US6609075B1 (en) * | 2001-06-04 | 2003-08-19 | William K. Warburton | Method and apparatus for baseline correction in x-ray and nuclear spectroscopy systems |
-
2005
- 2005-05-31 US US11/142,819 patent/US7966155B2/en not_active Expired - Lifetime
- 2005-06-02 AU AU2005253117A patent/AU2005253117B2/en not_active Ceased
- 2005-06-02 EP EP05767680.1A patent/EP1754113B1/en not_active Expired - Lifetime
- 2005-06-02 JP JP2007515559A patent/JP2008501954A/ja active Pending
- 2005-06-02 WO PCT/US2005/019355 patent/WO2005121988A2/en not_active Ceased
- 2005-06-02 SI SI200531719T patent/SI1754113T1/sl unknown
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