SI1754113T1 - Postopek in naprava za izboljšanje zaznavanja limitov pri x-žarčenju in nuklearnih spektroskopskih sistemih - Google Patents

Postopek in naprava za izboljšanje zaznavanja limitov pri x-žarčenju in nuklearnih spektroskopskih sistemih

Info

Publication number
SI1754113T1
SI1754113T1 SI200531719T SI200531719T SI1754113T1 SI 1754113 T1 SI1754113 T1 SI 1754113T1 SI 200531719 T SI200531719 T SI 200531719T SI 200531719 T SI200531719 T SI 200531719T SI 1754113 T1 SI1754113 T1 SI 1754113T1
Authority
SI
Slovenia
Prior art keywords
ray
detection limits
improving detection
spectroscopy systems
nuclear spectroscopy
Prior art date
Application number
SI200531719T
Other languages
English (en)
Slovenian (sl)
Inventor
William K. Warburton
Jackson T. Harris
Peter M. Grudberg
Gregory Roach
Original Assignee
William K. Warburton
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by William K. Warburton filed Critical William K. Warburton
Publication of SI1754113T1 publication Critical patent/SI1754113T1/sl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
SI200531719T 2004-06-04 2005-06-02 Postopek in naprava za izboljšanje zaznavanja limitov pri x-žarčenju in nuklearnih spektroskopskih sistemih SI1754113T1 (sl)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US57738904P 2004-06-04 2004-06-04
US11/142,819 US7966155B2 (en) 2004-06-04 2005-05-31 Method and apparatus for improving detection limits in x-ray and nuclear spectroscopy systems
EP05767680.1A EP1754113B1 (en) 2004-06-04 2005-06-02 Method and apparatus for improving detection limits in x-ray and nuclear spectroscopy systems
PCT/US2005/019355 WO2005121988A2 (en) 2004-06-04 2005-06-02 Method and apparatus for improving detection limits in x-ray and nuclear spectroscopy systems

Publications (1)

Publication Number Publication Date
SI1754113T1 true SI1754113T1 (sl) 2013-09-30

Family

ID=35503788

Family Applications (1)

Application Number Title Priority Date Filing Date
SI200531719T SI1754113T1 (sl) 2004-06-04 2005-06-02 Postopek in naprava za izboljšanje zaznavanja limitov pri x-žarčenju in nuklearnih spektroskopskih sistemih

Country Status (6)

Country Link
US (1) US7966155B2 (https=)
EP (1) EP1754113B1 (https=)
JP (1) JP2008501954A (https=)
AU (1) AU2005253117B2 (https=)
SI (1) SI1754113T1 (https=)
WO (1) WO2005121988A2 (https=)

Families Citing this family (63)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5022902B2 (ja) 2004-09-16 2012-09-12 サザン イノヴェーション インターナショナル プロプライアトリー リミテッド 検出器出力データ内の個別信号分離装置および方法
WO2006090138A2 (en) * 2005-02-25 2006-08-31 Micromass Uk Limited Mass spectrometer
WO2008060670A2 (en) * 2006-04-20 2008-05-22 Multi-Dimensional Imaging, Inc. Low noise voltage-to-frequency conversion apparatus and method for quantum measurements
WO2008157734A2 (en) * 2007-06-20 2008-12-24 Thermo Electron Scientific Instruments Llc Processing of spectrometer pile-up events
WO2009020866A1 (en) * 2007-08-03 2009-02-12 Pulsetor, Llc Adapting a high-performance pulse processor to an existing spectrometry system
JP5349476B2 (ja) * 2007-08-03 2013-11-20 パルセータ，エルエルシー エネルギー分散型放射線分光分析システムにおけるフォトンを示すエッジを検出する方法、当該方法を実行するパルスプロセッサおよびエネルギー分散型放射線分光分析システム
CA2732754C (en) * 2007-08-03 2015-12-08 Pulsetor, Llc Digital pulse processor slope correction
JP5043728B2 (ja) * 2008-03-19 2012-10-10 日本電子株式会社 放射線計測用パルスプロセッサ
WO2009121131A1 (en) 2008-03-31 2009-10-08 Southern Innovation International Pty Ltd Method and apparatus for borehole logging
CN101983331A (zh) 2008-03-31 2011-03-02 南方创新国际股份有限公司 具有单个信号分辨率的辐射成像方法
EP2260296A4 (en) 2008-03-31 2016-04-06 Southern Innovation Internat Pty Ltd INSPECTION METHOD AND APPARATUS
US7807973B2 (en) * 2008-08-01 2010-10-05 Pulsetor, Llc Pileup rejection in an energy-dispersive radiation spectrometry system
JP5581333B2 (ja) 2008-12-18 2014-08-27 サザン イノヴェーション インターナショナル プロプライアトリー リミテッド 数学的変換を使用することによってパイルアップされたパルスを分離する方法および装置
US8335363B2 (en) * 2009-06-16 2012-12-18 Jefferson Science Associates, Llc Method for image reconstruction of moving radionuclide source distribution
KR101616056B1 (ko) * 2009-08-19 2016-04-28 삼성전자주식회사 광자 계수 장치 및 방법
US8450693B2 (en) * 2009-12-11 2013-05-28 General Electric Company Method and system for fault-tolerant reconstruction of images
JP5427655B2 (ja) * 2010-03-11 2014-02-26 株式会社日立製作所 放射線計測装置，核医学診断装置
US8503748B2 (en) * 2010-08-02 2013-08-06 Toseh Sanaye Tasvirbardari Parto Negar Persia Nonlinear recursive filter for medical image processing
EP2663879B1 (en) * 2011-01-10 2017-08-02 Koninklijke Philips N.V. Detection device for detecting photons emitted by a radiation source
US8374814B2 (en) * 2011-02-16 2013-02-12 Rigaku Corporation X-ray detection signal processing apparatus and method therefor
JP4880077B1 (ja) * 2011-02-16 2012-02-22 株式会社リガク Ｘ線検出信号処理装置および方法
JP5076012B1 (ja) * 2011-05-20 2012-11-21 株式会社リガク 波長分散型蛍光ｘ線分析装置
FR2978562B1 (fr) * 2011-07-26 2013-09-20 Multix Sa Dispositif et procede de traitement pour une mesure spectrometrique d'un flux de photons
CN104350378B (zh) * 2012-04-05 2017-10-03 瑞尼斯豪公司 用于测量光谱系统的性能的方法和设备
EP2653891A1 (en) 2012-04-19 2013-10-23 Fei Company Method for analyzing an EDS signal
US9128194B2 (en) * 2013-04-19 2015-09-08 Kabushiki Kaisha Toshiba Pileup correction method for a photon-counting detector
JP6159144B2 (ja) * 2013-05-10 2017-07-05 株式会社堀場製作所 パルス波高検出装置、放射線検出装置、放射線分析装置、及びパルス波高検出方法
JP6214031B2 (ja) * 2013-07-19 2017-10-18 国立研究開発法人理化学研究所 放射線検出器のための信号データ処理方法、信号データ処理装置、および放射線検出システム
JP6179292B2 (ja) * 2013-09-11 2017-08-16 株式会社島津製作所 放射線検出器
WO2015079535A1 (ja) * 2013-11-28 2015-06-04 株式会社島津製作所 Ｘ線分析装置およびｘ線分析方法
EP3062125A1 (en) 2015-02-26 2016-08-31 Fei Company Pulse processing
US9869791B2 (en) 2015-06-17 2018-01-16 Baker Hughes, A Ge Company, Llc Measurement of downhole radiation
US11099279B2 (en) * 2015-09-18 2021-08-24 Koninklijke Philips N.V. Processing of a corrected X-ray detector signal
US10338235B2 (en) * 2016-03-22 2019-07-02 Shimadzu Corporation Radiation detector
CN105866557B (zh) * 2016-03-22 2018-08-10 成都理工大学 一种实现ghz脉冲通过率的时间、能量双谱同步测量系统
EP3451024B1 (en) * 2016-04-28 2026-03-04 Horiba, Ltd. Radiation detector and signal processor for radiation detection
US12399164B2 (en) 2018-06-19 2025-08-26 Seekops Inc. Emissions estimate model algorithms and methods
EP3811172B1 (en) 2018-06-19 2025-08-20 SeekOps Inc. Method and system for determining a gas source location
EP3811171B1 (en) 2018-06-19 2025-02-26 SeekOps Inc. Emissions estimate model algorithms and methods
WO2020028353A1 (en) 2018-07-30 2020-02-06 Seekops Inc. Ultra-lightweight, handheld gas leak detection device
US12281983B2 (en) 2018-10-22 2025-04-22 Seekops Inc. UAV-borne, high-bandwidth, lightweight point sensor for quantifying greenhouse gases in atmospheric strata
DE102019104710B4 (de) * 2019-02-25 2023-04-27 Ketek Gmbh Verfahren zum Betreiben eines Strahlungsdetektionssystems und Strahlungsdetektionssystem
JP6999593B2 (ja) * 2019-03-14 2022-01-18 株式会社堀場製作所 検出装置及びスペクトル生成装置
EP3948202A4 (en) 2019-04-05 2023-01-04 SeekOps Inc. TIME AND DATA EFFICIENT LEAK DETECTION CONFIRMATION
WO2020206006A1 (en) 2019-04-05 2020-10-08 Seekops Inc. Analog signal processing for a lightweight and compact laser-based trace gas sensor
EP4010246A4 (en) 2019-08-05 2023-09-13 SeekOps Inc. UAS SYSTEM THAT CAN BE RAPIDLY DEPLOYED FOR AUTONOMOUS INSPECTION OPERATIONS USING A COMBINED PAYLOAD
WO2021055902A1 (en) * 2019-09-20 2021-03-25 Seekops Inc. Spectral fitting of compact laser-based trace gas sensor measurements for high dynamic range (hdr)
EP4038357A4 (en) 2019-10-04 2023-11-08 SeekOps Inc. GENERATION OF FLIGHT PATTERNS WITH A CLOSED SURFACE FOR FLUX LEVEL ASSESSMENT OF UNMANNED AERIAL VEHICLES (UAV)
US11614430B2 (en) 2019-12-19 2023-03-28 Seekops Inc. Concurrent in-situ measurement of wind speed and trace gases on mobile platforms for localization and qualification of emissions
US11988598B2 (en) 2019-12-31 2024-05-21 Seekops Inc. Optical cell cleaner
WO2021158916A1 (en) 2020-02-05 2021-08-12 Seekops Inc. Multiple path length optical cell for trace gas measurement
US12055485B2 (en) 2020-02-05 2024-08-06 Seekops Inc. Multispecies measurement platform using absorption spectroscopy for measurement of co-emitted trace gases
CN111487663B (zh) * 2020-03-16 2022-06-03 中国石油天然气集团有限公司 一种核测井仪器能量电流谱获取方法
WO2021195394A1 (en) 2020-03-25 2021-09-30 Seekops Inc. Logarithmic demodulator for laser wavelength-modulaton spectroscopy
US11748866B2 (en) 2020-07-17 2023-09-05 Seekops Inc. Systems and methods of automated detection of gas plumes using optical imaging
US12475798B2 (en) 2020-07-17 2025-11-18 Seekops Inc. UAS work practice
WO2022093864A1 (en) 2020-10-27 2022-05-05 Seekops Inc. Methods and apparatus for measuring methane emissions with an optical open-cavity methane sensor
WO2022122545A1 (en) * 2020-12-09 2022-06-16 Ams International Ag Electric circuitry for baseline extraction in a photon counting system
US12161498B2 (en) 2021-05-11 2024-12-10 Analog Devices, Inc. Baseline restoration technique for photon counting computed tomography using active reference
CN113466924B (zh) * 2021-07-01 2023-05-05 成都理工大学 一种对称类弹头脉冲成形装置及方法
CN114660650A (zh) * 2022-03-14 2022-06-24 中国科学院微电子研究所 一种成形时间自适应的数字脉冲滤波方法、装置及电子设备
US12571923B2 (en) * 2022-12-13 2026-03-10 Analog Devices, Inc. Timer-based amplitude correction method for photon counting computed tomography
CN116381764A (zh) * 2022-12-17 2023-07-04 苏州瑞派宁科技有限公司 脉冲甄别方法、装置、数字化设备及存储介质

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL7110516A (https=) * 1971-07-30 1973-02-01
US5184017A (en) * 1989-09-12 1993-02-02 Sensors, Inc. Method and apparatus for detecting a component gas in a sample
US5349193A (en) * 1993-05-20 1994-09-20 Princeton Gamma Tech, Inc. Highly sensitive nuclear spectrometer apparatus and method
JP4083802B2 (ja) * 1995-08-14 2008-04-30 ワーバートン，ウィリアム，ケイ． デジタルベースの高速ｘ線スペクトロメータについての方法
US5870051A (en) * 1995-08-14 1999-02-09 William K. Warburton Method and apparatus for analog signal conditioner for high speed, digital x-ray spectrometer
US5684850A (en) * 1995-08-14 1997-11-04 William K. Warburton Method and apparatus for digitally based high speed x-ray spectrometer
US5873054A (en) * 1995-08-14 1999-02-16 William K. Warburton Method and apparatus for combinatorial logic signal processor in a digitally based high speed x-ray spectrometer
JP2001524217A (ja) * 1997-05-07 2001-11-27 ボード・オヴ・リージェンツ，ザ・ユニヴァーシティ・オヴ・テキサス・システム 信号のパイルアップを阻止するための方法および装置
US7065473B2 (en) * 1999-08-27 2006-06-20 William K. Warburton Method and apparatus for improving resolution in spectrometers processing output steps from non-ideal signal sources
US6587814B1 (en) * 1999-08-27 2003-07-01 William K. Warburton Method and apparatus for improving resolution in spectrometers processing output steps from non-ideal signal sources
US6389102B2 (en) * 1999-09-29 2002-05-14 Jordan Valley Applied Radiation Ltd. X-ray array detector
US6327549B1 (en) * 1999-10-25 2001-12-04 Perkinelmer, Inc. Differential correction method and apparatus
JP2002022846A (ja) * 2000-07-05 2002-01-23 Seiko Instruments Inc エネルギー分散型ｘ線分析装置
JP4160275B2 (ja) * 2001-05-28 2008-10-01 浜松ホトニクス株式会社 エネルギー測定方法及び測定装置
US6609075B1 (en) * 2001-06-04 2003-08-19 William K. Warburton Method and apparatus for baseline correction in x-ray and nuclear spectroscopy systems

Also Published As

Publication number Publication date
EP1754113A4 (en) 2011-03-16
WO2005121988A3 (en) 2006-10-26
US20060015290A1 (en) 2006-01-19
EP1754113B1 (en) 2013-04-17
EP1754113A2 (en) 2007-02-21
AU2005253117B2 (en) 2010-12-09
WO2005121988A2 (en) 2005-12-22
US7966155B2 (en) 2011-06-21
AU2005253117A1 (en) 2005-12-22
JP2008501954A (ja) 2008-01-24

Similar Documents

Publication Publication Date Title
SI1754113T1 (sl) Postopek in naprava za izboljšanje zaznavanja limitov pri x-žarčenju in nuklearnih spektroskopskih sistemih
GB2433777B (en) Method for inspecting object using multi-energy radiations and apparatus therefor
IL173980A0 (en) Method and apparatus for detecting defects in wafers
EP1774303A4 (en) METHOD AND APPARATUS FOR ELECTROCHEMICAL DETECTION
GB2459210C (en) Apparatus and method for providing an adjustable positive stop in space
GB2452663B (en) Method and apparatus for comparing document features using texture analysis
IL185532A0 (en) Apparatus and method for detection of radiation
IL187322A0 (en) Object detection method and apparatus
SI1393094T1 (sl) Postopek in naprava za korekcijo izhodišča v rentgenskih in nuklearnih spektroskopskih sistemih
IL184909A0 (en) Method and apparatus for imaging using multiple imaging detectors
IL231308A0 (en) Device and detection method
ZA200804709B (en) Method and apparatus for radiation imaging
TWI315980B (en) Radiophotography apparatus and signal processing method for radiation ray detection
EP1764038A4 (en) X-RAY INSPECTION METHOD AND X-RAY INSPECTION DEVICE
EP1979857A4 (en) METHOD AND APPARATUS FOR CLASSIFYING DETECTION INPUTS IN MEDICAL IMAGES
GB2454372B (en) Apparatus and method for detecting gamma ray radiation
GB2454564B (en) Inspection system, inspection method, CT apparatus and detection device
GB2453215B8 (en) Apparatus and method for reducing microphonic susceptibility in a radiation detector
SG126917A1 (en) Method and apparatus for x-ray diffraction analysis
GB2429472B (en) Technique and apparatus for use in well testing
GB0421868D0 (en) Apparatus and method for measuring hydrogen concentration
GB2412166B (en) Method and apparatus for particle analysis
GB2440465B (en) Condition checking apparatus and method
GB0414097D0 (en) Apparatus and method for object shape detection
GB2426340B (en) Apparatus and method for the detection of defects in rails