SI1754113T1 - Postopek in naprava za izboljšanje zaznavanja limitov pri x-žarčenju in nuklearnih spektroskopskih sistemih - Google Patents
Postopek in naprava za izboljšanje zaznavanja limitov pri x-žarčenju in nuklearnih spektroskopskih sistemihInfo
- Publication number
- SI1754113T1 SI1754113T1 SI200531719T SI200531719T SI1754113T1 SI 1754113 T1 SI1754113 T1 SI 1754113T1 SI 200531719 T SI200531719 T SI 200531719T SI 200531719 T SI200531719 T SI 200531719T SI 1754113 T1 SI1754113 T1 SI 1754113T1
- Authority
- SI
- Slovenia
- Prior art keywords
- ray
- detection limits
- improving detection
- spectroscopy systems
- nuclear spectroscopy
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/17—Circuit arrangements not adapted to a particular type of detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US57738904P | 2004-06-04 | 2004-06-04 | |
US11/142,819 US7966155B2 (en) | 2004-06-04 | 2005-05-31 | Method and apparatus for improving detection limits in x-ray and nuclear spectroscopy systems |
EP05767680.1A EP1754113B1 (en) | 2004-06-04 | 2005-06-02 | Method and apparatus for improving detection limits in x-ray and nuclear spectroscopy systems |
PCT/US2005/019355 WO2005121988A2 (en) | 2004-06-04 | 2005-06-02 | Method and apparatus for improving detection limits in x-ray and nuclear spectroscopy systems |
Publications (1)
Publication Number | Publication Date |
---|---|
SI1754113T1 true SI1754113T1 (sl) | 2013-09-30 |
Family
ID=35503788
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SI200531719T SI1754113T1 (sl) | 2004-06-04 | 2005-06-02 | Postopek in naprava za izboljšanje zaznavanja limitov pri x-žarčenju in nuklearnih spektroskopskih sistemih |
Country Status (6)
Country | Link |
---|---|
US (1) | US7966155B2 (sl) |
EP (1) | EP1754113B1 (sl) |
JP (1) | JP2008501954A (sl) |
AU (1) | AU2005253117B2 (sl) |
SI (1) | SI1754113T1 (sl) |
WO (1) | WO2005121988A2 (sl) |
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JP5022902B2 (ja) | 2004-09-16 | 2012-09-12 | サザン イノヴェーション インターナショナル プロプライアトリー リミテッド | 検出器出力データ内の個別信号分離装置および方法 |
US8106350B2 (en) * | 2005-02-25 | 2012-01-31 | Micromass Uk Limited | Correction of deadtime effects in mass spectrometry |
WO2008060670A2 (en) * | 2006-04-20 | 2008-05-22 | Multi-Dimensional Imaging, Inc. | Low noise voltage-to-frequency conversion apparatus and method for quantum measurements |
GB2463402B (en) * | 2007-06-20 | 2012-11-21 | Thermo Electron Scient Instr | Processing of spectrometer pile-up events |
CN101809434B (zh) * | 2007-08-03 | 2013-06-12 | 普尔斯特有限责任公司 | 能量色散辐射光谱测量系统中的堆积排除 |
CA2732754C (en) * | 2007-08-03 | 2015-12-08 | Pulsetor, Llc | Digital pulse processor slope correction |
US7741609B2 (en) * | 2007-08-03 | 2010-06-22 | Pulsetor, Llc | Adapting a high-performance pulse processor to an existing spectrometry system |
JP5043728B2 (ja) * | 2008-03-19 | 2012-10-10 | 日本電子株式会社 | 放射線計測用パルスプロセッサ |
AU2009230874B2 (en) | 2008-03-31 | 2014-06-26 | Southern Innovation International Pty Ltd | Screening method and apparatus |
AU2009230875B2 (en) | 2008-03-31 | 2014-07-10 | Southern Innovation International Pty Ltd | Method and apparatus for borehole logging |
JP2011519415A (ja) | 2008-03-31 | 2011-07-07 | サザン イノヴェーション インターナショナル プロプライアトリー リミテッド | 個別信号解像度を用いた放射線画像形成法 |
US7807973B2 (en) * | 2008-08-01 | 2010-10-05 | Pulsetor, Llc | Pileup rejection in an energy-dispersive radiation spectrometry system |
AU2009328651A1 (en) | 2008-12-18 | 2011-06-30 | Southern Innovation International Pty Ltd | Method and apparatus for resolving piled-up pulses by using a mathematical transform |
US8335363B2 (en) * | 2009-06-16 | 2012-12-18 | Jefferson Science Associates, Llc | Method for image reconstruction of moving radionuclide source distribution |
KR101616056B1 (ko) * | 2009-08-19 | 2016-04-28 | 삼성전자주식회사 | 광자 계수 장치 및 방법 |
US8450693B2 (en) * | 2009-12-11 | 2013-05-28 | General Electric Company | Method and system for fault-tolerant reconstruction of images |
JP5427655B2 (ja) * | 2010-03-11 | 2014-02-26 | 株式会社日立製作所 | 放射線計測装置,核医学診断装置 |
US8503748B2 (en) * | 2010-08-02 | 2013-08-06 | Toseh Sanaye Tasvirbardari Parto Negar Persia | Nonlinear recursive filter for medical image processing |
US9176238B2 (en) | 2011-01-10 | 2015-11-03 | Koninklijke Philips N.V. | Detection device for detecting photons emitted by a radiation source |
US8374814B2 (en) * | 2011-02-16 | 2013-02-12 | Rigaku Corporation | X-ray detection signal processing apparatus and method therefor |
JP4880077B1 (ja) * | 2011-02-16 | 2012-02-22 | 株式会社リガク | X線検出信号処理装置および方法 |
JP5076012B1 (ja) * | 2011-05-20 | 2012-11-21 | 株式会社リガク | 波長分散型蛍光x線分析装置 |
FR2978562B1 (fr) * | 2011-07-26 | 2013-09-20 | Multix Sa | Dispositif et procede de traitement pour une mesure spectrometrique d'un flux de photons |
EP2834624B1 (en) * | 2012-04-05 | 2019-07-24 | Renishaw PLC | A method for measuring performance of a spectroscopy system |
EP2653891A1 (en) * | 2012-04-19 | 2013-10-23 | Fei Company | Method for analyzing an EDS signal |
US9128194B2 (en) * | 2013-04-19 | 2015-09-08 | Kabushiki Kaisha Toshiba | Pileup correction method for a photon-counting detector |
JP6159144B2 (ja) * | 2013-05-10 | 2017-07-05 | 株式会社堀場製作所 | パルス波高検出装置、放射線検出装置、放射線分析装置、及びパルス波高検出方法 |
JP6214031B2 (ja) * | 2013-07-19 | 2017-10-18 | 国立研究開発法人理化学研究所 | 放射線検出器のための信号データ処理方法、信号データ処理装置、および放射線検出システム |
JP6179292B2 (ja) * | 2013-09-11 | 2017-08-16 | 株式会社島津製作所 | 放射線検出器 |
WO2015079535A1 (ja) * | 2013-11-28 | 2015-06-04 | 株式会社島津製作所 | X線分析装置およびx線分析方法 |
EP3062125A1 (en) | 2015-02-26 | 2016-08-31 | Fei Company | Pulse processing |
US9869791B2 (en) | 2015-06-17 | 2018-01-16 | Baker Hughes, A Ge Company, Llc | Measurement of downhole radiation |
WO2017046289A1 (en) * | 2015-09-18 | 2017-03-23 | Koninklijke Philips N.V. | Processing of a corrected x-ray detector signal |
CN105866557B (zh) * | 2016-03-22 | 2018-08-10 | 成都理工大学 | 一种实现ghz脉冲通过率的时间、能量双谱同步测量系统 |
US10338235B2 (en) * | 2016-03-22 | 2019-07-02 | Shimadzu Corporation | Radiation detector |
WO2017187972A1 (ja) * | 2016-04-28 | 2017-11-02 | 株式会社堀場製作所 | 放射線検出装置及び放射線検出用信号処理装置 |
DE102019104710B4 (de) | 2019-02-25 | 2023-04-27 | Ketek Gmbh | Verfahren zum Betreiben eines Strahlungsdetektionssystems und Strahlungsdetektionssystem |
JP6999593B2 (ja) * | 2019-03-14 | 2022-01-18 | 株式会社堀場製作所 | 検出装置及びスペクトル生成装置 |
US20220341806A1 (en) * | 2019-09-20 | 2022-10-27 | Seekops Inc. | Spectral fitting of compact laser-based trace gas sensor measurements for high dynamic range (hdr) |
US11614430B2 (en) | 2019-12-19 | 2023-03-28 | Seekops Inc. | Concurrent in-situ measurement of wind speed and trace gases on mobile platforms for localization and qualification of emissions |
CN111487663B (zh) * | 2020-03-16 | 2022-06-03 | 中国石油天然气集团有限公司 | 一种核测井仪器能量电流谱获取方法 |
US11748866B2 (en) | 2020-07-17 | 2023-09-05 | Seekops Inc. | Systems and methods of automated detection of gas plumes using optical imaging |
CN113466924B (zh) * | 2021-07-01 | 2023-05-05 | 成都理工大学 | 一种对称类弹头脉冲成形装置及方法 |
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US5873054A (en) * | 1995-08-14 | 1999-02-16 | William K. Warburton | Method and apparatus for combinatorial logic signal processor in a digitally based high speed x-ray spectrometer |
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CA2288788A1 (en) * | 1997-05-07 | 1998-11-12 | Board Of Regents, The University Of Texas System | Method and apparatus to prevent pile-up when detecting the energy of incoming signals |
US6587814B1 (en) * | 1999-08-27 | 2003-07-01 | William K. Warburton | Method and apparatus for improving resolution in spectrometers processing output steps from non-ideal signal sources |
US7065473B2 (en) * | 1999-08-27 | 2006-06-20 | William K. Warburton | Method and apparatus for improving resolution in spectrometers processing output steps from non-ideal signal sources |
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JP2002022846A (ja) * | 2000-07-05 | 2002-01-23 | Seiko Instruments Inc | エネルギー分散型x線分析装置 |
JP4160275B2 (ja) * | 2001-05-28 | 2008-10-01 | 浜松ホトニクス株式会社 | エネルギー測定方法及び測定装置 |
US6609075B1 (en) * | 2001-06-04 | 2003-08-19 | William K. Warburton | Method and apparatus for baseline correction in x-ray and nuclear spectroscopy systems |
-
2005
- 2005-05-31 US US11/142,819 patent/US7966155B2/en active Active
- 2005-06-02 AU AU2005253117A patent/AU2005253117B2/en not_active Ceased
- 2005-06-02 SI SI200531719T patent/SI1754113T1/sl unknown
- 2005-06-02 EP EP05767680.1A patent/EP1754113B1/en active Active
- 2005-06-02 JP JP2007515559A patent/JP2008501954A/ja active Pending
- 2005-06-02 WO PCT/US2005/019355 patent/WO2005121988A2/en not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
EP1754113A4 (en) | 2011-03-16 |
EP1754113A2 (en) | 2007-02-21 |
US7966155B2 (en) | 2011-06-21 |
EP1754113B1 (en) | 2013-04-17 |
WO2005121988A3 (en) | 2006-10-26 |
JP2008501954A (ja) | 2008-01-24 |
AU2005253117B2 (en) | 2010-12-09 |
WO2005121988A2 (en) | 2005-12-22 |
US20060015290A1 (en) | 2006-01-19 |
AU2005253117A1 (en) | 2005-12-22 |
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