AU2005253117B2 - Method and apparatus for improving detection limits in X-Ray and nuclear spectroscopy systems - Google Patents
Method and apparatus for improving detection limits in X-Ray and nuclear spectroscopy systems Download PDFInfo
- Publication number
- AU2005253117B2 AU2005253117B2 AU2005253117A AU2005253117A AU2005253117B2 AU 2005253117 B2 AU2005253117 B2 AU 2005253117B2 AU 2005253117 A AU2005253117 A AU 2005253117A AU 2005253117 A AU2005253117 A AU 2005253117A AU 2005253117 B2 AU2005253117 B2 AU 2005253117B2
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- AU
- Australia
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/17—Circuit arrangements not adapted to a particular type of detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US57738904P | 2004-06-04 | 2004-06-04 | |
US60/577,389 | 2004-06-04 | ||
US11/142,819 US7966155B2 (en) | 2004-06-04 | 2005-05-31 | Method and apparatus for improving detection limits in x-ray and nuclear spectroscopy systems |
US11/142,819 | 2005-05-31 | ||
PCT/US2005/019355 WO2005121988A2 (en) | 2004-06-04 | 2005-06-02 | Method and apparatus for improving detection limits in x-ray and nuclear spectroscopy systems |
Publications (2)
Publication Number | Publication Date |
---|---|
AU2005253117A1 AU2005253117A1 (en) | 2005-12-22 |
AU2005253117B2 true AU2005253117B2 (en) | 2010-12-09 |
Family
ID=35503788
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2005253117A Ceased AU2005253117B2 (en) | 2004-06-04 | 2005-06-02 | Method and apparatus for improving detection limits in X-Ray and nuclear spectroscopy systems |
Country Status (6)
Country | Link |
---|---|
US (1) | US7966155B2 (sl) |
EP (1) | EP1754113B1 (sl) |
JP (1) | JP2008501954A (sl) |
AU (1) | AU2005253117B2 (sl) |
SI (1) | SI1754113T1 (sl) |
WO (1) | WO2005121988A2 (sl) |
Cited By (1)
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CN105866557A (zh) * | 2016-03-22 | 2016-08-17 | 成都理工大学 | 一种实现ghz脉冲通过率的时间、能量双谱同步测量系统 |
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JP5022902B2 (ja) | 2004-09-16 | 2012-09-12 | サザン イノヴェーション インターナショナル プロプライアトリー リミテッド | 検出器出力データ内の個別信号分離装置および方法 |
US8106350B2 (en) * | 2005-02-25 | 2012-01-31 | Micromass Uk Limited | Correction of deadtime effects in mass spectrometry |
WO2008060670A2 (en) * | 2006-04-20 | 2008-05-22 | Multi-Dimensional Imaging, Inc. | Low noise voltage-to-frequency conversion apparatus and method for quantum measurements |
DE112008001646T5 (de) * | 2007-06-20 | 2010-06-10 | Thermo Electron Scientific Instruments LLC, Madison | Bearbeitung von Spektrometer-Pile-Up-Ereignissen |
JP5349476B2 (ja) * | 2007-08-03 | 2013-11-20 | パルセータ,エルエルシー | エネルギー分散型放射線分光分析システムにおけるフォトンを示すエッジを検出する方法、当該方法を実行するパルスプロセッサおよびエネルギー分散型放射線分光分析システム |
WO2009020859A1 (en) * | 2007-08-03 | 2009-02-12 | Pulsetor, Llc | Digital pulse processor slope correction |
US7741609B2 (en) * | 2007-08-03 | 2010-06-22 | Pulsetor, Llc | Adapting a high-performance pulse processor to an existing spectrometry system |
JP5043728B2 (ja) * | 2008-03-19 | 2012-10-10 | 日本電子株式会社 | 放射線計測用パルスプロセッサ |
EP2260334A4 (en) | 2008-03-31 | 2015-03-11 | Southern Innovation Internat Pty Ltd | METHOD AND APPARATUS FOR DRILLING DIAGRAPHY |
JP2011519415A (ja) | 2008-03-31 | 2011-07-07 | サザン イノヴェーション インターナショナル プロプライアトリー リミテッド | 個別信号解像度を用いた放射線画像形成法 |
WO2009121130A1 (en) | 2008-03-31 | 2009-10-08 | Southern Innovation International Pty Ltd | Screening method and apparatus |
US7807973B2 (en) * | 2008-08-01 | 2010-10-05 | Pulsetor, Llc | Pileup rejection in an energy-dispersive radiation spectrometry system |
AU2009328651A1 (en) | 2008-12-18 | 2011-06-30 | Southern Innovation International Pty Ltd | Method and apparatus for resolving piled-up pulses by using a mathematical transform |
US8335363B2 (en) * | 2009-06-16 | 2012-12-18 | Jefferson Science Associates, Llc | Method for image reconstruction of moving radionuclide source distribution |
KR101616056B1 (ko) * | 2009-08-19 | 2016-04-28 | 삼성전자주식회사 | 광자 계수 장치 및 방법 |
US8450693B2 (en) * | 2009-12-11 | 2013-05-28 | General Electric Company | Method and system for fault-tolerant reconstruction of images |
JP5427655B2 (ja) * | 2010-03-11 | 2014-02-26 | 株式会社日立製作所 | 放射線計測装置,核医学診断装置 |
US8503748B2 (en) * | 2010-08-02 | 2013-08-06 | Toseh Sanaye Tasvirbardari Parto Negar Persia | Nonlinear recursive filter for medical image processing |
WO2012095710A2 (en) * | 2011-01-10 | 2012-07-19 | Koninklijke Philips Electronics N.V. | Detection device for detecting photons emitted by a radiation source |
JP4880077B1 (ja) * | 2011-02-16 | 2012-02-22 | 株式会社リガク | X線検出信号処理装置および方法 |
US8374814B2 (en) * | 2011-02-16 | 2013-02-12 | Rigaku Corporation | X-ray detection signal processing apparatus and method therefor |
JP5076012B1 (ja) * | 2011-05-20 | 2012-11-21 | 株式会社リガク | 波長分散型蛍光x線分析装置 |
FR2978562B1 (fr) * | 2011-07-26 | 2013-09-20 | Multix Sa | Dispositif et procede de traitement pour une mesure spectrometrique d'un flux de photons |
JP6280910B2 (ja) * | 2012-04-05 | 2018-02-14 | レニショウ パブリック リミテッド カンパニーRenishaw Public Limited Company | 分光システムの性能を測定するための方法 |
EP2653891A1 (en) | 2012-04-19 | 2013-10-23 | Fei Company | Method for analyzing an EDS signal |
US9128194B2 (en) * | 2013-04-19 | 2015-09-08 | Kabushiki Kaisha Toshiba | Pileup correction method for a photon-counting detector |
JP6159144B2 (ja) * | 2013-05-10 | 2017-07-05 | 株式会社堀場製作所 | パルス波高検出装置、放射線検出装置、放射線分析装置、及びパルス波高検出方法 |
JP6214031B2 (ja) * | 2013-07-19 | 2017-10-18 | 国立研究開発法人理化学研究所 | 放射線検出器のための信号データ処理方法、信号データ処理装置、および放射線検出システム |
JP6179292B2 (ja) * | 2013-09-11 | 2017-08-16 | 株式会社島津製作所 | 放射線検出器 |
WO2015079535A1 (ja) * | 2013-11-28 | 2015-06-04 | 株式会社島津製作所 | X線分析装置およびx線分析方法 |
EP3062125A1 (en) | 2015-02-26 | 2016-08-31 | Fei Company | Pulse processing |
US9869791B2 (en) | 2015-06-17 | 2018-01-16 | Baker Hughes, A Ge Company, Llc | Measurement of downhole radiation |
US11099279B2 (en) * | 2015-09-18 | 2021-08-24 | Koninklijke Philips N.V. | Processing of a corrected X-ray detector signal |
US10338235B2 (en) * | 2016-03-22 | 2019-07-02 | Shimadzu Corporation | Radiation detector |
EP3451024A4 (en) * | 2016-04-28 | 2019-12-11 | Horiba, Ltd.g | RADIATION DETECTOR AND SIGNAL PROCESSING DEVICE FOR RADIATION DETECTION |
DE102019104710B4 (de) * | 2019-02-25 | 2023-04-27 | Ketek Gmbh | Verfahren zum Betreiben eines Strahlungsdetektionssystems und Strahlungsdetektionssystem |
JP6999593B2 (ja) * | 2019-03-14 | 2022-01-18 | 株式会社堀場製作所 | 検出装置及びスペクトル生成装置 |
WO2020206006A1 (en) | 2019-04-05 | 2020-10-08 | Seekops Inc. | Analog signal processing for a lightweight and compact laser-based trace gas sensor |
US20220341806A1 (en) * | 2019-09-20 | 2022-10-27 | Seekops Inc. | Spectral fitting of compact laser-based trace gas sensor measurements for high dynamic range (hdr) |
US11614430B2 (en) | 2019-12-19 | 2023-03-28 | Seekops Inc. | Concurrent in-situ measurement of wind speed and trace gases on mobile platforms for localization and qualification of emissions |
US11988598B2 (en) | 2019-12-31 | 2024-05-21 | Seekops Inc. | Optical cell cleaner |
CN111487663B (zh) * | 2020-03-16 | 2022-06-03 | 中国石油天然气集团有限公司 | 一种核测井仪器能量电流谱获取方法 |
US11748866B2 (en) | 2020-07-17 | 2023-09-05 | Seekops Inc. | Systems and methods of automated detection of gas plumes using optical imaging |
CN113466924B (zh) * | 2021-07-01 | 2023-05-05 | 成都理工大学 | 一种对称类弹头脉冲成形装置及方法 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5184017A (en) * | 1989-09-12 | 1993-02-02 | Sensors, Inc. | Method and apparatus for detecting a component gas in a sample |
Family Cites Families (14)
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NL7110516A (sl) * | 1971-07-30 | 1973-02-01 | ||
US5349193A (en) * | 1993-05-20 | 1994-09-20 | Princeton Gamma Tech, Inc. | Highly sensitive nuclear spectrometer apparatus and method |
US5870051A (en) * | 1995-08-14 | 1999-02-09 | William K. Warburton | Method and apparatus for analog signal conditioner for high speed, digital x-ray spectrometer |
US5684850A (en) * | 1995-08-14 | 1997-11-04 | William K. Warburton | Method and apparatus for digitally based high speed x-ray spectrometer |
EP0880821B1 (en) * | 1995-08-14 | 2003-12-17 | William K. Warburton | Method and apparatus for digitally based high speed x-ray spectrometer |
US5873054A (en) * | 1995-08-14 | 1999-02-16 | William K. Warburton | Method and apparatus for combinatorial logic signal processor in a digitally based high speed x-ray spectrometer |
PT1007988E (pt) * | 1997-05-07 | 2003-12-31 | Univ Texas | Processo e aparelho para evitar a acumulacao quando da deteccao da energia de sinais de entrada |
US6587814B1 (en) * | 1999-08-27 | 2003-07-01 | William K. Warburton | Method and apparatus for improving resolution in spectrometers processing output steps from non-ideal signal sources |
US7065473B2 (en) * | 1999-08-27 | 2006-06-20 | William K. Warburton | Method and apparatus for improving resolution in spectrometers processing output steps from non-ideal signal sources |
US6389102B2 (en) * | 1999-09-29 | 2002-05-14 | Jordan Valley Applied Radiation Ltd. | X-ray array detector |
US6327549B1 (en) * | 1999-10-25 | 2001-12-04 | Perkinelmer, Inc. | Differential correction method and apparatus |
JP2002022846A (ja) * | 2000-07-05 | 2002-01-23 | Seiko Instruments Inc | エネルギー分散型x線分析装置 |
JP4160275B2 (ja) * | 2001-05-28 | 2008-10-01 | 浜松ホトニクス株式会社 | エネルギー測定方法及び測定装置 |
US6609075B1 (en) * | 2001-06-04 | 2003-08-19 | William K. Warburton | Method and apparatus for baseline correction in x-ray and nuclear spectroscopy systems |
-
2005
- 2005-05-31 US US11/142,819 patent/US7966155B2/en active Active
- 2005-06-02 JP JP2007515559A patent/JP2008501954A/ja active Pending
- 2005-06-02 AU AU2005253117A patent/AU2005253117B2/en not_active Ceased
- 2005-06-02 WO PCT/US2005/019355 patent/WO2005121988A2/en not_active Application Discontinuation
- 2005-06-02 EP EP05767680.1A patent/EP1754113B1/en active Active
- 2005-06-02 SI SI200531719T patent/SI1754113T1/sl unknown
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5184017A (en) * | 1989-09-12 | 1993-02-02 | Sensors, Inc. | Method and apparatus for detecting a component gas in a sample |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105866557A (zh) * | 2016-03-22 | 2016-08-17 | 成都理工大学 | 一种实现ghz脉冲通过率的时间、能量双谱同步测量系统 |
CN105866557B (zh) * | 2016-03-22 | 2018-08-10 | 成都理工大学 | 一种实现ghz脉冲通过率的时间、能量双谱同步测量系统 |
Also Published As
Publication number | Publication date |
---|---|
EP1754113A2 (en) | 2007-02-21 |
EP1754113A4 (en) | 2011-03-16 |
EP1754113B1 (en) | 2013-04-17 |
US7966155B2 (en) | 2011-06-21 |
AU2005253117A1 (en) | 2005-12-22 |
WO2005121988A3 (en) | 2006-10-26 |
JP2008501954A (ja) | 2008-01-24 |
WO2005121988A2 (en) | 2005-12-22 |
SI1754113T1 (sl) | 2013-09-30 |
US20060015290A1 (en) | 2006-01-19 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FGA | Letters patent sealed or granted (standard patent) | ||
MK14 | Patent ceased section 143(a) (annual fees not paid) or expired |