JP2008501954A5 - - Google Patents
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- JP2008501954A5 JP2008501954A5 JP2007515559A JP2007515559A JP2008501954A5 JP 2008501954 A5 JP2008501954 A5 JP 2008501954A5 JP 2007515559 A JP2007515559 A JP 2007515559A JP 2007515559 A JP2007515559 A JP 2007515559A JP 2008501954 A5 JP2008501954 A5 JP 2008501954A5
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Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US57738904P | 2004-06-04 | 2004-06-04 | |
| US11/142,819 US7966155B2 (en) | 2004-06-04 | 2005-05-31 | Method and apparatus for improving detection limits in x-ray and nuclear spectroscopy systems |
| PCT/US2005/019355 WO2005121988A2 (en) | 2004-06-04 | 2005-06-02 | Method and apparatus for improving detection limits in x-ray and nuclear spectroscopy systems |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2008501954A JP2008501954A (ja) | 2008-01-24 |
| JP2008501954A5 true JP2008501954A5 (enExample) | 2012-10-25 |
Family
ID=35503788
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007515559A Pending JP2008501954A (ja) | 2004-06-04 | 2005-06-02 | Ｘ線及び核分光システムにおける検出限界を向上するための方法及び装置 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7966155B2 (enExample) |
| EP (1) | EP1754113B1 (enExample) |
| JP (1) | JP2008501954A (enExample) |
| AU (1) | AU2005253117B2 (enExample) |
| SI (1) | SI1754113T1 (enExample) |
| WO (1) | WO2005121988A2 (enExample) |
Families Citing this family (63)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5022902B2 (ja) | 2004-09-16 | 2012-09-12 | サザン イノヴェーション インターナショナル プロプライアトリー リミテッド | 検出器出力データ内の個別信号分離装置および方法 |
| WO2006090138A2 (en) * | 2005-02-25 | 2006-08-31 | Micromass Uk Limited | Mass spectrometer |
| WO2008060670A2 (en) * | 2006-04-20 | 2008-05-22 | Multi-Dimensional Imaging, Inc. | Low noise voltage-to-frequency conversion apparatus and method for quantum measurements |
| US8027811B2 (en) * | 2007-06-20 | 2011-09-27 | Thermo Electron Scientific Instruments Llc | Processing of spectrometer pile-up events |
| CA2732754C (en) * | 2007-08-03 | 2015-12-08 | Pulsetor, Llc | Digital pulse processor slope correction |
| US7855370B2 (en) * | 2007-08-03 | 2010-12-21 | Pulsetor, Llc | Pileup rejection in an energy-dispersive radiation spectrometry system |
| US7741609B2 (en) * | 2007-08-03 | 2010-06-22 | Pulsetor, Llc | Adapting a high-performance pulse processor to an existing spectrometry system |
| JP5043728B2 (ja) * | 2008-03-19 | 2012-10-10 | 日本電子株式会社 | 放射線計測用パルスプロセッサ |
| US8954300B2 (en) | 2008-03-31 | 2015-02-10 | Southern Innovation International Pty Ltd. | Screening method and apparatus |
| EP2260295A4 (en) | 2008-03-31 | 2015-12-23 | Southern Innovation Internat Pty Ltd | RADIATION IMAGING METHOD WITH SINGLE SIGNAL RESOLUTION |
| CN101983342A (zh) | 2008-03-31 | 2011-03-02 | 南方创新国际股份有限公司 | 用于钻孔测井的方法和装置 |
| US7807973B2 (en) * | 2008-08-01 | 2010-10-05 | Pulsetor, Llc | Pileup rejection in an energy-dispersive radiation spectrometry system |
| JP5581333B2 (ja) | 2008-12-18 | 2014-08-27 | サザン イノヴェーション インターナショナル プロプライアトリー リミテッド | 数学的変換を使用することによってパイルアップされたパルスを分離する方法および装置 |
| US8335363B2 (en) * | 2009-06-16 | 2012-12-18 | Jefferson Science Associates, Llc | Method for image reconstruction of moving radionuclide source distribution |
| KR101616056B1 (ko) * | 2009-08-19 | 2016-04-28 | 삼성전자주식회사 | 광자 계수 장치 및 방법 |
| US8450693B2 (en) * | 2009-12-11 | 2013-05-28 | General Electric Company | Method and system for fault-tolerant reconstruction of images |
| JP5427655B2 (ja) * | 2010-03-11 | 2014-02-26 | 株式会社日立製作所 | 放射線計測装置，核医学診断装置 |
| US8503748B2 (en) * | 2010-08-02 | 2013-08-06 | Toseh Sanaye Tasvirbardari Parto Negar Persia | Nonlinear recursive filter for medical image processing |
| CN103314307B (zh) * | 2011-01-10 | 2016-04-13 | 皇家飞利浦电子股份有限公司 | 用于探测由辐射源发射的光子的探测装置 |
| US8374814B2 (en) * | 2011-02-16 | 2013-02-12 | Rigaku Corporation | X-ray detection signal processing apparatus and method therefor |
| JP4880077B1 (ja) * | 2011-02-16 | 2012-02-22 | 株式会社リガク | Ｘ線検出信号処理装置および方法 |
| JP5076012B1 (ja) * | 2011-05-20 | 2012-11-21 | 株式会社リガク | 波長分散型蛍光ｘ線分析装置 |
| FR2978562B1 (fr) * | 2011-07-26 | 2013-09-20 | Multix Sa | Dispositif et procede de traitement pour une mesure spectrometrique d'un flux de photons |
| JP6280910B2 (ja) * | 2012-04-05 | 2018-02-14 | レニショウ パブリック リミテッド カンパニーＲｅｎｉｓｈａｗ Ｐｕｂｌｉｃ Ｌｉｍｉｔｅｄ Ｃｏｍｐａｎｙ | 分光システムの性能を測定するための方法 |
| EP2653891A1 (en) | 2012-04-19 | 2013-10-23 | Fei Company | Method for analyzing an EDS signal |
| US9128194B2 (en) * | 2013-04-19 | 2015-09-08 | Kabushiki Kaisha Toshiba | Pileup correction method for a photon-counting detector |
| JP6159144B2 (ja) * | 2013-05-10 | 2017-07-05 | 株式会社堀場製作所 | パルス波高検出装置、放射線検出装置、放射線分析装置、及びパルス波高検出方法 |
| JP6214031B2 (ja) * | 2013-07-19 | 2017-10-18 | 国立研究開発法人理化学研究所 | 放射線検出器のための信号データ処理方法、信号データ処理装置、および放射線検出システム |
| JP6179292B2 (ja) * | 2013-09-11 | 2017-08-16 | 株式会社島津製作所 | 放射線検出器 |
| WO2015079535A1 (ja) * | 2013-11-28 | 2015-06-04 | 株式会社島津製作所 | Ｘ線分析装置およびｘ線分析方法 |
| EP3062125A1 (en) | 2015-02-26 | 2016-08-31 | Fei Company | Pulse processing |
| US9869791B2 (en) | 2015-06-17 | 2018-01-16 | Baker Hughes, A Ge Company, Llc | Measurement of downhole radiation |
| US11099279B2 (en) * | 2015-09-18 | 2021-08-24 | Koninklijke Philips N.V. | Processing of a corrected X-ray detector signal |
| US10338235B2 (en) * | 2016-03-22 | 2019-07-02 | Shimadzu Corporation | Radiation detector |
| CN105866557B (zh) * | 2016-03-22 | 2018-08-10 | 成都理工大学 | 一种实现ghz脉冲通过率的时间、能量双谱同步测量系统 |
| US10795031B2 (en) | 2016-04-28 | 2020-10-06 | Horiba, Ltd. | Radiation detection system and signal processor for radiation detection |
| US12399164B2 (en) | 2018-06-19 | 2025-08-26 | Seekops Inc. | Emissions estimate model algorithms and methods |
| WO2019246283A1 (en) | 2018-06-19 | 2019-12-26 | Seekops Inc. | Localization analytics algorithms and methods |
| WO2019246280A1 (en) | 2018-06-19 | 2019-12-26 | Seekops Inc. | Emissions estimate model algorithms and methods |
| US12044666B2 (en) | 2018-07-30 | 2024-07-23 | Seekops Inc. | Ultra-lightweight, handheld gas leak detection device |
| US12281983B2 (en) | 2018-10-22 | 2025-04-22 | Seekops Inc. | UAV-borne, high-bandwidth, lightweight point sensor for quantifying greenhouse gases in atmospheric strata |
| DE102019104710B4 (de) * | 2019-02-25 | 2023-04-27 | Ketek Gmbh | Verfahren zum Betreiben eines Strahlungsdetektionssystems und Strahlungsdetektionssystem |
| JP6999593B2 (ja) * | 2019-03-14 | 2022-01-18 | 株式会社堀場製作所 | 検出装置及びスペクトル生成装置 |
| US12188847B2 (en) | 2019-04-05 | 2025-01-07 | Seekops Inc. | Time-and data-efficient assurance of leak detection |
| WO2020206006A1 (en) | 2019-04-05 | 2020-10-08 | Seekops Inc. | Analog signal processing for a lightweight and compact laser-based trace gas sensor |
| US12130204B2 (en) | 2019-08-05 | 2024-10-29 | Seekops Inc. | Rapidly deployable UAS system for autonomous inspection operations using a combined payload |
| US12392680B2 (en) * | 2019-09-20 | 2025-08-19 | Seekops Inc. | Spectral fitting of compact laser-based trace gas sensor measurements for high dynamic range (HDR) |
| US12197233B2 (en) | 2019-10-04 | 2025-01-14 | Seekops Inc. | Closed surface flight pattern generation for unmanned aerial vehicle (UAV) flux plane assessment of large facilities |
| US11614430B2 (en) | 2019-12-19 | 2023-03-28 | Seekops Inc. | Concurrent in-situ measurement of wind speed and trace gases on mobile platforms for localization and qualification of emissions |
| US11988598B2 (en) | 2019-12-31 | 2024-05-21 | Seekops Inc. | Optical cell cleaner |
| EP4100719A4 (en) | 2020-02-05 | 2024-02-21 | SeekOps Inc. | MULTIPLE PATH LENGTH OPTICAL CELL FOR MEASUREMENT OF TRACE GASES |
| US12055485B2 (en) | 2020-02-05 | 2024-08-06 | Seekops Inc. | Multispecies measurement platform using absorption spectroscopy for measurement of co-emitted trace gases |
| CN111487663B (zh) * | 2020-03-16 | 2022-06-03 | 中国石油天然气集团有限公司 | 一种核测井仪器能量电流谱获取方法 |
| US12015386B2 (en) | 2020-03-25 | 2024-06-18 | Seekops Inc. | Logarithmic demodulator for laser Wavelength-Modulaton Spectroscopy |
| EP4182766A4 (en) | 2020-07-17 | 2024-06-26 | SeekOps Inc. | Uas work practice |
| US11748866B2 (en) | 2020-07-17 | 2023-09-05 | Seekops Inc. | Systems and methods of automated detection of gas plumes using optical imaging |
| EP4237817A4 (en) | 2020-10-27 | 2024-10-09 | SeekOps Inc. | METHODS AND APPARATUS FOR MEASURING METHANE EMISSIONS WITH AN OPEN CAVITY OPTICAL METHANE SENSOR |
| WO2022122545A1 (en) * | 2020-12-09 | 2022-06-16 | Ams International Ag | Electric circuitry for baseline extraction in a photon counting system |
| US12161498B2 (en) | 2021-05-11 | 2024-12-10 | Analog Devices, Inc. | Baseline restoration technique for photon counting computed tomography using active reference |
| CN113466924B (zh) * | 2021-07-01 | 2023-05-05 | 成都理工大学 | 一种对称类弹头脉冲成形装置及方法 |
| CN114660650A (zh) * | 2022-03-14 | 2022-06-24 | 中国科学院微电子研究所 | 一种成形时间自适应的数字脉冲滤波方法、装置及电子设备 |
| US20240188918A1 (en) * | 2022-12-13 | 2024-06-13 | Analog Devices, Inc. | Timer-based amplitude correction method for photon counting computed tomography |
| CN116381764A (zh) * | 2022-12-17 | 2023-07-04 | 苏州瑞派宁科技有限公司 | 脉冲甄别方法、装置、数字化设备及存储介质 |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL7110516A (enExample) | 1971-07-30 | 1973-02-01 | ||
| US5184017A (en) * | 1989-09-12 | 1993-02-02 | Sensors, Inc. | Method and apparatus for detecting a component gas in a sample |
| US5349193A (en) | 1993-05-20 | 1994-09-20 | Princeton Gamma Tech, Inc. | Highly sensitive nuclear spectrometer apparatus and method |
| US5873054A (en) | 1995-08-14 | 1999-02-16 | William K. Warburton | Method and apparatus for combinatorial logic signal processor in a digitally based high speed x-ray spectrometer |
| US5684850A (en) | 1995-08-14 | 1997-11-04 | William K. Warburton | Method and apparatus for digitally based high speed x-ray spectrometer |
| US5870051A (en) | 1995-08-14 | 1999-02-09 | William K. Warburton | Method and apparatus for analog signal conditioner for high speed, digital x-ray spectrometer |
| JP4083802B2 (ja) * | 1995-08-14 | 2008-04-30 | ワーバートン，ウィリアム，ケイ． | デジタルベースの高速ｘ線スペクトロメータについての方法 |
| ATE245820T1 (de) * | 1997-05-07 | 2003-08-15 | Univ Texas | Verfahren und vorrichtung zum verhindern von 'pile-up'bei der detektion ankommender energiesignale |
| US7065473B2 (en) * | 1999-08-27 | 2006-06-20 | William K. Warburton | Method and apparatus for improving resolution in spectrometers processing output steps from non-ideal signal sources |
| US6587814B1 (en) * | 1999-08-27 | 2003-07-01 | William K. Warburton | Method and apparatus for improving resolution in spectrometers processing output steps from non-ideal signal sources |
| US6389102B2 (en) * | 1999-09-29 | 2002-05-14 | Jordan Valley Applied Radiation Ltd. | X-ray array detector |
| US6327549B1 (en) * | 1999-10-25 | 2001-12-04 | Perkinelmer, Inc. | Differential correction method and apparatus |
| JP2002022846A (ja) * | 2000-07-05 | 2002-01-23 | Seiko Instruments Inc | エネルギー分散型ｘ線分析装置 |
| JP4160275B2 (ja) * | 2001-05-28 | 2008-10-01 | 浜松ホトニクス株式会社 | エネルギー測定方法及び測定装置 |
| US6609075B1 (en) | 2001-06-04 | 2003-08-19 | William K. Warburton | Method and apparatus for baseline correction in x-ray and nuclear spectroscopy systems |
-
2005
- 2005-05-31 US US11/142,819 patent/US7966155B2/en not_active Expired - Lifetime
- 2005-06-02 AU AU2005253117A patent/AU2005253117B2/en not_active Ceased
- 2005-06-02 JP JP2007515559A patent/JP2008501954A/ja active Pending
- 2005-06-02 EP EP05767680.1A patent/EP1754113B1/en not_active Expired - Lifetime
- 2005-06-02 WO PCT/US2005/019355 patent/WO2005121988A2/en not_active Ceased
- 2005-06-02 SI SI200531719T patent/SI1754113T1/sl unknown
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