JP2008501954A5 - - Google Patents
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- JP2008501954A5 JP2008501954A5 JP2007515559A JP2007515559A JP2008501954A5 JP 2008501954 A5 JP2008501954 A5 JP 2008501954A5 JP 2007515559 A JP2007515559 A JP 2007515559A JP 2007515559 A JP2007515559 A JP 2007515559A JP 2008501954 A5 JP2008501954 A5 JP 2008501954A5
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Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US57738904P | 2004-06-04 | 2004-06-04 | |
| US11/142,819 US7966155B2 (en) | 2004-06-04 | 2005-05-31 | Method and apparatus for improving detection limits in x-ray and nuclear spectroscopy systems |
| PCT/US2005/019355 WO2005121988A2 (en) | 2004-06-04 | 2005-06-02 | Method and apparatus for improving detection limits in x-ray and nuclear spectroscopy systems |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2008501954A JP2008501954A (ja) | 2008-01-24 |
| JP2008501954A5 true JP2008501954A5 (enExample) | 2012-10-25 |
Family
ID=35503788
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007515559A Pending JP2008501954A (ja) | 2004-06-04 | 2005-06-02 | Ｘ線及び核分光システムにおける検出限界を向上するための方法及び装置 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7966155B2 (enExample) |
| EP (1) | EP1754113B1 (enExample) |
| JP (1) | JP2008501954A (enExample) |
| AU (1) | AU2005253117B2 (enExample) |
| SI (1) | SI1754113T1 (enExample) |
| WO (1) | WO2005121988A2 (enExample) |
Families Citing this family (62)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2006029475A1 (en) | 2004-09-16 | 2006-03-23 | Southern Innovation International Pty Ltd | Method and apparatus for resolving individual signals in detector output data. |
| WO2006090138A2 (en) * | 2005-02-25 | 2006-08-31 | Micromass Uk Limited | Mass spectrometer |
| WO2008060670A2 (en) * | 2006-04-20 | 2008-05-22 | Multi-Dimensional Imaging, Inc. | Low noise voltage-to-frequency conversion apparatus and method for quantum measurements |
| US8027811B2 (en) * | 2007-06-20 | 2011-09-27 | Thermo Electron Scientific Instruments Llc | Processing of spectrometer pile-up events |
| WO2009020866A1 (en) * | 2007-08-03 | 2009-02-12 | Pulsetor, Llc | Adapting a high-performance pulse processor to an existing spectrometry system |
| CA2732754C (en) * | 2007-08-03 | 2015-12-08 | Pulsetor, Llc | Digital pulse processor slope correction |
| JP5455904B2 (ja) * | 2007-08-03 | 2014-03-26 | パルセータ，エルエルシー | エネルギー分散型放射線分光分析システムにおけるパイルアップ検出方法、当該方法を実行するパルスプロセッサ、および、パイルアップを検出するエネルギー分散型放射線分光分析システム |
| JP5043728B2 (ja) * | 2008-03-19 | 2012-10-10 | 日本電子株式会社 | 放射線計測用パルスプロセッサ |
| AU2009230876B2 (en) | 2008-03-31 | 2014-07-10 | Southern Innovation International Pty Ltd | Radiation imaging method with individual signal resolution |
| JP2011516838A (ja) | 2008-03-31 | 2011-05-26 | サザン イノヴェーション インターナショナル プロプライアトリー リミテッド | スクリーニング方法および装置 |
| JP5832892B2 (ja) | 2008-03-31 | 2015-12-16 | サザン イノヴェーション インターナショナル プロプライアトリー リミテッド | 孔内検層のための方法および装置 |
| US7807973B2 (en) * | 2008-08-01 | 2010-10-05 | Pulsetor, Llc | Pileup rejection in an energy-dispersive radiation spectrometry system |
| EP2359261B1 (en) | 2008-12-18 | 2018-04-25 | Southern Innovation International Pty Ltd | Method and apparatus for resolving piled-up pulses by using a mathematical transform |
| US8335363B2 (en) * | 2009-06-16 | 2012-12-18 | Jefferson Science Associates, Llc | Method for image reconstruction of moving radionuclide source distribution |
| KR101616056B1 (ko) * | 2009-08-19 | 2016-04-28 | 삼성전자주식회사 | 광자 계수 장치 및 방법 |
| US8450693B2 (en) * | 2009-12-11 | 2013-05-28 | General Electric Company | Method and system for fault-tolerant reconstruction of images |
| JP5427655B2 (ja) * | 2010-03-11 | 2014-02-26 | 株式会社日立製作所 | 放射線計測装置，核医学診断装置 |
| US8503748B2 (en) * | 2010-08-02 | 2013-08-06 | Toseh Sanaye Tasvirbardari Parto Negar Persia | Nonlinear recursive filter for medical image processing |
| EP2663879B1 (en) * | 2011-01-10 | 2017-08-02 | Koninklijke Philips N.V. | Detection device for detecting photons emitted by a radiation source |
| JP4880077B1 (ja) * | 2011-02-16 | 2012-02-22 | 株式会社リガク | Ｘ線検出信号処理装置および方法 |
| JP5076012B1 (ja) * | 2011-05-20 | 2012-11-21 | 株式会社リガク | 波長分散型蛍光ｘ線分析装置 |
| FR2978562B1 (fr) * | 2011-07-26 | 2013-09-20 | Multix Sa | Dispositif et procede de traitement pour une mesure spectrometrique d'un flux de photons |
| EP2834624B1 (en) * | 2012-04-05 | 2019-07-24 | Renishaw PLC | A method for measuring performance of a spectroscopy system |
| EP2653891A1 (en) * | 2012-04-19 | 2013-10-23 | Fei Company | Method for analyzing an EDS signal |
| US9128194B2 (en) * | 2013-04-19 | 2015-09-08 | Kabushiki Kaisha Toshiba | Pileup correction method for a photon-counting detector |
| JP6159144B2 (ja) * | 2013-05-10 | 2017-07-05 | 株式会社堀場製作所 | パルス波高検出装置、放射線検出装置、放射線分析装置、及びパルス波高検出方法 |
| JP6214031B2 (ja) * | 2013-07-19 | 2017-10-18 | 国立研究開発法人理化学研究所 | 放射線検出器のための信号データ処理方法、信号データ処理装置、および放射線検出システム |
| JP6179292B2 (ja) * | 2013-09-11 | 2017-08-16 | 株式会社島津製作所 | 放射線検出器 |
| WO2015079535A1 (ja) * | 2013-11-28 | 2015-06-04 | 株式会社島津製作所 | Ｘ線分析装置およびｘ線分析方法 |
| EP3062125A1 (en) | 2015-02-26 | 2016-08-31 | Fei Company | Pulse processing |
| US9869791B2 (en) | 2015-06-17 | 2018-01-16 | Baker Hughes, A Ge Company, Llc | Measurement of downhole radiation |
| WO2017046289A1 (en) * | 2015-09-18 | 2017-03-23 | Koninklijke Philips N.V. | Processing of a corrected x-ray detector signal |
| US10338235B2 (en) * | 2016-03-22 | 2019-07-02 | Shimadzu Corporation | Radiation detector |
| CN105866557B (zh) * | 2016-03-22 | 2018-08-10 | 成都理工大学 | 一种实现ghz脉冲通过率的时间、能量双谱同步测量系统 |
| WO2017187972A1 (ja) * | 2016-04-28 | 2017-11-02 | 株式会社堀場製作所 | 放射線検出装置及び放射線検出用信号処理装置 |
| EP3811171B1 (en) | 2018-06-19 | 2025-02-26 | SeekOps Inc. | Emissions estimate model algorithms and methods |
| US12399164B2 (en) | 2018-06-19 | 2025-08-26 | Seekops Inc. | Emissions estimate model algorithms and methods |
| US12216105B2 (en) | 2018-06-19 | 2025-02-04 | Seekops Inc. | Localization analytics algorithms and methods |
| US12044666B2 (en) | 2018-07-30 | 2024-07-23 | Seekops Inc. | Ultra-lightweight, handheld gas leak detection device |
| EP3870951A4 (en) | 2018-10-22 | 2022-07-27 | SeekOps Inc. | HIGH BROADBAND, LIGHTWEIGHT POINT SENSOR ON UAV FOR QUANTIFICATION OF GREENHOUSE GASES IN ATMOSPHERIC LAYERS |
| DE102019104710B4 (de) * | 2019-02-25 | 2023-04-27 | Ketek Gmbh | Verfahren zum Betreiben eines Strahlungsdetektionssystems und Strahlungsdetektionssystem |
| JP6999593B2 (ja) * | 2019-03-14 | 2022-01-18 | 株式会社堀場製作所 | 検出装置及びスペクトル生成装置 |
| US12188847B2 (en) | 2019-04-05 | 2025-01-07 | Seekops Inc. | Time-and data-efficient assurance of leak detection |
| EP3949039A4 (en) | 2019-04-05 | 2022-11-30 | SeekOps Inc. | ANALOG SIGNAL PROCESSING FOR A LIGHT AND COMPACT LASER BASED TRACE ASSESSOR |
| EP4010246A4 (en) | 2019-08-05 | 2023-09-13 | SeekOps Inc. | UAS SYSTEM THAT CAN BE RAPIDLY DEPLOYED FOR AUTONOMOUS INSPECTION OPERATIONS USING A COMBINED PAYLOAD |
| WO2021055902A1 (en) * | 2019-09-20 | 2021-03-25 | Seekops Inc. | Spectral fitting of compact laser-based trace gas sensor measurements for high dynamic range (hdr) |
| US12197233B2 (en) | 2019-10-04 | 2025-01-14 | Seekops Inc. | Closed surface flight pattern generation for unmanned aerial vehicle (UAV) flux plane assessment of large facilities |
| US11614430B2 (en) | 2019-12-19 | 2023-03-28 | Seekops Inc. | Concurrent in-situ measurement of wind speed and trace gases on mobile platforms for localization and qualification of emissions |
| US11988598B2 (en) | 2019-12-31 | 2024-05-21 | Seekops Inc. | Optical cell cleaner |
| US12055485B2 (en) | 2020-02-05 | 2024-08-06 | Seekops Inc. | Multispecies measurement platform using absorption spectroscopy for measurement of co-emitted trace gases |
| US12276597B2 (en) | 2020-02-05 | 2025-04-15 | Seekops Inc. | Multiple path length optical cell for trace gas measurement |
| CN111487663B (zh) * | 2020-03-16 | 2022-06-03 | 中国石油天然气集团有限公司 | 一种核测井仪器能量电流谱获取方法 |
| EP4127740A4 (en) | 2020-03-25 | 2024-04-24 | SeekOps Inc. | Logarithmic demodulator for laser wavelength-modulaton spectroscopy |
| US11748866B2 (en) | 2020-07-17 | 2023-09-05 | Seekops Inc. | Systems and methods of automated detection of gas plumes using optical imaging |
| WO2022016107A1 (en) | 2020-07-17 | 2022-01-20 | Seekops Inc. | Uas work practice |
| WO2022093864A1 (en) | 2020-10-27 | 2022-05-05 | Seekops Inc. | Methods and apparatus for measuring methane emissions with an optical open-cavity methane sensor |
| JP7610030B2 (ja) | 2020-12-09 | 2025-01-07 | エーエムエス・インターナショナル・アーゲー | 光子計数システムにおける基線抽出のための電気回路機構 |
| US12161498B2 (en) | 2021-05-11 | 2024-12-10 | Analog Devices, Inc. | Baseline restoration technique for photon counting computed tomography using active reference |
| CN113466924B (zh) * | 2021-07-01 | 2023-05-05 | 成都理工大学 | 一种对称类弹头脉冲成形装置及方法 |
| CN114660650A (zh) * | 2022-03-14 | 2022-06-24 | 中国科学院微电子研究所 | 一种成形时间自适应的数字脉冲滤波方法、装置及电子设备 |
| US12571923B2 (en) * | 2022-12-13 | 2026-03-10 | Analog Devices, Inc. | Timer-based amplitude correction method for photon counting computed tomography |
| CN116381764B (zh) * | 2022-12-17 | 2026-06-19 | 苏州瑞派宁科技有限公司 | 脉冲甄别方法、装置、数字化设备及存储介质 |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL7110516A (enExample) * | 1971-07-30 | 1973-02-01 | ||
| US5184017A (en) * | 1989-09-12 | 1993-02-02 | Sensors, Inc. | Method and apparatus for detecting a component gas in a sample |
| US5349193A (en) * | 1993-05-20 | 1994-09-20 | Princeton Gamma Tech, Inc. | Highly sensitive nuclear spectrometer apparatus and method |
| JP4083802B2 (ja) * | 1995-08-14 | 2008-04-30 | ワーバートン，ウィリアム，ケイ． | デジタルベースの高速ｘ線スペクトロメータについての方法 |
| US5873054A (en) * | 1995-08-14 | 1999-02-16 | William K. Warburton | Method and apparatus for combinatorial logic signal processor in a digitally based high speed x-ray spectrometer |
| US5684850A (en) * | 1995-08-14 | 1997-11-04 | William K. Warburton | Method and apparatus for digitally based high speed x-ray spectrometer |
| US5870051A (en) * | 1995-08-14 | 1999-02-09 | William K. Warburton | Method and apparatus for analog signal conditioner for high speed, digital x-ray spectrometer |
| JP2001524217A (ja) * | 1997-05-07 | 2001-11-27 | ボード・オヴ・リージェンツ，ザ・ユニヴァーシティ・オヴ・テキサス・システム | 信号のパイルアップを阻止するための方法および装置 |
| US7065473B2 (en) * | 1999-08-27 | 2006-06-20 | William K. Warburton | Method and apparatus for improving resolution in spectrometers processing output steps from non-ideal signal sources |
| US6587814B1 (en) * | 1999-08-27 | 2003-07-01 | William K. Warburton | Method and apparatus for improving resolution in spectrometers processing output steps from non-ideal signal sources |
| US6389102B2 (en) * | 1999-09-29 | 2002-05-14 | Jordan Valley Applied Radiation Ltd. | X-ray array detector |
| US6327549B1 (en) * | 1999-10-25 | 2001-12-04 | Perkinelmer, Inc. | Differential correction method and apparatus |
| JP2002022846A (ja) * | 2000-07-05 | 2002-01-23 | Seiko Instruments Inc | エネルギー分散型ｘ線分析装置 |
| JP4160275B2 (ja) | 2001-05-28 | 2008-10-01 | 浜松ホトニクス株式会社 | エネルギー測定方法及び測定装置 |
| US6609075B1 (en) * | 2001-06-04 | 2003-08-19 | William K. Warburton | Method and apparatus for baseline correction in x-ray and nuclear spectroscopy systems |
-
2005
- 2005-05-31 US US11/142,819 patent/US7966155B2/en not_active Expired - Lifetime
- 2005-06-02 EP EP05767680.1A patent/EP1754113B1/en not_active Expired - Lifetime
- 2005-06-02 JP JP2007515559A patent/JP2008501954A/ja active Pending
- 2005-06-02 SI SI200531719T patent/SI1754113T1/sl unknown
- 2005-06-02 WO PCT/US2005/019355 patent/WO2005121988A2/en not_active Ceased
- 2005-06-02 AU AU2005253117A patent/AU2005253117B2/en not_active Ceased
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