JP2008280212A5 - - Google Patents
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- Publication number
- JP2008280212A5 JP2008280212A5 JP2007125848A JP2007125848A JP2008280212A5 JP 2008280212 A5 JP2008280212 A5 JP 2008280212A5 JP 2007125848 A JP2007125848 A JP 2007125848A JP 2007125848 A JP2007125848 A JP 2007125848A JP 2008280212 A5 JP2008280212 A5 JP 2008280212A5
- Authority
- JP
- Japan
- Prior art keywords
- single crystal
- producing
- pulling
- dopant
- rectifying member
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000013078 crystal Substances 0.000 claims description 17
- 238000004519 manufacturing process Methods 0.000 claims description 4
- 239000011261 inert gas Substances 0.000 description 3
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 230000007423 decrease Effects 0.000 description 1
- 239000002019 doping agent Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007125848A JP5172202B2 (ja) | 2007-05-10 | 2007-05-10 | 単結晶の製造方法 |
| PCT/JP2008/058483 WO2008142993A1 (ja) | 2007-05-10 | 2008-05-07 | 単結晶の製造方法 |
| DE112008000033.6T DE112008000033B4 (de) | 2007-05-10 | 2008-05-07 | Verfahren zum Herstellen eines Einkristalls |
| US12/515,730 US8110042B2 (en) | 2007-05-10 | 2008-05-07 | Method for manufacturing single crystal |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007125848A JP5172202B2 (ja) | 2007-05-10 | 2007-05-10 | 単結晶の製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2008280212A JP2008280212A (ja) | 2008-11-20 |
| JP2008280212A5 true JP2008280212A5 (https=) | 2010-12-16 |
| JP5172202B2 JP5172202B2 (ja) | 2013-03-27 |
Family
ID=40031708
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007125848A Active JP5172202B2 (ja) | 2007-05-10 | 2007-05-10 | 単結晶の製造方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US8110042B2 (https=) |
| JP (1) | JP5172202B2 (https=) |
| DE (1) | DE112008000033B4 (https=) |
| WO (1) | WO2008142993A1 (https=) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5226496B2 (ja) * | 2008-12-17 | 2013-07-03 | Sumco Techxiv株式会社 | シリコン単結晶引上装置 |
| MY159737A (en) | 2010-09-03 | 2017-01-31 | Gtat Ip Holding Llc | Silicon single crystal doped with gallium, indium, or aluminum |
| KR101252915B1 (ko) * | 2010-09-06 | 2013-04-09 | 주식회사 엘지실트론 | 단결정 잉곳 제조방법 |
| KR101303422B1 (ko) * | 2011-03-28 | 2013-09-05 | 주식회사 엘지실트론 | 단결정 잉곳의 제조방법 및 이에 의해 제조된 단결정 잉곳과 웨이퍼 |
| WO2013031091A1 (ja) * | 2011-09-01 | 2013-03-07 | 信越半導体株式会社 | シリコン単結晶の製造方法 |
| KR101384060B1 (ko) | 2012-08-03 | 2014-04-09 | 주식회사 엘지실트론 | 실리콘 단결정 잉곳 성장 방법 |
| CN113417003A (zh) * | 2021-06-22 | 2021-09-21 | 宁夏中欣晶圆半导体科技有限公司 | 能够降低头部氧含量的大直径单晶硅生产方法及装置 |
| JP7359241B2 (ja) * | 2022-03-15 | 2023-10-11 | 株式会社Sumco | シリコン単結晶の製造方法 |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0777994B2 (ja) * | 1989-11-16 | 1995-08-23 | 信越半導体株式会社 | 単結晶の酸素濃度コントロール方法及び装置 |
| EP0509312B1 (en) * | 1991-04-16 | 1995-08-23 | Sumitomo Electric Industries, Limited | Czochralski method using a member for intercepting radiation from raw material molten solution and apparatus therefor |
| JP2978607B2 (ja) * | 1991-09-17 | 1999-11-15 | 新日本製鐵株式会社 | シリコン単結晶の製造方法 |
| EP0625595B1 (en) * | 1993-03-29 | 2001-09-19 | Research Development Corporation Of Japan | Control of oxygen concentration in single crystal pulled up from melt containing group-V element |
| JP2760932B2 (ja) * | 1993-03-29 | 1998-06-04 | 科学技術振興事業団 | 単結晶引上げ用Si融液の酸素濃度制御方法 |
| US5477805A (en) | 1993-12-28 | 1995-12-26 | Research Development Corporation Of Japan | Preparation of silicon melt for use in pull method of manufacturing single crystal |
| JP2691393B2 (ja) | 1993-12-28 | 1997-12-17 | 科学技術振興事業団 | 単結晶引上げ用Si融液の調整方法 |
| JPH09227275A (ja) | 1996-02-28 | 1997-09-02 | Sumitomo Sitix Corp | ドープ剤添加装置 |
| US5904768A (en) * | 1996-10-15 | 1999-05-18 | Memc Electronic Materials, Inc. | Process for controlling the oxygen content in silicon wafers heavily doped with antimony or arsenic |
| JP3787452B2 (ja) * | 1999-02-10 | 2006-06-21 | 株式会社Sumco | シリコン単結晶の製造方法 |
| WO2001063027A1 (en) * | 2000-02-28 | 2001-08-30 | Shin-Etsu Handotai Co., Ltd | Method for preparing silicon single crystal and silicon single crystal |
| DE10250822B4 (de) | 2002-10-31 | 2006-09-28 | Siltronic Ag | Verfahren zur Herstellung eines mit leichtflüchtigem Fremdstoff dotierten Einkristalls aus Silicium |
| JP4153293B2 (ja) * | 2002-12-17 | 2008-09-24 | コバレントマテリアル株式会社 | シリコン単結晶引上方法 |
| JP2007112663A (ja) * | 2005-10-20 | 2007-05-10 | Sumco Techxiv株式会社 | 半導体単結晶製造装置および製造方法 |
-
2007
- 2007-05-10 JP JP2007125848A patent/JP5172202B2/ja active Active
-
2008
- 2008-05-07 DE DE112008000033.6T patent/DE112008000033B4/de active Active
- 2008-05-07 US US12/515,730 patent/US8110042B2/en active Active
- 2008-05-07 WO PCT/JP2008/058483 patent/WO2008142993A1/ja not_active Ceased
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