JP2008272476A5 - - Google Patents

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Publication number
JP2008272476A5
JP2008272476A5 JP2008115604A JP2008115604A JP2008272476A5 JP 2008272476 A5 JP2008272476 A5 JP 2008272476A5 JP 2008115604 A JP2008115604 A JP 2008115604A JP 2008115604 A JP2008115604 A JP 2008115604A JP 2008272476 A5 JP2008272476 A5 JP 2008272476A5
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Japan
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image
unit area
secondary radiation
area mass
corrected
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JP2008115604A
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Japanese (ja)
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JP2008272476A (ja
JP5264268B2 (ja
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Priority claimed from DE102007020065A external-priority patent/DE102007020065A1/de
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Expired - Fee Related legal-status Critical Current
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JP2008115604A 2007-04-27 2008-04-25 単位面積質量画像の作成方法 Expired - Fee Related JP5264268B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102007020065.1 2007-04-27
DE102007020065A DE102007020065A1 (de) 2007-04-27 2007-04-27 Verfahren für die Erstellung von Massenbelegungsbildern anhand von in unterschiedlichen Energiebereichen aufgenommenen Schwächungsbildern

Publications (3)

Publication Number Publication Date
JP2008272476A JP2008272476A (ja) 2008-11-13
JP2008272476A5 true JP2008272476A5 (enExample) 2011-03-10
JP5264268B2 JP5264268B2 (ja) 2013-08-14

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JP2008115604A Expired - Fee Related JP5264268B2 (ja) 2007-04-27 2008-04-25 単位面積質量画像の作成方法

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US (1) US8041096B2 (enExample)
JP (1) JP5264268B2 (enExample)
DE (1) DE102007020065A1 (enExample)

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JP7054329B2 (ja) * 2017-10-06 2022-04-13 キヤノン株式会社 画像処理装置、画像処理方法及びプログラム
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JP7093233B2 (ja) * 2018-06-07 2022-06-29 キヤノン株式会社 放射線撮影装置、放射線撮影方法およびプログラム
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JP7458750B2 (ja) * 2019-11-13 2024-04-01 キヤノン株式会社 画像処理装置、放射線撮影装置、画像処理方法及びプログラム
DE102019218589A1 (de) * 2019-11-29 2021-06-02 Bayer Aktiengesellschaft Simultane Bilddarstellung von zwei unterschiedlichen funktionellen Bereichen
JP7531337B2 (ja) * 2020-07-08 2024-08-09 キヤノン株式会社 放射線撮影システム、制御装置、制御方法、及びプログラム
JP7436320B2 (ja) * 2020-07-31 2024-02-21 富士フイルム株式会社 放射線画像処理装置、方法およびプログラム
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